JP7489671B2 - 補正パラメータ算出方法、変位量算出方法、補正パラメータ算出装置、及び、変位量算出装置 - Google Patents

補正パラメータ算出方法、変位量算出方法、補正パラメータ算出装置、及び、変位量算出装置 Download PDF

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JP7489671B2
JP7489671B2 JP2021552097A JP2021552097A JP7489671B2 JP 7489671 B2 JP7489671 B2 JP 7489671B2 JP 2021552097 A JP2021552097 A JP 2021552097A JP 2021552097 A JP2021552097 A JP 2021552097A JP 7489671 B2 JP7489671 B2 JP 7489671B2
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displacement
imaging device
correction parameter
image data
correction
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JPWO2021075090A5 (https=
JPWO2021075090A1 (https=
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晃浩 野田
太郎 今川
悠樹 丸山
博也 日下
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Panasonic Intellectual Property Management Co Ltd
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Panasonic Intellectual Property Management Co Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/022—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of tv-camera scanning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/03—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring coordinates of points
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C3/00—Measuring distances in line of sight; Optical rangefinders
    • G01C3/02—Details
    • G01C3/06—Use of electric means to obtain final indication
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S11/00—Systems for determining distance or velocity not using reflection or reradiation
    • G01S11/12—Systems for determining distance or velocity not using reflection or reradiation using electromagnetic waves other than radio waves
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K7/00—Methods or arrangements for sensing record carriers, e.g. for reading patterns
    • G06K7/10—Methods or arrangements for sensing record carriers, e.g. for reading patterns by electromagnetic radiation, e.g. optical sensing; by corpuscular radiation
    • G06K7/14—Methods or arrangements for sensing record carriers, e.g. for reading patterns by electromagnetic radiation, e.g. optical sensing; by corpuscular radiation using light without selection of wavelength, e.g. sensing reflected white light
    • G06K7/1404—Methods for optical code recognition
    • G06K7/1408—Methods for optical code recognition the method being specifically adapted for the type of code
    • G06K7/1417—2D bar codes

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Electromagnetism (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Artificial Intelligence (AREA)
  • General Health & Medical Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)
JP2021552097A 2019-10-17 2020-06-26 補正パラメータ算出方法、変位量算出方法、補正パラメータ算出装置、及び、変位量算出装置 Active JP7489671B2 (ja)

Applications Claiming Priority (3)

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JP2019190126 2019-10-17
JP2019190126 2019-10-17
PCT/JP2020/025232 WO2021075090A1 (ja) 2019-10-17 2020-06-26 補正パラメータ算出方法、変位量算出方法、補正パラメータ算出装置、及び、変位量算出装置

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JPWO2021075090A1 JPWO2021075090A1 (https=) 2021-04-22
JPWO2021075090A5 JPWO2021075090A5 (https=) 2022-08-01
JP7489671B2 true JP7489671B2 (ja) 2024-05-24

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US (1) US11920913B2 (https=)
JP (1) JP7489671B2 (https=)
CN (1) CN114502913B (https=)
WO (1) WO2021075090A1 (https=)

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KR102714250B1 (ko) * 2021-07-02 2024-10-08 리얼룩앤컴퍼니 주식회사 감지표식을 이용한 장비 편차 보정 장치 및, 이를 이용한 장비 편차 보정 방법
KR102679383B1 (ko) * 2021-11-12 2024-06-28 주식회사 아이쉐어넷 거리 측정 장치 및 방법
SE546659C2 (en) * 2022-11-01 2025-01-07 Optiload Tech Ab A displacement measuring method for measuring a displacement of an object to be measured
KR102919227B1 (ko) * 2022-12-19 2026-01-27 성균관대학교산학협력단 영상처리 기반 교량받침 3차원 변위측정 시스템 및 방법, 그리고 기록 매체
CN117115270B (zh) * 2023-08-31 2025-09-26 深圳市亿图视觉自动化技术有限公司 一种视觉相机的标定方法、装置、设备及存储介质

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JP2007296248A (ja) 2006-05-02 2007-11-15 Sony Computer Entertainment Inc ゲーム装置
JP2013124972A (ja) 2011-12-15 2013-06-24 Samsung Yokohama Research Institute Co Ltd 位置推定装置及び方法、並びにテレビジョン受信機
JP2015055969A (ja) 2013-09-11 2015-03-23 学校法人常翔学園 移動ロボット、移動ロボット制御システム、制御図形の表示されたシート、及びプログラム
JP2016071663A (ja) 2014-09-30 2016-05-09 株式会社Ｎｔｔドコモ 情報通信システムおよび情報読取方法
JP2017215306A (ja) 2016-02-24 2017-12-07 パナソニックＩｐマネジメント株式会社 変位検出装置および変位検出方法

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KR100458290B1 (ko) * 2001-12-27 2004-12-03 고속도로관리공단 이미지 프로세싱을 이용한 구조물의 변위량 측정방법
JP4234059B2 (ja) * 2003-06-06 2009-03-04 三菱電機株式会社 カメラキャリブレーション方法およびカメラキャリブレーション装置
JP5281610B2 (ja) 2010-05-14 2013-09-04 西日本旅客鉄道株式会社 レーザー距離計付き撮影装置
JP5222430B1 (ja) * 2012-10-19 2013-06-26 株式会社イノテック 寸法計測装置、寸法計測方法及び寸法計測装置用のプログラム
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JP2007296248A (ja) 2006-05-02 2007-11-15 Sony Computer Entertainment Inc ゲーム装置
JP2013124972A (ja) 2011-12-15 2013-06-24 Samsung Yokohama Research Institute Co Ltd 位置推定装置及び方法、並びにテレビジョン受信機
JP2015055969A (ja) 2013-09-11 2015-03-23 学校法人常翔学園 移動ロボット、移動ロボット制御システム、制御図形の表示されたシート、及びプログラム
JP2016071663A (ja) 2014-09-30 2016-05-09 株式会社Ｎｔｔドコモ 情報通信システムおよび情報読取方法
JP2017215306A (ja) 2016-02-24 2017-12-07 パナソニックＩｐマネジメント株式会社 変位検出装置および変位検出方法

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CN114502913B (zh) 2025-12-19
JPWO2021075090A1 (https=) 2021-04-22
US11920913B2 (en) 2024-03-05
CN114502913A (zh) 2022-05-13
US20220205776A1 (en) 2022-06-30
WO2021075090A1 (ja) 2021-04-22

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