JP7482912B2 - 画像の欠陥の特定 - Google Patents

画像の欠陥の特定 Download PDF

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Publication number
JP7482912B2
JP7482912B2 JP2021578101A JP2021578101A JP7482912B2 JP 7482912 B2 JP7482912 B2 JP 7482912B2 JP 2021578101 A JP2021578101 A JP 2021578101A JP 2021578101 A JP2021578101 A JP 2021578101A JP 7482912 B2 JP7482912 B2 JP 7482912B2
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image
defect
processors
generating
computer
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JP2022538468A (ja
JP2022538468A5 (enExample
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リー、ファン
クィヤン ヒュー、ギュオ
ナン チュー、シェン
チュー、ジュン
チャン ホアン、ジン
ジー、ペン
ユアン ディン、ユアン
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International Business Machines Corp
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International Business Machines Corp
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/24—Classification techniques
    • G06F18/241—Classification techniques relating to the classification model, e.g. parametric or non-parametric approaches
    • G06F18/2413—Classification techniques relating to the classification model, e.g. parametric or non-parametric approaches based on distances to training or reference patterns
    • G06F18/24133—Distances to prototypes
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/24—Classification techniques
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00—Image enhancement or restoration
    • G06T5/77—Retouching; Inpainting; Scratch removal
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/20—Image preprocessing
    • G06V10/24—Aligning, centring, orientation detection or correction of the image
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/764—Arrangements for image or video recognition or understanding using pattern recognition or machine learning using classification, e.g. of video objects
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/82—Arrangements for image or video recognition or understanding using pattern recognition or machine learning using neural networks
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/98—Detection or correction of errors, e.g. by rescanning the pattern or by human intervention; Evaluation of the quality of the acquired patterns
    • G06V10/993—Evaluation of the quality of the acquired pattern
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10048—Infrared image
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20084—Artificial neural networks [ANN]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30141—Printed circuit board [PCB]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V2201/00—Indexing scheme relating to image or video recognition or understanding
    • G06V2201/06—Recognition of objects for industrial automation

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Evolutionary Computation (AREA)
  • Quality & Reliability (AREA)
  • Multimedia (AREA)
  • Artificial Intelligence (AREA)
  • Computing Systems (AREA)
  • Health & Medical Sciences (AREA)
  • Databases & Information Systems (AREA)
  • General Health & Medical Sciences (AREA)
  • Medical Informatics (AREA)
  • Software Systems (AREA)
  • Data Mining & Analysis (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Evolutionary Biology (AREA)
  • General Engineering & Computer Science (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
JP2021578101A 2019-07-05 2020-06-12 画像の欠陥の特定 Active JP7482912B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US16/503,764 US11030738B2 (en) 2019-07-05 2019-07-05 Image defect identification
US16/503,764 2019-07-05
PCT/IB2020/055527 WO2021005426A1 (en) 2019-07-05 2020-06-12 Image defect identification

Publications (3)

Publication Number Publication Date
JP2022538468A JP2022538468A (ja) 2022-09-02
JP2022538468A5 JP2022538468A5 (enExample) 2022-10-25
JP7482912B2 true JP7482912B2 (ja) 2024-05-14

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JP2021578101A Active JP7482912B2 (ja) 2019-07-05 2020-06-12 画像の欠陥の特定

Country Status (6)

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US (1) US11030738B2 (enExample)
JP (1) JP7482912B2 (enExample)
CN (1) CN114072851B (enExample)
DE (1) DE112020002213T5 (enExample)
GB (1) GB2600587B (enExample)
WO (1) WO2021005426A1 (enExample)

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WO2020243333A1 (en) 2019-05-30 2020-12-03 The Research Foundation For The State University Of New York System, method, and computer-accessible medium for generating multi-class models from single-class datasets
US11295439B2 (en) * 2019-10-16 2022-04-05 International Business Machines Corporation Image recovery
CN115461612A (zh) * 2020-04-28 2022-12-09 三菱电机株式会社 外观检查装置和外观检查方法
US11967139B2 (en) * 2020-05-19 2024-04-23 Objectvideo Labs, Llc Adversarial masks for false detection removal
CN111667420B (zh) * 2020-05-21 2023-10-24 维沃移动通信有限公司 图像处理方法及装置
DE102020207324A1 (de) * 2020-06-12 2021-12-16 Robert Bosch Gesellschaft mit beschränkter Haftung Plausibilisierung der Ausgabe eines Bildklassifikators mit einem Generator für abgewandelte Bilder
JP7535934B2 (ja) * 2020-12-18 2024-08-19 株式会社豊田中央研究所 不良箇所検出装置、不良箇所検出方法、およびコンピュータプログラム
JP7563665B2 (ja) * 2021-01-26 2024-10-08 日東電工株式会社 検査システム、検査方法及び検査プログラム
CN112967248B (zh) * 2021-03-03 2024-01-23 北京百度网讯科技有限公司 生成缺陷图像样本的方法、装置、介质及程序产品
CN112950606B (zh) * 2021-03-15 2023-04-07 重庆邮电大学 一种基于小样本的手机屏幕缺陷分割方法
US11216932B1 (en) * 2021-03-26 2022-01-04 Minds AI Technologies Ltd Electronic substrate defect detection
US11386580B1 (en) * 2021-08-13 2022-07-12 Goodsize Inc. System apparatus and method for guiding user to comply with application-specific requirements
US12079982B2 (en) * 2021-11-17 2024-09-03 Yahoo Ad Tech Llc Object defect detection
CN113870262B (zh) * 2021-12-02 2022-04-19 武汉飞恩微电子有限公司 基于图像处理的印刷电路板分类方法、装置及储存介质
CN114494135B (zh) * 2021-12-24 2024-12-17 深圳英博达智能科技有限公司 Pcb板表面凸点缺陷检测方法、系统、及电子设备
CN114565622B (zh) * 2022-03-03 2023-04-07 北京安德医智科技有限公司 房间隔缺损长度的确定方法及装置、电子设备和存储介质
CN114332084B (zh) * 2022-03-11 2022-09-16 齐鲁工业大学 一种基于深度学习的pcb表面缺陷检测方法
CN115661123B (zh) * 2022-11-14 2023-06-23 哈尔滨工业大学 基于弱监督目标检测的工业品表面缺陷位置检测方法
JP2024082013A (ja) 2022-12-07 2024-06-19 株式会社Ｓｃｒｅｅｎホールディングス 画像処理装置、特徴抽出器の学習方法、識別器の更新方法、および画像処理方法
CN115937147B (zh) * 2022-12-09 2023-09-26 北京小米移动软件有限公司 缺陷检测参数的确定方法、装置、设备及存储介质
CN118314490B (zh) * 2024-06-11 2024-09-17 合肥工业大学 一种特高压变电站空天地多尺度重决策方法及系统

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Publication number Publication date
CN114072851A (zh) 2022-02-18
JP2022538468A (ja) 2022-09-02
DE112020002213T5 (de) 2022-03-17
US11030738B2 (en) 2021-06-08
GB2600587A (en) 2022-05-04
GB2600587B (en) 2023-11-15
US20210004945A1 (en) 2021-01-07
GB202200865D0 (en) 2022-03-09
WO2021005426A1 (en) 2021-01-14
CN114072851B (zh) 2025-07-15

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