GB2600587B - Image defect identification - Google Patents

Image defect identification Download PDF

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Publication number
GB2600587B
GB2600587B GB2200865.0A GB202200865A GB2600587B GB 2600587 B GB2600587 B GB 2600587B GB 202200865 A GB202200865 A GB 202200865A GB 2600587 B GB2600587 B GB 2600587B
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United Kingdom
Prior art keywords
image defect
defect identification
identification
image
defect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
GB2200865.0A
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English (en)
Other versions
GB2600587A (en
GB202200865D0 (en
Inventor
Li Fan
Qiang Hu Guo
Nan Zhu Sheng
Zhu Jun
Chang Huang Jing
Ji Peng
Yuan Ding Yuan
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
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International Business Machines Corp
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Publication date
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Publication of GB202200865D0 publication Critical patent/GB202200865D0/en
Publication of GB2600587A publication Critical patent/GB2600587A/en
Application granted granted Critical
Publication of GB2600587B publication Critical patent/GB2600587B/en
Active legal-status Critical Current
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Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/24—Classification techniques
    • G06F18/241—Classification techniques relating to the classification model, e.g. parametric or non-parametric approaches
    • G06F18/2413—Classification techniques relating to the classification model, e.g. parametric or non-parametric approaches based on distances to training or reference patterns
    • G06F18/24133—Distances to prototypes
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/24—Classification techniques
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00—Image enhancement or restoration
    • G06T5/77—Retouching; Inpainting; Scratch removal
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/20—Image preprocessing
    • G06V10/24—Aligning, centring, orientation detection or correction of the image
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/764—Arrangements for image or video recognition or understanding using pattern recognition or machine learning using classification, e.g. of video objects
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/82—Arrangements for image or video recognition or understanding using pattern recognition or machine learning using neural networks
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/98—Detection or correction of errors, e.g. by rescanning the pattern or by human intervention; Evaluation of the quality of the acquired patterns
    • G06V10/993—Evaluation of the quality of the acquired pattern
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10048—Infrared image
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20084—Artificial neural networks [ANN]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30141—Printed circuit board [PCB]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V2201/00—Indexing scheme relating to image or video recognition or understanding
    • G06V2201/06—Recognition of objects for industrial automation

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Evolutionary Computation (AREA)
  • Quality & Reliability (AREA)
  • Multimedia (AREA)
  • Artificial Intelligence (AREA)
  • Computing Systems (AREA)
  • Health & Medical Sciences (AREA)
  • Databases & Information Systems (AREA)
  • General Health & Medical Sciences (AREA)
  • Medical Informatics (AREA)
  • Software Systems (AREA)
  • Data Mining & Analysis (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Evolutionary Biology (AREA)
  • General Engineering & Computer Science (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
GB2200865.0A 2019-07-05 2020-06-12 Image defect identification Active GB2600587B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US16/503,764 US11030738B2 (en) 2019-07-05 2019-07-05 Image defect identification
PCT/IB2020/055527 WO2021005426A1 (en) 2019-07-05 2020-06-12 Image defect identification

Publications (3)

Publication Number Publication Date
GB202200865D0 GB202200865D0 (en) 2022-03-09
GB2600587A GB2600587A (en) 2022-05-04
GB2600587B true GB2600587B (en) 2023-11-15

Family

ID=74066825

Family Applications (1)

Application Number Title Priority Date Filing Date
GB2200865.0A Active GB2600587B (en) 2019-07-05 2020-06-12 Image defect identification

Country Status (6)

Country Link
US (1) US11030738B2 (enExample)
JP (1) JP7482912B2 (enExample)
CN (1) CN114072851B (enExample)
DE (1) DE112020002213T5 (enExample)
GB (1) GB2600587B (enExample)
WO (1) WO2021005426A1 (enExample)

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WO2020243333A1 (en) 2019-05-30 2020-12-03 The Research Foundation For The State University Of New York System, method, and computer-accessible medium for generating multi-class models from single-class datasets
US11295439B2 (en) * 2019-10-16 2022-04-05 International Business Machines Corporation Image recovery
CN115461612A (zh) * 2020-04-28 2022-12-09 三菱电机株式会社 外观检查装置和外观检查方法
US11967139B2 (en) * 2020-05-19 2024-04-23 Objectvideo Labs, Llc Adversarial masks for false detection removal
CN111667420B (zh) * 2020-05-21 2023-10-24 维沃移动通信有限公司 图像处理方法及装置
DE102020207324A1 (de) * 2020-06-12 2021-12-16 Robert Bosch Gesellschaft mit beschränkter Haftung Plausibilisierung der Ausgabe eines Bildklassifikators mit einem Generator für abgewandelte Bilder
JP7535934B2 (ja) * 2020-12-18 2024-08-19 株式会社豊田中央研究所 不良箇所検出装置、不良箇所検出方法、およびコンピュータプログラム
JP7563665B2 (ja) * 2021-01-26 2024-10-08 日東電工株式会社 検査システム、検査方法及び検査プログラム
CN112967248B (zh) * 2021-03-03 2024-01-23 北京百度网讯科技有限公司 生成缺陷图像样本的方法、装置、介质及程序产品
CN112950606B (zh) * 2021-03-15 2023-04-07 重庆邮电大学 一种基于小样本的手机屏幕缺陷分割方法
US11216932B1 (en) * 2021-03-26 2022-01-04 Minds AI Technologies Ltd Electronic substrate defect detection
US11386580B1 (en) * 2021-08-13 2022-07-12 Goodsize Inc. System apparatus and method for guiding user to comply with application-specific requirements
US12079982B2 (en) * 2021-11-17 2024-09-03 Yahoo Ad Tech Llc Object defect detection
CN113870262B (zh) * 2021-12-02 2022-04-19 武汉飞恩微电子有限公司 基于图像处理的印刷电路板分类方法、装置及储存介质
CN114494135B (zh) * 2021-12-24 2024-12-17 深圳英博达智能科技有限公司 Pcb板表面凸点缺陷检测方法、系统、及电子设备
CN114565622B (zh) * 2022-03-03 2023-04-07 北京安德医智科技有限公司 房间隔缺损长度的确定方法及装置、电子设备和存储介质
CN114332084B (zh) * 2022-03-11 2022-09-16 齐鲁工业大学 一种基于深度学习的pcb表面缺陷检测方法
CN115661123B (zh) * 2022-11-14 2023-06-23 哈尔滨工业大学 基于弱监督目标检测的工业品表面缺陷位置检测方法
JP2024082013A (ja) 2022-12-07 2024-06-19 株式会社Ｓｃｒｅｅｎホールディングス 画像処理装置、特徴抽出器の学習方法、識別器の更新方法、および画像処理方法
CN115937147B (zh) * 2022-12-09 2023-09-26 北京小米移动软件有限公司 缺陷检测参数的确定方法、装置、设备及存储介质
CN118314490B (zh) * 2024-06-11 2024-09-17 合肥工业大学 一种特高压变电站空天地多尺度重决策方法及系统

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070201739A1 (en) * 2006-02-27 2007-08-30 Ryo Nakagaki Method and apparatus for reviewing defects
CN101604080A (zh) * 2009-07-10 2009-12-16 友达光电股份有限公司 透镜基板的检测方法及其应用于显示装置的制造方法
US20110274342A1 (en) * 2008-12-25 2011-11-10 Shunji Maeda Defect inspection method and device thereof
CN107430988A (zh) * 2015-04-14 2017-12-01 佳能株式会社 压印装置、压印方法和制造物品的方法
WO2018216629A1 (ja) * 2017-05-22 2018-11-29 キヤノン株式会社 情報処理装置、情報処理方法、及びプログラム
CN109035248A (zh) * 2018-09-05 2018-12-18 深圳灵图慧视科技有限公司 疵点检测方法、装置、终端设备、服务器和存储介质

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JP6546826B2 (ja) 2015-10-08 2019-07-17 株式会社日立パワーソリューションズ 欠陥検査方法、及びその装置
KR102376200B1 (ko) * 2016-05-12 2022-03-18 에이에스엠엘 네델란즈 비.브이. 기계 학습에 의한 결함 또는 핫스폿의 식별
JP7031963B2 (ja) 2017-08-22 2022-03-08 株式会社ディスコ チップの製造方法
JP2019039727A (ja) 2017-08-23 2019-03-14 富士通株式会社 画像検査装置、画像検査方法および画像検査プログラム
US10424059B2 (en) * 2017-09-11 2019-09-24 International Business Machines Corporation Quality evaluation
JP6936957B2 (ja) 2017-11-07 2021-09-22 オムロン株式会社 検査装置、データ生成装置、データ生成方法及びデータ生成プログラム
CN109118482B (zh) 2018-08-07 2019-12-31 腾讯科技（深圳）有限公司 一种面板缺陷分析方法、装置及存储介质
CN109741328B (zh) * 2019-02-02 2023-04-14 东北大学 一种基于生成式对抗网络的汽车表观质量检测方法

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070201739A1 (en) * 2006-02-27 2007-08-30 Ryo Nakagaki Method and apparatus for reviewing defects
US20110274342A1 (en) * 2008-12-25 2011-11-10 Shunji Maeda Defect inspection method and device thereof
CN101604080A (zh) * 2009-07-10 2009-12-16 友达光电股份有限公司 透镜基板的检测方法及其应用于显示装置的制造方法
CN107430988A (zh) * 2015-04-14 2017-12-01 佳能株式会社 压印装置、压印方法和制造物品的方法
WO2018216629A1 (ja) * 2017-05-22 2018-11-29 キヤノン株式会社 情報処理装置、情報処理方法、及びプログラム
CN109035248A (zh) * 2018-09-05 2018-12-18 深圳灵图慧视科技有限公司 疵点检测方法、装置、终端设备、服务器和存储介质

Also Published As

Publication number Publication date
CN114072851A (zh) 2022-02-18
JP2022538468A (ja) 2022-09-02
DE112020002213T5 (de) 2022-03-17
US11030738B2 (en) 2021-06-08
JP7482912B2 (ja) 2024-05-14
GB2600587A (en) 2022-05-04
US20210004945A1 (en) 2021-01-07
GB202200865D0 (en) 2022-03-09
WO2021005426A1 (en) 2021-01-14
CN114072851B (zh) 2025-07-15

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Effective date: 20231208