JP7426058B2 - Coverage measuring device - Google Patents

Description

The present specification relates to a technique for measuring coverage of a shot-peened machined surface. Here, "coverage" is an index for quantitatively evaluating the amount of shot peening. Typically, it is expressed as the ratio of the area of the projection marks formed by the collision of the shot material to the processing surface and the area of the processing surface (namely, the area of the projection marks/the area of the processing surface).

BACKGROUND ART In order to improve the fatigue strength of metals such as mechanical parts (eg, gears, springs, etc.) and steel structures (eg, bridges, etc.), shot peening treatment is sometimes performed on the surface of metals. In the shot peening process, a projectile material (for example, a steel ball) is projected onto the surface of the metal to impart compressive residual stress to the surface of the metal. By applying compressive residual stress to the surface of the metal, the fatigue strength of the metal is improved. The compressive residual stress applied to the metal surface changes depending on the amount of shot peening. Therefore, in order to control the compressive residual stress imparted to the metal surface, it is necessary to quantitatively evaluate the amount of shot peening. Therefore, coverage has conventionally been used as an index for quantitatively evaluating the amount of shot peening. Patent Document 1 discloses an apparatus for measuring coverage. In the measuring device of Patent Document 1, a shot peened processed surface is photographed with a photographing device, a projection mark area is calculated from the photographed image, and coverage is calculated from the calculated projection mark area and the photographing area photographed with the photographing device. calculate. An LED that emits visible light is used as a light source of the photographing device.

Japanese Patent Application Publication No. 2011-152603

In the conventional technology, a reflected image of a processed surface is photographed using visible light, the photographed image is binarized, and the shot peened region is distinguished from the shot peened region. However, for example, scale may be formed on the processed surface. In such a case, depending on the binarization of the captured image, it may be difficult to distinguish between areas that have been subjected to shot peening and areas that have not been subjected to shot peening. Furthermore, depending on the base material to be measured, it may be difficult to distinguish between areas that have been subjected to shot peening and areas that have not been subjected to shot peening by binarizing a captured image. This specification discloses a technique that makes it possible to measure coverage even on processed surfaces that have surface textures that are difficult to measure by only binarizing captured images.

The coverage measuring method disclosed in this specification is a method of measuring the coverage of a shot-peened processed surface. The coverage measurement method involves a coating process in which fluorescent material is applied to the surface to be shot peened before shot peening, and ultraviolet light emitted from a light source is irradiated onto the processed surface after shot peening, and the surface is excited by the ultraviolet light. a photographing step of detecting fluorescence and photographing a reflected image from the processed surface; a specifying step of identifying at least one of brightness and saturation and hue of the reflected image photographed in the photographing step; A calculation step of calculating coverage from at least one of brightness and saturation and hue.

In the above-mentioned coverage measurement method, a fluorescent material is applied to a surface to be subjected to shot peening treatment, and after shot peening treatment, the processed surface is irradiated with ultraviolet light to detect fluorescence. Since no fluorescence is detected in the shot peened area, it is easy to identify the shot peened area. Further, the coverage is specified based on at least one of the brightness and saturation of the reflected image and the hue. For example, if the presence or absence of shot peening treatment is determined using only brightness as an indicator, if scale is formed on the machined surface or the base material is easily detected by fluorescence, the shot peening treatment and shot peening It may be difficult to distinguish between unprocessed parts. By using at least one of brightness and saturation and hue as an index for determining the presence or absence of shot peening treatment, detection of fluorescence can be determined more reliably. Therefore, coverage can be determined with high accuracy regardless of the base material to be measured or the presence or absence of scale.

Furthermore, the coverage measuring device disclosed in this specification measures the coverage of a processed surface that has been subjected to shot peening on a surface coated with a fluorescent material. The coverage measuring device includes a first light source that emits ultraviolet light, a photographing device that detects fluorescence excited by the ultraviolet light emitted from the first light source and photographs a reflected image from a processed surface, and a photographing device. The present invention includes an arithmetic device that calculates coverage from at least one of brightness and saturation and hue specified from a photographed reflected image.

In the above-mentioned coverage measuring device, ultraviolet light is irradiated onto a shot-peened surface coated with a fluorescent material, and coverage is calculated from at least one of brightness and saturation and hue determined from the reflected image. . Therefore, the same effects as the above-mentioned coverage measuring method can be achieved.

The present specification also discloses a computer program for calculating the coverage of a processed surface obtained by shot peening a surface coated with a fluorescent material. The computer program connects the computer to a data acquisition unit that detects fluorescence excited by ultraviolet light irradiated on the processed surface after shot peening processing and acquires photographic data of a reflected image from the processed surface, and a data acquisition unit. It functions as a calculation unit that calculates at least one of brightness and saturation and hue of the photographic data acquired in , and calculates coverage from the calculated hue and at least one of brightness and saturation.

FIG. 1 is a diagram schematically showing the overall configuration of a coverage measuring device according to an example. FIG. 2 is a block diagram showing a control system of a coverage measuring device according to an embodiment. FIG. 3 is a cross-sectional view showing the optical system of the imaging unit, showing a state in which an attachment is attached. FIG. 3 is a cross-sectional view showing the optical system of the imaging unit, showing a state where no attachment is attached. 2 is a flowchart showing an example of a procedure for measuring coverage using ultraviolet light. 6 is a flowchart illustrating an example of the procedure of the coverage measurement process in FIG. 5. FIG.

The main features of the embodiment described below will be listed. The technical elements described below are independent technical elements that exhibit technical utility alone or in various combinations, and are limited to the combinations described in the claims as filed. It's not a thing.

(Feature 1) The coverage measuring device disclosed in this specification includes a second light source that emits visible light, a main body that houses the second light source and a photographing device, and one end of which is removably attached to the photographing end of the main body. The image forming apparatus may further include an attachment that is connected to the image forming apparatus and whose other end is brought into contact with the processing surface during photographing. The first light source may be included in the attachment. In a first state in which one end of the attachment is connected to the photographing end of the main body and the other end of the attachment is in contact with the processing surface, the photographing device emits fluorescence excited by ultraviolet light emitted from the first light source. It may also be possible to detect and photograph a reflected image from the processed surface. In a second state in which one end of the attachment is not connected to the photographing end of the main body and the photographing end is in contact with the processing surface, the photographing device detects the reflection from the processing surface of visible light emitted from the second light source. It may also be possible to take an image. The optical path length from the second light source to the imaging device via the processing surface in the second state is the same as the optical path length from the first light source to the imaging device via the processing surface in the first state. It's okay. The arithmetic device may be capable of calculating the coverage specified from the reflected image from the processed surface using visible light captured by the imaging device in the second state. According to such a configuration, coverage can be calculated from a captured image of a processed surface captured using visible light. In addition, since the optical path length when photographing a reflected image with visible light and the optical path length when photographing a reflected image with ultraviolet light are the same, the coverage calculated based on visible light and the optical path length when photographing a reflected image with ultraviolet light are The coverage can be appropriately compared and evaluated. Therefore, coverage can be evaluated with higher accuracy.

The coverage measuring device 10 according to the embodiment will be described below. The coverage measuring device 10 is carried and used by an operator close to the processing surface 60 to be measured. As shown in FIGS. 1 and 2, the coverage measurement device 10 includes a control section main body 12 and an imaging section 14. The control section main body 12 and the photographing section 14 are connected by a cord 13.

The control unit main body 12 includes switches such as a power switch 23 and a measurement start switch 22, a display 20, and a computer 24 that controls each part of the coverage measuring device 10. The power switch 23 is a switch for starting the coverage measuring device 10. When the power switch 23 is operated, power supply from a battery (not shown) housed in the control unit main body 12 to each part of the control unit main body 12 and the photographing unit 14 is started. The measurement start switch 22 is a switch for starting coverage measurement. Note that instead of providing the measurement start switch 22, the display 20 may be a touch panel, and coverage measurement may be started by touching a predetermined location on the screen within the display 20.

The display 20 displays images photographed by the photographing unit 14, measured coverage, and the like. When the coverage is measured multiple times by the coverage measuring device 10, the transition, average value, etc. of the measured coverage are also displayed on the display 20.

The computer 24 includes a CPU, ROM, and RAM. The computer 24 is connected to the photographing section 14, the display 20, various switches 22 and 23, and a memory 25 (see FIG. 2). The computer 24 performs processes such as controlling the photographing unit 14 to photograph the processed surface 60, calculating coverage based on the photographed image, and displaying the calculated coverage on the display 20. The processing of the computer 24 will be detailed later.

The memory 25 stores images photographed by the photographing section 14. The memory 25 also stores setting conditions for hue, brightness, and saturation used when calculating coverage in the computer 24. The setting conditions for hue, brightness, and saturation will be detailed later.

The photographing section 14 will be explained with reference to FIGS. 3 and 4. As shown in FIG. 3, the imaging unit 14 includes a main body 30 and an attachment 40 that can be attached to and detached from the main body 30. The main body 30 includes a visible light source 32 that emits visible light, a camera 34 that takes images, a half mirror 36, and a casing 39 that houses the visible light source 32, the camera 34, and the half mirror 36. Camera 34 is controlled on/off by computer 24. Image data taken by the camera 34 is input to the computer 24 and stored in the memory 25. The attachment 40 includes an ultraviolet light source 42 that irradiates ultraviolet light, a substrate 43 on which the ultraviolet light source 42 is mounted, a resin cover 44, a support member 45 that supports the attachment 40, and the ultraviolet light source 42 and the substrate 43. A casing 49 that accommodates a resin cover 44 is provided. The processed surface 60 to be measured is photographed using visible light emitted from the visible light source 32 or ultraviolet light emitted from the ultraviolet light source 42 .

Here, the visible light optical system 38 used when photographing the processed surface 60 to be measured using visible light emitted from the visible light source 32 will be described. As shown in FIG. 4, when photographing the processed surface 60 using visible light, the attachment 40 is removed from the main body 30, and the end 37 of the main body 30 to which the attachment 40 can be attached is brought into contact with the processed surface 60. Take pictures in the condition.

The visible light optical system 38 has a first optical axis 38a and a second optical axis 38b orthogonal to the first optical axis 38a. A camera 34 is arranged on the first optical axis 38a, and a visible light source 32 is arranged on the second optical axis 38b. The half mirror 36 is arranged at a position where the first optical axis 38a and the second optical axis 38b intersect. Therefore, the visible light emitted from the visible light source 32 is reflected by the half mirror 36 and irradiated onto the processing surface 60. The optical axis of the light from the visible light source 32 that is reflected by the half mirror 36 and irradiated onto the processing surface 60 is coaxial with the optical axis of the camera 34 (ie, the first optical axis 38a). That is, the visible light optical system 38 is a coaxial epi-illumination system. The visible light optical system 38 also includes an object-side telecentric lens (not shown). Therefore, the principal ray of light irradiated onto the processed surface 60 is parallel to the first optical axis 38a. That is, the visible light optical system 38 is an object-side telecentric optical system.

Further, as shown in FIGS. 1 and 4, the visible light source 32, the camera 34, and the visible light optical system 38 are housed in a casing 39. The casing 39 is formed into a thin tube shape with a diameter of 12 mm, for example. When measuring coverage using visible light (when taking an image), the tip of the casing 39 is brought into contact with the processed surface 60 (the surface to be measured) (the state shown in FIG. 4). Thereby, the visible light from the visible light source 32 is vertically irradiated onto the processing surface 60. Further, by photographing an image by abutting the tip of the casing 39 against the processing surface 60, the range photographed by the camera 34 is limited to a predetermined area. Therefore, the area photographed by the camera 34 is approximately constant. Here, since the casing 39 has a thin tubular shape, the area photographed by the camera 34 is also narrow. As a result, a clear image can be captured by the camera 34, and subsequent analysis can be performed appropriately.

Next, the ultraviolet optical system 48 used when photographing the processed surface 60 to be measured using ultraviolet light emitted from the ultraviolet light source 42 will be described. As shown in FIG. 3, when photographing the processed surface 60 using ultraviolet light, the attachment 40 is attached to the main body 30, and the end 47 of the attachment 40 opposite to the end 46 connected to the main body 30 is The photograph is taken while in contact with the processing surface 60.

The ultraviolet optical system 48 has a third optical axis 48a inside the attachment 40 and a first optical axis 38a inside the main body 30. The third optical axis 48a is coaxial with the first optical axis 38a. Therefore, the optical axes of the ultraviolet optical system 48 (i.e., the third optical axis 48a and the first optical axis 38a) are linear within the imaging section 14 (i.e., inside the attachment 40 and the main body 30). There is.

The ultraviolet light source 42 is arranged at the tip of the attachment 40 (ie, on the end 47 side). Specifically, the substrate 43 is arranged near the end 47 in the attachment 40 so as to be orthogonal to the third optical axis 48a. A through hole 50 is formed in the center of the substrate 43. In this embodiment, the diameter of the through hole 50 is φ5 mm. The ultraviolet light source 42 is installed on the surface of the substrate 43 on the end 47 side. The ultraviolet light source 42 is arranged at a position that does not coincide with the through hole 50 when viewed along the third optical axis 48a. In this embodiment, two ultraviolet light sources 42 are installed on the surface of the substrate 43, but the number of ultraviolet light sources 42 installed on the surface of the substrate 43 on the end 47 side is not particularly limited. In this embodiment, the two ultraviolet light sources 42 are arranged symmetrically with respect to the third optical axis 48a and at the same distance from the third optical axis 48a.

A resin cover 44 is disposed closer to the end portion 47 of the attachment 40 than the ultraviolet light source 42 . The resin cover 44 is made of a material that transmits ultraviolet light emitted from the ultraviolet light source 42 and fluorescence generated from a fluorescent material to be described later, and is made of, for example, PET resin. As described above, the coverage measuring device 10 of this embodiment is used by an operator by carrying it close to the processing surface 60 to be measured. Therefore, the coverage measuring device 10 may be used not only indoors but also outdoors. When the coverage measuring device 10 is used outdoors, there is a risk that water or the like may enter the attachment 40 when the tip of the attachment 40 comes into contact with the processing surface 60. By arranging the resin cover 44 at the tip of the attachment 40, it is possible to suppress water from entering the attachment 40. Thereby, it is possible to suppress water or the like from coming into contact with the ultraviolet light source 42 disposed on the distal end side of the attachment 40.

The ultraviolet light emitted from the ultraviolet light source 42 passes through the resin cover 44 and is irradiated onto the processing surface 60 . The reflected light from the processed surface 60 enters the casing 49 through the through hole 50 provided in the substrate 43. As described above, the camera 34 is arranged on the first optical axis 38a. Therefore, the reflected light from the processed surface 60 passes through the casing 49 along the third optical axis 48a, and passes through the casing 39 along the first optical axis 38a coaxial with the third optical axis 48a. , enters the camera 34. Here, since the reflected light enters the casing 49 through the through hole 50 having a small diameter, the area photographed by the camera 34 also becomes narrow. As a result, a clear image can be captured by the camera 34, and subsequent analysis can be performed appropriately.

Further, by providing the ultraviolet light source 42 on the end 47 side of the substrate 43 disposed at the tip of the attachment 40, the ultraviolet light emitted from the ultraviolet light source 42 can be irradiated toward the inside of the attachment 40. suppressed. Therefore, it is possible to suppress ultraviolet light from entering the camera 34, and noise can be reduced. Note that if the resin cover 44 is placed on the optical path when measuring the coverage of the processed surface 60 using visible light, the visible light will be reflected by the resin cover 44 and noise will occur. However, when measuring the coverage of the processed surface 60 using visible light, the attachment 40 is removed, so the resin cover 44 is not present on the optical path. By arranging the resin cover 44 on the attachment 40 side, it is possible to avoid noise due to reflection on the resin cover 44 when photographing the processed surface 60 using visible light.

Furthermore, a support member 45 is disposed on the attachment 40 closer to the end portion 47 than the resin cover 44 . The support member 45 is annular and covers the side surface and tip of the casing 49 on the end 47 side. Furthermore, a through hole 45a is formed on the end 47 side of the support member 45. As a result, the support member 45 is not disposed at a position that coincides with the ultraviolet light source 42 when the attachment 40 is viewed along the third optical axis 48a, and the resin cover 44 is exposed. Therefore, the support member 45 prevents the ultraviolet light irradiated from the ultraviolet light source 42 to the processing surface 60 from being blocked. Furthermore, by installing the support member 45 so as to cover the tip of the casing 49, when the imaging unit 14 (that is, the attachment 40) is butted against the processing surface 60, only the tip of the support member 45 is placed on the processing surface 60. This can prevent the resin cover 44 from coming into direct contact with the processing surface 60. Thereby, it is possible to suppress the surface of the resin cover 44 from being damaged due to contact with the processed surface 60, and it is possible to suppress the appearance of the scratches on the surface of the resin cover 44 in the photographed image.

Further, the dimension of the attachment 40 in the optical axis direction is such that the optical path length of the visible light optical system 38 and the optical path length of the ultraviolet optical system 48 match. Specifically, the optical path length of the visible light optical system 38 is the optical path length from the visible light source 32 to the half mirror 36, the optical path length from the half mirror 36 to the processed surface 60, and the optical path length from the processed surface 60 to the camera 34. This is the total optical path length. The optical path length of the ultraviolet optical system 48 is the sum of the optical path length from the ultraviolet light source 42 to the processing surface 60 and the optical path length from the processing surface 60 to the camera 34. The dimensions of the attachment 40 in the optical axis direction are designed so that the optical path lengths of the visible light optical system 38 and the ultraviolet optical system 48 match. By matching the optical path length of the visible light optical system 38 and the optical path length of the ultraviolet optical system 48, the focus etc. of the camera 34 can be changed when photographing with the visible light source 32 and when photographing with the ultraviolet light source 42. You can shoot under the same shooting conditions without having to worry about Therefore, the coverage calculated based on visible light and the coverage calculated based on ultraviolet light can be appropriately compared and evaluated, and the coverage can be evaluated with higher accuracy.

Next, a procedure for measuring coverage using ultraviolet light using the coverage measuring device 10 of this embodiment will be described. As shown in FIG. 5, first, before the shot peening process, the operator applies a fluorescent material to the surface to be shot peened (S12). When a fluorescent material is irradiated with ultraviolet light, the fluorescent material is excited by the ultraviolet light and generates fluorescence. When measuring coverage using ultraviolet light, the camera 34 photographs fluorescence generated by the ultraviolet light. Therefore, prior to the shot peening treatment and coverage measurement, a fluorescent material is first applied to the surface to be shot peened. After that, the operator performs a shot peening process on the surface coated with the fluorescent material (S14).

When the shot peening process is completed, coverage is measured using the coverage measuring device 10 (S16). The process of measuring coverage in step S16 will be described in more detail with reference to FIG. When measuring coverage, the operator first pushes the tip of the imaging unit 14 with the attachment 40 attached (that is, the end 47 of the attachment 40) against the processed surface 60 (the shot-peened surface). (state shown in Figure 3). Next, the operator turns on the measurement start switch 22.

When the measurement start switch 22 is turned on, as shown in FIG. 6, the computer 24 activates the ultraviolet light source 42 and camera 34 (S22). As described above, the attachment 40 is attached to the photographing section 14. The computer 24 detects that the attachment 40 is attached to the photographing unit 14 and activates the ultraviolet light source 42 and camera 34. As a result, the processing surface 60 is irradiated with ultraviolet light emitted from the ultraviolet light source 42 . When the processed surface 60 is irradiated with ultraviolet light, the fluorescent material applied to the processed surface 60 is excited and generates fluorescence. The camera 34 photographs this fluorescence as a reflected image from the processed surface 60. Photographic data photographed by the camera 34 is input to the computer 24 and stored in the memory 25.

Next, the computer 24 specifies the hue, saturation, and brightness of the image data captured by the camera 34 (S24). Then, coverage is calculated based on the specified hue, saturation, and brightness (S26). In the area where projection marks are formed by the shot peening process, the irradiated light is scattered due to minute irregularities, and the fluorescence generated from the fluorescent material applied to the processed surface 60 is difficult to reach the camera 34. That is, a portion where fluorescence is not detected from the image data can be identified as a portion where a projection mark is formed. On the other hand, in areas where projection marks are not formed, the irradiated light is less likely to be scattered, so the fluorescence generated from the fluorescent material applied to the processed surface 60 reaches the camera 34. That is, a portion where fluorescence is detected from the photographic data can be identified as a portion where no projection trace is formed. Therefore, the conditions of hue, saturation, and brightness are set so that the fluorescence generated from the fluorescent material applied to the processed surface 60 by irradiation with ultraviolet light can be detected, and the presence or absence of projection marks is determined.

The conditions of hue, saturation, and lightness used to determine the presence or absence of projection marks are set according to the combination of the type of fluorescent material applied before shot peening in step S12, the base material to be measured, etc. For example, depending on the type of fluorescent material, the wavelength range of fluorescence emitted when ultraviolet light is irradiated is specified. Therefore, depending on the type of fluorescent material applied in step S12, the hue is set so that fluorescence of a wavelength generated from the fluorescent material is detected. Specifically, image data is filtered so that only specific wavelengths are detected, and only a set hue is detected from the image data. Then, it is determined whether the brightness of data in which only a specific hue (namely, wavelength) is detected is equal to or greater than a predetermined threshold value. In areas where projection marks are not formed, the camera 34 photographs fluorescence having a wavelength generated from the fluorescent material applied to the processed surface 60. On the other hand, in the portion where the projection trace is formed, fluorescence of a specific wavelength is not photographed by the camera 34. For this reason, for each pixel, if the brightness is above a predetermined threshold, it is classified as a part where no projection marks have been formed, and if the brightness is less than a predetermined threshold, it is classified as a part with projection marks. do.

Furthermore, depending on the base material to be measured, even if projection marks are formed, the brightness may be high in the set hue. In such a case, the presence or absence of projection marks may be determined using hue and saturation. That is, image data is filtered so that only specific wavelengths are detected, and it is determined whether the saturation of data in which only specific hues (i.e., wavelengths) are detected is greater than or equal to a predetermined threshold. It's okay. When setting a brightness threshold, even a slight change in the brightness value may result in a large difference in the determination result. On the other hand, when setting a saturation threshold, the amount of change in the determination result when the saturation value is slightly changed is smaller than when the brightness value is slightly changed. Therefore, the saturation threshold can be set more finely than the brightness threshold.

The conditions of hue, saturation, and brightness may be set in advance depending on the combination of the fluorescent material and the base material to be measured. For example, the operator applies a fluorescent material to a test piece made of the same base material as the measurement target in advance, and performs a shot peening process to obtain a desired projection area ratio. By measuring the hue, saturation, and brightness of a test piece subjected to shot peening treatment, conditions for the hue, saturation, and brightness can be set so that the presence or absence of projection marks can be clearly distinguished. The set conditions of hue, saturation, and brightness are stored in the memory 25. When calculating the coverage in step S26, the hue, saturation, and brightness conditions stored in the memory 25 can be read out and used.

Once the presence or absence of a projection mark is determined for each pixel, the computer 24 calculates coverage. Specifically, the total number of pixels classified as having formed a projection mark (projection mark area) and all pixels in the photographic data (i.e., the pixels classified as having formed a projection mark and the number of pixels in which a projection mark has been formed) are calculated. Coverage is calculated based on the total number of pixels classified as "no" (processed surface area). Note that a known method can be used to calculate the coverage from the area of the projection mark and the area of the machined surface, so a detailed explanation will be omitted. When the coverage is calculated in step S26, the computer 24 displays the calculated coverage on the display 20 (S28).

Furthermore, the coverage can be calculated again using the image data stored in the memory 25 in step S22. At this time, coverage may be calculated using different setting conditions for hue, saturation, and brightness. Specifically, the computer 24 reads the image data stored in the memory 25 in step S18. The computer 24 then filters the image data to detect hues with different settings. This allows fluorescence of different wavelengths to be detected. Then, it is determined whether the brightness and saturation of each of the different hues are equal to or higher than a threshold value, and whether or not each pixel has a projection trace is determined. Then calculate coverage. In this way, coverage can be evaluated more accurately by calculating coverage under a plurality of different conditions using the same image data and comparing and evaluating them.

Furthermore, the coverage measuring device 10 of this embodiment can be used to measure coverage using visible light. When measuring coverage using visible light, the tip of the imaging unit 14 with the attachment 40 removed (i.e., the end 37 of the main body 30) is pushed against the shot peened processed surface 60. The surface 60 is photographed (the state shown in FIG. 4). In this case, since the processed surface 60 is photographed using visible light, it is not necessary to apply the fluorescent material in step S12 described above. Next, the operator turns on the measurement start switch 22. The computer 24 then activates the visible light source 32 and camera 34. Specifically, the computer 24 detects that the attachment 40 is not attached to the photographing unit 14, and activates the visible light source 32 and camera 34. As a result, the light emitted from the visible light source 32 is irradiated onto the processing surface 60, and a reflected image from the processing surface 60 is captured by the camera 34. Image data captured by the camera 34 is input to the computer 24. Next, the computer 24 specifies the brightness of the image data captured by the camera 34, and calculates coverage based on the specified brightness. Note that as a method of calculating coverage based on the brightness of image data photographed using visible light, a conventionally known method can be used, so detailed explanation will be omitted. As described above, in the coverage measuring device 10 of this embodiment, the optical path length of the visible light optical system 38 and the optical path length of the ultraviolet optical system 48 are the same. Therefore, it is possible to compare and evaluate the coverage calculated from image data taken using visible light and the coverage calculated from image data taken using ultraviolet light. In this way, by evaluating coverage calculated under a plurality of different conditions for the same machined surface 60, coverage can be evaluated more accurately.

Points to note regarding the coverage measuring device 10 described in the embodiment will be described. The ultraviolet light source 42 of the embodiment is an example of a "first light source," the visible light source 32 is an example of a "second light source," and the camera 34 is an example of a "photographing device."

Although specific examples of the technology disclosed in this specification have been described above in detail, these are merely illustrative and do not limit the scope of the claims. The techniques described in the claims include various modifications and changes to the specific examples illustrated above. Further, the technical elements described in this specification or the drawings exhibit technical usefulness singly or in various combinations, and are not limited to the combinations described in the claims as filed.

10: Coverage measuring device 12: Control unit main body 14: Photographing unit 20: Display 24: Computer 25: Memory 30: Photographing unit main body 32: Visible light source 34: Camera 36: Half mirror 39: Casing 40: Attachment 42: Ultraviolet light source 44: Resin cover 45: Support member 49: Casing 60: Processed surface

Claims (1)

A device for measuring the coverage of a processed surface coated with a fluorescent material by shot peening,
a first light source that emits ultraviolet light;
an imaging device that detects fluorescence excited by the ultraviolet light emitted from the first light source and photographs a fluorescence image from the processed surface;
an arithmetic device that calculates coverage from at least one of brightness and saturation and hue specified from the fluorescent image photographed by the photographing device;
a second light source that emits visible light;
a main body housing the second light source and the photographing device;
an attachment, wherein one end of the attachment is removably connected to the photographing end of the main body, while the other end of the attachment is brought into contact with the processing surface during photographing ,
The first light source is provided in the attachment,
In a first state in which one end of the attachment is connected to the photographing end of the main body and the other end of the attachment is in contact with the processing surface, the photographing device emits ultraviolet light emitted from the first light source. It is possible to detect fluorescence excited by light and photograph a fluorescence image from the processed surface,
In a second state in which one end of the attachment is not connected to the photographing end of the main body and the photographing end is in contact with the processing surface, the photographing device emits visible light emitted from the second light source. It is possible to photograph a reflected image from the processed surface by
The optical path length from the second light source to the imaging device via the processing surface in the second state is the same as the optical path length from the first light source to the imaging device via the processing surface in the first state. is the same as the optical path length up to
The arithmetic device is a coverage measuring device capable of calculating coverage specified from an image reflected from the processed surface by the visible light photographed by the photographing device in the second state.

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