JP2020180887A - Coverage measurement method, coverage measurement device, and computer program for calculating coverage - Google Patents

Abstract

To enable coverage measurement to be performed even for a machining surface that has such surface properties that coverage measurement is difficult by only binarization processing of an imaged image.SOLUTION: Provided is a coverage measurement method for measuring the coverage of a shot-peened machining surface. The coverage measurement method comprises: a coating step for applying a coating of fluorescent material to the surface to be shot-peened before a shot-peening process; an imaging step for irradiating the machining surface after the shot-peening process with ultraviolet light emitted from a light source, detecting fluorescence excited by the ultraviolet light and imaging a reflection image from the machining surface; a specification step for specifying the brightness and/or saturation and the hue of the reflection image imaged in the imaging step; and a calculation step for calculating a coverage from the brightness and/or saturation and the hue specified in the specification step.SELECTED DRAWING: Figure 3

Description

The present specification relates to a technique for measuring the coverage of a shot peened machined surface. Here, "coverage" is an index for quantitatively evaluating the amount of shot peening. Typically, it is represented by the ratio of the area of the projection mark formed by the collision of the projection material with the machined surface to the area of the machined surface (that is, the area of the projection mark / the area of the machined surface).

Shot peening treatment may be applied to the surface of the metal in order to improve the fatigue strength of the metal such as mechanical parts (for example, gears, springs, etc.) and steel structures (for example, bridges, etc.). In the shot peening process, a projecting material (for example, a steel ball) is projected onto the surface of the metal to apply compressive residual stress to the surface of the metal. The fatigue strength of the metal is improved by applying the compressive residual stress to the surface of the metal. The compressive residual stress applied to the surface of the metal changes depending on the amount of shot peening. Therefore, in order to control the compressive residual stress applied to the surface of the metal, it is necessary to quantitatively evaluate the amount of shot peening. Therefore, coverage has been conventionally used as an index for quantitatively evaluating the amount of shot peening. Patent Document 1 discloses an apparatus for measuring coverage. In the measuring device of Patent Document 1, a shot peened processed surface is photographed by a photographing device, a projection mark area is calculated from the photographed image, and coverage is obtained from the calculated projection mark area and the imaged area photographed by the photographing device. calculate. As a light source of the photographing apparatus, an LED that irradiates visible light is used.

Japanese Unexamined Patent Publication No. 2011-15263

In the prior art, a reflected image of a processed surface is photographed using visible light, and the captured image is binarized to distinguish between a region subjected to shot peening processing and a region not subjected to shot peening processing. However, a scale may be formed on the machined surface, for example. In such a case, it may be difficult to distinguish between the area that has been shot peened and the area that has not been shot peened, depending on the binarization of the captured image. Further, depending on the base material to be measured, it may be difficult to distinguish between a region that has been shot peened by binarizing the captured image and a region that has not been shot peened. The present specification discloses a technique that enables coverage measurement even on a processed surface having a surface texture for which coverage measurement is difficult only by binarization processing of a photographed image.

The coverage measuring method disclosed in the present specification is a method for measuring the coverage of a processed surface that has been shot peened. The coverage measurement method consists of a coating step of applying a fluorescent material to the surface to be shot peened before the shot peening process, and irradiating the processed surface after the shot peening process with ultraviolet light emitted from a light source to excite it by the ultraviolet light. It was specified in a photographing process of detecting fluorescence and photographing a reflected image from a processed surface, a specific step of specifying at least one of the brightness and saturation of the reflected image photographed in the photographing process and a hue, and a specific step. It includes a calculation step of calculating coverage from at least one of lightness and saturation and hue.

In the above-mentioned coverage measurement method, a fluorescent material is applied to the surface to be shot peened, and after the shot peening treatment, the processed surface is irradiated with ultraviolet light to detect fluorescence. Since fluorescence is not detected in the shot peened region, it is easy to identify the shot peened region. In addition, coverage is specified based on at least one of the brightness and saturation of the reflected image and the hue. For example, when the presence or absence of shot peening is determined using only the brightness as an index, when a scale is formed on the machined surface or when the base material is a base material in which fluorescence is easily detected, the shot peening portion and the shot peening It may be difficult to distinguish it from the unprocessed part. By using at least one of lightness and saturation and hue as an index for determining the presence or absence of shot peening processing, the detection of fluorescence can be determined more reliably. Therefore, the coverage can be accurately specified regardless of the presence or absence of the base material and the scale to be measured.

Further, the coverage measuring device disclosed in the present specification measures the coverage of the processed surface obtained by shot peening the surface coated with the fluorescent material. The coverage measuring device is a first light source that emits ultraviolet light, a photographing device that detects fluorescence excited by the ultraviolet light emitted from the first light source, and photographs a reflected image from a processed surface. It is provided with an arithmetic device for calculating coverage from at least one of brightness and saturation specified from a captured reflection image and hue.

In the above-mentioned coverage measuring device, the surface coated with the fluorescent material is shot-peened and the processed surface is irradiated with ultraviolet light, and the coverage is calculated from at least one of the brightness and saturation specified from the reflected image and the hue. .. Therefore, the same action and effect as the above-mentioned coverage measurement method can be obtained.

The present specification also discloses a computer program for calculating the coverage of a machined surface obtained by shot peening the surface coated with the fluorescent material. The computer program has a data acquisition unit and a data acquisition unit that acquire shooting data obtained by capturing a reflection image from the processed surface by detecting fluorescence excited by ultraviolet light applied to the processed surface after shot peening processing. It is used as a calculation unit that calculates at least one of the brightness and saturation of the shooting data acquired in 1 and the hue, and calculates the coverage from at least one of the calculated brightness and saturation and the hue.

The figure which shows typically the whole structure of the coverage measuring apparatus which concerns on Example. The block diagram which shows the control system of the coverage measuring apparatus which concerns on Example. It is sectional drawing which shows the optical system of a photographing part, and shows the state which attachment is attached. It is sectional drawing which shows the optical system of a photographing part, and shows the state which the attachment is not attached. A flowchart showing an example of a procedure for measuring coverage using ultraviolet light. The flowchart which shows an example of the procedure of the coverage measurement process of FIG.

The main features of the examples described below are listed. It should be noted that the technical elements described below are independent technical elements and exhibit technical usefulness alone or in various combinations, and are limited to the combinations described in the claims at the time of filing. It's not a thing.

(Feature 1) The coverage measuring device disclosed in the present specification has a second light source that emits visible light, a main body that houses the second light source and a photographing device, and one end thereof can be attached to and detached from the photographing end of the main body. While being connected, it may further include an attachment whose other end comes into contact with the machined surface during photographing. The first light source may be provided in the attachment. In the first state in which one end of the attachment is connected to the photographing end of the main body and the other end of the attachment abuts on the machined surface, the photographing apparatus emits fluorescence excited by ultraviolet light emitted from the first light source. It may be possible to detect and capture a reflected image from the machined surface. In the second state in which one end of the attachment is not connected to the photographing end of the main body and the photographing end abuts on the processed surface, the photographing apparatus reflects the visible light emitted from the second light source from the processed surface. The image may be photographable. In the second state, the optical path length from the second light source to the imaging device via the machined surface is the same as the optical path length from the first light source to the photographing device through the machined surface in the first state. You may. The arithmetic unit may be able to calculate the coverage specified from the reflected image from the processed surface by the visible light photographed by the imaging device in the second state. According to such a configuration, the coverage can be calculated from the photographed image of the processed surface photographed using visible light. In addition, since the optical path length when photographing the reflected image by visible light and the optical path length when photographing the reflected image by ultraviolet light are the same, it is calculated based on the coverage and ultraviolet light calculated based on visible light. It can be evaluated by appropriately comparing it with the coverage that has been obtained. Therefore, the coverage can be evaluated more accurately.

Hereinafter, the coverage measuring device 10 according to the embodiment will be described. The coverage measuring device 10 is carried and used by the operator up to the vicinity of the machined surface 60 to be measured. As shown in FIGS. 1 and 2, the coverage measuring device 10 includes a control unit main body 12 and a photographing unit 14. The control unit main body 12 and the photographing unit 14 are connected by a cord 13.

The control unit main body 12 includes switches such as a power switch 23 and a measurement start switch 22, a display 20, and a computer 24 that controls each part of the coverage measurement device 10. The power switch 23 is a switch for activating the coverage measuring device 10. When the power switch 23 is operated, power is started to be supplied from the battery (not shown) housed in the control unit main body 12 to each part of the control unit main body 12 and the photographing unit 14. The measurement start switch 22 is a switch for starting the measurement of coverage. Instead of providing the measurement start switch 22, the display 20 may be used as a touch panel, and the coverage measurement may be started by touching a predetermined position on the screen in the display 20.

The display 20 displays an image taken by the photographing unit 14, the measured coverage, and the like. When the coverage is measured a plurality of times by the coverage measuring device 10, the transition of the measured coverage, the average value, and the like are also displayed on the display 20.

The computer 24 includes a CPU, a ROM, and a RAM. The computer 24 is connected to the photographing unit 14, the display 20, various switches 22, 23, and the memory 25 (see FIG. 2). The computer 24 controls the photographing unit 14 to perform a process of photographing the processed surface 60, a process of calculating coverage based on the captured image, a process of displaying the calculated coverage on the display 20, and the like. The processing of the computer 24 will be described in detail later.

The memory 25 stores an image taken by the photographing unit 14. Further, the memory 25 stores the setting conditions of hue, lightness, and saturation used when calculating the coverage in the computer 24. The setting conditions for hue, lightness, and saturation will be described in detail later.

The photographing unit 14 will be described with reference to FIGS. 3 and 4. As shown in FIG. 3, the photographing unit 14 includes a main body 30 and an attachment 40 that can be attached to and detached from the main body 30. The main body 30 includes a visible light light source 32 that irradiates visible light, a camera 34 that captures an image, a half mirror 36, and a casing 39 that houses the visible light light source 32, the camera 34, and the half mirror 36. The camera 34 is on / off controlled by the computer 24. The image data taken by the camera 34 is input to the computer 24 and stored in the memory 25. The attachment 40 includes an ultraviolet light source 42 that irradiates ultraviolet light, a substrate 43 on which the ultraviolet light source 42 is mounted, a resin cover 44, a support member 45 that supports the attachment 40, an ultraviolet light source 42, and a substrate 43. A casing 49 for accommodating the resin cover 44 is provided. The processed surface 60 to be measured is photographed using visible light emitted from the visible light light source 32 or ultraviolet light emitted from the ultraviolet light source 42.

Here, the visible light optical system 38 used when photographing the processed surface 60 to be measured by using the visible light emitted from the visible light light source 32 will be described. As shown in FIG. 4, when the machined surface 60 is photographed using visible light, the attachment 40 is removed from the main body 30 and the end portion 37 to which the attachment 40 of the main body 30 can be attached is brought into contact with the machined surface 60. Take a picture in the state.

The visible light optical system 38 has a first optical axis 38a and a second optical axis 38b orthogonal to the first optical axis 38a. A camera 34 is arranged on the first optical axis 38a, and a visible light light source 32 is arranged on the second optical axis 38b. The half mirror 36 is arranged at a position where the first optical axis 38a and the second optical axis 38b intersect. Therefore, the visible light emitted from the visible light light source 32 is reflected by the half mirror 36 and is applied to the processed surface 60. The optical axis of the light from the visible light light source 32, which is reflected by the half mirror 36 and irradiates the processed surface 60, is coaxial with the optical axis of the camera 34 (that is, the first optical axis 38a). That is, the visible light optical system 38 is a coaxial epi-illumination system. Further, the visible light optical system 38 includes an object-side telecentric lens (not shown). Therefore, the main light beam of the light applied to the processed surface 60 is parallel to the first optical axis 38a. That is, the visible light optical system 38 is an object-side telecentric optical system.

Further, as shown in FIGS. 1 and 4, the visible light light source 32, the camera 34, and the visible light optical system 38 are housed in the casing 39. The casing 39 is formed in a thin tubular shape having a diameter of, for example, φ12 mm. At the time of coverage measurement using visible light (at the time of image capture), the tip of the casing 39 is abutted against the machined surface 60 (the surface to be measured) (state shown in FIG. 4). As a result, the visible light from the visible light light source 32 is vertically irradiated to the processed surface 60. Further, by abutting the tip of the casing 39 against the processed surface 60 and taking an image, the range taken by the camera 34 is limited to a predetermined area. Therefore, the shooting area shot by the camera 34 is substantially constant. Here, since the casing 39 is a thin tubular, the area photographed by the camera 34 is also narrowed. As a result, a clear image can be taken by the camera 34, and subsequent analysis can be performed appropriately.

Next, the ultraviolet optical optical system 48 used when the processed surface 60 to be measured is photographed by using the ultraviolet light emitted from the ultraviolet light source 42 will be described. As shown in FIG. 3, when the processed surface 60 is photographed using ultraviolet light, the attachment 40 is attached to the main body 30, and the end 47 opposite to the end 46 connected to the main body 30 of the attachment 40 is attached. The photograph is taken in a state of being in contact with the machined surface 60.

The ultraviolet optical optical system 48 has a third optical axis 48a in the attachment 40 and a first optical axis 38a in the main body 30. The third optical axis 48a is coaxial with the first optical axis 38a. Therefore, the optical axes of the ultraviolet optical optical system 48 (that is, the third optical axis 48a and the first optical axis 38a) become linear in the photographing unit 14 (that is, inside the attachment 40 and the main body 30). There is.

The ultraviolet light source 42 is arranged at the tip (that is, the end 47 side) of the attachment 40. Specifically, the substrate 43 is arranged in the vicinity of the end portion 47 in the attachment 40 so as to be orthogonal to the third optical axis 48a. A through hole 50 is formed in the center of the substrate 43. In this embodiment, the diameter of the through hole 50 is φ5 mm. The ultraviolet light source 42 is installed on the surface of the substrate 43 on the end portion 47 side. The ultraviolet light source 42 is arranged at a position that does not coincide with the through hole 50 when viewed along the third optical axis 48a. In this embodiment, two ultraviolet light sources 42 are installed on the surface of the substrate 43, but the number of ultraviolet light sources 42 installed on the surface of the substrate 43 on the end 47 side is not particularly limited. In this embodiment, the two ultraviolet light sources 42 are arranged at positions that are symmetrical with respect to the third optical axis 48a and have the same distance from the third optical axis 48a.

A resin cover 44 is arranged on the end 47 side of the attachment 40 from the ultraviolet light source 42. The resin cover 44 is made of a material that transmits ultraviolet light emitted from the ultraviolet light source 42 and fluorescence generated from a fluorescent material described later, and is made of, for example, PET resin. As described above, the coverage measuring device 10 of this embodiment is carried by the operator to the vicinity of the machined surface 60 to be measured. Therefore, the coverage measuring device 10 may be used not only indoors but also outdoors. When the coverage measuring device 10 is used outdoors, there is a risk that water or the like may enter the attachment 40 when the tip of the attachment 40 comes into contact with the machined surface 60. By arranging the resin cover 44 at the tip of the attachment 40, it is possible to prevent water from entering the attachment 40. As a result, it is possible to prevent water or the like from coming into contact with the ultraviolet light source 42 arranged on the tip side of the attachment 40.

The ultraviolet light emitted from the ultraviolet light source 42 passes through the resin cover 44 and irradiates the processed surface 60. The reflected light from the machined surface 60 enters the casing 49 through the through hole 50 provided in the substrate 43. As described above, the camera 34 is arranged on the first optical axis 38a. Therefore, the reflected light from the machined surface 60 passes through the casing 49 along the third optical axis 48a, and passes through the casing 39 along the first optical axis 38a coaxial with the third optical axis 48a. , Incidents on the camera 34. Here, since the reflected light enters the casing 49 through the through hole 50 having a small diameter, the area photographed by the camera 34 is also narrowed. As a result, a clear image can be taken by the camera 34, and subsequent analysis can be performed appropriately.

Further, by providing the ultraviolet light source 42 on the end portion 47 side of the substrate 43 arranged at the tip of the attachment 40, the ultraviolet light emitted from the ultraviolet light source 42 can be emitted toward the inside of the attachment 40. It is suppressed. Therefore, it is possible to suppress the incident of ultraviolet light on the camera 34, and it is possible to reduce noise. If the resin cover 44 is arranged on the optical path when measuring the coverage of the processed surface 60 using visible light, the resin cover 44 reflects the visible light to generate noise. However, when measuring the coverage of the machined surface 60 using visible light, the attachment 40 is removed, so that the resin cover 44 does not exist on the optical path. By arranging the resin cover 44 on the attachment 40 side, it is possible to avoid noise due to reflection by the resin cover 44 when photographing the processed surface 60 with visible light.

Further, the attachment 40 has a support member 45 arranged on the end portion 47 side of the resin cover 44. The support member 45 has an annular shape and covers the side surface and the tip of the casing 49 on the end portion 47 side. Further, a through hole 45a is formed on the end portion 47 side of the support member 45. As a result, the support member 45 is not arranged at a position corresponding to the ultraviolet light source 42 when the attachment 40 is viewed along the third optical axis 48a, and the resin cover 44 is exposed. Therefore, it is avoided that the support member 45 blocks the ultraviolet light emitted from the ultraviolet light source 42 to the processed surface 60. Further, by installing the support member 45 so as to cover the tip of the casing 49, when the photographing portion 14 (that is, the attachment 40) is abutted against the machined surface 60, only the tip of the support member 45 is placed on the machined surface 60. It is possible to prevent the resin cover 44 from coming into direct contact with the machined surface 60. As a result, it is possible to prevent the surface of the resin cover 44 from being scratched by contact with the processed surface 60, and it is possible to prevent the scratches on the surface of the resin cover 44 from being reflected in the photographed image.

Further, the dimension of the attachment 40 in the optical axis direction is such that the optical path length of the visible light optical system 38 and the optical path length of the ultraviolet optical optical system 48 match. Specifically, the optical path length of the visible light optical system 38 includes the optical path length from the visible light light source 32 to the half mirror 36, the optical path length from the half mirror 36 to the machined surface 60, and the machined surface 60 to the camera 34. It is the total of the optical path lengths. The optical path length of the ultraviolet optical optical system 48 is the total of the optical path length from the ultraviolet light source 42 to the processed surface 60 and the optical path length from the processed surface 60 to the camera 34. The dimensions of the attachment 40 in the optical axis direction are designed so that the optical path lengths of the visible light optical system 38 and the optical path lengths of the ultraviolet optical optical system 48 match. By matching the optical path length of the visible light optical system 38 with the optical path length of the ultraviolet optical optical system 48, the focus of the camera 34 and the like can be changed when shooting with the visible light light source 32 and when shooting with the ultraviolet light source 42. You can shoot under the same shooting conditions without any problems. Therefore, the coverage calculated based on visible light and the coverage calculated based on ultraviolet light can be appropriately compared and evaluated, and the coverage can be evaluated more accurately.

Next, a procedure for measuring coverage with ultraviolet light using the coverage measuring device 10 of this embodiment will be described. As shown in FIG. 5, first, the operator applies a fluorescent material to the surface to be shot peened before the shot peening treatment (S12). When the fluorescent material is irradiated with ultraviolet light, the fluorescent material is excited by the ultraviolet light to generate fluorescence. When measuring coverage using ultraviolet light, the camera 34 captures the fluorescence generated by the ultraviolet light. Therefore, prior to the shot peening treatment and the coverage measurement, first, a fluorescent material is applied to the surface to be shot peened. After that, the operator performs a shot peening process on the surface coated with the fluorescent material (S14).

When the shot peening process is completed, the coverage is measured using the coverage measuring device 10 (S16). The process of measuring the coverage in step S16 will be described in more detail with reference to FIG. When measuring coverage, the operator first thrusts the tip of the photographing unit 14 (that is, the end 47 of the attachment 40) with the attachment 40 attached to the machined surface 60 (shot peened surface). Hit (state shown in Fig. 3). The operator then turns on the measurement start switch 22.

When the measurement start switch 22 is turned on, the computer 24 operates the ultraviolet light source 42 and the camera 34 (S22), as shown in FIG. As described above, the attachment 40 is attached to the photographing unit 14. The computer 24 detects that the attachment 40 is attached to the photographing unit 14, and operates the ultraviolet light source 42 and the camera 34. As a result, the processed surface 60 is irradiated with the ultraviolet light emitted from the ultraviolet light source 42. When the processed surface 60 is irradiated with ultraviolet light, the fluorescent material applied to the processed surface 60 is excited to generate fluorescence. The camera 34 captures this fluorescence as a reflected image from the processed surface 60. The shooting data shot by the camera 34 is input to the computer 24 and stored in the memory 25.

Next, the computer 24 identifies the hue, saturation, and lightness of the image data captured by the camera 34 (S24). Then, the coverage is calculated based on the specified hue, saturation and lightness (S26). In the portion where the projection mark is formed by the shot peening process, the irradiated light is scattered due to the fine unevenness, and the fluorescence generated from the fluorescent material applied to the processed surface 60 is difficult to reach the camera 34. That is, the portion where fluorescence is not detected from the image data can be identified as the portion where the projection mark is formed. On the other hand, in the portion where the projection marks are not formed, the irradiated light is unlikely to be scattered, so that the fluorescence generated from the fluorescent material applied to the processed surface 60 reaches the camera 34. That is, the portion where fluorescence is detected from the photographed data can be identified as a portion where no projection mark is formed. Therefore, the conditions of hue, saturation, and brightness that can detect the fluorescence generated from the fluorescent material applied to the processed surface 60 by irradiating with ultraviolet light are set, and the presence or absence of projection marks is determined.

The hue, saturation, and lightness conditions used for determining the presence or absence of projection marks are set according to the combination of the type of fluorescent material applied before the shot peening treatment in step S12 and the base material to be measured. For example, a range of wavelengths of fluorescence emitted when irradiated with ultraviolet light is specified according to the type of fluorescent material. Therefore, the hue is set so that the fluorescence of the wavelength generated from the fluorescent material is detected according to the type of the fluorescent material applied in step S12. Specifically, the image data is filtered so that only a specific wavelength is detected, and only the hue set from the image data is detected. Then, it is determined whether or not the brightness is equal to or higher than a predetermined threshold value for the data in which only a specific hue (that is, wavelength) is detected. In the portion where the projection marks are not formed, the fluorescence of the wavelength generated from the fluorescent material applied to the processed surface 60 is photographed by the camera 34. On the other hand, in the portion where the projection mark is formed, the fluorescence of a specific wavelength is not captured by the camera 34. Therefore, for each pixel, when the brightness is equal to or more than a predetermined threshold value, it is classified as a portion where no projection mark is formed, and when the brightness is less than a predetermined threshold value, it is classified as a portion where a projection mark is formed. To do.

Further, depending on the base material to be measured, the brightness may be high in the set hue even if the projection marks are formed. In such a case, the presence or absence of projection marks may be determined using the hue and saturation. That is, the image data is filtered so that only a specific wavelength is detected, and it is determined whether or not the saturation of the data in which only a specific hue (that is, wavelength) is detected is equal to or higher than a predetermined threshold value. You may. When setting the lightness threshold value, the determination result may differ greatly even if the lightness value is slightly changed. On the other hand, when the saturation threshold is set, the amount of change in the determination result when the saturation value is slightly changed is smaller than when the brightness value is slightly changed. Therefore, the saturation threshold can be set more finely than the lightness threshold.

Hue, saturation and lightness conditions may be set in advance according to the combination of the fluorescent material and the base material to be measured. For example, the operator applies a fluorescent material to a test piece previously formed of a base material similar to the one to be measured, and performs a shot peening process so as to obtain a desired projection area ratio. The hue, saturation and lightness of the shot peened test piece can be measured, and the hue, saturation and lightness conditions can be set so that the presence or absence of projection marks can be clearly distinguished. The set hue, saturation, and lightness conditions are stored in the memory 25. When calculating the coverage in step S26, the hue, saturation, and lightness conditions stored in the memory 25 can be read out and used.

When the presence or absence of projection marks is classified for each pixel, the computer 24 calculates the coverage. Specifically, the total number of pixels classified as having a projection mark (projection mark area) and all the pixels in the shooting data (that is, the pixels classified as having a projection mark and the projection mark are formed). Coverage is calculated based on the total of the pixels classified as not (total area of processed surface area). Since a known method can be used as a method for calculating the coverage from the projected trace area and the processed surface area, detailed description thereof will be omitted. When the coverage is calculated in step S26, the computer 24 displays the calculated coverage on the display 20 (S28).

Further, the coverage can be calculated again by using the image data stored in the memory 25 in step S22. At this time, the coverage may be calculated using different setting conditions for the hue, saturation, and lightness conditions. Specifically, the computer 24 reads out the image data stored in the memory 25 in step S18. The computer 24 then filters the image data to detect hues under different setting conditions. As a result, fluorescence of different wavelengths is detected. Then, it is determined whether or not the lightness and the saturation are equal to or higher than the threshold value in different hues, and the presence or absence of projection marks of each pixel is classified. Then the coverage is calculated. In this way, coverage can be evaluated more accurately by calculating coverage under a plurality of different conditions using the same image data and comparing and evaluating them.

Further, using the coverage measuring device 10 of this embodiment, coverage can be measured using visible light. When measuring coverage using visible light, the tip of the photographing unit 14 (that is, the end 37 of the main body 30) with the attachment 40 removed is projected onto the shot peened processed surface 60 for processing. The surface 60 is photographed (state shown in FIG. 4). In this case, since the processed surface 60 is photographed using visible light, it is not necessary to apply the fluorescent material in step S12 above. The operator then turns on the measurement start switch 22. Then, the computer 24 operates the visible light light source 32 and the camera 34. Specifically, the computer 24 detects that the attachment 40 is not attached to the photographing unit 14, and operates the visible light light source 32 and the camera 34. As a result, the light emitted from the visible light light source 32 is applied to the processed surface 60, and the reflected image from the processed surface 60 is captured by the camera 34. The imaged data captured by the camera 34 is input to the computer 24. Next, the computer 24 specifies the brightness of the image data captured by the camera 34, and calculates the coverage based on the specified brightness. As a method for calculating coverage based on the brightness of image data captured using visible light, a conventionally known method can be used, and therefore detailed description thereof will be omitted. As described above, in the coverage measuring device 10 of this embodiment, the optical path length of the visible light optical system 38 and the optical path length of the ultraviolet optical optical system 48 are the same. Therefore, it is possible to compare and evaluate the coverage calculated from the image data taken using visible light and the coverage calculated from the image data taken using ultraviolet light. In this way, the coverage can be evaluated more accurately by evaluating the coverage calculated under a plurality of different conditions for the same machined surface 60.

The points to be noted regarding the coverage measuring device 10 described in the examples will be described. The ultraviolet light source 42 of the embodiment is an example of a "first light source", the visible light light source 32 is an example of a "second light source", and the camera 34 is an example of a "photographing device".

Although specific examples of the disclosed techniques have been described in detail in the present specification, these are merely examples and do not limit the scope of claims. The techniques described in the claims include various modifications and modifications of the specific examples illustrated above. In addition, the technical elements described in the present specification or the drawings exhibit technical usefulness alone or in various combinations, and are not limited to the combinations described in the claims at the time of filing.

10: Coverage measuring device 12: Control unit main body 14: Imaging unit 20: Display 24: Computer 25: Memory 30: Imaging unit main unit 32: Visible light light source 34: Camera 36: Half mirror 39: Casing 40: Attachment 42: Ultraviolet light source 44: Resin cover 45: Support member 49: Casing 60: Processed surface

Claims (4)

A method of measuring the coverage of a shot peened machined surface.
A coating process in which a fluorescent material is applied to the surface to be shot peened before the shot peening process,
An imaging step of irradiating the processed surface after shot peening treatment with ultraviolet light emitted from a light source, detecting fluorescence excited by the ultraviolet light, and photographing a reflected image from the processed surface.
A specific step of specifying at least one of the brightness and saturation of the reflected image taken in the shooting step and the hue, and a specific step of specifying the hue.
A coverage measuring method comprising a calculation step of calculating coverage from at least one of the brightness and saturation specified in the specific step and the hue. A device that measures the coverage of a machined surface that has been shot peened on a surface coated with a fluorescent material.
A first light source that emits ultraviolet light,
An imaging device that detects fluorescence excited by ultraviolet light emitted from the first light source and photographs a reflected image from the processed surface.
A coverage measuring device including an arithmetic unit that calculates coverage from at least one of brightness and saturation specified from the reflected image taken by the photographing device and hue. A second light source that emits visible light,
A main body accommodating the second light source and the photographing apparatus,
One end thereof is detachably connected to the shooting end of the main body, while the other end is further provided with an attachment that comes into contact with the processed surface during shooting.
The first light source is provided in the attachment.
In the first state in which one end of the attachment is connected to the photographing end of the main body and the other end of the attachment abuts on the processed surface, the photographing apparatus emits ultraviolet rays emitted from the first light source. It is possible to detect fluorescence excited by light and take a reflection image from the processed surface.
In a second state in which one end of the attachment is not connected to the photographing end of the main body and the photographing end abuts on the machined surface, the photographing apparatus emits visible light from the second light source. It is possible to take a reflection image from the processed surface by
In the second state, the optical path length from the second light source to the imaging device via the processed surface is the optical path length from the first light source to the photographing device via the processed surface in the first state. Is the same as the optical path length up to
The coverage measuring device according to claim 2, wherein the arithmetic unit can calculate the coverage specified from the reflected image of the visible light taken by the photographing device in the second state from the processed surface. .. A computer program for calculating the coverage of a machined surface that has been shot peened on a surface coated with a fluorescent material.
Computer,
A data acquisition unit that detects fluorescence excited by ultraviolet light applied to the processed surface after shot peening processing and acquires imaging data obtained by photographing a reflected image from the processed surface.
It calculates at least one of the brightness and saturation of the shooting data acquired by the data acquisition unit and the hue, and functions as a calculation unit for calculating coverage from at least one of the calculated brightness and saturation and the hue. Computer program.

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