JP7422956B1 - 非侵襲成分分析装置 - Google Patents

非侵襲成分分析装置 Download PDF

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Publication number
JP7422956B1
JP7422956B1 JP2023551201A JP2023551201A JP7422956B1 JP 7422956 B1 JP7422956 B1 JP 7422956B1 JP 2023551201 A JP2023551201 A JP 2023551201A JP 2023551201 A JP2023551201 A JP 2023551201A JP 7422956 B1 JP7422956 B1 JP 7422956B1
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Japan
Prior art keywords
optical
detector
probe light
signal representing
optical medium
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JP2023551201A
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English (en)
Japanese (ja)
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JPWO2024247177A1 (https=
JPWO2024247177A5 (https=
Inventor
周作 林
祐樹 津田
敬太 宮川
浩一 秋山
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Mitsubishi Electric Corp
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Mitsubishi Electric Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/171—Systems in which incident light is modified in accordance with the properties of the material investigated with calorimetric detection, e.g. with thermal lens detection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/069—Supply of sources
    • G01N2201/0696—Pulsed

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  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Optics & Photonics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Measurement Of The Respiration, Hearing Ability, Form, And Blood Characteristics Of Living Organisms (AREA)
JP2023551201A 2023-05-31 2023-05-31 非侵襲成分分析装置 Active JP7422956B1 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2023/020321 WO2024247177A1 (ja) 2023-05-31 2023-05-31 非侵襲成分分析装置

Publications (3)

Publication Number Publication Date
JP7422956B1 true JP7422956B1 (ja) 2024-01-26
JPWO2024247177A1 JPWO2024247177A1 (https=) 2024-12-05
JPWO2024247177A5 JPWO2024247177A5 (https=) 2025-05-13

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ID=89620874

Family Applications (1)

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JP2023551201A Active JP7422956B1 (ja) 2023-05-31 2023-05-31 非侵襲成分分析装置

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JP (1) JP7422956B1 (https=)
CN (1) CN121195157A (https=)
DE (1) DE112023006432T5 (https=)
WO (1) WO2024247177A1 (https=)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5268746A (en) * 1989-09-26 1993-12-07 Ente Per Le Nuove Tecnologie, L'energia E L'ambiente (Enea) Devices for measuring the optical absorption in thin layer materials by using the photothermal deflection spectroscopy
JP6956930B1 (ja) * 2021-03-23 2021-11-02 三菱電機株式会社 生体成分測定装置および生体成分測定方法
JP6966028B1 (ja) * 2021-03-03 2021-11-10 三菱電機株式会社 成分測定装置および成分測定方法
JP7205002B1 (ja) * 2022-02-17 2023-01-16 三菱電機株式会社 非侵襲物質分析装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102014108424B3 (de) 2014-06-16 2015-06-11 Johann Wolfgang Goethe-Universität Nicht-invasive Stoffanalyse

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5268746A (en) * 1989-09-26 1993-12-07 Ente Per Le Nuove Tecnologie, L'energia E L'ambiente (Enea) Devices for measuring the optical absorption in thin layer materials by using the photothermal deflection spectroscopy
JP6966028B1 (ja) * 2021-03-03 2021-11-10 三菱電機株式会社 成分測定装置および成分測定方法
JP6956930B1 (ja) * 2021-03-23 2021-11-02 三菱電機株式会社 生体成分測定装置および生体成分測定方法
JP7205002B1 (ja) * 2022-02-17 2023-01-16 三菱電機株式会社 非侵襲物質分析装置

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WO2024247177A1 (ja) 2024-12-05
CN121195157A (zh) 2025-12-23
JPWO2024247177A1 (https=) 2024-12-05
DE112023006432T5 (de) 2026-03-26

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