JP7309858B2 - デュアルセンササブピクセル放射線検出器 - Google Patents

デュアルセンササブピクセル放射線検出器 Download PDF

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Publication number
JP7309858B2
JP7309858B2 JP2021512778A JP2021512778A JP7309858B2 JP 7309858 B2 JP7309858 B2 JP 7309858B2 JP 2021512778 A JP2021512778 A JP 2021512778A JP 2021512778 A JP2021512778 A JP 2021512778A JP 7309858 B2 JP7309858 B2 JP 7309858B2
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pixels
sub
radiation
array
pixel
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Japanese (ja)
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JP2022506008A (ja
JP2022506008A5 (enExample
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ヨハネス ウィルヘルムス マリア ヤコブス
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Koninklijke Philips NV
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Koninklijke Philips NV
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Priority claimed from EP18193337.5A external-priority patent/EP3620826A1/en
Priority claimed from EP19154188.7A external-priority patent/EP3690489A1/en
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
JP2021512778A 2018-09-10 2019-08-29 デュアルセンササブピクセル放射線検出器 Active JP7309858B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
EP18193337.5A EP3620826A1 (en) 2018-09-10 2018-09-10 Multi-piece mono-layer radiation detector
EP18193337.5 2018-09-10
EP19154188.7A EP3690489A1 (en) 2019-01-29 2019-01-29 Dual-sensor subpixel radiation detector
EP19154188.7 2019-01-29
PCT/EP2019/073103 WO2020052987A1 (en) 2018-09-10 2019-08-29 Dual-sensor subpixel radiation detector

Publications (3)

Publication Number Publication Date
JP2022506008A JP2022506008A (ja) 2022-01-17
JP2022506008A5 JP2022506008A5 (enExample) 2022-09-05
JP7309858B2 true JP7309858B2 (ja) 2023-07-18

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JP2021512778A Active JP7309858B2 (ja) 2018-09-10 2019-08-29 デュアルセンササブピクセル放射線検出器

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US (1) US20220050218A1 (enExample)
EP (1) EP3850399A1 (enExample)
JP (1) JP7309858B2 (enExample)
CN (1) CN112673286B (enExample)
WO (1) WO2020052987A1 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3521862A1 (en) * 2018-02-02 2019-08-07 Koninklijke Philips N.V. Multi-spectral x-ray detector
FR3119708B1 (fr) * 2021-02-11 2023-08-25 Trixell Détecteur numérique à étages de conversion superposés
WO2024044925A1 (en) * 2022-08-30 2024-03-07 Shenzhen Xpectvision Technology Co., Ltd. Side incidence image sensors with protruding integrated circuit chips
CN118037666A (zh) * 2024-02-21 2024-05-14 中国科学院高能物理研究所 一种像素型碲锌镉探测器非单极性区亚像素分辨方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011503535A (ja) 2007-11-06 2011-01-27 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 間接放射線検出器
JP2012112928A (ja) 2010-05-31 2012-06-14 Fujifilm Corp 放射線撮影装置
JP2016503506A (ja) 2012-12-03 2016-02-04 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． イメージング検出器
US20170200762A1 (en) 2016-01-13 2017-07-13 mPower Technology, Inc. Fabrication and Operation of Multi-Function Flexible Radiation Detection Systems
JP2018107343A (ja) 2016-12-27 2018-07-05 キヤノン株式会社 放射線撮像装置、その製造方法および撮像システム

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10054678A1 (de) 2000-11-03 2002-05-16 Siemens Ag Verfahren zur Herstellung eines ein- oder mehrdimensionalen Detektorarrays
WO2009107045A2 (en) * 2008-02-25 2009-09-03 Philips Intellectual Property & Standards Gmbh Suppression of direct detection events in x-ray detectors
CN102066976A (zh) * 2008-06-16 2011-05-18 皇家飞利浦电子股份有限公司 辐射探测器和制造辐射探测器的方法
JP5744903B2 (ja) * 2009-12-21 2015-07-08 コーニンクレッカ フィリップス エヌ ヴェ 信号処理回路の電気的試験を行う装置及び方法
IN2014CN01055A (enExample) * 2011-08-30 2015-04-10 Koninkl Philips Nv
US10067239B2 (en) * 2012-05-31 2018-09-04 Minnesota Imaging And Engineering Llc Detector systems for radiation imaging
JP6325650B2 (ja) * 2013-04-24 2018-05-16 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 光検出器画素アレイを有する放射線検出装置、ｐｅｔ撮像システム、光フォトン加算方法、及び光フォトン加算方法のステップを実行するためのコンピュータプログラム
JP6559250B2 (ja) * 2014-12-21 2019-08-14 イオンビーム アプリケーションズ， エス．エー． 放射線センサおよび放射線イメージセンサを構成する方法
EP3326008B1 (en) * 2015-07-21 2018-11-28 Koninklijke Philips N.V. X-ray detector for phase contrast and/or dark-field imaging
US20170212253A1 (en) * 2016-01-22 2017-07-27 General Electric Company Adaptive ct detector having integrated readout electronics

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011503535A (ja) 2007-11-06 2011-01-27 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 間接放射線検出器
JP2012112928A (ja) 2010-05-31 2012-06-14 Fujifilm Corp 放射線撮影装置
JP2016503506A (ja) 2012-12-03 2016-02-04 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． イメージング検出器
US20170200762A1 (en) 2016-01-13 2017-07-13 mPower Technology, Inc. Fabrication and Operation of Multi-Function Flexible Radiation Detection Systems
JP2018107343A (ja) 2016-12-27 2018-07-05 キヤノン株式会社 放射線撮像装置、その製造方法および撮像システム

Also Published As

Publication number Publication date
CN112673286B (zh) 2024-11-01
US20220050218A1 (en) 2022-02-17
JP2022506008A (ja) 2022-01-17
WO2020052987A1 (en) 2020-03-19
EP3850399A1 (en) 2021-07-21
CN112673286A (zh) 2021-04-16

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