JP7258703B2 - 劣化測定からの制約付き凸回帰を使用する、残存耐用年数の適応的推定方法 - Google Patents

劣化測定からの制約付き凸回帰を使用する、残存耐用年数の適応的推定方法 Download PDF

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JP7258703B2
JP7258703B2 JP2019169173A JP2019169173A JP7258703B2 JP 7258703 B2 JP7258703 B2 JP 7258703B2 JP 2019169173 A JP2019169173 A JP 2019169173A JP 2019169173 A JP2019169173 A JP 2019169173A JP 7258703 B2 JP7258703 B2 JP 7258703B2
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useful life
tul
degradation
function
bearing structure
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JP2020076744A5 (OSRAM
JP2020076744A (ja
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ドクウー・ジュン
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パロ アルト リサーチ センター インコーポレイテッド
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/58—Testing of lines, cables or conductors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M5/00—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings
    • G01M5/0033—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings by determining damage, crack or wear
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/024—Quantitative history assessment, e.g. mathematical relationships between available data; Functions therefor; Principal component analysis [PCA]; Partial least square [PLS]; Statistical classifiers, e.g. Bayesian networks, linear regression or correlation analysis; Neural networks
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0283—Predictive maintenance, e.g. involving the monitoring of a system and, based on the monitoring results, taking decisions on the maintenance schedule of the monitored system; Estimating remaining useful life [RUL]

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Aviation & Aerospace Engineering (AREA)
  • Artificial Intelligence (AREA)
  • Evolutionary Computation (AREA)
  • Mathematical Physics (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
  • Complex Calculations (AREA)
  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
JP2019169173A 2018-10-10 2019-09-18 劣化測定からの制約付き凸回帰を使用する、残存耐用年数の適応的推定方法 Active JP7258703B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US16/156,995 US11262272B2 (en) 2018-10-10 2018-10-10 Adaptive remaining useful life estimation method using constraint convex regression from degradation measurement
US16/156,995 2018-10-10

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JP2020076744A JP2020076744A (ja) 2020-05-21
JP2020076744A5 JP2020076744A5 (OSRAM) 2022-09-20
JP7258703B2 true JP7258703B2 (ja) 2023-04-17

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US (1) US11262272B2 (OSRAM)
EP (1) EP3637121B1 (OSRAM)
JP (1) JP7258703B2 (OSRAM)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3923213B1 (en) * 2020-06-08 2025-09-10 Hitachi Energy Ltd Method and computing system for performing a prognostic health analysis for an asset
CN111783242B (zh) * 2020-06-17 2024-05-28 河南科技大学 一种基于rvm-kf的滚动轴承剩余寿命预测方法及装置
CN113588452B (zh) * 2021-07-30 2023-10-27 国网青海省电力公司信息通信公司 电缆寿命预测方法和装置以及处理器和存储介质
EP4286814A1 (de) * 2022-05-31 2023-12-06 Siemens Aktiengesellschaft Betrieb eines schleppkabels
US12578719B2 (en) * 2023-02-03 2026-03-17 Xerox Corporation Prediction of remaining useful life of an asset using conformal mathematical filtering
CN119087225B (zh) * 2024-08-29 2025-10-28 孝感楚能新能源创新科技有限公司 锂离子电池剩余寿命预测方法及装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103048607A (zh) 2012-12-15 2013-04-17 华中科技大学 一种基于给定阀值的数控成品电路板性能退化测评方法
JP6372490B2 (ja) 2013-09-11 2018-08-15 株式会社Ｇｓユアサ 蓄電素子の寿命推定装置、寿命推定方法及び蓄電システム

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Publication number Priority date Publication date Assignee Title
US20030065409A1 (en) * 2001-09-28 2003-04-03 Raeth Peter G. Adaptively detecting an event of interest
JP4820815B2 (ja) * 2004-03-16 2011-11-24 オーチス エレベータ カンパニー エレベータ荷重支持部材の状態を監視する電気信号適用方法
US8121818B2 (en) * 2008-11-10 2012-02-21 Mitek Analytics Llc Method and system for diagnostics of apparatus
US8725456B1 (en) * 2009-05-05 2014-05-13 The United States of America as represented by the Administrator of the National Aeronautics & Space Administration (NASA) Decomposition technique for remaining useful life prediction
US9250625B2 (en) * 2011-07-19 2016-02-02 Ge Intelligent Platforms, Inc. System of sequential kernel regression modeling for forecasting and prognostics
JP2014160457A (ja) * 2013-02-20 2014-09-04 Nec Corp 対話的変数選択装置、対話的変数選択方法および対話的変数選択プログラム
CN107238800B (zh) 2017-06-12 2019-11-12 北京理工大学 基于相关向量机和粒子滤波的电池剩余可用寿命预测方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103048607A (zh) 2012-12-15 2013-04-17 华中科技大学 一种基于给定阀值的数控成品电路板性能退化测评方法
JP6372490B2 (ja) 2013-09-11 2018-08-15 株式会社Ｇｓユアサ 蓄電素子の寿命推定装置、寿命推定方法及び蓄電システム

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EP3637121A3 (en) 2020-05-06
EP3637121A2 (en) 2020-04-15
EP3637121B1 (en) 2023-05-03
US20200116585A1 (en) 2020-04-16
JP2020076744A (ja) 2020-05-21
US11262272B2 (en) 2022-03-01

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