JP7168127B2 - 故障予兆検知装置、故障予兆検知方法、故障予兆検知プログラム、学習装置、学習済みの学習モデルの生成方法、学習済みの学習モデル生成プログラム - Google Patents

故障予兆検知装置、故障予兆検知方法、故障予兆検知プログラム、学習装置、学習済みの学習モデルの生成方法、学習済みの学習モデル生成プログラム Download PDF

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JP7168127B2
JP7168127B2 JP2022528363A JP2022528363A JP7168127B2 JP 7168127 B2 JP7168127 B2 JP 7168127B2 JP 2022528363 A JP2022528363 A JP 2022528363A JP 2022528363 A JP2022528363 A JP 2022528363A JP 7168127 B2 JP7168127 B2 JP 7168127B2
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learning
data
unit
failure
estimation
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JPWO2021245898A5 (https=
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直樹 田口
寛光 穂苅
靖 佐藤
玄太 吉村
利貞 毬山
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Mitsubishi Electric Corp
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/22—Matching criteria, e.g. proximity measures
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/0227—Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions
    • G05B23/0232—Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions based on qualitative trend analysis, e.g. system evolution
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/21—Design or setup of recognition systems or techniques; Extraction of features in feature space; Blind source separation
    • G06F18/211—Selection of the most significant subset of features
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/21—Design or setup of recognition systems or techniques; Extraction of features in feature space; Blind source separation
    • G06F18/217—Validation; Performance evaluation; Active pattern learning techniques
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00—Machine learning
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/20—Pc systems
    • G05B2219/26—Pc applications
    • G05B2219/2614—HVAC, heating, ventillation, climate control
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0283—Predictive maintenance, e.g. involving the monitoring of a system and, based on the monitoring results, taking decisions on the maintenance schedule of the monitored system; Estimating remaining useful life [RUL]

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Data Mining & Analysis (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Artificial Intelligence (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Evolutionary Computation (AREA)
  • General Engineering & Computer Science (AREA)
  • Software Systems (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Evolutionary Biology (AREA)
  • Mathematical Physics (AREA)
  • Computing Systems (AREA)
  • Medical Informatics (AREA)
  • Automation & Control Theory (AREA)
  • Air Conditioning Control Device (AREA)
  • Testing And Monitoring For Control Systems (AREA)
JP2022528363A 2020-06-05 2020-06-05 故障予兆検知装置、故障予兆検知方法、故障予兆検知プログラム、学習装置、学習済みの学習モデルの生成方法、学習済みの学習モデル生成プログラム Active JP7168127B2 (ja)

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PCT/JP2020/022242 WO2021245898A1 (ja) 2020-06-05 2020-06-05 故障予兆検知装置、故障予兆検知方法、故障予兆検知プログラム、学習装置、学習済みの学習モデルの生成方法、学習済みの学習モデル生成プログラム

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JPWO2021245898A5 JPWO2021245898A5 (https=) 2022-08-12
JP7168127B2 true JP7168127B2 (ja) 2022-11-09

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Cited By (1)

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KR102754728B1 (ko) * 2024-02-16 2025-01-22 오토시맨틱스 주식회사 공기조화기의 이상여부를 감지하는 방법 및 장치

Families Citing this family (6)

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CN118696282A (zh) * 2022-02-09 2024-09-24 三菱电机株式会社 设备诊断系统、学习装置、已学习模型和已学习模型的生成方法
WO2024042560A1 (ja) * 2022-08-22 2024-02-29 三菱電機株式会社 パラメータ探索装置およびパラメータ探索方法
JP7284441B1 (ja) 2022-09-12 2023-05-31 ダイキン工業株式会社 異常診断装置、方法、およびプログラム
WO2025074433A1 (en) * 2023-10-07 2025-04-10 Jio Platforms Limited System and method for predicting a failure event in a network
CN117176560B (zh) * 2023-11-03 2024-01-26 山东智云信息科技有限公司 一种基于物联网的监测设备监管系统及其方法
CN121039592A (zh) * 2024-03-28 2025-11-28 松下知识产权经营株式会社 信息处理方法、信息处理装置以及程序

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WO2018230645A1 (ja) 2017-06-14 2018-12-20 株式会社東芝 異常検知装置、異常検知方法、およびプログラム

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JP5431235B2 (ja) * 2009-08-28 2014-03-05 株式会社日立製作所 設備状態監視方法およびその装置
JP6237037B2 (ja) 2013-09-20 2017-11-29 セイコーエプソン株式会社 液体噴射装置
JP2016177676A (ja) 2015-03-20 2016-10-06 株式会社東芝 診断装置、診断方法、診断システムおよび診断プログラム
JP5946573B1 (ja) * 2015-08-05 2016-07-06 株式会社日立パワーソリューションズ 異常予兆診断システム及び異常予兆診断方法
JP6658462B2 (ja) * 2016-11-08 2020-03-04 東芝三菱電機産業システム株式会社 プラント設備劣化診断装置
JP6661559B2 (ja) * 2017-02-03 2020-03-11 株式会社東芝 異常検出装置、異常検出方法およびプログラム
KR102602216B1 (ko) * 2017-12-22 2023-11-15 삼성전자주식회사 고장 예측에 기반한 가전기기의 제어 방법 및 장치
JP6453504B1 (ja) 2018-02-22 2019-01-16 エヌ・ティ・ティ・コミュニケーションズ株式会社 異常監視装置、異常監視方法および異常監視プログラム
JP6760348B2 (ja) * 2018-10-11 2020-09-23 株式会社富士通ゼネラル 空気調和機、データ送信方法及び空気調和システム
US11307570B2 (en) * 2019-05-31 2022-04-19 Panasonic Intellectual Property Management Co., Ltd. Machine learning based predictive maintenance of equipment

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WO2018230645A1 (ja) 2017-06-14 2018-12-20 株式会社東芝 異常検知装置、異常検知方法、およびプログラム

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102754728B1 (ko) * 2024-02-16 2025-01-22 오토시맨틱스 주식회사 공기조화기의 이상여부를 감지하는 방법 및 장치

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EP4123402A1 (en) 2023-01-25
EP4123402B1 (en) 2025-01-01
EP4123402A4 (en) 2023-05-24
WO2021245898A1 (ja) 2021-12-09
US12572624B1 (en) 2026-03-10
JPWO2021245898A1 (https=) 2021-12-09

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