JP7162098B2 - Antiglare film and image display device - Google Patents

Description

The present invention relates to an antiglare film and an image display device.

2. Description of the Related Art An anti-glare film is sometimes installed on the surface of an image display device such as a monitor for a television, a notebook PC, or a desktop PC in order to suppress reflection of background such as lighting and people.

An antiglare film is basically composed of an antiglare layer having an uneven surface on a transparent substrate. As such an antiglare film, for example, Patent Documents 1 to 4 and the like have been proposed.

JP-A-2005-234554 JP-A-2009-86410 JP 2009-265500 A International publication number WO2013/015039

Conventional anti-glare films such as those disclosed in Patent Documents 1 to 4 impart anti-glare properties to the extent that reflected images are blurred, and it is difficult to sufficiently suppress reflection of backgrounds such as lighting and people. Met.
On the other hand, by increasing the degree of roughness of the surface unevenness of the antiglare layer, reflection can be sufficiently suppressed and antiglare properties can be enhanced. However, simply increasing the degree of roughness of the surface irregularities causes a problem that reflected and scattered light becomes stronger, impairing the contrast of the image display device.

An object of the present invention is to provide an antiglare film that is excellent in antiglare properties and capable of suppressing reflected scattered light.

The present invention provides the following antiglare films and display devices [1] to [2].
[1] An antiglare film having an antiglare layer, the antiglare film has an uneven surface, and the smoothed reflected light intensity measured under the following measurement conditions satisfies the following conditions 1 and 2. glare film.
<Measurement conditions>
(1) In the transmission measurement mode of the goniophotometer, the visible light is emitted from the light source of the goniophotometer as parallel rays, and the intensity of the emitted light is measured at an aperture angle of 1 degree without passing through the sample. The standard is adjusted so that the strength is 100,000.
(2) A black plate is attached to the surface of the antiglare film opposite to the uneven surface via a transparent adhesive layer, and the antiglare film, the transparent adhesive layer and the black plate are laminated, A sample α having the uneven surface is prepared.
(3) Place the sample α in a variable angle photometer, irradiate the uneven surface of the sample α with visible light as parallel rays from the light source of the variable angle photometer, and adjust the reflected light intensity to an aperture angle of 1 degree. Measure in The irradiation angle of the parallel light beam is set to a direction inclined by +45 degrees from the normal direction of the sample α. The reflected light intensity is measured at intervals of 1 degree from 0 degrees to -85 degrees, which is the normal direction of the sample α. In addition, in order to maintain the effect of standard adjustment in (1), the reflected light intensity is measured in the transmission measurement mode.
(4) A smoothing process represented by the following formula (i) is performed at each angle from 0 degree to -85 degrees, and the reflected light intensity after the smoothing process is defined as the smoothed reflected light intensity at each angle.
n degree smoothed reflected light intensity = ([n-2 degree reflected light intensity] + [n-1 degree reflected light intensity] + [n degree reflected light intensity] + [n + 1 degree reflected light intensity] + [reflected light intensity at n+2 degrees])/5 (i)
<Condition 1>
When the n-degree smoothed reflected light intensity is defined as Rn and the n-1-degree smoothed reflected light intensity is defined as Rn-1, the maximum absolute value of the difference between Rn and Rn-1 is 2.00 or less. .
<Condition 2>
The smoothed reflected light intensity at -35 degrees is 4.0 or less.
[2] The antiglare film according to [1] is arranged on a display element so that the uneven surface side of the antiglare film faces the opposite side of the display element, and the antiglare film is the outermost surface. An image display device arranged in the

The antiglare film and the image display device of the present invention are excellent in antiglare properties and can suppress reflected scattered light.

BRIEF DESCRIPTION OF THE DRAWINGS It is a schematic sectional drawing which shows one Embodiment of the anti-glare film of this invention. It is a schematic diagram for demonstrating the measuring method of reflected light intensity. It is a schematic diagram for demonstrating the behavior of the light which injected into the anti-glare layer. 1 is a cross-sectional view showing an embodiment of an image display device of the present invention; FIG. 4 is a graph showing the smoothed reflected light intensity for each angle of the antiglare film of Example 1. FIG. FIG. 10 is a diagram showing the smoothed reflected light intensity for each angle of the antiglare film of Example 2; FIG. 10 is a diagram showing the smoothed reflected light intensity for each angle of the antiglare film of Example 3; FIG. 10 is a diagram showing the smoothed reflected light intensity for each angle of the antiglare film of Example 4; FIG. 10 is a graph showing the smoothed reflected light intensity for each angle of the antiglare film of Example 5; FIG. 10 is a diagram showing the smoothed reflected light intensity for each angle of the antiglare film of Comparative Example 1; FIG. 10 is a diagram showing the smoothed reflected light intensity for each angle of the antiglare film of Comparative Example 2; FIG. 10 is a diagram showing the smoothed reflected light intensity for each angle of the antiglare film of Comparative Example 3; FIG. 10 is a diagram showing the smoothed reflected light intensity for each angle of the antiglare film of Comparative Example 4; It is a figure for demonstrating the calculation method of the amplitude spectrum of the altitude of an uneven|corrugated surface. It is a figure for demonstrating the calculation method of the amplitude spectrum of the altitude of an uneven|corrugated surface. 2 is a diagram showing the relationship between spatial frequency and amplitude of the antiglare film of Example 1. FIG. 3 is a diagram showing the relationship between spatial frequency and amplitude of the antiglare film of Comparative Example 1. FIG.

Embodiments of the present invention will be described below.
In this specification, the notation of AA to BB means from AA to BB.

[Anti-glare film]
The antiglare film of the present invention has an antiglare layer and an uneven surface, and the smoothed reflected light intensity measured under the following measurement conditions satisfies the following conditions 1 and 2.

<Measurement conditions>
(1) In the transmission measurement mode of the goniophotometer, the visible light is emitted from the light source of the goniophotometer as parallel rays, and the intensity of the emitted light is measured at an aperture angle of 1 degree without passing through the sample. The standard is adjusted so that the strength is 100,000.
(2) A black plate is attached to the surface of the antiglare film opposite to the uneven surface via a transparent adhesive layer, and the antiglare film, the transparent adhesive layer and the black plate are laminated, A sample α having the uneven surface is prepared.
(3) Place the sample α in a variable angle photometer, irradiate the uneven surface of the sample α with visible light as parallel rays from the light source of the variable angle photometer, and adjust the reflected light intensity to an aperture angle of 1 degree. Measure in The irradiation angle of the parallel light beam is set to a direction inclined by +45 degrees from the normal direction of the sample α. The reflected light intensity is measured at intervals of 1 degree from 0 degrees to -85 degrees, which is the normal direction of the sample α. In addition, in order to maintain the effect of standard adjustment in (1), the reflected light intensity is measured in the transmission measurement mode.
(4) A smoothing process represented by the following formula (i) is performed at each angle from 0 degree to -85 degrees, and the reflected light intensity after the smoothing process is defined as the smoothed reflected light intensity at each angle.
n degree smoothed reflected light intensity = ([n-2 degree reflected light intensity] + [n-1 degree reflected light intensity] + [n degree reflected light intensity] + [n + 1 degree reflected light intensity] + [reflected light intensity at n+2 degrees])/5 (i)

<Condition 1>
When the n-degree smoothed reflected light intensity is defined as Rn and the n-1-degree smoothed reflected light intensity is defined as Rn-1, the maximum absolute value of the difference between Rn and Rn-1 is 2.00 or less. .
<Condition 2>
The smoothed reflected light intensity at -35 degrees is 4.0 or less.

FIG. 1 is a schematic cross-sectional view of the cross-sectional shape of an antiglare film 100 of the present invention.
The antiglare film 100 of FIG. 1 includes an antiglare layer 20 and has an uneven surface. In addition, in FIG. 1, the surface of the antiglare layer 20 is the uneven surface of the antiglare film. Also, the antiglare film 100 of FIG. 1 has an antiglare layer 20 on the transparent substrate 10 . Further, the antiglare layer 20 of FIG. 1 has a binder resin 21 and organic particles 22 .
Note that FIG. 1 is a schematic cross-sectional view. That is, the scale of each layer constituting the antiglare film 100, the scale of each material, and the scale of the surface unevenness are schematic for ease of illustration, and are different from the actual scale. 2 to 4 are the same.

The antiglare film of the present invention is not limited to the lamination structure shown in FIG. For example, the antiglare film may have a single-layer structure of an antiglare layer, or may have a layer other than a transparent substrate and an antiglare layer (for example, an antireflection layer, an antifouling layer, etc.). good. When another layer is provided on the antiglare layer, the surface of the other layer may be the uneven surface of the antiglare film.
A preferred embodiment of the antiglare film has an antiglare layer on a transparent substrate, and the surface of the antiglare layer opposite to the transparent substrate is the uneven surface of the antiglare film.

<Transparent substrate>
The antiglare film preferably has a transparent substrate from the viewpoint of ease of production of the antiglare film and handleability of the antiglare film.

As the transparent base material, it is preferable that the base material has optical transparency, smoothness, heat resistance, and excellent mechanical strength. Examples of such transparent substrates include polyester, triacetyl cellulose (TAC), cellulose diacetate, cellulose acetate butyrate, polyamide, polyimide, polyethersulfone, polysulfone, polypropylene, polymethylpentene, polyvinyl chloride, and polyvinyl acetal. , polyetherketone, polymethyl methacrylate, polycarbonate, polyurethane and amorphous olefin (Cyclo-Olefin-Polymer: COP). The transparent substrate may be a laminate of two or more plastic films.
Among these, stretched, particularly biaxially stretched polyesters (polyethylene terephthalate, polyethylene naphthalate, etc.) are preferred from the viewpoint of mechanical strength and dimensional stability. TAC and acrylic are suitable from the viewpoint of optical transparency and optical isotropy. In addition, COP and polyester are suitable because of their excellent weather resistance.

The thickness of the transparent substrate is preferably 5 to 300 μm, more preferably 20 to 200 μm, even more preferably 30 to 120 μm.
When it is desired to make the antiglare film thinner, the preferred upper limit of the thickness of the transparent substrate is 60 µm, and the more preferred upper limit is 50 µm. When the transparent base material is a low moisture-permeable base material such as polyester, COP, acrylic, etc., the preferred upper limit of the thickness of the transparent base material for thinning is 40 μm, and the more preferred upper limit is 20 μm. Even in the case of a large screen, if the upper limit of the thickness of the transparent base material is within the range described above, it is preferable in that distortion can be prevented from occurring.
The thickness of the transparent substrate can be measured with a Digimatic standard outside micrometer (Mitutoyo Co., Ltd., product number "MDC-25SX") or the like. As for the thickness of the transparent base material, the average value obtained by measuring arbitrary 10 points should be the above numerical value.

The surface of the transparent substrate may be subjected to physical treatment such as corona discharge treatment or chemical treatment, or may be formed with an easy-adhesion layer in order to improve adhesion.

<Uneven surface>
The antiglare film of the present invention has an uneven surface. When there is no other layer on the antiglare layer, the surface of the antiglare layer becomes the uneven surface of the antiglare film. When another layer is provided on the antiglare layer, the surface of the other layer becomes the uneven surface of the antiglare film.

<Condition 1, Condition 2>
The antiglare film of the present invention has an uneven surface, and the smoothed reflected light intensity measured under the following measurement conditions satisfies Conditions 1 and 2.

"Measurement condition"
(1) In the transmission measurement mode of the goniophotometer, the visible light is emitted from the light source of the goniophotometer as parallel rays, and the intensity of the emitted light is measured at an aperture angle of 1 degree without passing through the sample. The standard is adjusted so that the strength is 100,000.
(2) A black plate is attached to the surface of the antiglare film opposite to the uneven surface via a transparent adhesive layer, and the antiglare film, the transparent adhesive layer and the black plate are laminated, A sample α having the uneven surface is prepared.
(3) Place the sample α in a variable angle photometer, irradiate the uneven surface of the sample α with visible light as parallel rays from the light source of the variable angle photometer, and adjust the reflected light intensity to an aperture angle of 1 degree. Measure in The irradiation angle of the parallel light beam is set to a direction inclined by +45 degrees from the normal direction of the sample α. The reflected light intensity is measured at intervals of 1 degree from 0 degrees to -85 degrees, which is the normal direction of the sample α. In addition, in order to maintain the effect of standard adjustment in (1), the reflected light intensity is measured in the transmission measurement mode.
(4) A smoothing process represented by the following formula (i) is performed at each angle from 0 degree to −85 degrees, and the reflected light intensity after the smoothing process is defined as the smoothed reflected light intensity at each angle.
n degree smoothed reflected light intensity = ([n-2 degree reflected light intensity] + [n-1 degree reflected light intensity] + [n degree reflected light intensity] + [n + 1 degree reflected light intensity] + [reflected light intensity at n+2 degrees])/5 (i)

Step (1) of measurement conditions is a step of standard adjustment. By performing step (1), even if the brightness of the light source of the goniophotometer is different, the absolute value of the reflected light intensity in step (3) and smoothing in step (4), which will be described later. The reflection properties of the antiglare film can be evaluated based on the absolute value of the reflected light intensity. When measuring the reflected light intensity in step (3), which will be described later, for a plurality of samples, the standardization in step (1) shall be performed for each sample.
In step (1), the direction of the parallel light beams and the normal direction of the light receiver are aligned to perform standard alignment.

As a goniophotometer, for example, the trade name "GC5000L" manufactured by Nippon Denshoku Industries Co., Ltd. can be used. In the examples described later, a GC5000L (trade name) manufactured by Nippon Denshoku Industries Co., Ltd. (luminous flux diameter: about 3 mm, inclination angle within the luminous flux: within 0.8 degrees, aperture angle of the light receiver: 1 degree) was used as the goniophotometer. are using.

The step (2) of measurement conditions is a step of preparing a sample α, which is a sample for measurement. In the measurement of the reflected light intensity in the step (3) described later, the sample α was the surface opposite to the uneven surface of the antiglare film and the uneven surface of the antiglare film to eliminate reflection at the interface with air. has a black plate attached to the opposite side.
The difference in refractive index between the member (e.g., transparent substrate) on the side of the antiglare film in contact with the transparent adhesive layer and the transparent adhesive layer is preferably within 0.15, more preferably within 0.10. It is preferably within 0.05, more preferably within 0.02, even more preferably within 0.01. The black plate preferably has a total light transmittance of 1% or less, more preferably 0%, according to JIS K7361-1:1997. Further, the difference in refractive index between the resin constituting the black plate and the transparent adhesive layer is preferably within 0.15, more preferably within 0.10, and is preferably within 0.05. is more preferably within 0.02, and even more preferably within 0.01.

The step (3) of the measurement conditions is a step of irradiating the uneven surface of the sample α with visible rays as parallel rays and measuring the reflected light intensity. The measurement of the reflected light intensity in step (3) shall be carried out in transmission measurement mode in order to maintain the effect of standardization in step (1).
In step (3), the incident angle of the visible light is set to a direction inclined +45 degrees from the normal direction of the sample α. In FIG. 2, the dashed line indicates the normal direction (0 degrees) of the sample α, and the solid-line arrows indicate parallel rays emitted from the light source.
In step (3), the reflected light intensity is measured from 0 degrees to −85 degrees, which is the normal direction of the sample α, at intervals of 1 degree. In FIG. 2, the direction of the dashed line indicates 0 degrees, and the direction of the dashed line indicates -85 degrees.

When measuring the reflected light intensity in step (3), the aperture angle of the photodetector detected by the aperture of the photodetector is 1 degree. For example, a measurement of 0 degrees measures a range of -0.5 degrees to +0.5 degrees, a measurement of -35 degrees measures a range of -34.5 degrees to -35.5 degrees, and a range of -85 degrees In the measurement, the range of -85.5 to -84.5 degrees will be measured.

The step (4) of the measurement conditions is a step of performing a smoothing process represented by the following formula (i) and using the reflected light intensity after the smoothing process as the smoothed reflected light intensity at each angle.
n degree smoothed reflected light intensity = ([n-2 degree reflected light intensity] + [n-1 degree reflected light intensity] + [n degree reflected light intensity] + [n + 1 degree reflected light intensity] + [reflected light intensity at n+2 degrees])/5 (i)

Formula (i) takes into consideration that the "central visual field", which is the region of the human visual field that is clearly visible, is "about 5 degrees", since the measured value of the reflected light intensity may repeat increases and decreases in a short period. , 5 points of data are smoothed.

Since the measurement range is from 0 degrees to -85 degrees, in formula (i), 3 points are averaged at 0 degrees and -85 degrees, 4 points are averaged at -1 degree and -84 degrees, and 5 points are averaged. should not. However, 0 degrees, -1 degrees, -84 degrees, and -85 degrees are far from -45 degrees, which is the specular reflection direction of the incident light, and the absolute value of the reflected light intensity is small. It can be said that it does not give

《Condition 1, Condition 2》
The antiglare film of the present invention requires that the smoothed reflected light intensity measured under the above measurement conditions satisfies the conditions 1 and 2.

-Condition 1-
When the n-degree smoothed reflected light intensity is defined as Rn and the n-1-degree smoothed reflected light intensity is defined as Rn-1, the maximum absolute value of the difference between Rn and Rn-1 is 2.00 or less. .

Satisfying condition 1 means that the change in smoothed reflected light intensity for each angle is small. That is, the light incident on and reflected by the uneven surface of the antiglare film that satisfies condition 1 is diffusely reflected at various angles without being concentrated in the vicinity of the specular reflection direction. Therefore, by satisfying the condition 1, the antiglare property can be improved.
On the other hand, if the condition 1 is not satisfied, the reflection of the light source or the like is visible, and the anti-glare property cannot be improved.

In Condition 1, the maximum absolute value of the difference is preferably 1.00 or less, more preferably 0.50 or less, more preferably 0.20 or less, and 0.10 or less. It is more preferable to be 0.05 or less.
Note that if the absolute value of the difference in condition 1 becomes too small, the resolution of the video tends to decrease. Therefore, the maximum absolute value of the difference is preferably 0.01 or more, more preferably 0.02 or more.

In the configuration requirements shown in this specification, when multiple upper limit options and lower limit options are indicated, one selected from the upper limit options and one selected from the lower limit options are combined , can be embodiments of numerical ranges. For example, in the case of the maximum absolute value of the difference in Condition 1, 2.00 or less, 0.01 or more and 2.00 or less, 0.01 or more and 1.00 or less, 0.01 or more and 0.50 or less, 0.01 0.20 or less, 0.01 or more and 0.10 or less, 0.01 or more and 0.05 or less, 0.02 or more and 2.00 or less, 0.02 or more and 1.00 or less, 0.02 or more and 0.50 or less , 0.02 to 0.20, 0.02 to 0.10, and 0.02 to 0.05.

In this specification, values of smoothed reflected light intensity according to conditions 1 to 3, surface shape values such as Sa and Smp, numerical values related to altitude amplitude spectra such as AM1 and AM2, and optical properties ( Haze, total light transmittance, etc.) means the average value of 16 measured values.
In this specification, the 16 measurement points are the intersections of lines that divide the area inside the margin into 5 equal parts in the vertical and horizontal directions, with a margin of 1 cm from the outer edge of the measurement sample. 16 points are preferably used as the center of the measurement. For example, when the sample to be measured is a rectangle, a region 1 cm from the outer edge of the rectangle is used as a margin, and the region inside the margin is divided vertically and horizontally into five equal halves. , and the average value thereof to calculate the parameter. If the sample to be measured has a shape other than a quadrangle such as a circle, an ellipse, a triangle, or a pentagon, it is preferable to draw a quadrangle inscribed in the shape and measure 16 points on the quadrangle by the above method.

Further, in the present specification, smoothed reflected light intensity according to conditions 1 to 3, surface shapes such as Sa and Smp, altitude amplitude spectra such as AM1 and AM2, and optical physical properties (haze, total ray Transmittance, etc.) are measured at a temperature of 23±5° C. and a humidity of 40 to 65% unless otherwise specified. In addition, before starting each measurement, the target sample is exposed to the atmosphere for 30 minutes or longer before the measurement.

-Condition 2-
The smoothed reflected light intensity at -35 degrees is 4.0 or less.

Satisfying condition 2 means that the smoothed reflected light intensity at −35 degrees, which is a direction 10 degrees away from −45 degrees, which is the regular reflection direction, is small. Normally, when people look at an object, they see it from an angle where there is no specular reflection. Therefore, the intensity (≈whiteness) of the reflected scattered light can be matched with human appearance by evaluating it at an angle other than -45 degrees, which is the specular reflection direction.
Therefore, by satisfying the condition 2, reflected scattered light can be suppressed and the contrast of the image display device can be improved.
Note that the intensity of the smoothed reflected light at -35 degrees and the intensity of the smoothed reflected light at -55 degrees are usually about the same. Therefore, it is preferable that the smoothed reflected light intensity at −55 degrees is also 4.0 or less.

Further, satisfying condition 2 and satisfying condition 1 means that even if a small amount of reflected scattered light is generated, the angular distribution of the reflected scattered light is uniform without bias. Therefore, by satisfying the conditions 1 and 2, the observer can hardly perceive the reflected scattered light, the anti-glare film can be given a feeling of jet black, and the image display device can have a high-class feeling. can be given.

In Condition 2, the smoothed reflected light intensity at -35 degrees is preferably 2.0 or less, more preferably 1.5 or less, more preferably 1.0 or less, and 0.5 or less. is more preferably 0.3 or less. It is preferable that the smoothed reflected light intensity at -55 degrees is also the above value.
If the intensity of the smoothed reflected light at −35 degrees in Condition 2 becomes too small, the resolution of the image tends to decrease. Therefore, the smoothed reflected light intensity at −35 degrees is preferably 0.1 or more. It is preferable that the smoothed reflected light intensity at -55 degrees is also the above value.

《Condition 3》
In the antiglare film of the present invention, the smoothed reflected light intensity measured under the above measurement conditions preferably satisfies Condition 3 below.

-Condition 3-
The smoothed reflected light intensity at -45 degrees is 8.0 or less.

Satisfying condition 3 means that the intensity of the smoothed reflected light at -45 degrees, which is the regular reflection direction, is small. Therefore, by satisfying the condition 3, reflected scattered light can be suppressed in all directions, and the antiglare property of the antiglare film, the contrast of the image display device, and the jet-black feeling of the antiglare film can be improved.

In condition 3, the smoothed reflected light intensity at -45 degrees is more preferably 4.0 or less, even more preferably 2.0 or less, and even more preferably 1.5 or less.
If the intensity of the smoothed reflected light at −45 degrees in condition 3 becomes too small, the resolution of the image tends to decrease. Therefore, it is preferable that the smoothed reflected light intensity at -45 degrees is 0.1 or more.

In order to easily satisfy Conditions 1 to 3, it is preferable that the uneven surface of the antiglare film has a structure in which high mountains are present at narrow intervals. In the case of this configuration, it is considered that conditions 1 to 3 are likely to be satisfied mainly for the following reasons (y1) to (y5).

(y1) Since the adjacent mountains are close to each other, most of the reflected light reflected on the surface of any mountain is incident on the adjacent mountain. Then, the light repeats total reflection inside the adjacent mountain, and finally travels to the opposite side of the observer 200 (solid line image in FIG. 3).
(y2) Reflected light incident on a steep slope of an arbitrary mountain travels in the direction opposite to the observer 200 regardless of the adjacent mountain (image of broken line in FIG. 3).
(y3) Since the adjacent mountains are close to each other, there are few substantially flat regions that generate specularly reflected light.
(y4) Reflected light reflected by a substantially flat region, which exists in a small proportion, tends to collide with an adjacent mountain. For this reason, the angular distribution of the reflected light reflected by the substantially flat area is not biased to a predetermined angle, and becomes a substantially uniform angular distribution.
(y5) Reflected light incident on a gentle slope of an arbitrary mountain travels toward the observer 200 (an image of the dashed-dotted line in FIG. 3). Since the angle distribution of the gentle slopes of the mountain is uniform, the angle distribution of the reflected light is also uniform without being biased toward a specific angle.

First, from the above (y1) to (y3), it is considered that the reflected scattered light can be suppressed, and the antiglare property can be improved at a predetermined level.
Furthermore, from the above (y4) and (y5), even if a small amount of reflected scattered light is generated, the angular distribution of the reflected scattered light can be made uniform, and conditions 1 to 3 can be easily satisfied. Even if the amount of reflected and scattered light is very small, if the angular distribution of the reflected and scattered light is biased toward a specific angle, it will be recognized as reflected light. Therefore, the antiglare property can be made extremely good from the above (y4) and (y5).
In addition, from the above (y1) to (y5), the reflected scattered light can be hardly felt by the observer, so that the antiglare film can be given a jet-black feeling, and the image display device can be given a high-class feeling. can do.

《Sa, Smp》
The uneven surface of the antiglare film preferably has a three-dimensional arithmetic mean roughness Sa of 0.30 μm or more. In addition, the uneven surface of the antiglare film preferably has a three-dimensional average peak interval Smp of 10.00 μm or less. By setting Sa and Smp within the above ranges, it becomes easier to obtain an uneven surface in which high mountains are present at narrow intervals, and conditions 1 to 3 can be easily satisfied.

Sa is preferably 0.40 μm or more, more preferably 0.50 μm or more, and even more preferably 0.55 μm or more.
Also, Sa is preferably 1.00 μm or less, more preferably 0.80 μm or less, and even more preferably 0.70 μm or less.

Smp is preferably 8.00 μm or less, more preferably 6.00 μm or less, even more preferably 4.50 μm or less, and even more preferably 3.50 μm or less.
Also, Smp is preferably 1.00 μm or more, more preferably 1.50 μm or more, and even more preferably 2.00 μm or more.

Sa/Smp of the uneven surface of the antiglare film is preferably 0.05 or more, more preferably 0.10 or more, and even more preferably 0.13 or more. By setting Sa/Smp to 0.05 or more, it is possible to further increase the tendency of high mountains to exist at narrow intervals on the uneven surface of the antiglare layer, and it is possible to easily satisfy Conditions 1 to 3. .
Also, Sa/Smp is preferably 0.50 or less, more preferably 0.40 or less, and even more preferably 0.25 or less.

《Sz/Sa》
In the antiglare film of the present invention, the ratio of the three-dimensional ten-point average roughness Sz of the uneven surface to Sa (Sz/Sa) is preferably 5.0 or more, more preferably 5.5 or more. Preferably, it is more preferably 6.0 or more. When Sz/Sa is 5.0 or more, a certain degree of randomness is imparted to the uneven surface, and defects such as scratches on the uneven surface can be made inconspicuous.
If Sz/Sa is too large, glare (a phenomenon in which minute variations in luminance appear in the image light) may occur due to the presence of specific spots on the uneven surface, or the feeling of jet blackness may be locally reduced. there's a possibility that. Therefore, Sz/Sa is preferably 10.0 or less, more preferably 8.0 or less, and even more preferably 7.5 or less.

《Ssk》
In the antiglare film of the present invention, the three-dimensional skewness Ssk of the uneven surface is preferably 0.60 or less, more preferably 0.20 or less, and even more preferably 0 or less. A small Ssk means that the uneven surface has a small proportion of low-altitude locations. Therefore, by setting Ssk to 0.60 or less, the above effects (y3) and (y4) are more likely to occur, and the above-mentioned effects (anti-glare property, suppression of reflected and scattered light, jet-black feeling) are more exhibited. can be made easier.
If Ssk is too small, the effect of (y5) above tends to increase reflected scattered light. Also, if Ssk is too small, the bottoms of adjacent mountains may overlap and slopes with large angles may disappear, reducing the effect of (y2) above. Therefore, Ssk is preferably −1.00 or more, more preferably −0.80 or more, and even more preferably −0.70 or more.

Ssk is an index that indicates the degree of bias in the positive and negative directions of the distribution of altitudes with respect to the average value of the altitudes of the entire measurement surface. Ssk indicates 0 when the altitude distribution is a normal distribution. When the altitude distribution is biased in the negative direction, Ssk shows a positive value, and the greater the degree of bias in the negative direction, the larger the value of Ssk in the positive direction. On the other hand, when the altitude distribution is biased toward the positive direction, Ssk exhibits a negative value, and the greater the degree of bias toward the positive direction, the greater the value of Ssk in the negative direction.

《Inclination》
The uneven surface of the antiglare film preferably has a predetermined distribution of tilt angles.
Specifically, with respect to the tilt angle of the uneven surface of the antiglare film, the tilt angle is 0 degrees to less than 1 degree, the tilt angle is θ2 from 1 degree to less than 3 degrees, and the tilt angle is from 3 degrees to less than 10 degrees. An inclination angle of θ3 and 10 degrees or more and less than 90 degrees is defined as θ4. When the sum of θ1, θ2, θ3 and θ4 is taken as 100%, the proportions of θ1, θ2, θ3 and θ4 are preferably within the following ranges. By setting θ1, θ2, θ3, and θ4 within the following ranges, Conditions 1 to 3 can be easily satisfied.
θ1≦3.0%
0.5%≤θ2≤15.0%
7.0%≤θ3≤40.0%
50.0%≤θ4≤90.0%

The ratio of θ1 is more preferably 2.0% or less, even more preferably 1.5% or less, and even more preferably 1.2% or less. Although the lower limit of the ratio of θ1 is not particularly limited, it is usually 0.1% or more.
The ratio of θ2 is more preferably 12.0% or less, even more preferably 10.0% or less, and even more preferably 8.0% or less. The lower limit of the ratio of θ2 is more preferably 1.0% or more, more preferably 1.5% or more, and even more preferably 2.0% or more.
The ratio of θ3 is more preferably 8.5% or more, still more preferably 10.0% or more, and even more preferably 12.0% or more. The ratio of θ3 is more preferably 35.0% or less, even more preferably 32.0% or less, and even more preferably 30.0% or less.
The ratio of θ4 is more preferably 55.0% or more, still more preferably 57.5% or more, and even more preferably 60.0% or more. The ratio of θ4 is more preferably 88.0% or less, even more preferably 86.5% or less, and even more preferably 85.0% or less.

In this specification, the three-dimensional arithmetic mean roughness Sa is obtained by expanding the two-dimensional roughness parameter Ra described in JIS B0601: 1994 to three dimensions, and the orthogonal coordinate axes X and Y axes are set on the reference plane. , where Z(x, y) is the roughness curved surface, and Lx and Ly are the sizes of the reference surface. In addition, it is A=Lx*Ly in Formula (i).

In this specification, the three-dimensional average peak spacing Smp is obtained as follows. Let Ps be the number of peaks when the portion surrounded by one region from the three-dimensional roughness curved surface and surrounded by one region is one peak, and A be the area of the entire measurement region (reference plane), then Smp is calculated by the following formula (ii).

In this specification, the three-dimensional ten-point average roughness Sz is a three-dimensional expansion of the ten-point average roughness Rz, which is a two-dimensional roughness parameter described in JIS B0601:1994.
A large number of straight lines passing through the center of the reference plane are placed on the reference plane in a 360-degree radial pattern so as to cover the entire area. The point average roughness (the sum of the average of the top five peak heights from the highest peak and the average of the top five valley depths from the deepest valley to the deepest) is obtained. Sz is calculated by averaging the top 50% of a large number of ten-point average roughness values thus obtained.

In this specification, the three-dimensional skewness Ssk is obtained by extending the skewness Rsk of the roughness curve of the two-dimensional roughness parameter described in JIS B0601:1994 to three dimensions, and the orthogonal coordinate axes X, Y It is calculated by the following formula (iii), where an axis is set, the measured surface shape curve is z=f(x, y), and the sizes of the reference plane are Lx and Ly. In formula (iii), "Sq" is the root mean square deviation of the surface height distribution defined by formula (iv) below.

In this specification, the inclination angle distribution of the uneven surface can be calculated from the three-dimensional roughness curved surface. The data of the three-dimensional roughness curved surface are represented by points arranged in a grid pattern with an interval d on a reference plane (where the horizontal direction is the x-axis and the vertical direction is the y-axis) and the heights at the positions of the points. Let Z _i,j be the height at the position of the i-th point in the x-axis direction and the j-th point in the y-axis direction (hereinafter referred to as (i, j)), then at an arbitrary position (i, j), x The inclination Sx in the x-axis direction with respect to the axis and the inclination Sy in the y-axis direction with respect to the y-axis are calculated as follows.
Sx=(Zi _+1,j -Zi _-1,j )/2d
Sy=(Zi _,j+1 -Zi _,j-1 )/2d
Furthermore, the inclination St with respect to the reference plane at (i, j) is calculated by the following formula (v).

The tilt angle at (i, j) is calculated as tan ⁻¹ (St). By performing the above calculation for each point, the tilt angle distribution of the three-dimensional roughness curved surface can be calculated.

The above Sa, Smp and tilt angle distribution are preferably measured using an interference microscope. Such interference microscopes include the "New View" series from Zygo. Moreover, by using the measurement/analysis application software "MetroPro" attached to the above-mentioned interference microscope "New View" series, Sa, Smp and tilt angle distribution can be easily calculated.

《Elevation Amplitude Spectrum》
In the antiglare film of the present invention, it is preferable that the amplitude spectrum of the altitude of the uneven surface satisfies a predetermined condition.
Regarding the amplitude spectrum of the elevation of the uneven surface, AM1 is the sum of the amplitudes corresponding to spatial frequencies of 0.005 μm ⁻¹ , 0.010 μm ⁻¹ , and 0.015 μm ⁻¹ , and AM2 is the amplitude at the spatial frequency of 0.300 μm ⁻¹ . defined as
On the above premise, AM1 is preferably 0.070 to 0.400 μm. Moreover, it is preferable that AM2 is 0.0050 μm or more. Moreover, it is preferable that AM2<AM1.
Further, on the above premise, it is more preferable that AM1 is 0.070 to 0.400 μm, AM2 is 0.0050 μm or more, and AM2<AM1.

As noted above, AM1 is the sum of the amplitudes of the three spatial frequencies and is expressed by the following equation.
AM1 = Amplitude at spatial frequency 0.005 μm ⁻¹ + Amplitude at spatial frequency 0.010 μm ⁻¹ + Amplitude at spatial frequency 0.015 μm ⁻¹ Note that the spatial frequency is a discrete value that depends on the length of one side. , 0.005 μm ⁻¹ , 0.010 μm ⁻¹ , 0.015 μm ⁻¹ , and 0.300 μm ⁻¹ may not be obtained. If there is no spatial frequency that matches the value, the amplitude of the spatial frequency closest to the value should be extracted.

In this specification, the "elevation of the uneven surface" refers to an arbitrary point P on the uneven surface and a virtual plane M (elevation is 0 μm as a reference) having the average height of the uneven surface. , means the linear distance in the direction of the normal line V of the antiglare film (the normal line direction on the imaginary plane M) (see FIG. 14). If the altitude of any point P is higher than the average height, the altitude is positive, and if the altitude of any point P is lower than the average height, the altitude is negative.
In addition, in this specification, words including "elevation" mean elevation based on the above-mentioned average height unless otherwise specified.

The spatial frequency and amplitude can be obtained by Fourier transforming the three-dimensional coordinate data of the uneven surface. The details of the method of calculating the spatial frequency and amplitude from the three-dimensional coordinate data of the uneven surface will be described later.

《AM1, AM2》
Regarding the amplitude spectrum of the elevation of the uneven surface, it can be said that the spatial frequency roughly correlates with "the reciprocal of the interval between the convexes" and the amplitude roughly correlates with "the amount of change in the elevation of the convexes with a predetermined interval". Note that the spatial frequency of 0.005 μm ⁻¹ indicates that the interval is about 200 μm, the spatial frequency of 0.010 μm ⁻¹ indicates that the interval is about 100 μm, and the spatial frequency of 0.015 μm ⁻¹ indicates that the interval is about 67 μm, and the spatial frequency of 0.300 μm ⁻¹ indicates that the spacing is about 3 μm. In addition, it can be said that "amount of change in elevation of convex portions with a predetermined interval" is roughly proportional to the absolute value of the height of each convex portion with a predetermined interval.
Therefore, the uneven surface having AM1 of 0.070 to 0.400 μm, AM2 of 0.0050 μm or more, and AM2<AM1 indirectly includes the following convex group of i and ii It can be said that it is stipulated.
<Convex group of i>
A plurality of protrusions i are arranged at intervals of about 67 to 200 μm, and the absolute value of the height of the protrusions i is within a predetermined range.
<Convex group of ii>
A plurality of protrusions ii are arranged at intervals of about 3 μm, and the absolute value of the height of the protrusions ii is equal to or greater than a predetermined value and less than the absolute value of the height of the protrusion i.

It is believed that the uneven surface provided with the i and ii groups of protrusions first produces the effects (y1) to (y5) described above due to the i groups of protrusions. Furthermore, the uneven surface provided with the groups of protrusions i and ii above can form protrusions by the groups of protrusions ii above in a substantially flat region between adjacent mountains, so that in a substantially flat region It is possible to reduce the proportion of specularly reflected light in the reflected light. For this reason, it is considered that the uneven surface having the groups of protrusions i and ii above tends to improve anti-glare properties, suppression of reflected and scattered light, and a feeling of jet-blackness.

AM1 is preferably 0.090 to 0.390 μm, more preferably 0.130 to 0.380 μm, and more preferably 0.150 to 0.370 μm, in order to facilitate the above-described effects. is more preferred.
If AM 1 is too small, the antiglare property tends to be particularly insufficient.
On the other hand, if AM1 becomes too large, the resolution of the video tends to decrease. Further, when AM1 becomes too large, the percentage of light totally reflected by the uneven surface in the light (mainly image light) incident from the side opposite to the uneven surface tends to increase, and the transmittance tends to decrease. On the other hand, if AM1 is too large, the number of convex portions with a large absolute value of height increases, the proportion of light reflected toward the observer side increases, and the reflected scattered light may become conspicuous. Therefore, not making AM1 too large is also preferable from the viewpoint of suppressing a decrease in resolution and transmittance, and from the viewpoint of further suppressing reflected scattered light.

AM2 is preferably 0.0055 to 0.0550 μm, more preferably 0.0060 to 0.0500 μm, and more preferably 0.0070 to 0.0450 μm, in order to facilitate the above-described effects. is more preferable, and 0.0080 to 0.0400 μm is even more preferable.
Note that if AM2 becomes too large, the resolution of the video tends to decrease. Therefore, not making AM2 too large is also preferable from the viewpoint of suppressing a decrease in resolution.

In this embodiment, AM1 is the sum of amplitudes of three spatial frequencies. That is, in AM1, three intervals are considered as the intervals of the convex portions. In the present embodiment, since a plurality of intervals are taken into consideration in AM1, it is possible to easily suppress an increase in reflected light due to uniform intervals of the convex portions.

In the present embodiment, when AM1ave is defined as the average amplitude corresponding to spatial frequencies of 0.005 μm ⁻¹ , 0.010 μm ⁻¹ , and 0.015 μm ⁻¹ , AM1ave is 0.023 to 0.133 μm. preferably 0.030 to 0.130 μm, more preferably 0.043 to 0.127 μm, even more preferably 0.050 to 0.123 μm. AM1ave can be represented by the following formula.
AM1ave = (amplitude at spatial frequency 0.005 μm ⁻¹ + amplitude at spatial frequency 0.010 μm ⁻¹ + amplitude at spatial frequency 0.015 μm ⁻¹ )/3

In this embodiment, the amplitude corresponding to the spatial frequency of 0.005 μm ⁻¹ is AM1-1, the amplitude corresponding to the spatial frequency of 0.010 μm ⁻¹ is AM1-2, and the amplitude corresponding to the spatial frequency of 0.015 μm ⁻¹ is AM1. When defined as -3, AM1-1, AM1-2, and AM1-3 are preferably within the following ranges. By setting AM1-1, AM1-2, and AM1-3 within the following ranges, it becomes easier to suppress the uniformity of the intervals between the convex portions, so it is easier to suppress an increase in reflected light.
AM1-1 is preferably 0.020 to 0.150 μm, more preferably 0.030 to 0.140 μm, even more preferably 0.040 to 0.130 μm, and 0.050 to Even more preferably, it is 0.120 μm.
AM1-2 is preferably 0.020 to 0.145 μm, more preferably 0.030 to 0.135 μm, even more preferably 0.040 to 0.125 μm, and 0.050 to Even more preferably, it is 0.120 μm.
AM1-3 is preferably 0.020 to 0.145 μm, more preferably 0.030 to 0.135 μm, even more preferably 0.040 to 0.125 μm, and 0.050 to Even more preferably, it is 0.120 μm.

In the antiglare film of the present invention, AM1/AM2 is 1.0 to 60.0 from the viewpoint of improving the balance of convex portions with different periods and making it easier to produce the above effects (y1) to (y5). is preferably 2.0 to 50.0, even more preferably 3.0 to 40.0, even more preferably 4.0 to 30.0.

- Calculation method for AM1 and AM2 -
In this specification, AM1 means the sum of amplitudes corresponding to spatial frequencies of 0.005 μm ⁻¹ , 0.010 μm ⁻¹ , and 0.015 μm ⁻¹ with respect to the amplitude spectrum of the elevation of the uneven surface, and AM2 is , with respect to said amplitude spectrum, means the amplitude at a spatial frequency of 0.300 μm ⁻¹ . A method of calculating AM1 and AM2 will be described below.

First, as described above, in this specification, the "elevation of the uneven surface" refers to an arbitrary point P on the uneven surface and a virtual plane M (elevation is 0 μm as a reference), which means a linear distance in the direction of the normal line V of the antiglare film (the normal direction on the imaginary plane M) (see FIG. 14).

When the orthogonal coordinates in the uneven surface of the antiglare film are represented by (x, y), the altitude of the uneven surface of the antiglare film can be expressed as a two-dimensional function h(x, y) of the coordinates (x, y). can.

The elevation of the uneven surface is preferably measured using an interference microscope. Examples of interference microscopes include Zygo's "New View" series.
The horizontal resolution required for the measuring instrument is at least 5 μm or less, preferably 1 μm or less, and the vertical resolution is at least 0.01 μm or less, preferably 0.001 μm or less.
Considering that the spatial frequency resolution is 0.0050 μm ⁻¹ , the altitude measurement area is preferably at least 200 μm×200 μm or more.

Next, a method for obtaining an altitude amplitude spectrum from a two-dimensional function h(x, y) will be described. First, from the two-dimensional function h(x, y), the amplitude spectrum Hx(fx) in the x direction and the amplitude spectrum Hy(fy) in the y direction are obtained by Fourier transform defined by the following equations (1a) and (1b). Ask.

where fx and fy are the frequencies in the x and y directions, respectively, and have the inverse length dimension. Also, π in the formulas (1a) and (1b) is the circular constant, and i is the imaginary unit. The amplitude spectrum H(f) can be obtained by averaging the amplitude spectrum Hx(fx) in the x direction and the amplitude spectrum Hy(fy) in the y direction. This amplitude spectrum H(f) represents the spatial frequency distribution of the uneven surface of the antiglare film.

Hereinafter, a method for obtaining the amplitude spectrum H(f) of the elevation of the uneven surface of the antiglare film will be described more specifically. The three-dimensional information of the surface shape actually measured by the above interference microscope is generally obtained as discrete values, ie elevations corresponding to a large number of measurement points.
FIG. 15 is a schematic diagram showing how the function h(x, y) representing altitude is discretely obtained. As shown in FIG. 15, the in-plane orthogonal coordinates of the antiglare layer are represented by (x, y), and the lines divided by Δx in the x-axis direction and the lines divided by Δy in the y-axis direction on the projection plane Sp In actual measurement, the elevation of the uneven surface is obtained as a discrete elevation value at each intersection point of each broken line on the projection plane Sp.

The number of elevation values obtained depends on the measurement range and Δx and Δy. As shown in FIG. 15, if the measurement range in the x-axis direction is X=(M−1)Δx and the measurement range in the y-axis direction is Y=(N−1)Δy, the number of obtained altitude values is M xN pieces.

As shown in FIG. 15, the coordinates of the point of interest A on the projection plane Sp are defined as (jΔx, kΔy) (where j is 0 or more and M−1 or less, and k is 0 or more and N−1 or less). Then, the altitude of the point P on the uneven surface corresponding to the point A of interest can be expressed as h(jΔx, kΔy).

Here, the measurement intervals Δx and Δy depend on the horizontal resolution of the measuring instrument, and in order to accurately evaluate the fine uneven surface, as described above, both Δx and Δy are preferably 5 μm or less, and 2 μm or less. is more preferred. Moreover, as described above, both the measurement ranges X and Y are preferably 200 μm or more.

Thus, in actual measurement, the function representing the elevation of the uneven surface is obtained as a discrete function h(x,y) having M×N values. N discrete functions Hx(fx) are obtained by subjecting the discrete function h(x,y) obtained by the measurement to the discrete Fourier transform defined by the following equations (2a) and (2b) in the x direction and the y direction respectively. , M discrete functions Hy(fy) are obtained, and the amplitude spectrum H(f) is obtained by obtaining the absolute values (=amplitudes) and averaging all of them according to the following equation (2c). Note that M=N and Δx=Δy in this specification. In the following formulas (2a) to (2c), "l" is an integer of -M/2 or more and M/2 or less, and "m" is an integer of -N/2 or more and N/2 or less. Δfx and Δfy are frequency intervals in the x direction and y direction, respectively, and are defined by the following equations (3) and (4).

The discrete function H(f) of the amplitude spectrum calculated as described above represents the spatial frequency distribution of the uneven surface of the antiglare film. 16 and 17 show the discrete function H(f) of the amplitude spectrum of the elevation of the uneven surface of Example 1 and Comparative Example 1. FIG. In the figure, the horizontal axis represents the spatial frequency (unit: "μm ⁻¹ "), and the vertical axis represents the amplitude (unit: "μm").

<Anti-glare layer>
The antiglare layer is a layer that plays a central role in suppression of reflected scattered light and antiglare properties.

<<Formation method of antiglare layer>>
The antiglare layer can be formed, for example, by (A) a method using an embossing roll, (B) etching treatment, (C) molding using a mold, and (D) forming a coating film by coating. Among these methods, molding with a mold (C) is preferable from the viewpoint of making it easier to obtain a stable surface shape, and formation of a coating film by coating (D) is preferable from the viewpoint of productivity and compatibility with a wide variety of products. preferred.
When forming a coating film (antiglare layer) by coating, for example, means (d1) for coating a coating liquid containing a binder resin and particles to form unevenness with the particles, an arbitrary resin, and compatibility with the resin There is a means (d2) of applying a coating liquid containing a resin having poor adhesion and causing phase separation of the resin to form unevenness. (d1) is more preferable than (d2) in that it is easier to suppress variations in surface profile such as Sa and Smp. In addition, (d1) is preferable to (d2) because it is easier to achieve a good balance between AM1 and AM2.

《Thickness》
The thickness T of the antiglare layer is preferably 2 to 10 μm, more preferably 4 to 8 μm, from the viewpoint of curl suppression, mechanical strength, hardness and toughness balance.
The thickness of the antiglare layer can be calculated, for example, by selecting 20 arbitrary points in a cross-sectional photograph of the antiglare film taken by a scanning transmission electron microscope (STEM) and calculating the average value thereof. The acceleration voltage of STEM is preferably 10 kV to 30 kV, and the magnification of STEM is preferably 1000 to 7000 times.

"component"
The antiglare layer mainly contains a resin component, and if necessary, particles such as organic particles and inorganic fine particles, a refractive index adjuster, an antistatic agent, an antifouling agent, an ultraviolet absorber, a light stabilizer, an antioxidant, Additives such as viscosity modifiers and thermal polymerization initiators are included.
The antiglare layer preferably contains a binder resin and particles. Particles include organic particles and inorganic particles, with organic particles being preferred. That is, the antiglare layer more preferably contains a binder resin and organic particles.

-particle-
Examples of organic particles include particles made of polymethyl methacrylate, polyacrylic-styrene copolymer, melamine resin, polycarbonate, polystyrene, polyvinyl chloride, benzoguanamine-melamine-formaldehyde condensate, silicone, fluorine-based resin, polyester-based resin, and the like. mentioned. Examples of inorganic particles include silica, alumina, zirconia and titania, with silica being preferred.
Since the organic particles have a low specific gravity, they are preferably used in combination with the inorganic fine particles described later so that the organic particles tend to float in the vicinity of the surface of the antiglare layer, and conditions 1 to 3 can be easily satisfied. In addition, by using organic particles and inorganic fine particles together, the organic particles can easily form long-period irregularities, and the inorganic fine particles can easily form short-period irregularities, making it easier to set AM1 and AM2 within the ranges described above. Further, since the organic particles are likely to float in the vicinity of the surface of the antiglare layer, the surface shape of Sa, Smp, etc. can be easily set within the ranges described above.
Further, when only organic particles are used as the particles, it is preferable to increase the content of the organic particles in the antiglare layer in order to easily satisfy the conditions 1 to 3. By increasing the content of organic particles in the antiglare layer, a shape in which the organic particles are spread all over is formed, and further, a shape in which the organic particles are stacked in the shape is partially formed. easier to form. Such a shape makes it easier to obtain the effects (y1) to (y5) described above. In addition, by increasing the content of the organic particles, the organic particles are spread all over to form unevenness (AM2) with a short period due to the organic particles, and furthermore, the organic particles are spread all over. By partially forming a shape in which the organic particles are stacked in such a shape, irregularities (AM1) having a long period can be formed. In addition, the shape in which the organic particles are spread all over makes it easy to reduce Smp. Furthermore, by partially forming a shape in which the organic particles are stacked in a shape in which the organic particles are spread all over, Sa can be easily increased.

The average particle diameter D of particles such as organic particles and inorganic particles is preferably 1.0 to 5.0 μm, more preferably 1.5 to 3.5 μm, and more preferably 1.7 to 2.5 μm. It is even more preferable to have
By setting the average particle diameter D within the above range, it becomes easier to set the height and spacing of the peaks on the uneven surface to an appropriate range, and to easily satisfy the conditions 1 to 3.
Further, by setting the average particle diameter D to 1.0 μm or more, AM1 can be easily suppressed from becoming too small, and Sa can be easily set to 0.30 μm or more. Further, by setting the average particle diameter D to 5.0 μm or less, AM1 can be easily suppressed from becoming too large, and Smp can be easily set to 10.00 μm or less.

The average particle size of particles such as organic particles and inorganic particles can be calculated by the following operations (A1) to (A3).
(A1) Take a transmission observation image of the antiglare film with an optical microscope. A magnification of 500 to 2000 is preferable.
(A2) Extract arbitrary 10 particles from the observation image and calculate the particle diameter of each particle. The particle diameter is measured as the distance between two straight lines that provide the maximum distance between two parallel straight lines that sandwich the cross section of the particle.
(A3) Perform the same operation 5 times on different screen observation images of the same sample, and take the value obtained from the number average of the particle diameters for a total of 50 particles as the average particle diameter of the particles.

The ratio (D/T) between the thickness T of the antiglare layer and the average particle diameter D of the particles is preferably 0.20 to 0.96, more preferably 0.25 to 0.90. , more preferably 0.30 to 0.80, and even more preferably 0.35 to 0.70. By setting D/T within the above range, it becomes easy to set the height of the peaks and the interval of the peaks on the uneven surface to an appropriate range, and to easily satisfy the conditions 1 to 3. Further, by setting D/T within the above range, AM1 and AM2 can be easily set within the ranges described above. Further, by setting D/T within the above range, it becomes easier to set the height and spacing of the peaks of the uneven surface within the appropriate ranges, and it is possible to easily set the surface shapes such as Sa and Smp within the above ranges.

The content of particles such as organic particles and inorganic particles is preferably 40 to 200 parts by mass, more preferably 55 to 170 parts by mass, and 60 to 150 parts by mass with respect to 100 parts by mass of the binder resin. is more preferable.
By setting the content of the particles to 40 parts by mass or more, the height of the peaks and the spacing of the peaks on the uneven surface can be easily set within appropriate ranges, and Conditions 1 to 3 can be easily satisfied. Further, by setting the content of the particles to 40 parts by mass or more, it is possible to easily suppress AM1 from becoming too small. Further, by setting the content of the particles to 40 parts by mass or more, it is possible to easily make Sa 0.30 μm or more and Smp 10.00 μm or less.
By setting the content of the particles to 200 parts by mass or less, it is possible to easily prevent the particles from falling off from the antiglare layer.
In addition, when the inorganic fine particles described later are not used, the content of the particles is preferably set to a relatively large amount within the above range in order to facilitate the manifestation of the above-described "laying" and "stacking".

―Inorganic Fine Particles―
The antiglare layer preferably contains inorganic fine particles in addition to the binder resin and particles. In particular, the antiglare layer preferably contains inorganic fine particles in addition to the binder resin and organic particles.
When the antiglare layer contains inorganic fine particles, organic particles having a relatively low specific gravity tend to float near the surface of the antiglare layer, and the surface shape such as Sa and Smp is easily within the above-described ranges. 3 can be easily satisfied. Further, since the antiglare layer contains inorganic fine particles, fine irregularities are formed between the peaks of the uneven surface, and regular reflection light is reduced, so that conditions 1 to 3 can be easily satisfied. Further, since the anti-glare layer contains inorganic fine particles, fine unevenness is formed between the peaks of the uneven surface, and AM1 and AM2 can be easily set within the ranges described above.
In addition, since the antiglare layer contains the inorganic fine particles, the difference between the refractive index of the organic particles and the refractive index difference of the composition other than the organic particles in the antiglare layer is reduced, and the internal haze can be easily reduced.

Examples of inorganic fine particles include fine particles made of silica, alumina, zirconia, titania, and the like. Among these, silica is preferable since it easily suppresses the generation of internal haze.

The average particle diameter of the inorganic fine particles is preferably 1 to 200 nm, more preferably 2 to 100 nm, even more preferably 5 to 50 nm.

The average particle size of the inorganic fine particles can be calculated by the following operations (B1) to (B3).
(B1) A cross section of the antiglare film is imaged with a TEM or STEM. The acceleration voltage of the TEM or STEM is preferably 10 kV to 30 kV, and the magnification is preferably 50,000 to 300,000 times.
(B2) Any 10 inorganic fine particles are extracted from the observation image, and the particle diameter of each inorganic fine particle is calculated. The particle diameter is measured as the distance between two arbitrary parallel straight lines sandwiching the cross section of the inorganic fine particles, and the distance between the two straight lines being the maximum.
(B3) Perform the same operation 5 times on different screen observation images of the same sample, and take the value obtained from the number average of the particle diameters of a total of 50 particles as the average particle diameter of the inorganic fine particles.

The content of the inorganic fine particles is preferably 40 to 200 parts by mass, more preferably 50 to 150 parts by mass, and even more preferably 60 to 100 parts by mass with respect to 100 parts by mass of the binder resin. .
By setting the content of the inorganic fine particles to 40 parts by mass or more, it is possible to easily obtain the effects based on the inorganic fine particles described above. Further, by setting the content of the inorganic fine particles to 200 parts by mass or less, it is possible to easily suppress a decrease in coating strength of the antiglare layer.

―Binder Resin―
From the viewpoint of improving mechanical strength, the binder resin preferably contains a cured product of a curable resin such as a cured product of a thermosetting resin composition or a cured product of an ionizing radiation-curable resin composition. More preferably, it contains a cured product of a curable resin composition.

A thermosetting resin composition is a composition containing at least a thermosetting resin, and is a resin composition that is cured by heating.
Thermosetting resins include acrylic resins, urethane resins, phenol resins, urea melamine resins, epoxy resins, unsaturated polyester resins, silicone resins, and the like. If necessary, a curing agent is added to these curable resins in the thermosetting resin composition.

The ionizing radiation-curable resin composition is a composition containing a compound having an ionizing radiation-curable functional group (hereinafter also referred to as an "ionizing radiation-curable compound"). Examples of ionizing radiation-curable functional groups include ethylenically unsaturated bond groups such as (meth)acryloyl groups, vinyl groups, and allyl groups, epoxy groups, and oxetanyl groups. As the ionizing radiation-curable compound, a compound having an ethylenically unsaturated bond group is preferable, and a compound having two or more ethylenically unsaturated bond groups is more preferable. Polyfunctional (meth)acrylate compounds are more preferred. Both monomers and oligomers can be used as polyfunctional (meth)acrylate compounds.
Ionizing radiation means an electromagnetic wave or a charged particle beam that has an energy quantum capable of polymerizing or cross-linking molecules, and usually ultraviolet (UV) or electron beam (EB) is used. Electromagnetic waves such as X-rays and γ-rays, and charged particle beams such as α-rays and ion beams can also be used.

Among polyfunctional (meth)acrylate compounds, bifunctional (meth)acrylate monomers include ethylene glycol di(meth)acrylate, bisphenol A tetraethoxy diacrylate, bisphenol A tetrapropoxy diacrylate, 1,6-hexane. diol diacrylate and the like.
Trifunctional or higher (meth)acrylate monomers include, for example, trimethylolpropane tri(meth)acrylate, pentaerythritol tri(meth)acrylate, pentaerythritol tetra(meth)acrylate, dipentaerythritol hexa(meth)acrylate, di Examples include pentaerythritol tetra(meth)acrylate and isocyanuric acid-modified tri(meth)acrylate.
Further, the (meth)acrylate-based monomer may have a partially modified molecular skeleton, and may be modified with ethylene oxide, propylene oxide, caprolactone, isocyanuric acid, alkyl, cyclic alkyl, aromatic, bisphenol, or the like. can also be used.

Examples of polyfunctional (meth)acrylate oligomers include acrylate polymers such as urethane (meth)acrylate, epoxy (meth)acrylate, polyester (meth)acrylate, and polyether (meth)acrylate.
Urethane (meth)acrylates are obtained, for example, by reacting polyhydric alcohols and organic diisocyanates with hydroxy (meth)acrylates.
Preferred epoxy (meth)acrylates are (meth)acrylates obtained by reacting tri- or more functional aromatic epoxy resins, alicyclic epoxy resins, aliphatic epoxy resins, etc. with (meth)acrylic acid, bifunctional (Meth)acrylates obtained by reacting the above aromatic epoxy resins, alicyclic epoxy resins, aliphatic epoxy resins, etc. with polybasic acid and (meth)acrylic acid, and bifunctional or higher aromatic epoxy resins, It is a (meth)acrylate obtained by reacting an alicyclic epoxy resin, an aliphatic epoxy resin, or the like with a phenol and (meth)acrylic acid.

For the purpose of adjusting the viscosity of the antiglare layer coating liquid, a monofunctional (meth)acrylate may be used in combination as the ionizing radiation-curable compound. Monofunctional (meth)acrylates include methyl (meth)acrylate, ethyl (meth)acrylate, propyl (meth)acrylate, butyl (meth)acrylate, pentyl (meth)acrylate, hexyl (meth)acrylate, and cyclohexyl (meth)acrylate. , 2-ethylhexyl (meth)acrylate, lauryl (meth)acrylate, stearyl (meth)acrylate and isobornyl (meth)acrylate.
The ionizing radiation-curable compounds may be used singly or in combination of two or more.

When the ionizing radiation-curable compound is an ultraviolet-curable compound, the ionizing radiation-curable composition preferably contains additives such as a photopolymerization initiator and a photopolymerization accelerator.
Examples of the photopolymerization initiator include one or more selected from acetophenone, benzophenone, α-hydroxyalkylphenone, Michler's ketone, benzoin, benzyldimethylketal, benzoylbenzoate, α-acyloxime ester, thioxanthones, and the like.
The photopolymerization accelerator can reduce polymerization inhibition by air during curing and increase the curing speed, and is selected from, for example, p-dimethylaminobenzoic acid isoamyl ester, p-dimethylaminobenzoic acid ethyl ester, and the like. One or more types are mentioned.

When the binder resin contains a cured product of an ionizing radiation-curable resin composition, it preferably has the following configuration (C1) or (C2).

(C1) The binder resin contains a thermoplastic resin in addition to the cured product of the ionizing radiation-curable resin composition.
(C2) The binder resin contains substantially only the cured product of the ionizing radiation-curable resin composition, and the ionizing radiation-curable compound contained in the ionizing radiation-curable resin composition contains substantially only the monomer component. include.

In the case of the above embodiment C1, the thermoplastic resin increases the viscosity of the antiglare layer coating liquid, so that the organic particles are less likely to sink, and the binder resin is less likely to flow down between the peaks. For this reason, in the case of the embodiment C1, it becomes easy to set the height of the ridges and the interval of the ridges on the uneven surface to an appropriate range, so that the conditions 1 to 3 can be easily satisfied. Furthermore, in the case of the embodiment of C1, it is possible to easily prevent AM1 and AM2 from becoming too small, and it is possible to easily set the surface shapes such as Sa and Smp within the above ranges.

Thermoplastic resins include polystyrene-based resins, polyolefin-based resins, ABS resins (including heat-resistant ABS resins), AS resins, AN resins, polyphenylene oxide-based resins, polycarbonate-based resins, polyacetal-based resins, acrylic-based resins, and polyethylene terephthalate-based resins. Resins, polybutylene tephthalate-based resins, polysulfone-based resins, polyphenylene sulfide-based resins, and the like can be mentioned, and acrylic resins are preferred from the viewpoint of transparency.

The weight average molecular weight of the thermoplastic resin is preferably 20,000 to 200,000, more preferably 30,000 to 150,000, even more preferably 50,000 to 100,000.
As used herein, the weight average molecular weight is the average molecular weight measured by GPC analysis and converted to standard polystyrene.

In the embodiment of C1 above, the mass ratio of the cured product of the ionizing radiation curable resin composition and the thermoplastic resin is preferably 60:40 to 90:10, and 70:30 to 80:20. is more preferred.
By setting the number of thermoplastic resins to 10 or more relative to the cured product 90 of the ionizing radiation-curable resin composition, the effect of increasing the viscosity of the antiglare layer coating liquid can be easily exhibited. Further, by setting the proportion of the thermoplastic resin to 40 or less with respect to the cured product 60 of the ionizing radiation-curable resin composition, it is possible to easily suppress the decrease in the mechanical strength of the antiglare layer.

In the case of the above embodiment C2, the bottom of the antiglare layer is covered with organic particles, and the organic particles are stacked in a part of the region, and these organic particles are covered with a skin-like binder resin. It tends to be shaped like Such a shape makes it easier to obtain the effects of (y1) to (y5) described above, making it easier to satisfy conditions 1 to 3. In the embodiment of C2, long-period unevenness (AM1) is formed by stacked organic particles, and short-period unevenness (AM2) is formed between long-period unevenness by organic particles that are not stacked. It will be. Therefore, in the case of the above C2 embodiment, AM1 and AM2 can be easily set within the above ranges. Further, in the case of the above embodiment C2, the stacked organic particles can make Sa easily within the above range, and the spread organic particles can easily make Smp within the above range.
In the case of the above embodiment C2, it is preferable that the amount of the binder resin with respect to the organic particles is less than in the above embodiment C1 in order to make the binder resin easier to form a thin film.

In C2 above, the ratio of the cured product of the ionizing radiation-curable resin composition to the total amount of the binder resin is preferably 90% by mass or more, more preferably 95% by mass or more, and 100% by mass. More preferred.
In C2 above, the ratio of the monomer component to the total amount of the ionizing radiation-curable compound is preferably 90% by mass or more, more preferably 95% by mass or more, and even more preferably 100% by mass. . The monomer component is preferably a polyfunctional (meth)acrylate compound.

Solvents are usually used in antiglare layer coating liquids to adjust the viscosity and to dissolve or disperse each component. Since the surface shape of the antiglare layer after coating and drying differs depending on the type of solvent, it is preferable to select the solvent in consideration of the saturated vapor pressure of the solvent, the permeability of the solvent to the transparent substrate, and the like.
Specifically, solvents include, for example, ketones (acetone, methyl ethyl ketone, methyl isobutyl ketone (MIBK), cyclohexanone, etc.), ethers (dioxane, tetrahydrofuran, etc.), aliphatic hydrocarbons (hexane, etc.), alicyclic Hydrocarbons (cyclohexane, etc.), aromatic hydrocarbons (toluene, xylene, etc.), halogenated carbons (dichloromethane, dichloroethane, etc.), esters (methyl acetate, ethyl acetate, butyl acetate, etc.), alcohols (isopropanol, butanol, cyclohexanol, etc.), cellosolves (methyl cellosolve, ethyl cellosolve, etc.), glycol ethers (propylene glycol monomethyl ether acetate, etc.), cellosolve acetates, sulfoxides (dimethyl sulfoxide, etc.), amides (dimethylformamide, dimethyl acetamide, etc.) and the like, and mixtures thereof may also be used.

The solvent in the antiglare layer coating liquid preferably contains a solvent having a high evaporation rate as a main component. By increasing the evaporation rate of the solvent, it is possible to suppress the sedimentation of the organic particles in the lower part of the antiglare layer, and furthermore, it becomes difficult for the binder resin to flow down between the peaks. For this reason, by increasing the evaporation rate of the solvent, it becomes easier to set the height of the ridges and the interval between the ridges on the uneven surface to appropriate ranges, and to easily satisfy the conditions 1 to 3. Further, by increasing the evaporation rate of the solvent, AM1 and AM2 can be easily set within the above range, and surface shapes such as Sa and Smp can be easily set within the above range.
The main component means 50% by mass or more, preferably 70% by mass or more, and more preferably 80% by mass or more of the total amount of the solvent.

In the present specification, a solvent having a high evaporation rate means a solvent having an evaporation rate of 100 or more when the evaporation rate of butyl acetate is set to 100. The evaporation rate of the solvent having a high evaporation rate is more preferably 120-300, more preferably 150-220.
Examples of solvents with high evaporation rates include methyl isobutyl ketone (evaporation rate 160), toluene (evaporation rate 200), and methyl ethyl ketone (evaporation rate 370).

The solvent in the antiglare layer coating liquid preferably contains a small amount of a solvent with a slow evaporation rate in addition to the solvent with a high evaporation rate. By including a solvent with a slow evaporation rate, the organic particles are aggregated, the height of the ridges and the interval between the ridges on the uneven surface are easily set within appropriate ranges, and conditions 1 to 3 can be easily satisfied. In addition, by containing a solvent with a slow evaporation rate and moderately aggregating the organic particles, AM1 and AM2 can be easily set within the above ranges, and surface shapes such as Sa and Smp can be easily set within the above ranges.
The mass ratio of the fast evaporating solvent and the slow evaporating solvent is preferably 99:1 to 80:20, more preferably 98:2 to 85:15.

In the present specification, a solvent with a slow evaporation rate means a solvent with an evaporation rate of less than 100 when the evaporation rate of butyl acetate is defined as 100. The evaporation rate of the solvent having a high evaporation rate is more preferably 20-60, more preferably 25-40.
Solvents with a slow evaporation rate include, for example, cyclohexanone (evaporation rate of 32) and propylene glycol monomethyl ether acetate (evaporation rate of 44).

Moreover, when forming the antiglare layer from the antiglare layer coating solution, it is preferable to control the drying conditions.
Drying conditions can be controlled by drying temperature and air speed in the dryer. Specifically, the drying temperature is preferably 30 to 120° C., and the drying wind speed is preferably 0.2 to 50 m/s. In order to control the surface shape of the antiglare layer by drying, it is preferable to irradiate ionizing radiation after drying the coating liquid.

<Optical properties>
The antiglare film preferably has a total light transmittance of 70% or more, more preferably 80% or more, and even more preferably 85% or more according to JIS K7361-1:1997.
The light incident surface for measuring the total light transmittance and haze, which will be described later, is the opposite side of the uneven surface.

The antiglare film preferably has a JIS K7136:2000 haze of 60 to 98%, more preferably 66 to 86%, even more preferably 70 to 80%.
By setting the haze to 60% or more, the antiglare property can be easily improved. Further, by setting the haze to 98% or less, it is possible to easily suppress deterioration in image resolution.

The antiglare film preferably has an internal haze of 20% or less, more preferably 15% or less, and even more preferably 10% or less, in order to easily improve image resolution and contrast.
The internal haze can be measured by a general-purpose method. For example, it can be measured by flattening the unevenness of the uneven surface by pasting a transparent sheet on the uneven surface with a transparent adhesive layer interposed therebetween.

<Other layers>
The antiglare film may have layers other than the antiglare layer and the transparent base material described above. Other layers include an antireflection layer, an antifouling layer, an antistatic layer, and the like.
A preferred embodiment having other layers includes an embodiment having an antireflection layer on the antiglare layer, and the surface of the antireflection layer is the uneven surface. In addition, it is more preferable that the antireflection layer has an antifouling property. That is, an embodiment in which an antifouling antireflection layer is provided on the antiglare layer and the surface of the antifouling antireflection layer is the uneven surface is more preferable.

《Anti-reflection layer》
Examples of the antireflection layer include a single layer structure of a low refractive index layer; a two-layer structure of a high refractive index layer and a low refractive index layer; and a multilayer structure of three or more layers. The low refractive index layer and the high refractive index layer can be formed by a general-purpose wet method, dry method, or the like. In the case of the wet method, the single-layer structure or the two-layer structure is preferred, and in the case of the dry method, the multi-layer structure is preferred.

-Single-layer structure or two-layer structure-
A single-layer structure or a two-layer structure is preferably formed by a wet method.
The low refractive index layer is preferably arranged on the outermost surface of the antiglare film. When imparting antifouling properties to the antireflection layer, the low refractive index layer preferably contains an antifouling agent such as a silicone-based compound and a fluorine-based compound.

The lower limit of the refractive index of the low refractive index layer is preferably 1.10 or more, more preferably 1.20 or more, more preferably 1.26 or more, more preferably 1.28 or more, and more preferably 1.30 or more. , the upper limit is preferably 1.48 or less, more preferably 1.45 or less, more preferably 1.40 or less, more preferably 1.38 or less, and more preferably 1.32 or less.

The lower limit of the thickness of the low refractive index layer is preferably 80 nm or more, more preferably 85 nm or more, more preferably 90 nm or more, and the upper limit is preferably 150 nm or less, more preferably 110 nm or less, and more preferably 105 nm or less.

The high refractive index layer is preferably arranged closer to the antiglare layer than the low refractive index layer.
The lower limit of the refractive index of the high refractive index layer is preferably 1.53 or more, more preferably 1.54 or more, more preferably 1.55 or more, more preferably 1.56 or more, and the upper limit is 1.85 or less. is preferred, 1.80 or less is more preferred, 1.75 or less is more preferred, and 1.70 or less is more preferred.

The upper limit of the thickness of the high refractive index layer is preferably 200 nm or less, more preferably 180 nm or less, still more preferably 150 nm or less, and the lower limit is preferably 50 nm or more, more preferably 70 nm or more.

-In the case of a multi-layered structure with three or more layers-
A multilayer structure preferably formed by a dry method is a structure in which high refractive index layers and low refractive index layers are alternately laminated to form a total of three or more layers. Also in the multilayer structure, the low refractive index layer is preferably arranged on the outermost surface of the antiglare film.

The high refractive index layer preferably has a thickness of 10 to 200 nm and a refractive index of 2.1 to 2.4. More preferably, the thickness of the high refractive index layer is 20 to 70 nm.
The low refractive index layer preferably has a thickness of 5 to 200 nm and a refractive index of 1.33 to 1.53. More preferably, the thickness of the low refractive index layer is 20 to 120 nm.

<Size, shape, etc.>
The anti-glare film may be in the form of a leaf cut into a predetermined size, or may be in the form of a roll obtained by winding a long sheet. The size of the sheet is not particularly limited, but the maximum diameter is about 2 to 500 inches. The “maximum diameter” refers to the maximum length of the antiglare film when two arbitrary points are connected. For example, when the anti-glare film is rectangular, the diagonal line of the region is the maximum diameter. Moreover, when the antiglare film is circular, the diameter is the maximum diameter.
The width and length of the roll are not particularly limited, but generally the width is about 500 to 3000 mm and the length is about 500 to 5000 m. The roll-shaped anti-glare film can be cut into sheets according to the size of an image display device or the like. When cutting, it is preferable to exclude the roll ends whose physical properties are not stable.
Also, the shape of the leaf is not particularly limited, and may be, for example, a polygon (triangle, quadrangle, pentagon, etc.), a circle, or a random irregular shape. More specifically, when the antiglare film has a square shape, the aspect ratio is not particularly limited as long as there is no problem as a display screen. For example, width:height = 1:1, 4:3, 16:10, 16:9, 2:1, etc., but for in-vehicle applications and digital signage that are rich in design, this aspect ratio is limited. not.

The shape of the surface of the antiglare film on the side opposite to the uneven surface is not particularly limited, but it is preferably substantially smooth. Substantially smooth means that Sa is less than 0.03 μm, preferably 0.02 μm or less.

[Image display device]
The image display device of the present invention comprises the above-described antiglare film of the present invention disposed on a display element so that the uneven surface side faces the opposite side to the display element, and the antiglare film is disposed on the display element. It is arranged on the outermost surface (see FIG. 4).

Examples of display elements include liquid crystal display elements, EL display elements (organic EL display elements, inorganic EL display elements), plasma display elements, and the like, and LED display elements such as micro LED display elements. These display elements may have a touch panel function inside the display element.
The liquid crystal display method of the liquid crystal display element includes an IPS method, a VA method, a multi-domain method, an OCB method, an STN method, a TSTN method, and the like. If the display element is a liquid crystal display element, a backlight is required. The backlight is arranged on the side of the liquid crystal display element opposite to the side where the antiglare film is arranged.

Further, the image display device of the present embodiment may be an image display device with a touch panel having a touch panel between the display element and the antiglare film. In this case, the anti-glare film may be placed on the outermost surface of the image display device with the touch panel, and the uneven surface side of the anti-glare film may be placed so as to face the side opposite to the display element.

The size of the image display device is not particularly limited, but the maximum diameter of the effective display area is about 2 to 500 inches.
The effective display area of an image display device is an area in which an image can be displayed. For example, when the image display device has a housing that surrounds the display element, the area inside the housing becomes the effective image area.
It should be noted that the maximum diameter of the effective image area refers to the maximum length obtained by connecting any two points within the effective image area. For example, if the effective image area is a rectangle, the diagonal of the area will be the maximum diameter. Also, when the effective image area is circular, the diameter of the area is the maximum diameter.

EXAMPLES Next, the present invention will be described in more detail with reference to examples, but the present invention is not limited to these examples. "Parts" and "%" are based on mass unless otherwise specified.

1. Measurement and Evaluation The antiglare films of Examples and Comparative Examples were measured and evaluated as follows. The atmosphere during each measurement and evaluation was a temperature of 23±5° C. and a humidity of 40 to 65%. Moreover, before starting each measurement and evaluation, the target sample was exposed to the atmosphere for 30 minutes or more, and then the measurement and evaluation were performed. The results are shown in Tables 1-3.

1-1. Measurement of Reflected Light Intensity The reflected light intensity of the antiglare films of Examples and Comparative Examples was measured by the following steps, and the smoothed reflected light intensity was calculated. Table 1 shows the maximum absolute value of the difference under condition 1 and the values under conditions 2 and 3. 5 to 13 show the smoothed reflected light intensity for each angle of the antiglare films of Examples and Comparative Examples. The horizontal axis is the light receiving angle (degrees), and the vertical axis is the smoothed reflected light intensity (logarithmic scale).

(0) In a variable angle photometer (trade name “GC5000L” manufactured by Nippon Denshoku Industries Co., Ltd., luminous flux diameter: about 3 mm, luminous flux inclination angle: within 0.8 degrees, receiver opening angle: 1 degree), After turning on the power switch of the apparatus in advance and waiting for 20 minutes or longer so that the light source was stabilized, zero adjustment was performed. Zero adjustment was carried out by setting a zero cap on the sample table of the goniophotometer and pressing the "zero adjustment" button on the attached software with light irradiation at 45 degrees.
(1) In the transmission measurement mode of the goniophotometer (1000-fold photosensitivity), visible light is emitted from the light source of the goniophotometer as parallel rays, and the intensity of the emitted light is measured at the aperture angle without passing through the sample. It was measured at one time and standardized so that the maximum strength was 100,000.
(2) Next, on the surface of the antiglare film of Examples and Comparative Examples opposite to the uneven surface, a black plate is placed via a transparent adhesive layer (Panac, trade name: Panaclean PD-S1) having a thickness of 25 μm. (Kuraray Co., Ltd., trade name: Comoglass DFA2CG 502K (black) system, thickness 2 mm) were bonded together to prepare a sample α of 10 cm×10 cm. Sample α had an antiglare film, a transparent adhesive layer and a black plate in this order, and had an uneven surface (=an uneven surface of the antiglare film).
(3) Place the sample α in the variable angle photometer, irradiate the uneven surface of the sample α with visible light as parallel light from the light source of the variable angle photometer, and measure the intensity of the reflected light at an aperture angle of 1 measured in degrees. The irradiation angle of the parallel rays was set to a direction inclined by +45 degrees from the normal direction of the sample α. The reflected light intensity was measured at intervals of 1 degree from 0 degrees to -85 degrees, which is the normal direction of the sample α. In addition, in order to maintain the effect of standard matching in (1), the reflected light intensity was measured in the transmission measurement mode.
(4) A smoothing process represented by the following formula (i) was performed at each angle from 0 degree to -85 degrees, and the reflected light intensity after the smoothing process was calculated as the smoothed reflected light intensity at each angle.
n degree smoothed reflected light intensity = ([n-2 degree reflected light intensity] + [n-1 degree reflected light intensity] + [n degree reflected light intensity] + [n + 1 degree reflected light intensity] + [reflected light intensity at n+2 degrees])/5 (i)

1-2. Measurement of Surface Shape The antiglare films of Examples and Comparative Examples were cut into pieces of 10 cm×10 cm. After visually confirming that there were no abnormalities such as dust or scratches, the cutting sites were selected at random. The transparent substrate side of the cut anti-glare film was passed through an optically transparent adhesive sheet from Panac Corporation (trade name: Panaclean PD-S1, thickness 25 μm), and a glass plate (length 10 cm×width 10 cm) (thickness 2.0 cm) was placed. 0 mm) was prepared.
Using a white interference microscope (New View 7300, Zygo), after setting the sample 2 on the measurement stage so that it is fixed and in close contact, the surface of the antiglare film under the following measurement conditions 1 and analysis conditions 1 Shape measurements and analysis were performed. For measurement and analysis software, Microscope Application of MetroPro ver 9.0.10 (64-bit) was used.

(Measurement condition 1)
Objective lens: 50 times ImageZoom: 1 time Measurement area: 218 μm × 218 μm
Resolution (spacing per point): 0.22 μm
・Instrument: NewView 7000 Id 0 SN 073395
・Acquisition Mode: Scan
・Scan Type: Bipolar
・Camera Mode: 992x992 48Hz
・Subtract Sys Err: Off
- SysErr File: SysErr. dat
・AGC: Off
・Phase Res: High
・Connection Order: Location
- Disc Action: Filter
・Min Mod (%): 0.01
・Min Area Size: 7
・Remove Fringes: Off
・Number of Averages: 0
・FDA Noise Threshold: 10
・Scan Length: 15um bipolar (6 sec)
・Extended Scan Length: 1000 μm
・FDA Res: High 2G

(Analysis condition 1)
・Removed: None
・Data Fill: On
・Data Fill Max: 10000
・Filter: High Pass
・FilterType: Gauss Spline
・Filter Window Size: 3
・Filter Trim: Off
・Filter Low wave length: 800 μm
・Min Area Size: 0
・Remove spikes: On
・Spike Height (xRMS): 2.5
Note that Low wavelength corresponds to the cutoff value λc in the roughness parameter.

"Ra", "SRz", and "Rsk" were displayed on the Surface Map screen, and the respective numerical values were defined as Sa, Sz, and Ssk for each measurement area.
Next, the "Save Data" button was displayed on the Surface Map screen to save the three-dimensional curved surface roughness data after the analysis. Then, in Advanced Texture Application, the saved data was read and the following analysis condition 2 was applied.
(Analysis condition 2)
・High FFT Filter: off
・Low FFT Filter: off
・Calc High Frequency: On
・Calc Low Frequency: On
・Filter Trim: On
・Remove spikes: Off
・Spike Height (xRMS): 5.00
・Noise Filter Size: 0
・Noise Filter Type: 2 Sigma
・Fill Data: Off
・Data Fill Max: 25
・Trim: 0
・Trim Mode: All
・Remove: Plane
・Reference Band: 0 μm
・Mim Peaks/Valleys Area: 0 μm ²
・Max Peaks/Valleys Area: 0 μm ²

Next, display the "Peaks/Valleys" screen, perform analysis with "Reference Band: 0 μm", "Mim Peaks/Valleys Area: 0 μm ² ", and "Max Peaks/Valleys Area: 0 μm ² ", and set to "Peak Spacing". The numerical value displayed was taken as the Smp of each measurement area.

Next, the Slope Mag Map screen is displayed with the analysis software (Microscope Application of MetroPro ver 9.0.10 (64-bit)), and the horizontal axis is Value (μm / mm) and the vertical axis is Counts Histogram data of the three-dimensional surface inclination angle distribution was obtained by displaying the histogram as , and converting the horizontal axis to an angle using the arctangent. In addition, in each measurement sample, adjustment was made by changing the numerical value of nBins so that an angle distribution histogram in which the tilt angle after conversion was incremented by 1 degree or less was obtained. Based on the obtained histogram data, the tilt angle (θ1) of more than 0 degrees and less than 1 degree, the tilt angle (θ2) of 1 degree or more and less than 3 degrees, the tilt angle of 3 degrees or more and less than 10 degrees (θ3), 10 degrees or more. A tilt angle (θ4) of less than 90 degrees was calculated.

1-3. Total light transmittance (Tt) and haze (Hz)
The antiglare films of Examples and Comparative Examples were cut into 10 cm squares. After visually confirming that there were no abnormalities such as dust or scratches, the cutting sites were selected at random. Using a haze meter (HM-150, manufactured by Murakami Color Research Laboratory), the total light transmittance of each sample according to JIS K7361-1:1997 and the haze according to JIS K7136:2000 were measured.
In order to stabilize the light source, turn on the power switch of the device and wait at least 15 minutes before performing calibration without setting anything at the entrance opening (the place where the measurement sample is installed). A sample was set and measured. Also, the light incident surface was on the side of the transparent substrate.

1-4. Anti-glare 1 (anti-glare in specular direction)
The sample α prepared in 1-1 was placed on a horizontal table with a height of 70 cm with the uneven surface facing up, and in a bright room environment, from the angle of the regular reflection direction of the illumination light, the following evaluation criteria were used. Reflection of illumination light on the uneven surface was evaluated. In the evaluation, the position of the sample α with respect to the illumination was adjusted so that the incident angle of the light emitted from the center of the illumination with respect to the sample α was 10 degrees. For lighting, an Hf32 type straight tube three-wavelength neutral white fluorescent lamp was used, and the position of the lighting was set at a height of 2 m above the horizontal table in the vertical direction. Also, the evaluation was performed in the range of 500 to 1000 lux of illuminance on the uneven surface of the sample. Also, the line of sight of the observer was about 160 cm from the floor. Observers were healthy people in their thirties with visual acuity of 0.7 or better.
<Evaluation Criteria>
◎: There is no contour of the lighting, and the position is not known ○: There is no contour of the lighting, but the position can be vaguely recognized △: The contour and position of the lighting can be vaguely recognized ×: The blurring of the contour of the lighting is weak, and the position is also clear I understand

1-5. Anti-glare 2 (anti-glare at various angles)
While holding the sample α prepared in 1-1 with both hands and changing the height and angle of the sample α (however, the incident angle of the light emitted from the center of the illumination with respect to the sample α is changed within the range of 10 to 70 degrees). The reflection of illumination light on the uneven surface was evaluated in the same manner as in 1-4, except that the points to be evaluated were changed.

1-6. Reflected scattered light (≒ jet black feeling)
The sample α prepared in 1-1 was placed on a horizontal table with a height of 70 cm with the uneven surface facing upward. The position of the sample α with respect to the illumination was adjusted so that the light with the strongest output angle out of the lights emitted from the illumination could barely enter the sample α. Due to this adjustment, the positions of the samples relative to the observer are positioned farther from the observer than the positions of the samples 1-4.
The sample α was placed at the position described above, and the degree of reflected scattered light (approximately pitch-black feeling) was evaluated according to the following evaluation criteria. The observer's line of sight was about 160 cm from the floor. Observers were healthy people in their thirties with visual acuity of 0.7 or better.
<Evaluation Criteria>
◎: The whiteness of the scattered light is not felt, and it is sufficiently black.

1-7. Measurement of AM1 and AM2 Using a white interference microscope (New View 7300, Zygo), after setting the sample 2 prepared in 1-2 on the measurement stage so that it is fixed and in close contact, under the following conditions: The altitude of the uneven surface of the antiglare film was measured to calculate AM1 and AM2. The measurement conditions and analysis conditions for measuring the altitude were the same as measurement conditions 1 and analysis conditions 1 in 1-2 above. Microscope Application of MetroPro ver 9.0.10 was used as measurement/analysis software.

(Calculation procedure for AM1 and AM2)
A "Save Data" button was displayed on the Surface Map screen, and the analyzed three-dimensional curved surface roughness data was saved in the "XYZ File (*.xyz)" format. Next, exporting was performed in Microsoft's Excel (registered trademark) to obtain a two-dimensional function h(x,y) of altitude. The number of raw data obtained is 992 rows×992 columns=984064 points, and the length of one side (MΔx or NΔy) is 218 μm. Data with a side length of 200 μm was obtained from 910 horizontal rows=828,100 points. Next, using statistical analysis software R (ver3.6.3), a one-dimensional amplitude spectrum Hx '(fx) of the elevation of each row and each column in the two-dimensional function of elevation (910 rows × 910 columns), Hy′(fy) was calculated respectively, and the amplitude values corresponding to each spatial frequency value were averaged to obtain a one-dimensional amplitude spectrum H″(f) of elevation. A one-dimensional function H″(f) of altitude was measured, and the result of averaging amplitude values corresponding to respective spatial frequency values was defined as a one-dimensional amplitude spectrum H(f) of altitude.
Next, AM2 (amplitude at spatial frequency 0.300 μm ⁻¹ ) is extracted from the obtained data, and AM1 (spatial frequencies corresponding to 0.005 μm ⁻¹ , 0.010 μm ⁻¹ , 0.015 μm ⁻¹ , respectively) ) was calculated. AM1-1 is the amplitude corresponding to the spatial frequency of 0.005 μm ⁻¹ , AM1-2 is the amplitude corresponding to the spatial frequency of 0.010 μm ⁻¹ , and AM1 is the amplitude corresponding to the spatial frequency of 0.015 μm ⁻¹ The -3 values are shown in Table 3.
16 and 17 show the discrete function H(f) of the altitude amplitude spectrum of the uneven surface of the antiglare films of Example 1 and Comparative Example 1. FIG. In the figure, the horizontal axis indicates spatial frequency (unit: μm ⁻¹ ), and the vertical axis indicates amplitude (unit: μm).

2. Preparation of antiglare film [Example 1]
Antiglare layer coating solution 1 having the following formulation was applied to a transparent substrate (80 μm thick triacetyl cellulose resin film (TAC), Fuji Film Co., Ltd., TD80UL) and dried at 70° C. for 30 seconds at a wind speed of 5 m/s. An antiglare layer was formed by irradiating ultraviolet rays in a nitrogen atmosphere (oxygen concentration of 200 ppm or less) so that the integrated amount of light was 100 mJ/cm ² , and an antiglare film of Example 1 was obtained. The thickness of the antiglare layer was 5.0 μm. The Sa on the side opposite to the antiglare layer of the antiglare film was 0.012 μm.

<Anti-glare layer coating solution 1>
・ Pentaerythritol triacrylate 58.2 parts (Nippon Kayaku, trade name: KAYARAD-PET-30)
・ Urethane acrylate oligomer 18.2 parts (DIC, trade name: V-4000BA)
- Thermoplastic resin 23.6 parts (acrylic polymer, Mitsubishi Rayon Co., molecular weight 75,000)
・ Organic particles 63.6 parts (Sekisui Plastics Co., Ltd., spherical polyacrylic-styrene copolymer)
(Average particle size 2.0 μm, refractive index 1.515)
(The proportion of particles with a particle size of 1.8 to 2.2 μm is 90% or more)
・ 230 parts of inorganic fine particle dispersion (Nissan Chemical Co., Ltd., silica with a reactive functional group introduced on the surface, solvent: MIBK, solid content: 35.5%)
(Average particle size 12 nm)
(Active ingredient of inorganic fine particles: 81.9 parts)
- Photopolymerization initiator 5.5 parts (IGM Resins B.V., trade name: Omnirad 184)
- Photopolymerization initiator 1.8 parts (IGM Resins B.V., trade name: Omnirad 907)
- Silicone leveling agent 0.2 parts (Momentive Performance Materials, trade name: TSF4460)
・Solvent (toluene) 346.8 parts ・Solvent 3 17.9 parts (cyclohexanone)

[Examples 2 to 5], [Comparative Examples 1 to 4]
Examples 2 to 5 and Comparative Examples 1 to 4 were prepared in the same manner as in Example 1, except that the antiglare layer coating solution 1 was changed to the antiglare layer coating solution having the number shown in Table 1. got the film. The compositions of antiglare layer coating solutions 2 to 9 are shown below.

<Anti-glare layer coating solution 2>
The organic particles of the antiglare layer coating liquid 1 were "average particle size 4.0 μm, refractive index 1.515 (Sekisui Kasei Co., Ltd., spherical polyacrylic-styrene copolymer, particle size 3.8 to 4.2 μm A coating liquid having the same composition as the antiglare layer coating liquid 1 except that organic particles having a ratio of 90% or more) are used.

<Anti-glare layer coating liquid 3>
・ Pentaerythritol triacrylate 100 parts (Nippon Kayaku, trade name: KAYARAD-PET-30)
・ Organic particles 129.8 parts (Sekisui Kasei Co., Ltd., spherical polyacrylic-styrene copolymer)
(Average particle size 2.0 μm, refractive index 1.515)
(The proportion of particles with a particle size of 1.8 to 2.2 μm is 90% or more)
- Photopolymerization initiator 6.4 parts (IGM Resins B.V., trade name: Omnirad184)
- Photopolymerization initiator 1.0 parts (IGM Resins B.V., trade name: Omnirad 907)
- Silicone leveling agent 0.1 part (Momentive Performance Materials, trade name: TSF4460)
・Solvent (toluene) 498.4 parts ・Solvent (cyclohexanone) 55.4 parts

<Anti-glare layer coating solution 4>
・ Pentaerythritol triacrylate 100 parts (Nippon Kayaku, trade name: KAYARAD-PET-30)
・ Organic particles 99.6 parts (Sekisui Kasei Co., Ltd., spherical polyacrylic-styrene copolymer)
(Average particle size 2.0 μm, refractive index 1.515)
(The proportion of particles with a particle size of 1.8 to 2.2 μm is 90% or more)
・ 10 parts of silica particles (average particle size: 4.1 μm)
(manufactured by Fuji Silysia Chemical Co., Ltd., gel method amorphous silica)
- Photopolymerization initiator 6.1 parts (IGM Resins B.V., trade name: Omnirad184)
- Photopolymerization initiator 1.1 parts (IGM Resins B.V., trade name: Omnirad 907)
・Solvent (toluene) 452.9 parts ・Solvent (cyclohexanone) 50.3 parts ・Solvent (ethyl acetate) 2.6 parts

<Anti-glare layer coating solution 5>
In Antiglare Layer Coating Solution 1, the amount of organic particles added was changed from 63.6 parts to 50.0 parts, and the amount of inorganic fine particle dispersion added was changed from 230 parts to 187 parts. A coating liquid having the same composition as the liquid 1.

<Anti-glare layer coating solution 6>
・ Pentaerythritol triacrylate 100 parts (Nippon Kayaku, trade name: KAYARAD-PET-30)
・ 14 parts of silica particles (average particle size: 4.1 μm)
(manufactured by Fuji Silysia Chemical Co., Ltd., gel method amorphous silica)
- Photopolymerization initiator 5 parts (IGM Resins B.V., trade name: Omnirad 184)
- Silicone leveling agent 0.2 parts (Momentive Performance Materials, trade name: TSF4460)
・Solvent (toluene) 150 parts ・Solvent (MIBK) 35 parts ・Solvent (ethyl acetate) 5.2 parts

<Anti-glare layer coating liquid 7>
・ Pentaerythritol triacrylate 91.5 parts (Nippon Kayaku, trade name: KAYARAD-PET-30)
・ Urethane acrylate oligomer 8.5 parts (DIC, trade name: V-4000BA)
・ Organic particles 2 parts (Sekisui Plastics Co., Ltd., spherical polyacrylic-styrene copolymer)
(Average particle size 5.0 μm, refractive index 1.550)
・ 15 parts of silica particles (average particle size: 4.1 μm)
(manufactured by Fuji Silysia Chemical Co., Ltd., gel method amorphous silica)
- Photopolymerization initiator 1.9 parts (IGM Resins B.V., trade name: Omnirad184)
- Photopolymerization initiator 7 parts (IGM Resins B.V., trade name: Omnirad 907)
- Silicone leveling agent 0.1 part (Momentive Performance Materials, trade name: TSF4460)
・Solvent (toluene) 161.1 parts ・Solvent (cyclohexanone) 69 parts ・Solvent (ethyl acetate) 3.9 parts

<Anti-glare layer coating solution 8>
・ 50.6 parts of pentaerythritol triacrylate (Nippon Kayaku Co., Ltd., trade name: KAYARAD-PET-30)
・ Urethane acrylate oligomer 49.4 parts (DIC, trade name: V-4000BA)
・ Organic particles 3 parts (Sekisui Plastics Co., Ltd., spherical polyacrylic-styrene copolymer)
(Average particle size 2.0 μm, refractive index 1.545 μm)
・ 1 part of silica particles (average particle size: 12 nm
(Nippon Aerosil Co., Ltd., fumed silica)
- Photopolymerization initiator 1 part (IGM Resins B.V., trade name: Omnirad184)
- Photopolymerization initiator 0.2 parts (IGM Resins B.V., trade name: Omnirad 907)
- Photoinitiator 1.5 parts (Lamberti, ESACUREONE)
- Silicone leveling agent 0.1 part (Momentive Performance Materials, trade name: TSF4460)
・Solvent (toluene) 98.6 parts ・Solvent (cyclohexanone) 38.7 parts ・Solvent (isopropyl alcohol) 44.1 parts ・Solvent (MIBK) 2.4 parts

<Anti-glare layer coating solution 9>
・ Pentaerythritol triacrylate 65 parts (Nippon Kayaku, trade name: KAYARAD-PET-30)
・ Urethane acrylate oligomer 35 parts (DIC, trade name: V-4000BA)
・ Organic particles 14 parts (Sekisui Plastics Co., Ltd., spherical polyacrylic-styrene copolymer)
(Average particle size 3.5 μm, refractive index 1.550)
・ 6 parts of silica particles (average particle size: 12 nm)
(Nippon Aerosil Co., Ltd., fumed silica)
- Photopolymerization initiator 5 parts (IGM Resins B.V., trade name: Omnirad 184)
- Silicone leveling agent 0.025 parts (Momentive Performance Materials, trade name: TSF4460)
・Solvent (toluene) 100 parts ・Solvent (cyclohexanone) 20 parts ・Solvent (isopropyl alcohol) 55 parts

From the results in Table 1, it can be confirmed that the antiglare films of Examples have excellent antiglare properties, suppress reflected scattered light, and have an excellent jet-black appearance.

10: Transparent substrate 20: Antiglare layer 21: Binder resin 22: Organic particles 100: Antiglare film 110: Display element 120: Image display device 200: Observer

Claims (14)

An antiglare film having an antiglare layer,
The antiglare film has an uneven surface, and the smoothed reflected light intensity measured under the following measurement conditions satisfies the following conditions 1 and 2,
The anti-glare film, wherein the uneven surface has a three-dimensional average peak spacing Smp of 2.524 μm or more and 8.228 μm or less.
<Measurement conditions>
(1) In the transmission measurement mode of the goniophotometer, the visible light is emitted from the light source of the goniophotometer as parallel rays, and the intensity of the emitted light is measured at an aperture angle of 1 degree without passing through the sample. The standard is adjusted so that the strength is 100,000.
(2) A black plate is attached to the surface of the antiglare film opposite to the uneven surface via a transparent adhesive layer, and the antiglare film, the transparent adhesive layer and the black plate are laminated, A sample α having the uneven surface is prepared.
(3) Place the sample α in a variable angle photometer, irradiate the uneven surface of the sample α with visible light as parallel rays from the light source of the variable angle photometer, and adjust the reflected light intensity to an aperture angle of 1 degree. Measure in The irradiation angle of the parallel light beam is set to a direction inclined by +45 degrees from the normal direction of the sample α. The reflected light intensity is measured at intervals of 1 degree from 0 degrees to -85 degrees, which is the normal direction of the sample α. In addition, in order to maintain the effect of standard adjustment in (1), the reflected light intensity is measured in the transmission measurement mode.
(4) A smoothing process represented by the following formula (i) is performed at each angle from 0 degree to -85 degrees, and the reflected light intensity after the smoothing process is defined as the smoothed reflected light intensity at each angle.
n degree smoothed reflected light intensity = ([n-2 degree reflected light intensity] + [n-1 degree reflected light intensity] + [n degree reflected light intensity] + [n + 1 degree reflected light intensity] + [reflected light intensity at n+2 degrees])/5 (i)
<Condition 1>
When the n-degree smoothed reflected light intensity is defined as Rn and the n-1-degree smoothed reflected light intensity is defined as Rn-1, the maximum absolute value of the difference between Rn and Rn-1 is 2.00 or less. .
<Condition 2>
The smoothed reflected light intensity at -35 degrees is 0.1 or more and 4.0 or less. 2. The anti-glare film according to claim 1, wherein in Condition 1, the maximum absolute value of said difference is 1.00 or less. Furthermore, the antiglare film of Claim 1 or 2 which satisfy|fills following condition 3.
<Condition 3>
The smoothed reflected light intensity at -45 degrees is 8.0 or less. The antiglare film according to any one of claims 1 to 3, which has a haze of 60 to 98% according to JIS K7136:2000. The antiglare film according to any one of claims 1 to 4, wherein the antiglare layer contains a binder resin and particles. 6. The antiglare film according to claim 5, wherein D/T is 0.20 to 0.96, where T is the thickness of the antiglare layer and D is the average particle diameter of the particles. 7. The antiglare film according to claim 5, wherein the particles have an average particle diameter D of 1.0 to 5.0 μm. The antiglare film according to any one of claims 5 to 7, comprising 40 to 200 parts by mass of the particles with respect to 100 parts by mass of the binder resin. The antiglare film according to any one of claims 5 to 8, wherein the particles are organic particles. The antiglare film according to any one of claims 5 to 9, wherein the antiglare layer further contains inorganic fine particles. 11. The antiglare film according to claim 10, containing 40 to 200 parts by mass of the inorganic fine particles with respect to 100 parts by mass of the binder resin. The antiglare film according to any one of claims 5 to 11, wherein the binder resin contains a cured product of an ionizing radiation-curable resin composition and a thermoplastic resin. The antiglare film according to any one of claims 1 to 12, further comprising an antireflection layer on the antiglare layer, the surface of the antireflection layer being the uneven surface. The antiglare film according to any one of claims 1 to 13 is arranged on a display element so that the uneven surface side faces the opposite side of the display element, and the antiglare film is placed at the maximum An image display device arranged on a surface.

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