JP7153309B2 - ベクトルネットワークアナライザを用いた反射係数の測定方法 - Google Patents

ベクトルネットワークアナライザを用いた反射係数の測定方法 Download PDF

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JP7153309B2
JP7153309B2 JP2018107017A JP2018107017A JP7153309B2 JP 7153309 B2 JP7153309 B2 JP 7153309B2 JP 2018107017 A JP2018107017 A JP 2018107017A JP 2018107017 A JP2018107017 A JP 2018107017A JP 7153309 B2 JP7153309 B2 JP 7153309B2
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reflection coefficient
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JP2019211314A (ja
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諒子 岸川
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National Institute of Advanced Industrial Science and Technology AIST
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JP2018107017A 2018-06-04 2018-06-04 ベクトルネットワークアナライザを用いた反射係数の測定方法 Active JP7153309B2 (ja)

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CN111983431B (zh) * 2020-08-31 2022-11-15 中电科思仪科技股份有限公司 一种提高矢量网络分析仪端口反射系数模拟精度的方法
KR102898597B1 (ko) 2021-01-20 2025-12-10 삼성전자주식회사 반사 계수 검출을 위한 방법 및 장치
CN119044865B (zh) * 2024-09-02 2025-07-25 中国计量科学研究院 微波毫米波等效源反射系数的测量系统及方法

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US20040199350A1 (en) 2003-04-04 2004-10-07 Blackham David V. System and method for determining measurement errors of a testing device

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US4853613A (en) * 1987-10-27 1989-08-01 Martin Marietta Corporation Calibration method for apparatus evaluating microwave/millimeter wave circuits
WO2005101037A1 (ja) * 2004-04-02 2005-10-27 Murata Manufacturing Co., Ltd. 電子部品の高周波電気特性測定方法および装置
WO2006090550A1 (ja) * 2005-02-22 2006-08-31 Murata Manufacturing Co., Ltd. 伝送路材料の誘電率測定方法およびこの誘電率測定方法を用いた電子部品の電気特性測定方法
WO2007029495A1 (ja) * 2005-09-01 2007-03-15 Murata Manufacturing Co., Ltd. 被検体の散乱係数の測定方法および測定装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040199350A1 (en) 2003-04-04 2004-10-07 Blackham David V. System and method for determining measurement errors of a testing device

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Title
堀部雅弘, 信太正明, 小見山耕司，ＰＣ-７ 高周波同軸インピーダンスの標準供給，電子情報通信学会２００５年通信ソサイエティ大会講演論文集１

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