JP7110880B2 - Three-dimensional measuring device, three-dimensional measuring method, and program - Google Patents

Description

The present invention relates to a three-dimensional measuring device, a three-dimensional measuring method, and a program.

In recent years, research and development of a technology (digital archive) for scanning articles with high preservation value such as cultural properties, works of art, and crafts and saving their shapes and textures in the form of digital data has been advanced. The objects of the digital archive include a wide variety of items with different materials and shapes, such as paintings, sculptures, folding screens, wall paintings, and swords. Therefore, it is important to apply a scanning method suitable for the characteristics of the object to faithfully reproduce the expression peculiar to the object.

Non-contact three-dimensional measurement, for example, is used as a technique for scanning the shape of an object. In non-contact 3D measurement, a pattern is projected onto an object using a projector or the like, and the pattern that changes according to the unevenness of the object is captured by multiple cameras. It is a technique to measure.

Non-contact three-dimensional measurement uses, for example, a three-dimensional measuring device that includes a projector that projects a pattern, two cameras, and two laser pointers that are used to align an object (Patent Document 1). The two laser pointers are fixed so that the laser irradiation directions match the optical axes of the two cameras. Therefore, the measurer can place the object in the measurement area by placing the object at the position where the laser pointers intersect.

Japanese Patent Application Laid-Open No. 2018-48860

The positioning mechanism using the laser pointer described above is effective for a flat object having a certain size and no fine irregularities. However, when performing non-contact three-dimensional measurement of an object having a detailed and complicated three-dimensional shape, it is difficult to align the intersection of two laser pointers with a small area.

Also, objects are often restricted from being directly touched or moved in order to avoid the risk of damage or soiling. Therefore, it is necessary to adjust the position and orientation of the three-dimensional measuring device without moving the object to align the intersection of the two laser pointers in a small area, which makes the positioning more difficult.

Therefore, according to one aspect of the present invention, it is an object of the present invention to provide a three-dimensional measuring apparatus, a three-dimensional measuring method, and a program that facilitate placement of an object in a measurement area.

According to one aspect of the present invention, a pattern projection unit that projects a measurement pattern onto an object, first and second imaging units that photograph the object on which the measurement pattern is projected, and a first imaging unit. a first projector capable of projecting a two-dimensional pattern in the optical axis direction of the second imaging unit; a second projector capable of projecting a two-dimensional pattern in the optical axis direction of the second imaging unit; a control unit that projects one two-dimensional pattern and controls a second projector to project a second two-dimensional pattern, wherein the first two-dimensional pattern is the first point or the first point The second two-dimensional pattern includes at least a portion of a first figure having a shape symmetrical about a line through the second point or a second figure having a shape symmetrical about a line passing through the second point The control unit controls the first projector so that the first point and the optical axis direction of the first imaging unit are aligned, and the second point and the second imaging unit A three-dimensional measuring device is provided that controls the second projector so that the second projector is aligned with the optical axis direction.

Further, according to another aspect of the present invention, the computer controls the first projector capable of projecting a two-dimensional pattern in the optical axis direction of the first imaging unit to obtain the first point or the first A first two-dimensional pattern including at least a portion of a first graphic having a shape symmetrical about a straight line passing through the points is projected such that the first points are aligned with the optical axis direction of the first imaging unit. , controlling a second projector capable of projecting a two-dimensional pattern in the direction of the optical axis of the second image pickup unit to create a second graphic having a shape symmetrical about the second point or a straight line passing through the second point; A second two-dimensional pattern including at least a part is projected so that the second point is aligned with the optical axis direction of the second imaging unit, and the first two-dimensional pattern and the second two-dimensional pattern are projected. After the projection is stopped, the measurement pattern is projected toward the object, the object onto which the measurement pattern is projected is photographed by controlling the first imaging unit and the second imaging unit, and the photographed data of the object is obtained. A three-dimensional measurement method is provided that performs a process of measuring the shape of an object from

Further, according to still another aspect of the present invention, the computer controls the first projector capable of projecting a two-dimensional pattern in the optical axis direction of the first imaging unit, and the first point or the first projecting a first two-dimensional pattern including at least a portion of a first graphic having a shape symmetrical about a straight line passing through the point so that the first point and the optical axis direction of the first imaging unit are aligned and controlling a second projector capable of projecting a two-dimensional pattern in the direction of the optical axis of the second imaging unit to obtain a second figure having a shape symmetrical about the second point or a straight line passing through the second point. A second two-dimensional pattern including at least part of is projected so that the second point and the optical axis direction of the second imaging unit are aligned, and the first two-dimensional pattern and the second two-dimensional pattern After stopping the projection, the measurement pattern is projected toward the object, and the object on which the measurement pattern is projected is photographed by controlling the first imaging unit and the second imaging unit, and the object is photographed. A program is provided for executing a process of measuring the shape of an object from data. Also, a computer-readable non-transitory recording medium in which the program is recorded can be provided.

According to the present invention, it becomes easy to arrange the object in the measurement area.

1 is a schematic diagram showing a configuration example of a three-dimensional measuring device; FIG. 2 is a block diagram showing a configuration example of hardware capable of realizing functions of a control device; FIG. 3 is a block diagram showing an example of functions of a control device; FIG. FIG. 4 is a first diagram for explaining positioning of the three-dimensional measuring device; FIG. 10 is a second diagram for explaining positioning of the three-dimensional measuring device; 4 is a chart showing an example of lens information; FIG. 10 is a first diagram showing an example of guide patterns; FIG. FIG. 11 is a second diagram showing an example of guide patterns; FIG. 4 is a flow chart showing the flow of processing executed by the control device; FIG.

EMBODIMENT OF THE INVENTION Embodiment (henceforth this embodiment) of this invention is described, referring an accompanying drawing below. Elements having substantially the same functions in the present specification and drawings may be denoted by the same reference numerals, thereby omitting redundant description.

In this embodiment, three-dimensional measurement is performed by projecting a pattern for measurement onto a three-dimensional object, photographing the object with a plurality of imaging devices, and measuring the three-dimensional shape of the object based on the photographed images. Regarding the device. When handling an object such as a cultural property, in order to avoid the risk of damage to the object, the three-dimensional measuring device is moved to guide the object to the measurement area.

A conventional three-dimensional measurement apparatus displays the optical axis direction of each imaging device with a light spot of a laser pointer, and uses the position where the light spots overlap as an index of the measurement area. In an environment where the three-dimensional measuring device is fixed and the object can be moved freely, it is relatively easy to find the position where the light spots overlap. However, when the three-dimensional measuring device is moved, the light spot is often lost, and it takes a considerable amount of time to superimpose a plurality of light spots on one point.

At sites where objects such as cultural properties are handled, measurements are often performed in the environment where the object is installed, and there are many situations where it is difficult to move freely with a three-dimensional measuring device. In addition, it is difficult to superimpose a plurality of light spots on such a fine portion because the measurement may be performed with a focus on a fine portion such as a fingertip of a statue. In particular, it is very difficult to overlap the light spots in a small (thin) portion and a thin portion.

An object of the present embodiment is to provide a three-dimensional measurement apparatus that solves the problems that may occur at the site of three-dimensional measurement as described above. The three-dimensional measuring apparatus according to the present embodiment and the flow of processing executed by the three-dimensional measuring apparatus will be sequentially described below.

[1. Three-dimensional measuring device]
A three-dimensional measuring apparatus 100 will be described with reference to FIG. FIG. 1 is a schematic diagram showing a configuration example of a three-dimensional measuring device. A three-dimensional measuring apparatus 100 shown in FIG. 1 is an example of a three-dimensional measuring apparatus according to this embodiment.

As shown in FIG. 1, the three-dimensional measuring apparatus 100 has a pattern projector 101, imaging devices 102a and 103a, laser projectors 102b and 103b, and a control device 105. FIG. Note that the imaging device 102a and the laser projector 102b may be formed integrally. The imaging device 103a and the laser projector 103b may be formed integrally. The controller 105 may be formed integrally with the pattern projector 101 .

The pattern projector 101 and imaging device 102a are physically connected by a support member 104a. The pattern projector 101 and imaging device 103a are physically connected by a support member 104b.

The control device 105 is electrically connected to each of the pattern projector 101, imaging devices 102a and 103a, and laser projectors 102b and 103b. However, the control device 105 uses a wireless technology such as a wireless LAN (Local Area Network) or short-range wireless communication to establish wireless communication with the pattern projector 101, imaging devices 102a and 103a, and laser projectors 102b and 103b. may be connected.

A pattern projector 101 is a projector for projecting a measurement pattern onto an object. The measurement pattern is any pattern that can be used for three-dimensional measurement, such as a zebra pattern, a grid pattern, or a checkerboard pattern. Projectors that can be used as the pattern projector 101 include, for example, liquid crystal projectors, DLP (Digital Light Processing) projectors, and LCOS (Liquid Crystal On Silicon) projectors.

However, the types of measurement patterns and the types of projectors that can be used as the pattern projector 101 are not limited to the above examples. For example, a laser projector that uses laser light as a light source may be used as the pattern projector 101 . For convenience of explanation, the angle of view of the pattern projector 101 may be indicated as t1 below.

The imaging devices 102a and 103a are, for example, digital cameras having lenses, imaging elements, processors (eg, CPU (Central Processing Unit), DSP (Digital Signal Processor)), and the like. The imaging devices 102a and 103a are equipped with lenses having the same focal length and brightness. The type of lens is determined according to the type of object or the purpose of measurement. The imaging devices 102a and 103a may be lens-interchangeable digital cameras. Lens information (focal length, maximum F-number, etc.) can be provided to the control device 105 from the imaging devices 102a and 103a.

For convenience of explanation, the imaging angle of view of the imaging device 102a may be denoted as t2, and the optical axis direction as L2. Also, the imaging angle of view of the imaging device 103a may be denoted as t3, and the optical axis direction as L3. In some cases, the focus range of the imaging device 102a is denoted as D2, and the focus range of the imaging device 103a is denoted as D3. Note that the in-focus range referred to here refers to a range in the depth direction (the direction toward the subject along the optical axis) within the depth of field.

The laser projectors 102b and 103b are laser beam scanning projectors that use laser beams as light sources. A laser beam scanning projector is a type of projector that displays a two-dimensional pattern on a screen by scanning the screen with a laser beam two-dimensionally at high speed. The color of the laser light output from the laser projector 102b may be the same as or different from the color of the laser light output from the laser projector 103b.

The orientation of the laser projector 102b is set with reference to the optical axis direction of the imaging device 102a. For example, the laser projector 102b is arranged so as to render a two-dimensional pattern by regarding a plane perpendicular to the optical axis direction of the imaging device 102a as a screen. The orientation of the laser projector 103b is set with reference to the optical axis direction of the imaging device 103a. For example, the laser projector 103b is arranged so as to render a two-dimensional pattern by regarding a plane perpendicular to the optical axis direction of the imaging device 103a as a screen.

Here, the arrangement of the measurement area and the object will be described with reference to FIG. As an example, FIG. 1 schematically shows a measurement area 10 (an area surrounded by a thick line) and an object 20a. The measurement area 10 is mainly determined by the optical axis directions L2 and L3, the imaging angles of view t2 and t3, and the focusing ranges D2 and D3. However, since the portion of the object 20a on which the measurement pattern is projected is photographed, strictly speaking, it also depends on the angle of view t1 of the pattern projector 101 that determines the range on which the measurement pattern is projected.

Therefore, the three-dimensional measurement apparatus 100 is operated so that the object 20a is arranged in the measurement area 10 determined from the optical axis directions L2 and L3, the imaging angles of view t2 and t3, the focusing ranges D2 and D3, and the angle of view t1. If the position can be moved, desired measurement results can be expected. However, the measurement area 10 is invisible. Therefore, the three-dimensional measuring apparatus 100 draws two two-dimensional patterns using the laser projectors 102b and 103b, and moves the three-dimensional measuring apparatus 100 so that the object 20a fits within the measurement area 10 (hereinafter referred to as , positioning).

Operations of the pattern projector 101 , imaging devices 102 a and 103 a , and laser projectors 102 b and 103 b are controlled by a control device 105 . Hereinafter, the control device 105 will be explained, and in the explanation, the reason why the two-dimensional pattern drawing using the laser projectors 102b and 103b is effective for positioning will be explained in detail.

(controller hardware)
First, the hardware of the control device 105 will be described with reference to FIG. FIG. 2 is a block diagram showing a configuration example of hardware capable of realizing the functions of the control device.

The functions of the control device 105 can be implemented using, for example, the hardware resources shown in FIG. That is, the functions of the control device 105 are realized by controlling the hardware shown in FIG. 2 using a computer program.

As shown in FIG. 2, this hardware mainly has a processor 105a, a memory 105b, a display I/F (Interface) 105c, a communication I/F 105d, and a connection I/F 105e.

The processor 105a is, for example, a CPU, DSP, ASIC (Application Specific Integrated Circuit), FPGA (Field Programmable Gate Array), or the like. The memory 105b is, for example, a storage device such as ROM (Read Only Memory), RAM (Random Access Memory), HDD (Hard Disk Drive), SSD (Solid State Drive), and flash memory.

The display I/F 105c is an interface for connecting display devices such as LCD (Liquid Crystal Display) and ELD (Electro-Luminescence Display). For example, the display I/F 105c performs display control by a GPU (Graphic Processing Unit) mounted on the processor 105a and/or the display I/F 105c. Note that the control device 105 may be equipped with a display device.

The communication I/F 105d is an interface for connecting to a wired and/or wireless network. The communication I/F 105d is connected to, for example, a wired LAN, a wireless LAN, an optical communication network, a mobile phone network, and the like.

The connection I/F 105e is an interface for connecting external devices. The connection I/F 105e is, for example, a USB (Universal Serial Bus) port, IEEE1394 port, SCSI (Small Computer System Interface), or the like.

An input interface such as a keyboard, mouse, touch panel, or touch pad can be connected to the connection I/F 105e. Also, an audio device such as a speaker and/or a printer can be connected to the connection I/F 105e. A portable recording medium 105f can be connected to the connection I/F 105e. The recording medium 105f is, for example, a magnetic recording medium, an optical disk, a magneto-optical disk, a semiconductor memory, or the like.

The processor 105a described above can read the program stored in the recording medium 105f, store it in the memory 105b, and control the operation of the control device 105 according to the program read from the memory 105b. A program for controlling the operation of the control device 105 may be stored in advance in the memory 105b, or may be downloaded from the network via the communication I/F 105d.

(Function of control device)
Next, the functions of the control device 105 will be further described with reference to FIG. FIG. 3 is a block diagram showing an example of functions of the control device.

As shown in FIG. 3 , the control device 105 has a storage unit 151 , a guide pattern drawing control unit 152 , a measurement pattern projection control unit 153 and a measurement unit 154 .

Note that the function of the storage unit 151 can be realized using the memory 105b or the like described above. The functions of the guide pattern drawing control unit 152, the measurement pattern projection control unit 153, and the measurement unit 154 can be realized using the processor 105a.

The storage unit 151 stores guide pattern information 151a, measurement pattern information 151b, and lens information 151c.

The guide pattern information 151a is information about the shape of a two-dimensional pattern (hereinafter referred to as a guide pattern) drawn by the laser projectors 102b and 103b for positioning. The shape of the guide pattern will be detailed later (description of FIGS. 7 and 8). The measurement pattern information 151b is information about the shape of the measurement pattern. The lens information 151c is information (focal length, open F-number, etc.) about the lenses attached to the imaging devices 102a and 103a.

The guide pattern drawing control unit 152 selects a first guide pattern to be drawn by the laser projector 102b and a second guide pattern to be drawn by the laser projector 103b among at least one guide pattern included in the guide pattern information 151a. Identify. For example, the first guide pattern and the second guide pattern are preset by a measurer who performs positioning or when the three-dimensional measuring apparatus 100 is manufactured. The first guide pattern and the second guide pattern may be the same guide pattern, or may be different guide patterns.

The guide pattern drawing control unit 152 selects the color of the laser light for drawing the first guide pattern (hereinafter referred to as the first color) and the color of the laser light for drawing the second guide pattern (hereinafter referred to as the second color). 2 colors). The first color and the second color may be the same color or different colors. However, if the colors of laser light that can be output from each of the laser projectors 102b and 103b are determined, the guide pattern drawing control unit 152 omits the process of specifying the first color and the second color.

The guide pattern drawing control unit 152 controls the laser projector 102b to draw a first guide pattern with a first color laser beam. The guide pattern drawing control unit 152 draws a first guide pattern assuming a plane (hereinafter referred to as a first virtual screen) perpendicular to the optical axis direction L2 of the imaging device 102a. That is, if there is an actual screen at the position of the first virtual screen, the laser projector 102b draws the first guide pattern so that the first guide pattern is displayed on that screen.

The guide pattern drawing control unit 152 also controls the laser projector 103b to draw a second guide pattern with a second color laser beam. The guide pattern drawing control unit 152 draws a second guide pattern assuming a plane perpendicular to the optical axis direction L3 of the imaging device 103a (hereinafter referred to as a second virtual screen). That is, if there is an actual screen at the position of the second virtual screen, the second guide pattern is drawn by the laser projector 103b so that the second guide pattern is displayed on that screen.

When the imaging devices 102a and 103a are lens-interchangeable digital cameras, the guide pattern drawing control unit 152 specifies the imaging angles of view t2 and t3 of the imaging devices 102a and 103a based on the lens information 151c. At this time, the guide pattern drawing control unit 152 may specify the vertical angle of view and the horizontal angle of view as the imaging angles of view t2 and t3.

The guide pattern drawing control unit 152 also adjusts the size of the first guide pattern based on the imaging angle of view t2 so that the outermost portion of the first guide pattern fits within the imaging angle of view t2. The guide pattern drawing control unit 152 also adjusts the size of the second guide pattern based on the imaging angle of view t3 so that the outermost portion of the second guide pattern fits within the imaging angle of view t3. Then, the guide pattern drawing control unit 152 draws the first guide pattern and the second guide pattern by the method described above.

The first guide pattern and the second guide pattern are drawn simultaneously and continuously. During the period in which the first guide pattern and the second guide pattern are drawn, the pattern for measurement is not projected by the pattern projector 101 and photographed by the imaging devices 102a and 103a. When an operation to stop drawing the guide pattern is executed, the guide pattern drawing control unit 152 stops the outputs of the laser projectors 102b and 103b.

The measurement pattern projection control unit 153 acquires image data representing the shape of the measurement pattern from the measurement pattern information 151b. Then, the measurement pattern projection control unit 153 inputs the image data to the pattern projector 101, and the pattern projector 101 projects the measurement pattern onto the object. The measurement unit 154 controls the imaging devices 102a and 103a to photograph the object, and measures the three-dimensional shape of the object based on the photographed image.

(Positioning)
Here, positioning of the three-dimensional measuring apparatus 100 will be further described with reference to FIGS. 4 and 5. FIG. FIG. 4 is a first diagram for explaining positioning of the three-dimensional measuring device. FIG. 5 is a second diagram for explaining positioning of the three-dimensional measuring device.

The difficulty of moving the three-dimensional measuring device 100 to fit the object within the measurement area 10 depends on the distance between the three-dimensional measuring device 100 and the object, and the tilt of the three-dimensional measuring device 100 (especially when rotating around the Z axis). It is difficult for the measurer to appropriately control the direction of rotation with respect to the axis.

As shown in FIG. 4, when the three-dimensional measuring device 100 is brought too close to the object 20b (time T1), the optical axes of the imaging devices 102a and 103a do not intersect the object 20b. Also when the three-dimensional measuring device 100 is moved too far from the object 20b (time T2), the optical axes of the imaging devices 102a and 103a do not intersect the object 20b. In the conventional method of pointing only in the direction of the optical axis with a laser pointer, the measurer loses sight of the light spot in these situations.

If the distance between the three-dimensional measuring device 100 and the object 20b is appropriate (time T3), the optical axes of the imaging devices 102a and 103a intersect at the object 20b. When the three-dimensional measuring device 100 tilts in the direction of rotation about the Y axis, the optical axis tilts in the +Z direction or the -Z direction. When the width (height) of the object 20b in the Z direction is small, the tilt in the Z direction may prevent the optical axis from intersecting the object 20b. In this case as well, the measurer loses sight of the light spot in the conventional method of pointing only in the direction of the optical axis with a laser pointer.

However, as shown in FIG. 5, the three-dimensional measuring apparatus 100 according to this embodiment draws two-dimensional patterns 121 and 131 using laser projectors 102b and 103b. In the example of FIG. 5, a two-dimensional pattern formed by two straight lines intersecting the cross and a rectangular frame surrounding the cross is illustrated, but the shape of the two-dimensional pattern is not limited to this. The two-dimensional pattern 121 is an example of a figure drawn by the laser projector 102b. The two-dimensional pattern 131 is an example of a figure drawn by the laser projector 103b.

As shown in FIG. 4, the optical axis does not intersect the object 20b at time T1, but as shown in FIG. Also, the measurer can recognize that the three-dimensional measuring apparatus 100 and the object 20b are too close from the sizes of the two-dimensional patterns 121 and 131 drawn on the object 20b. In other words, it is possible to recognize whether some shapes are larger or smaller than the size of the shape displayed in the appropriate positional relationship, and based on that recognition, determine whether they are too close or too far away. can do.

Although the optical axis does not intersect the object 20b at time T2, part of the two-dimensional patterns 121 and 131 intersects the object 20b as shown in FIG. Since the size of the portion that intersects the target object 20b and the arrangement of the two-dimensional patterns 121 and 131 are reversed (if the two-dimensional pattern 121 is positioned appropriately, the two-dimensional pattern 121 is positioned on the right side of the paper surface), the three-dimensional measuring apparatus A measurer can recognize that 100 and the target object 20b are too far.

When the three-dimensional measuring apparatus 100 and the target object 20b are in an appropriate positional relationship to some extent (time T3), the two-dimensional patterns 121 and 131 substantially match as shown in FIG. At this time, the measurement person can grasp the tilt of the three-dimensional measuring apparatus 100 from the tilt of the two-dimensional patterns 121 and 131, the difference in size, the distortion of the shape, and the like. Therefore, the use of the two-dimensional patterns 121 and 131 facilitates fine adjustment of the three-dimensional measuring apparatus 100 including tilt. By applying the three-dimensional measuring device 100 according to this embodiment in this manner, positioning becomes much easier than with the conventional three-dimensional measuring device.

(lens information)
Next, the use of the lens information 151c will be further described with reference to FIG. FIG. 6 is a chart showing an example of lens information.

As shown in FIG. 6, the lens information 151c includes information such as the lens name, F-number, focusing range, and shooting angle of view. A lens name is an example of identification information used to identify a lens. The F-number is an index indicating the brightness of a lens, and is generally defined as a value obtained by dividing the focal length of the lens by the effective aperture. The F-number included in the lens information 151c may be the aperture-open F-number, but in the example of FIG. 6, it is the F-number (set value) corresponding to the aperture setting applied at the time of measurement.

The focus range indicates the range in which the imaging devices 102a and 103a are in focus. The focus range and depth of field can be calculated based on the distance to the subject, the focal length of the lens, the size of the imaging device, and the F-number. For example, if the distance to the subject is 2m, the focal length of the lens is 90mm, the size of the image sensor is full size (36mm x 24mm), and the F value is set to 5.6, the focusing range is about 1.9 to about 2. .1m, the depth of field is about 0.18m.

In the case of three-dimensional measurement, since it is necessary to capture the object clearly, a sufficient focusing range is set in the lens information 151c as an effective value.

The shooting angle of view can be calculated based on the focal length of the lens and the size of the image sensor. In general, the longer the focal length of the lens, the narrower the angle of view for photography, and the shorter the focal length of the lens, the wider the angle of view for photography. The larger the size of the imaging device, the wider the shooting angle of view, and the smaller the size of the imaging device, the narrower the shooting angle of view. Since the shape of a general image sensor is horizontally long, the shooting angle of view is: diagonal angle of view corresponding to the diagonal direction of the image sensor, horizontal angle of view corresponding to the horizontal direction (horizontal direction), and vertical direction (vertical direction). There is a vertical angle of view corresponding to

The three-dimensional measuring apparatus 100 (guide pattern drawing control unit 152) according to the present embodiment adjusts the shape of the guide pattern (such as the size of the outer frame) drawn by the laser projectors 102b and 103b to match the angle of view for shooting. . Therefore, the lens information 151c describes the horizontal angle of view and the vertical angle of view as the shooting angle of view.

The lens information 151c may be generated in advance based on the lens to be used and the F value set in advance, or may be generated by the guide pattern drawing control unit 152 when the lens is replaced. For example, the guide pattern drawing control unit 152 acquires lens information (focal length, etc.) from the imaging devices 102a and 103a, and sets the preset F value and distance to the object, and the known size of the imaging device. Based on this, the focal distance and the shooting angle of view are calculated.

Using the lens information 151c described above, the guide pattern drawing control unit 152 aligns the configuration part of the guide pattern drawn at the farthest position from the optical axis of the imaging device 102a or 103a with the end of the shooting angle of view, or It is possible to fit within the shooting angle of view.

For example, in the case of the two-dimensional pattern 121 shown in FIG. 5, the guide pattern drawing control unit 152 aligns the intersection of two straight lines that intersect at the center with the optical axis. In addition, the guide pattern drawing control unit 152 aligns two vertical lines (straight lines extending in the vertical direction of the imaging device) among the four straight lines forming the outer frame with the vertical angle of view, and adjusts the two horizontal lines (imaging A straight line extending in the lateral direction of the element) is aligned with the horizontal angle of view.

No. of the lens information 151c illustrated in FIG. 1 lens is attached to the imaging device 102a, the guide pattern drawing control unit 152 draws a vertical line passing through a position +11.25° from the optical axis in the horizontal direction and a vertical line passing through the position +11.25° from the optical axis in the horizontal direction. A vertical line is drawn through the position of °, a horizontal line is drawn vertically through the position of +7.5° from the optical axis, and a horizontal line is drawn through the position of -7.5° from the optical axis in the vertical direction. By adjusting the size of the guide pattern in accordance with the imaging angle of view in this manner, the measurement area 10 can be recognized from the guide pattern.

(Example of guide pattern)
In the above description, the two-dimensional patterns 121 and 131 in which two cross lines are combined in a rectangular outer frame are illustrated, but the shape of the guide pattern applicable to the three-dimensional measuring apparatus 100 according to the present embodiment is limited to this. not.

For example, guide patterns of various shapes as shown in FIGS. 7 and 8 can be applied. FIG. 7 is a first diagram showing an example of guide patterns. FIG. 8 is a second diagram showing an example of guide patterns. The figures shown in FIGS. 7 and 8 are merely examples, and combinations of these figures, partial figures cut out from these figures, combinations of these partial figures, or conceived from these figures. The application of arbitrary graphics also belongs to the technical scope of this embodiment.

First, refer to FIG. Of the fifteen figures shown in FIG. 7, figure #01 is a circle. Figure #01 can be transformed into an ellipse. For example, when the guide pattern is an ellipse, the guide pattern drawing control unit 152 sets the long axis according to the horizontal angle of view, sets the short axis according to the vertical angle of view, and sets the intersection point of the long axis and the short axis. is aligned with the optical axis. Graphic #02 is part of graphic #01. A circle or an ellipse is a shape symmetrical about the center or a straight line (major axis, minor axis) passing through the center. Therefore, the position of the center can be easily guessed from the partial shape.

A figure #3 is a figure in which a plurality of figures having the same shape as the figure #01 but different sizes are arranged with their centers aligned. FIG. 7 shows an example in which two circles are arranged concentrically, but as a modification of figure #03, a figure in which three or more circles are arranged concentrically, or a figure in which two or more circles are arranged There is a figure in which ellipses of are arranged concentrically. In addition, a figure obtained by combining a circle and an ellipse, and a combination of partial figures such as figure #02 are also included in the modified examples of figure #03.

A figure #04 is a figure obtained by combining the figure #01 and the center point. A modified example of the figure #4 is a figure combining the figure #02 or the figure #03 with the center point. A graphic #05 is a graphic in which the solid line of the graphic #01 is represented by a chain line or a dotted line. As a modified example of the figure #05, there is a figure represented by a line type different from the solid line, such as a one-dot chain line and a two-dot chain line. As with the figure #06, the representation of the figure #05 may be applied to the figures #01 to #04 and their modifications.

A figure #07 is a so-called "square square" figure including a rectangular frame drawn with four straight lines and two straight lines perpendicular to each other at the center. Modified examples of the graphic #07 include a graphic whose frame line is a vertically or horizontally long rectangle, and a rhombic graphic whose entire frame or frame is rotated by 45°. Also included in the modified examples of figure #07 is a figure in which two straight lines perpendicular to each other at the center do not touch the frame line, or a figure in which the two straight lines intersect the frame line.

A figure #08 is a figure formed by two straight lines that are perpendicular to each other at the center. The length of the two straight lines may be the same or different. When the figure #08 is applied, the guide pattern drawing control unit 152 adjusts the length of the horizontal line according to the horizontal angle of view, and adjusts the length of the vertical line according to the vertical angle of view. That is, the guide pattern drawing control unit 152 sets the farthest point on the figure from the center based on the horizontal angle of view and the vertical angle of view.

Graphic #09 is a graphic corresponding to the frame line of graphic #07. As a modified example of the figure #09, there is a figure in which the figure #09 and the center point are combined like the figure #4. Also, like figure #03, a figure combining a plurality of rectangles with different sizes so that their centers are aligned, and like figure #02, parts corresponding to the first and third quadrants of figure #09 are cut out. The figure #09 is also included in the modified example of figure #09.

Graphic #10 is a graphic obtained by rotating graphic #08 by 45 degrees. The length of the two straight lines may be the same or different. When applying figure #10, the guide pattern drawing control unit 152 sets the positions of the endpoints of the two straight lines according to the horizontal angle of view or the vertical angle of view. As a modified example of figure #10, there is a figure in which two straight lines are set not to intersect each other at the center, but to intersect at an angle corresponding to the angle of view for photographing. For example, the guide pattern drawing control unit 152 can set two diagonal lines connecting the vertices of a rectangle that matches the horizontal angle of view and the vertical angle of view.

A figure #11 is a figure formed by three or more straight lines intersecting at the center. A graphic #12 is a graphic in which dots (points or small diameter circles expressed by the spread of laser light) are displayed at the vertices of each line forming the graphic #11. The length of each line forming figure #11 is set, for example, to a length that makes contact with the inner side of a circle or ellipse (figure #01 and its modification) centered at the intersection of each line. A graphic #13 is a graphic in which dots are displayed at the vertices and the center of each line forming the graphic #08.

A graphic #14 is a graphic obtained by cutting out a part of the graphic #03. A figure #14 is, for example, a figure obtained by cutting the figure #03 along the line of the figure #10 and removing four curves located above and below the center. A graphic #15 is a mesh-like graphic formed by a plurality of straight lines having a length that fits within the frame of the graphic #09. As a modified example of the figure #09, there is a mesh figure formed so as to fit within the frame of the figure #01.

Reference is now made to FIG. FIG. 8 shows nine graphics #16-#24. First, attention is paid to figures #16 to #21. All of the figures #16 to #21 include figures pointing upward or downward along the vertical direction (hereinafter referred to as indicator figures). For example, figure #16 includes a triangle with one vertex pointing vertically upward as an indicator figure.

As already described with reference to FIG. 5, when aligning the three-dimensional measuring apparatus 100, the measurer determines the distance between the object and the three-dimensional measuring apparatus 100 and the inclination of the three-dimensional measuring apparatus 100. (rotation in the YZ plane). At this time, if the figure #16 shown in FIG. 8 is applied, by looking at the inclination of the triangle pointing vertically upward, the measurer can determine whether the three-dimensional measuring apparatus 100 is inclined to the right or to the left. It becomes possible to easily grasp whether there is This allows the measurer to easily adjust the tilt of the three-dimensional measuring device 100 .

Graphic #17 includes a triangle with one vertex pointing vertically downward as an indicator graphic. Similarly, when the figure #17 is employed as the guide pattern, the measurer can easily grasp the tilt direction of the three-dimensional measuring apparatus 100 from the tilt of the triangle pointing vertically downward, and can easily adjust the tilt. . In the figures #16 and #17, a triangle is used as an indicator for direction indication, but it is also possible to use, for example, a semi-cylindrical figure with a rounded tip as an indicator for direction indication, such as figures #18 and #19. .

Figures #16 to #18 are figures in which the rectangle of the outer frame is combined with a triangular or kamaboko-shaped figure. is. Also, a modification is possible in which an arrow is used as an index for indicating a direction instead of the triangle. In addition, the triangle, the semi-cylindrical figure, the arrow, and the directional indicators obtained by transforming them may not be in contact with the rectangle of the outer frame. In addition, the graphics #16 to #21 and their modified graphics serving as indicators for direction indication may be combined with at least a part of each of the graphics shown in FIG.

Next, focusing on figures #22 to #24 shown in FIG. 8, a suitable figure setting method when using a figure formed of a plurality of line segments as a guide pattern will be described. A graphic including line segments can be generated by cutting out a part of the graphic described above or by combining a plurality of line segments.

For example, figure #22 has two vertically extending line segments and an oblique line segment connecting the lower end of the line segment on the left side and the upper end of the line segment on the right side. When two line segments are drawn as the guide pattern, the measurer can recognize the range in which the reference points corresponding to the optical axis direction exist. Also, depending on whether the width of the two line segments is wide or narrow, the measurer can recognize whether the distance between the object and the three-dimensional measuring apparatus 100 is long or short. Therefore, although it makes sense to use only two line segments, the oblique line segment in the guide pattern makes it easier for the measurer to guess the position of the reference point from the guide pattern.

In the case of figure #22, the two line segments are arranged symmetrically with respect to a vertical straight line (chain line) passing through the reference point. Also, the oblique line segment is set so as to pass through the reference point. Therefore, the measurer guesses a straight line (straight line corresponding to the vertical dashed line) located between the two line segments and parallel to the two line segments, and the intersection of the straight line and the diagonal line segment is used as the reference. can be inferred as a point. In the case of the figure #22, the intersection of the two line segments and the oblique line segment serves as an indication index in the vertical direction.

Also, when a part of a figure having symmetry with respect to the reference point or a straight line passing through the reference point is cut out like figures #23 and #24 (Figures #23 and #24 are cut out from figure #09), By cutting out a plurality of elements located opposite to each other with the reference point interposed therebetween, the measurer can easily guess the position of the reference point. In other words, if there is a group of elements that are symmetrical about one straight line (e.g., a horizontal chain line) passing through the reference point and a group of elements that are symmetrical about another straight line (e.g., a vertical chain line), the measurer can and the intersection point (reference point) of those straight lines can be estimated. At this time, the two straight lines need only intersect and do not have to be orthogonal.

So far, the shapes of the guide patterns have been described using the figures #01 to #24 as an example. naturally belong to the technical scope of this embodiment. For example, it is possible to transform a figure represented by a straight line or a line segment in the above description into a figure represented by a set of points. For example, the set of points including the vertices of the four line segments shown in graphic #24 is a modified example of graphic #24.

[2. Processing flow]
Next, the flow of processing executed by the control device 105 will be described with reference to FIG. FIG. 9 is a flowchart showing the flow of processing executed by the control device.

(S101) The guide pattern drawing control unit 152 refers to the lens information 151c and acquires the shooting angle of view of the corresponding lens. Note that the guide pattern drawing control unit 152 may calculate the imaging angle of view based on lens information acquired from the lenses via the imaging devices 102a and 103a.

(S102) The guide pattern drawing control unit 152 refers to the guide pattern information 151a and determines the first guide pattern to be drawn by the laser projector 102b and the second guide pattern to be drawn by the laser projector 103b. The first guide pattern and the second guide pattern may be different guide patterns. Also, the first guide pattern and the second guide pattern may be set as fixed values in advance, or may be set by the measurer at the time of measurement.

(S103) The guide pattern drawing control unit 152 determines the representation method of the first guide pattern and the second guide pattern. If the first guide pattern and the second guide pattern are expressed differently, the line of interest in the portion where the first guide pattern and the second guide pattern overlap is a part of any of the guide patterns. This makes it easier for the measurer to recognize the presence. Expression methods include, for example, color, blinking, line thickness, and the like.

For example, the guide pattern drawing control unit 152 controls the color of the laser light output from the laser projector 102b (hereinafter referred to as the first color) and the color of the laser light output from the laser projector 103b (hereinafter referred to as the second color). to determine. The first color and the second color may be the same or different. Also, the first color and the second color may be set as fixed values in advance, or may be set by the measurer at the time of measurement.

Also, the guide pattern drawing control unit 152 determines whether or not to blink the first guide pattern or the second guide pattern. For example, even if the first color and the second color are the same, if one of the guide patterns blinks at regular intervals (for example, disappears for 0.5 seconds every second), the line of interest However, it becomes easier for the measurer to recognize which guide pattern it is part of. The presence or absence of blinking may be set as a fixed value in advance, or may be set by the measurer at the time of measurement.

Further, the guide pattern drawing control unit 152 determines whether or not to change the thickness of the line between the first guide pattern and the second guide pattern. For example, even if the first color and the second color are the same and the guide pattern does not blink, if the thickness of the line is different, it is possible to determine which guide pattern the focused line is part of. becomes easier for the measurer to recognize. Whether or not to change the thickness of the line may be set as a fixed value in advance, or may be set by the measurer at the time of measurement.

Whether or not the above-described expression method can be applied depends on the functions of the laser projectors 102b and 103b, so an applicable expression method can be selected according to the mode of implementation. Further, the process of S103 may be omitted if the specification outputs different colors of laser light depending on the type of the laser light source mounted on the laser projectors 102b and 103b.

(S104) The guide pattern drawing control unit 152 controls the laser projector 102b to draw the first guide pattern, and controls the laser projector 103b to draw the second guide pattern. At this time, the guide pattern drawing control unit 152 adjusts the drawing sizes of the first guide pattern and the second guide pattern according to the shooting angle of view (horizontal angle of view, vertical angle of view) acquired from the lens information 151c.

(S105) The guide pattern drawing control unit 152 determines whether or not the positioning of the three-dimensional measuring device 100 has been completed. For example, when the measurer performs an operation to complete positioning, or when the measurer performs an operation to start measurement, the guide pattern drawing control unit 152 determines that the positioning has been completed. If the positioning is completed, the process proceeds to S106. On the other hand, if the positioning is not completed, the process proceeds to S104 to continue drawing the guide pattern.

(S106) The guide pattern drawing control unit 152 controls the laser projectors 102b and 103b to stop outputting the laser light, and finishes drawing the guide pattern. Further, the guide pattern drawing control unit 152 notifies the measurement pattern projection control unit 153 of completion of positioning.

(S107) The measurement pattern projection control unit 153 acquires the image data of the measurement pattern from the measurement pattern information 151b. The measurement pattern projection control unit 153 also inputs the acquired image data to the pattern projector 101 to project the measurement pattern. The measurement pattern projection control unit 153 notifies the measurement unit 154 to start projecting the measurement pattern.

(S108) The measurement unit 154 controls the imaging devices 102a and 103a to capture an image of the object on which the measurement pattern is projected. The measurement unit 154 also acquires imaging data output from the imaging devices 102a and 103a, and performs three-dimensional measurement of the object based on the acquired imaging data.

(S109) The measurement unit 154 determines whether to continue measurement.

For example, when the measurer moves the three-dimensional measuring apparatus 100 to measure an object from a different angle, or when continuing the three-dimensional measurement from a different position, the measuring unit 154 operates (guides) the measurer. It is determined to continue the measurement according to the pattern re-display operation, etc.). In this case, the measurement unit 154 notifies the measurement pattern projection control unit 153 and the guide pattern drawing control unit 152 to continue the measurement. The measurement pattern projection control unit 153 stops projecting the measurement pattern in response to this notification. Also, the process proceeds to S104.

On the other hand, when the three-dimensional measurement work of a certain object is completed and the measurer finishes the measurement, the measuring unit 154 does not continue the measurement according to the measurer's operation (such as turning off the power of the three-dimensional measuring apparatus 100). I judge. In this case, the measurement unit 154 notifies the measurement pattern projection control unit 153 of the end of measurement. The measurement pattern projection control unit 153 terminates projection of the measurement pattern in response to this notification. Then, the series of processes shown in FIG. 9 ends.

As described above, by displaying a visible guide pattern that spreads two-dimensionally with respect to the object, it is less likely that the measurer will lose sight of the guide pattern. In addition, the size of the guide pattern allows the measurer to easily estimate the distance between the three-dimensional measuring device 100 and the object, which facilitates the position adjustment of the three-dimensional measuring device 100 . In addition, it becomes easy to estimate the tilt of the three-dimensional measuring device 100 from the tilt of the guide pattern, and it becomes easy to adjust the tilt of the three-dimensional measuring device 100 . As a result, the measurer can efficiently move the three-dimensional measuring device 100 and easily introduce the object into a suitable shooting range. It is particularly effective to visually display the guide pattern as described above when targeting a small-sized object, a thin object, an object with complicated irregularities, or a part of them.

Although the preferred embodiments of the present invention have been described above with reference to the accompanying drawings, the present invention is not limited to such examples. It is obvious that a person skilled in the art can conceive of various modifications or modifications within the scope described in the claims, which naturally belong to the technical scope of the present invention.

For example, in the above description, a laser beam scanning projector was used as a means for displaying a guide pattern, but any light source other than a laser beam scanning projector can be used. As means for displaying the guide pattern, for example, it is possible to apply a projector of a type that projects an image using a liquid crystal or a DMD (Digital Mirror Device). When applying this type of projector, by focusing on the vicinity of the position where the optical axes of the imaging devices 102a and 103a intersect, it can be used in the same manner as a laser beam scanning projector. However, by using a light source capable of outputting light with a narrow line width and high straightness, such as a laser beam, there is an advantage that the trouble of focusing can be omitted.

Further, in the above description, it is assumed that the imaging devices 102a and 103a are equipped with single focus lenses, but the imaging devices 102a and 103a may be equipped with zoom lenses. Even when a zoom lens is applied, if the focal length used for measurement is set, the focusing range and the shooting angle of view can be calculated in the same way as when applying a single focal length lens. control based on information 151c) can be similarly applied.

These modifications also naturally belong to the technical scope of the present embodiment.

10 measurement regions 20a, 20b object 100 three-dimensional measuring device 101 pattern projector 102a, 103a imaging device 102b, 103b laser projector 104a, 104b support member 105 control device 121, 131 two-dimensional pattern 151 storage unit 151a guide pattern information 151b Measurement pattern information 151c Lens information 152 Guide pattern drawing control unit 153 Measurement pattern projection control unit 154 Measurement unit

Claims (11)

a pattern projection unit that projects a measurement pattern onto an object;
first and second imaging units that capture images of the object on which the measurement pattern is projected;
a first projector capable of projecting a two-dimensional pattern in the optical axis direction of the first imaging unit;
a second projector capable of projecting a two-dimensional pattern in the optical axis direction of the second imaging unit;
a control unit that controls the first projector to project a first two-dimensional pattern and controls the second projector to project a second two-dimensional pattern;
The first two-dimensional pattern includes at least part of a first figure having a symmetrical shape about a first point or a straight line passing through the first point,
the second two-dimensional pattern includes at least part of a second figure having a shape symmetrical about a second point or a straight line passing through the second point;
The control unit controls the first projector so that the first point and the optical axis direction of the first imaging unit are aligned, and controls the second point and the light from the second imaging unit. A three-dimensional measuring device that controls the second projector so that the axial direction of the projector and the axial direction of the projector coincide with each other. When the first figure includes a plurality of line segments arranged symmetrically about a first straight line passing through the first point, a second straight line intersecting the first straight line at the first point or having symmetry about said first point;
When the second figure includes a plurality of line segments arranged symmetrically about a third straight line passing through the second point, a fourth straight line intersecting the third straight line at the second point The three-dimensional measuring apparatus according to claim 1, further comprising a figure having symmetry of or having symmetry about said second point. The three-dimensional measuring device according to claim 1 or 2, wherein at least one of the first graphic and the second graphic includes one or more circles or ellipses. the first two-dimensional pattern includes a plurality of line segments that intersect at the first point;
the second two-dimensional pattern comprises a plurality of line segments intersecting at the second point; or
2. The first two-dimensional pattern includes a plurality of line segments that intersect at the first point, and the second two-dimensional pattern includes a plurality of line segments that intersect at the second point. 3. The three-dimensional measuring device according to any one of 1 to 3. The three-dimensional measuring device according to any one of claims 1 to 4, wherein the first two-dimensional pattern and the second two-dimensional pattern have different colors. The three-dimensional measuring device according to any one of claims 1 to 5, wherein the first two-dimensional pattern and the second two-dimensional pattern have different shapes. The three-dimensional measuring device according to any one of claims 1 to 6, wherein the first graphic and the second graphic have the same shape. further comprising a storage unit that stores information about the shooting angle of view of the lens used by the first and second imaging units;
The three-dimensional measurement according to any one of claims 1 to 7, wherein the control unit projects the first two-dimensional pattern and the second two-dimensional pattern in a size corresponding to the imaging angle of view of the lens. Device. The three-dimensional measuring apparatus according to any one of claims 1 to 8, wherein the first projector and the second projector are laser projectors that output laser light. the computer
Controlling a first projector capable of projecting a two-dimensional pattern in the direction of the optical axis of a first imaging unit to create a first graphic having a shape symmetrical about a first point or a straight line passing through the first point Projecting a first two-dimensional pattern including at least a portion such that the first point and the optical axis direction of the first imaging unit are aligned,
Controlling a second projector capable of projecting a two-dimensional pattern in the direction of the optical axis of the second imaging unit to create a second figure having a shape symmetrical about a second point or a straight line passing through the second point projecting a second two-dimensional pattern including at least a portion such that the second point and the optical axis direction of the second imaging unit are aligned;
After stopping projection of the first two-dimensional pattern and the second two-dimensional pattern, projecting a pattern for measurement toward an object,
capturing an image of the object onto which the measurement pattern is projected by controlling the first imaging unit and the second imaging unit, and measuring the shape of the object from the imaged data of the object; , three-dimensional measurement method. to the computer,
Controlling a first projector capable of projecting a two-dimensional pattern in the direction of the optical axis of a first imaging unit to create a first graphic having a shape symmetrical about a first point or a straight line passing through the first point Projecting a first two-dimensional pattern including at least a portion such that the first point and the optical axis direction of the first imaging unit are aligned,
Controlling a second projector capable of projecting a two-dimensional pattern in the direction of the optical axis of the second imaging unit to create a second figure having a shape symmetrical about a second point or a straight line passing through the second point projecting a second two-dimensional pattern including at least a portion such that the second point and the optical axis direction of the second imaging unit are aligned;
After stopping the projection of the first two-dimensional pattern and the second two-dimensional pattern, projecting the measurement pattern toward the object,
executing a process of controlling the first imaging unit and the second imaging unit to photograph the object onto which the measurement pattern is projected, and measuring the shape of the object from photographed data of the object; program.

Images