JP2020056580A - Three-dimensional measuring device, three-dimensional measuring method, and program - Google Patents

Abstract

To facilitate the placement of an object in a measurement area.SOLUTION: A three-dimensional measuring device includes: a pattern projection unit that projects a measurement pattern onto an object; first and second imaging units for capturing the object on which the measurement pattern is projected; first and second projectors; and a control unit that controls the first projector to project the first two-dimensional pattern and controls the second projector to project the second two-dimensional pattern. There is provided the three-dimensional measuring device in which the first two-dimensional pattern includes at least a part of a first figure having a symmetrical shape with respect to a first point or a straight line passing through the first point, and the second two-dimensional pattern includes at least a part of a second figure having a symmetrical shape with respect to a second point or a straight line passing through the second point, so that the first point matches the optical axis direction of the first imaging unit and the second point matches the optical axis direction of the second imaging unit.SELECTED DRAWING: Figure 1

Description

  The present invention relates to a three-dimensional measuring device, a three-dimensional measuring method, and a program.

  2. Description of the Related Art In recent years, research and development of a technology (digital archive) for scanning articles having high storage value, such as cultural properties, arts, and crafts, and storing the shapes and textures in the form of digital data has been advanced. The objects of the digital archive include a wide variety of objects of different materials and shapes, such as paintings, sculptures, folding screens, wall paintings, and swords. Therefore, it is important to apply a scanning method suitable for the characteristics of the target object and faithfully reproduce the expression unique to the target object.

  As a method of scanning the shape of the object, for example, non-contact three-dimensional measurement is used. In non-contact three-dimensional measurement, a pattern is projected on an object using a projector, etc. It is a technology to measure.

  For non-contact three-dimensional measurement, for example, a three-dimensional measuring device including a projector that projects a pattern, two cameras, and two laser pointers used for positioning an object is used (Patent Document 1). The two laser pointers are fixed so that the irradiation directions of the lasers respectively match the optical axes of the two cameras. Therefore, the measurer can place the object in the measurement area by arranging the object at the position where the laser pointer intersects.

JP 2018-48860 JP

  The above-described positioning mechanism using a laser pointer has a certain size and is effective for a flat object having no fine irregularities. However, when performing non-contact three-dimensional measurement of an object having a fine and complicated three-dimensional shape, it is difficult to match the intersection of two laser pointers to a small area.

  Further, in order to avoid the risk of breakage or soiling of the object, direct contact with the object itself and movement of the object are often restricted. For this reason, it is necessary to adjust the position and orientation of the three-dimensional measuring device without moving the target object so that the intersection of the two laser pointers matches a small area, which makes positioning more difficult.

  Therefore, according to one aspect of the present invention, it is an object of the present invention to provide a three-dimensional measuring device, a three-dimensional measuring method, and a program that can easily arrange an object in a measurement area.

  According to one aspect of the present invention, a pattern projecting unit that projects a measurement pattern on an object, first and second imaging units that photograph the object on which the measurement pattern is projected, and a first imaging unit A first projector capable of projecting a two-dimensional pattern in the optical axis direction of the second imaging unit, a second projector capable of projecting a two-dimensional pattern in the optical axis direction of the second imaging unit, and a first projector that controls the first projector. A control unit that projects one two-dimensional pattern and controls a second projector to project a second two-dimensional pattern, wherein the first two-dimensional pattern is a first point or a first point. A second figure having at least a part of a first figure having a shape symmetric about a straight line passing through the second point, and a second figure having a shape symmetric about a second point or a straight line passing through the second point. And the control unit includes a first point and A tertiary controller that controls the first projector so that the optical axis direction of the first imaging unit matches, and controls the second projector so that the second point matches the optical axis direction of the second imaging unit. An original measurement device is provided.

  According to another aspect of the present invention, the computer controls the first projector capable of projecting the two-dimensional pattern in the optical axis direction of the first imaging unit, and controls the first point or the first point. A first two-dimensional pattern including at least a part of a first figure having a symmetrical shape with respect to a straight line passing through a point is projected so that the first point and the optical axis direction of the first imaging unit match. Controlling a second projector capable of projecting a two-dimensional pattern in the optical axis direction of the second imaging unit to generate a second point or a second figure having a symmetrical shape with respect to a straight line passing through the second point. A second two-dimensional pattern including at least a part is projected so that the second point coincides with the optical axis direction of the second imaging unit, and the first two-dimensional pattern and the second two-dimensional pattern are projected. After stopping the projection, the measurement pattern is projected toward the object, and the first imaging unit and And controls the second imaging unit capturing an object measurement pattern is projected, a process for measuring the shape of the object from the imaging data of the object, three-dimensional measurement method is provided.

  Further, according to still another aspect of the present invention, the computer controls the first projector capable of projecting the two-dimensional pattern in the optical axis direction of the first imaging unit, so that the first point or the first point is controlled. Projecting a first two-dimensional pattern including at least a part of a first figure having a shape symmetrical with respect to a straight line passing through the first point so that the first point and the optical axis direction of the first imaging unit coincide with each other. And controlling a second projector capable of projecting a two-dimensional pattern in the optical axis direction of the second image pickup unit to obtain a second figure having a symmetrical shape with respect to the second point or a straight line passing through the second point. Are projected so that the second point and the optical axis direction of the second imaging unit coincide with each other, and the first two-dimensional pattern and the second two-dimensional pattern Is stopped, and then the measurement pattern is projected toward the target object. Beauty and controls the second imaging unit capturing an object measurement pattern is projected, to execute processing to measure the shape of the object from the imaging data of the object, the program is provided. Further, a non-transitory computer-readable recording medium on which the program is recorded can be provided.

  ADVANTAGE OF THE INVENTION According to this invention, arrangement | positioning of an object to a measurement area becomes easy.

It is the schematic diagram which showed the structural example of the three-dimensional measuring apparatus. FIG. 3 is a block diagram illustrating a configuration example of hardware capable of realizing a function of a control device. FIG. 3 is a block diagram illustrating an example of a function of the control device. FIG. 4 is a first diagram for describing positioning of the three-dimensional measuring device. FIG. 9 is a second diagram for describing positioning of the three-dimensional measuring device. 5 is a chart showing an example of lens information. It is the 1st chart which showed the example of the guide pattern. It is the 2nd chart which showed the example of the guide pattern. FIG. 5 is a flowchart showing a flow of a process executed by the control device.

  Hereinafter, embodiments of the present invention (hereinafter, this embodiment) will be described with reference to the accompanying drawings. In the specification and the drawings, elements having substantially the same function are denoted by the same reference numerals, and redundant description may be omitted.

  In the present embodiment, three-dimensional measurement is performed in which a measurement pattern is projected on a three-dimensional object, the object is photographed by a plurality of imaging devices, and the three-dimensional shape of the object is measured based on the photographed image. Related to the device. When an object such as a cultural property is handled, the object is guided to the measurement area by moving the three-dimensional measuring device in order to avoid the risk of damage to the object.

  The conventional three-dimensional measuring device displays the optical axis direction of each imaging device by a light spot of a laser pointer, and uses a position where the light spot overlaps as an index of a measurement area. In an environment where the three-dimensional measuring device is fixed and the object can be moved freely, it is relatively easy to find the position where the light spots overlap. However, when the three-dimensional measuring apparatus is moved, the light spot is often lost, and furthermore, it takes a considerable time to overlap a plurality of light spots at one point.

  In the field where an object such as a cultural property is handled, measurement may be performed in an environment where the object is installed, and it is often difficult to move freely with a three-dimensional measuring device. In addition, there are cases where measurement is performed focusing on a small part such as a fingertip of a statue, and it is difficult to overlap a plurality of light spots on such a small part. In particular, it is very difficult to overlap light spots in a small (thin) portion and a thin portion.

  An object of the present embodiment is to provide a three-dimensional measurement apparatus that solves the problems that can occur at the site of three-dimensional measurement as described above. Hereinafter, the three-dimensional measurement apparatus according to the present embodiment and the flow of processing executed by the three-dimensional measurement apparatus will be sequentially described.

[1. 3D measuring device]
The three-dimensional measuring device 100 will be described with reference to FIG. FIG. 1 is a schematic diagram illustrating a configuration example of a three-dimensional measurement device. The three-dimensional measurement device 100 illustrated in FIG. 1 is an example of the three-dimensional measurement device according to the present embodiment.

  As shown in FIG. 1, the three-dimensional measuring apparatus 100 includes a pattern projector 101, imaging devices 102a and 103a, laser projectors 102b and 103b, and a control device 105. Note that the imaging device 102a and the laser projector 102b may be formed integrally. The imaging device 103a and the laser projector 103b may be formed integrally. The control device 105 may be formed integrally with the pattern projector 101.

  The pattern projector 101 and the imaging device 102a are physically connected by a support member 104a. The pattern projector 101 and the imaging device 103a are physically connected by a support member 104b.

  The control device 105 is electrically connected to each of the pattern projector 101, the imaging devices 102a and 103a, and the laser projectors 102b and 103b. However, the control device 105 communicates with each of the pattern projector 101, the imaging devices 102a and 103a, and the laser projectors 102b and 103b by using a wireless technology such as a wireless LAN (Local Area Network) or a short-range wireless communication. May be connected.

  The pattern projector 101 is a projector for projecting a measurement pattern on an object. The measurement pattern is an arbitrary pattern that can be used for three-dimensional measurement, such as a zebra pattern, a grid pattern, and a checkered pattern. Examples of the projector that can be used as the pattern projector 101 include a liquid crystal projector, a DLP (Digital Light Processing) projector, and an LCOS (Liquid Crystal On Silicon) projector.

  However, the type of the measurement pattern and the type of the projector that can be used as the pattern projector 101 are not limited to the above example. For example, a laser projector that uses laser light as a light source may be used as the pattern projector 101. Hereinafter, the angle of view of the pattern projector 101 may be described as t1 for convenience of description.

  The imaging devices 102a and 103a are, for example, digital cameras having a lens, an imaging device, a processor (for example, a CPU (Central Processing Unit), a DSP (Digital Signal Processor)), and the like. Lenses having the same focal length and brightness are mounted on the imaging devices 102a and 103a. The type of the lens is determined according to the type of the object or the measurement purpose. The imaging devices 102a and 103a may be digital cameras with interchangeable lenses. Lens information (focal length, open F value, etc.) can be provided from the imaging devices 102a and 103a to the control device 105.

  Hereinafter, for convenience of description, the imaging angle of view of the imaging device 102a may be expressed as t2, and the optical axis direction may be expressed as L2. In addition, the imaging angle of view of the imaging device 103a may be expressed as t3 and the optical axis direction may be expressed as L3. Further, the focusing range of the imaging device 102a may be described as D2, and the focusing range of the imaging device 103a may be described as D3. Note that the in-focus range here refers to a range in a depth direction (a direction toward the subject along the optical axis) within the depth of field.

  The laser projectors 102b and 103b are laser light scanning projectors using laser light as a light source. The laser beam scanning projector is a type of projector that displays a two-dimensional pattern on a screen by scanning a laser beam two-dimensionally on a screen at high speed. The color of the laser beam output from the laser projector 102b may be the same as or different from the laser beam output from the laser projector 103b.

  The direction of the laser projector 102b is set based on the optical axis direction of the imaging device 102a. For example, the laser projector 102b is arranged such that a plane perpendicular to the optical axis direction of the imaging device 102a is regarded as a screen and can draw a two-dimensional pattern. The direction of the laser projector 103b is set based on the optical axis direction of the imaging device 103a. For example, the laser projector 103b is arranged such that a plane perpendicular to the optical axis direction of the imaging device 103a is regarded as a screen and can draw a two-dimensional pattern.

  Here, the arrangement of the measurement region and the object will be described with reference to FIG. FIG. 1 schematically shows, as an example, a measurement region 10 (a region surrounded by a thick line) and an object 20a. The measurement area 10 is mainly determined by the optical axis directions L2 and L3, the imaging angles of view t2 and t3, and the focusing ranges D2 and D3. However, since the part of the target object 20a on which the measurement pattern is projected is photographed, it depends strictly on the angle of view t1 of the pattern projector 101 that determines the range in which the measurement pattern is projected.

  Therefore, the three-dimensional measuring apparatus 100 is arranged so that the target object 20a is arranged in the measurement area 10 determined by the optical axis directions L2 and L3, the shooting angles of view t2 and t3, the focusing ranges D2 and D3, and the angle of view t1. If the position can be moved, a desired measurement result can be expected. However, the measurement area 10 is not visible. Therefore, the three-dimensional measuring apparatus 100 draws two two-dimensional patterns using the laser projectors 102b and 103b, and moves the three-dimensional measuring apparatus 100 so that the target object 20a fits in the measurement area 10 (hereinafter, referred to as an operation). , Positioning).

  The operations of the pattern projector 101, the imaging devices 102a and 103a, and the laser projectors 102b and 103b are controlled by the control device 105. Hereinafter, the control device 105 will be described, and in the description, the reason why drawing of a two-dimensional pattern using the laser projectors 102b and 103b is effective for positioning will be described in detail.

(Control device hardware)
First, the hardware of the control device 105 will be described with reference to FIG. FIG. 2 is a block diagram illustrating a configuration example of hardware capable of realizing the functions of the control device.

  The functions of the control device 105 can be realized using, for example, the hardware resources shown in FIG. That is, the functions of the control device 105 are realized by controlling the hardware shown in FIG. 2 using a computer program.

  As shown in FIG. 2, this hardware mainly includes a processor 105a, a memory 105b, a display I / F (Interface) 105c, a communication I / F 105d, and a connection I / F 105e.

  The processor 105a is, for example, a CPU, a DSP, an ASIC (Application Specific Integrated Circuit), an FPGA (Field Programmable Gate Array), or the like. The memory 105b is a storage device such as a read only memory (ROM), a random access memory (RAM), a hard disk drive (HDD), a solid state drive (SSD), and a flash memory.

  The display I / F 105c is an interface for connecting a display device such as an LCD (Liquid Crystal Display) and an ELD (Electro-Luminescence Display). For example, the display I / F 105c performs display control by a GPU (Graphic Processing Unit) mounted on the processor 105a and / or the display I / F 105c. Note that a display device may be mounted on the control device 105.

  The communication I / F 105d is an interface for connecting to a wired and / or wireless network. The communication I / F 105d is connected to, for example, a wired LAN, a wireless LAN, an optical communication network, a mobile phone network, or the like.

  The connection I / F 105e is an interface for connecting an external device. The connection I / F 105e is, for example, a USB (Universal Serial Bus) port, an IEEE1394 port, a SCSI (Small Computer System Interface), or the like.

  An input interface such as a keyboard, a mouse, a touch panel, and a touch pad can be connected to the connection I / F 105e. In addition, an audio device such as a speaker and / or a printer may be connected to the connection I / F 105e. A portable recording medium 105f can be connected to the connection I / F 105e. The recording medium 105f is, for example, a magnetic recording medium, an optical disk, a magneto-optical disk, a semiconductor memory, or the like.

  The processor 105a described above can read a program stored in the recording medium 105f, store the program in the memory 105b, and control the operation of the control device 105 according to the program read from the memory 105b. Note that a program for controlling the operation of the control device 105 may be stored in the memory 105b in advance, or may be downloaded from a network via the communication I / F 105d.

(Function of control device)
Next, the function of the control device 105 will be further described with reference to FIG. FIG. 3 is a block diagram illustrating an example of a function of the control device.

  As illustrated in FIG. 3, the control device 105 includes a storage unit 151, a guide pattern drawing control unit 152, a measurement pattern projection control unit 153, and a measurement unit 154.

  Note that the function of the storage unit 151 can be realized using the memory 105b and the like. The functions of the guide pattern drawing control unit 152, the measurement pattern projection control unit 153, and the measurement unit 154 can be realized using the processor 105a.

  The storage unit 151 stores guide pattern information 151a, measurement pattern information 151b, and lens information 151c.

  The guide pattern information 151a is information on the shape of a two-dimensional pattern (hereinafter, a guide pattern) drawn by the laser projectors 102b and 103b for positioning. The shape of the guide pattern will be described in detail later (the description of FIGS. 7 and 8). The measurement pattern information 151b is information on the shape of the measurement pattern. The lens information 151c is information (focal length, open F value, and the like) regarding the lenses attached to the imaging devices 102a and 103a.

  The guide pattern drawing control unit 152 determines, among at least one guide pattern included in the guide pattern information 151a, a first guide pattern drawn by the laser projector 102b and a second guide pattern drawn by the laser projector 103b. Identify. For example, the first guide pattern and the second guide pattern are set in advance by a measurer who performs positioning or when the three-dimensional measuring apparatus 100 is manufactured. The first guide pattern and the second guide pattern may be the same guide pattern or different guide patterns.

  The guide pattern drawing control unit 152 includes a laser light color (hereinafter, a first color) for drawing a first guide pattern and a laser light color (hereinafter, a first color) for drawing a second guide pattern. 2). The first color and the second color may be the same color or different colors. However, when the color of the laser light that can be output by each of the laser projectors 102b and 103b is determined, the guide pattern drawing control unit 152 omits the process of specifying the first color and the second color.

  The guide pattern drawing control unit 152 controls the laser projector 102b to draw the first guide pattern with the first color laser light. The guide pattern drawing control unit 152 draws a first guide pattern assuming a plane perpendicular to the optical axis direction L2 of the imaging device 102a (hereinafter, a first virtual screen). That is, if there is an actual screen at the position of the first virtual screen, the first guide pattern is drawn by the laser projector 102b so that the first guide pattern is displayed on the screen.

  Further, the guide pattern drawing control unit 152 controls the laser projector 103b to draw the second guide pattern with the second color laser light. The guide pattern drawing control unit 152 draws a second guide pattern assuming a plane perpendicular to the optical axis direction L3 of the imaging device 103a (hereinafter, a second virtual screen). That is, if there is an actual screen at the position of the second virtual screen, the second guide pattern is drawn by the laser projector 103b so that the second guide pattern is displayed on the screen.

  When the imaging devices 102a and 103a are interchangeable lens digital cameras, the guide pattern drawing control unit 152 specifies the shooting angle of view t2 and t3 of the imaging devices 102a and 103a based on the lens information 151c. At this time, the guide pattern drawing control unit 152 may specify the vertical angle of view and the horizontal angle of view as the imaging angles of view t2 and t3.

  In addition, the guide pattern drawing control unit 152 adjusts the size of the first guide pattern based on the shooting angle of view t2 such that the outermost portion of the first guide pattern falls within the shooting angle of view t2. In addition, the guide pattern drawing control unit 152 adjusts the size of the second guide pattern based on the shooting angle of view t3 so that the outermost portion of the second guide pattern falls within the shooting angle of view t3. Then, the guide pattern drawing control unit 152 draws the first guide pattern and the second guide pattern by the method described above.

  The first guide pattern and the second guide pattern are drawn simultaneously and continuously. During the period in which the first guide pattern and the second guide pattern are drawn, the projection of the measurement pattern by the pattern projector 101 and the imaging by the imaging devices 102a and 103a are not performed. When the operation of stopping the drawing of the guide pattern is performed, the guide pattern drawing control unit 152 stops the output of the laser projectors 102b and 103b.

  The measurement pattern projection control unit 153 acquires image data indicating the shape of the measurement pattern from the measurement pattern information 151b. Then, the measurement pattern projection control unit 153 inputs the image data to the pattern projector 101, and projects the measurement pattern on the target object by the pattern projector 101. The measurement unit 154 controls the imaging devices 102a and 103a to photograph the target, and measures the three-dimensional shape of the target based on the captured image.

(Positioning)
Here, the positioning of the three-dimensional measuring apparatus 100 will be further described with reference to FIGS. 4 and 5. FIG. 4 is a first diagram for describing positioning of the three-dimensional measuring device. FIG. 5 is a second diagram for describing positioning of the three-dimensional measuring device.

  Difficulties in moving the three-dimensional measuring device 100 to fit the target in the measurement area 10 include the distance between the three-dimensional measuring device 100 and the target, and the inclination of the three-dimensional measuring device 100 (particularly, rotating the Z axis It is difficult to appropriately control the rotation direction as an axis) by the measurer's hand.

  As shown in FIG. 4, when the three-dimensional measuring apparatus 100 is too close to the object 20b (at time T1), the optical axes of the imaging devices 102a and 103a do not cross the object 20b. Also, when the three-dimensional measuring apparatus 100 is too far away from the object 20b (time T2), the optical axes of the imaging devices 102a and 103a do not cross the object 20b. In the conventional method in which only the direction of the optical axis is pointed by the laser pointer, the measurer loses the light spot in these situations.

  If the distance between the three-dimensional measuring apparatus 100 and the object 20b is appropriate (at time T3), the optical axes of the imaging devices 102a and 103a intersect at the object 20b. When the three-dimensional measuring apparatus 100 tilts in the rotation direction about the Y axis as the rotation axis, the optical axis tilts in the + Z direction or the −Z direction. When the width (height) of the object 20b in the Z direction is small, the optical axis may not cross the object 20b due to the inclination in the Z direction. Also in this case, in the conventional method in which the laser pointer points only in the optical axis direction, the measurer loses the light spot.

  However, as shown in FIG. 5, the three-dimensional measuring apparatus 100 according to the present embodiment draws the two-dimensional patterns 121 and 131 using the laser projectors 102b and 103b. Although the example of FIG. 5 illustrates a two-dimensional pattern formed by two straight lines crossing a cross and a rectangular frame surrounding the cross, the shape of the two-dimensional pattern is not limited to this. The two-dimensional pattern 121 is an example of a figure drawn by the laser projector 102b. The two-dimensional pattern 131 is an example of a figure drawn by the laser projector 103b.

  As shown in FIG. 4, the optical axis does not intersect with the object 20b at the time T1, but as shown in FIG. 5, a part of the two-dimensional patterns 121 and 131 intersect with the object 20b. Further, from the sizes of the two-dimensional patterns 121 and 131 drawn on the object 20b, the measurer can recognize that the three-dimensional measuring device 100 and the object 20b are too close. In other words, it is possible to recognize whether some figures are larger or smaller than the size of the figure displayed in an appropriate positional relationship, and determine whether the figure is too close or too far based on the recognition. can do.

  At time T2, the optical axis does not cross the target 20b, but as shown in FIG. 5, a part of the two-dimensional patterns 121 and 131 cross the target 20b. Since the size of the portion that intersects with the object 20b and the arrangement of the two-dimensional patterns 121 and 131 are reversed (the two-dimensional pattern 121 is located on the right side of the paper if appropriate), the three-dimensional measurement device is used. The measurer can recognize that the object 100b is too far from the object 100b.

  When the three-dimensional measuring apparatus 100 and the target object 20b have an appropriate positional relationship to some extent (at time T3), the two-dimensional patterns 121 and 131 substantially match as shown in FIG. At this time, the measurer can grasp the inclination of the three-dimensional measurement apparatus 100 from the inclination, the difference in size, the shape distortion, and the like of the two-dimensional patterns 121 and 131. Therefore, by using the two-dimensional patterns 121 and 131, the fine adjustment of the three-dimensional measuring apparatus 100 including the inclination becomes easy. As described above, when the three-dimensional measuring apparatus 100 according to the present embodiment is applied, positioning is significantly easier than in a conventional three-dimensional measuring apparatus.

(Lens information)
Next, the use of the lens information 151c will be further described with reference to FIG. FIG. 6 is a chart showing an example of the lens information.

  As shown in FIG. 6, the lens information 151c includes information such as a lens name, an F value, a focusing range, and a shooting angle of view. The lens name is an example of identification information used for identifying a lens. The F value is an index indicating the brightness of the lens, and is generally defined as a value obtained by dividing the focal length of the lens by the effective aperture. The F value included in the lens information 151c may be an aperture-open F value, but in the example of FIG. 6, is an F value (set value) corresponding to the aperture setting applied at the time of measurement.

  The in-focus range indicates a range where the imaging devices 102a and 103a are in focus. The focusing range and the depth of field can be calculated based on the distance to the subject, the focal length of the lens, the size of the image sensor, and the F value. For example, if the distance to the subject is set to 2 m, the focal length of the lens is set to 90 mm, the size of the image sensor is set to full size (36 mm × 24 mm), and the F-number is set to 5.6, the focusing range is about 1.9 to about 2 .1 m, the depth of field is about 0.18 m.

  In the case of three-dimensional measurement, since it is necessary to clearly capture an object, a focusing range with a margin is set in the lens information 151c as an effective value.

  The shooting angle of view can be calculated based on the focal length of the lens and the size of the image sensor. Generally, the longer the focal length of the lens, the narrower the shooting angle of view, and the shorter the focal length of the lens, the wider the shooting angle of view. The larger the size of the image sensor, the wider the shooting angle of view, and the smaller the size of the image sensor, the narrower the field of view. Since a general image sensor has a horizontally long shape, the photographing angle of view includes a diagonal angle of view corresponding to a diagonal direction of the image sensor, a horizontal angle of view corresponding to a horizontal direction (horizontal direction), and a vertical direction (vertical direction). There is a corresponding vertical angle of view.

  The three-dimensional measuring apparatus 100 (guide pattern drawing control unit 152) according to the present embodiment adjusts the shape (the size of the outer frame and the like) of the guide pattern drawn by the laser projectors 102b and 103b to the shooting angle of view. . Therefore, the horizontal angle of view and the vertical angle of view are described as the shooting angle of view in the lens information 151c.

  The lens information 151c may be generated in advance based on the lens to be used and the F value set in advance, or may be generated by the guide pattern drawing control unit 152 when the lens is replaced. For example, the guide pattern drawing control unit 152 acquires lens information (focal length and the like) from the imaging devices 102a and 103a, and sets the F value and the distance to the object set in advance, and the size of the known imaging device. The focusing distance and the angle of view are calculated based on the focusing distance.

  Using the above lens information 151c, the guide pattern drawing control unit 152 adjusts the component of the guide pattern drawn at the position farthest from the optical axis of the imaging devices 102a and 103a to the end of the shooting angle of view, or It is possible to fit inside the shooting angle of view.

  For example, in the case of the two-dimensional pattern 121 shown in FIG. 5, the guide pattern drawing control unit 152 matches the intersection of two straight lines that intersect at the center with the optical axis. In addition, the guide pattern drawing control unit 152 adjusts two vertical lines (straight lines extending in the vertical direction of the image sensor) of the four straight lines forming the outer frame to the vertical angle of view, and adjusts the two horizontal lines (imaging (A straight line extending in the lateral direction of the element) to the horizontal angle of view.

  The lens information 151c illustrated in FIG. When one lens is mounted on the imaging device 102a, the guide pattern drawing control unit 152 determines that the vertical line passes through a position + 11.25 ° from the optical axis in the horizontal direction, and -11.25 from the optical axis in the horizontal direction. A vertical line passing through the position of ° is drawn, and a horizontal line passing through the position of + 7.5 ° from the optical axis in the vertical direction and a horizontal line passing through the position of -7.5 ° from the optical axis in the vertical direction are drawn. As described above, by adjusting the size of the guide pattern according to the shooting angle of view, the measurement area 10 can be recognized from the guide pattern.

(Example of guide pattern)
In the above description, the two-dimensional patterns 121 and 131 in which a rectangular outer frame is combined with two cross lines are illustrated, but the shape of the guide pattern applicable to the three-dimensional measuring apparatus 100 according to the present embodiment is not limited thereto. Not done.

  For example, guide patterns of various shapes as shown in FIGS. 7 and 8 can be applied. FIG. 7 is a first chart showing an example of a guide pattern. FIG. 8 is a second chart showing an example of the guide pattern. It should be noted that the figures shown in FIGS. 7 and 8 are merely examples, and combinations of these figures, partial figures cut out from these figures, combinations of the partial figures, or ideas conceived from these figures. Also, the application of an arbitrary figure is also within the technical scope of the present embodiment.

  First, reference is made to FIG. Of the fifteen figures shown in FIG. 7, figure # 01 is a circle. Figure # 01 can be transformed into an ellipse. For example, when the guide pattern is an ellipse, the guide pattern drawing control unit 152 sets the major axis according to the horizontal angle of view, sets the minor axis according to the vertical angle of view, and sets the intersection of the major axis and the minor axis. To the optical axis. Figure # 02 is a part of figure # 01. The circle or the ellipse has a shape symmetric with respect to the center or a straight line (long axis, short axis) passing through the center. Therefore, the position of the center can be easily estimated from a part of the shape.

  The figure # 3 is a figure in which a plurality of figures having the same shape and different sizes as the figure # 01 are arranged at the same center. FIG. 7 shows an example in which two circles are arranged concentrically. As a modification of FIG. # 03, a figure in which three or more circles are arranged concentrically, or a figure in which two or three or more circles are arranged concentrically There is a figure in which ellipses are arranged concentrically. Further, a modified example of the graphic # 03 includes a graphic in which a circle and an ellipse are combined and a combination of partial graphics such as the graphic # 02.

  The graphic # 04 is a graphic obtained by combining the graphic # 01 and the center point. As a modified example of the graphic # 4, there is a graphic in which the graphic # 02 or the graphic # 03 is combined with the center point. The graphic # 05 is a graphic in which the solid line of the graphic # 01 is represented by a chain line or a dotted line. As a modified example of the figure # 05, there is a figure expressed by a line type different from a solid line such as a dashed line and a two-dot chain line. Like the graphic # 06, the graphic # 05 may be applied to the graphic # 01- # 04 and its modifications.

  The graphic # 07 is a so-called “cross-shaped” graphic including a rectangular frame drawn by four straight lines and two straight lines orthogonal to each other at the center. As a modified example of the figure # 07, there are a figure in which the shape of the frame is a vertically long or horizontally long rectangle, and a rhombus in which the whole or the frame is rotated by 45 °. Further, a figure in which two straight lines perpendicular to the center and the frame line do not touch each other, or a figure in which these two straight lines intersect the frame line are also included in the modified example of the figure # 07.

  The figure # 08 is a figure formed by two straight lines orthogonal to each other at the center. The lengths of the two straight lines may be the same or different. When applying the figure # 08, the guide pattern drawing control unit 152 adjusts the length of the horizontal line according to the horizontal angle of view, and adjusts the length of the vertical line according to the vertical angle of view. That is, the guide pattern drawing control unit 152 sets a point on the figure farthest from the center based on the horizontal angle of view and the vertical angle of view.

  The graphic # 09 is a graphic corresponding to the frame line of the graphic # 07. As a modification of the graphic # 09, there is a graphic in which the graphic # 09 and the center point are combined like the graphic # 4. Also, a figure in which a plurality of rectangles having different sizes are combined so that the centers coincide with each other as in the case of the figure # 03, and a portion corresponding to the first and third quadrants of the figure # 09 as in the case of the figure # 02 are cut out. The changed figure is also included in the modified example of the figure # 09.

  The graphic # 10 is a graphic obtained by rotating the graphic # 08 by 45 °. The lengths of the two straight lines may be the same or different. When applying the figure # 10, the guide pattern drawing control unit 152 sets the positions of the end points of the two straight lines in accordance with the horizontal angle of view or the vertical angle of view. As a modified example of the graphic # 10, there is a graphic set such that two straight lines are not orthogonal to each other at the center but intersect at an angle corresponding to the angle of view. For example, the guide pattern drawing control unit 152 can set two diagonal lines connecting the vertices of a rectangle matching the horizontal angle of view and the vertical angle of view.

  The graphic # 11 is a graphic formed by three or more straight lines intersecting at the center. The graphic # 12 is a graphic in which dots (points expressed by the spread of laser light or small-diameter circles) are displayed at the vertices of each line forming the graphic # 11. The length of each line forming the graphic # 11 is set, for example, to a length in contact with the inside of a circle or an ellipse (graphic # 01 and its modifications) centered on the intersection of each line. The graphic # 13 is a graphic in which dots are displayed at the vertices and the center of each line forming the graphic # 08.

  The graphic # 14 is a graphic obtained by cutting off a part of the graphic # 03. The graphic # 14 is, for example, a graphic obtained by cutting the graphic # 03 by the line of the graphic # 10 and removing four curves located above and below the center. The graphic # 15 is a mesh-shaped graphic formed by a plurality of straight lines having a length that fits within the frame of the graphic # 09. As a modified example of the graphic # 09, there is a mesh-shaped graphic formed so as to fit within the frame of the graphic # 01.

  Next, reference is made to FIG. FIG. 8 shows nine figures # 16 to # 24. First, attention is paid to figures # 16 to # 21. Each of the figures # 16 to # 21 includes a figure (hereinafter referred to as an instruction figure) pointing upward or downward along the vertical direction. For example, figure # 16 includes a triangle in which one vertex points vertically upward as an instruction figure.

  As described above with reference to FIG. 5, when adjusting the position of the three-dimensional measuring device 100, the measurer adds the distance between the target object and the three-dimensional measuring device 100 and the tilt of the three-dimensional measuring device 100. (Rotation in the YZ plane) is adjusted. At this time, when the graphic # 16 shown in FIG. 8 is applied, by observing the inclination of the triangle pointing vertically upward, the measurer can see whether the three-dimensional measuring device 100 is inclined rightward or leftward. It is possible to easily grasp whether the user is present. Thus, the measurer can easily adjust the inclination of the three-dimensional measuring device 100.

  The graphic # 17 includes a triangle whose one vertex points vertically downward as an instruction graphic. Similarly, when the figure # 17 is adopted as the guide pattern, the measurer can easily grasp the inclination direction of the three-dimensional measuring apparatus 100 from the inclination of the triangle pointing vertically downward, and can easily adjust the inclination. . In the figures # 16 and # 17, a triangle is used as an index for indicating a direction. However, for example, a figure having a rounded tip such as a figure # 18 or # 19 may be used as an index for indicating a direction. .

  Further, the figures # 16 to # 18 are figures in which a rectangle of the outer frame is combined with a triangular or semi-cylindrical figure, but a modification in which the rectangle of the outer frame is omitted as in the figures # 20 and # 21 is possible. It is. Further, a modification is possible in which an arrow is used as a direction indication index instead of a triangle. In addition, the triangle, the semicircular figure, the arrow, and the indicator of the direction indicating the deformation thereof may not be in contact with the rectangle of the outer frame. In addition, the figures # 16 to # 21 and the figures serving as indices of direction indications obtained by deforming them may be combined with at least a part of each figure shown in FIG.

  Next, focusing on figures # 22 to # 24 shown in FIG. 8, a description will be given of a suitable figure setting method when a figure formed by a plurality of line segments is used as a guide pattern. A graphic including a line segment can be generated by cutting out a part of the graphic described so far or by combining a plurality of line segments.

  For example, the figure # 22 has two vertically extending line segments and an oblique line segment connecting the lower end of the left side line segment and the upper end of the right side line segment. When two line segments are drawn as the guide pattern, the measurer can recognize the range where the reference point corresponding to the optical axis direction exists. In addition, the measurer can recognize whether the distance between the target object and the three-dimensional measuring apparatus 100 is long or short depending on whether the width of the two line segments is wide or narrow. Therefore, it makes sense to adopt only two line segments. However, since the guide pattern has oblique line segments, the measurer can easily estimate the position of the reference point from the guide pattern.

  In the case of the graphic # 22, the two line segments are arranged symmetrically with respect to a vertically extending straight line (vertical chain line) passing through the reference point. The oblique line segment is set to pass through the reference point. Therefore, the measurer estimates a straight line (a straight line corresponding to the vertical chain line) that is located in the middle of the two line segments and is parallel to the two line segments, and uses the intersection point of the straight line and the oblique line segment as a reference. Can be guessed as a point. In the case of the graphic # 22, a portion where the two line segments intersect with the oblique line segment serves as a vertical indicator, so that the measurer can use the indicator for adjusting the inclination of the three-dimensional measuring apparatus 100.

  When a part of a figure having symmetry with respect to a reference point or a straight line passing through the reference point, such as figures # 23 and # 24, is cut out (figure # 23 and # 24 are cut out from figure # 09), By cutting out a plurality of elements at positions facing each other with the reference point interposed therebetween, the measurer can easily estimate the position of the reference point. In other words, if there is an element group that is symmetric about one straight line (for example, a horizontal dashed line) passing through the reference point and an element group that is symmetric for another straight line (for example, a vertical dashed line), the measurer can use two straight lines. And the intersection (reference point) of these straight lines can be estimated. At this time, the two straight lines need only intersect and need not be orthogonal.

  Up to this point, the shapes of the guide patterns have been described using the figures # 01 to # 24 as an example. However, various modifications can be made to each figure as described above. This naturally belongs to the technical scope of the present embodiment. For example, a graphic represented as a straight line or a line segment in the above description can be transformed into a graphic represented by a set of points. For example, a set of points including the vertices of four line segments shown in FIG. 24 is a modification of FIG.

[2. Processing flow]
Next, a flow of processing executed by the control device 105 will be described with reference to FIG. FIG. 9 is a flowchart illustrating a flow of a process executed by the control device.

  (S101) The guide pattern drawing control unit 152 refers to the lens information 151c and acquires the shooting angle of view of the corresponding lens. Note that the guide pattern drawing control unit 152 may calculate the shooting angle of view based on lens information acquired from the lenses via the imaging devices 102a and 103a.

  (S102) The guide pattern drawing control unit 152 determines the first guide pattern to be drawn by the laser projector 102b and the second guide pattern to be drawn by the laser projector 103b with reference to the guide pattern information 151a. The first guide pattern and the second guide pattern may be different guide patterns. In addition, the first guide pattern and the second guide pattern may be set in advance as fixed values, or may be set by a measurer at the time of measurement.

  (S103) The guide pattern drawing control unit 152 determines a method of expressing the first guide pattern and the second guide pattern. If the first guide pattern and the second guide pattern are expressed differently, a line of interest is a part of any of the guide patterns at a portion where the first guide pattern and the second guide pattern overlap. It becomes easier for the measurer to recognize whether or not there is. Examples of the expression method include color, blinking, and line thickness.

  For example, the guide pattern drawing control unit 152 controls the color of the laser light output from the laser projector 102b (hereinafter, first color) and the color of the laser light output from the laser projector 103b (hereinafter, second color). And decide. The first color and the second color may be the same or different. In addition, the first color and the second color may be set in advance as fixed values, or may be set by a measurer at the time of measurement.

  In addition, the guide pattern drawing control unit 152 determines whether to blink the first guide pattern or the second guide pattern. For example, even if the first color and the second color are the same, if one of the guide patterns blinks at a fixed period (for example, disappears every second for 0.5 second), the line of interest is drawn. However, it becomes easier for the measurer to recognize which of the guide patterns is a part. The presence or absence of blinking may be set in advance as a fixed value, or may be set by a measurer at the time of measurement.

  In addition, the guide pattern drawing control unit 152 determines whether to change the line thickness between the first guide pattern and the second guide pattern. For example, even if the first color and the second color are the same and there is no flickering of the guide pattern, if the line thickness is different, the line of interest is part of which guide pattern. Can be easily recognized by the measurer. Whether or not to change the line thickness may be set in advance as a fixed value, or may be set by a measurer at the time of measurement.

  Whether or not the above-described expression method can be applied depends on the functions of the laser projectors 102b and 103b. Therefore, an applicable expression method can be selected according to the embodiment. Further, if the specification is such that laser beams of different colors are output depending on the types of laser light sources mounted on the laser projectors 102b and 103b, the process of S103 may be omitted.

  (S104) The guide pattern drawing control unit 152 draws a first guide pattern by controlling the laser projector 102b, and draws a second guide pattern by controlling the laser projector 103b. At this time, the guide pattern drawing control unit 152 adjusts the drawing size of the first guide pattern and the second guide pattern according to the shooting angle of view (horizontal angle of view, vertical angle of view) acquired from the lens information 151c.

  (S105) The guide pattern drawing control unit 152 determines whether the positioning of the three-dimensional measuring device 100 has been completed. For example, when the measurer has performed the operation of completing the positioning, or when the measurer has performed the operation of starting the measurement, the guide pattern drawing control unit 152 determines that the positioning has been completed. If the positioning has been completed, the process proceeds to S106. On the other hand, if the positioning has not been completed, the process proceeds to S104, and drawing of the guide pattern is continued.

  (S106) The guide pattern drawing control unit 152 controls the laser projectors 102b and 103b to stop the output of the laser beam, and ends the guide pattern drawing. Further, the guide pattern drawing control unit 152 notifies the measurement pattern projection control unit 153 of the completion of positioning.

  (S107) The measurement pattern projection control unit 153 acquires image data of the measurement pattern from the measurement pattern information 151b. The measurement pattern projection control unit 153 inputs the acquired image data to the pattern projector 101, and projects the measurement pattern. The measurement pattern projection control unit 153 notifies the measurement unit 154 of the start of projection of the measurement pattern.

  (S108) The measurement unit 154 controls the imaging devices 102a and 103a to image the target on which the measurement pattern is projected. In addition, the measurement unit 154 acquires imaging data output from the imaging devices 102a and 103a, and performs three-dimensional measurement of an object based on the acquired imaging data.

  (S109) The measurement unit 154 determines whether to continue the measurement.

  For example, when the measurer moves the three-dimensional measuring apparatus 100 to measure the target object from another angle and continues the three-dimensional measurement from another position, the measuring unit 154 operates the measurer (guide). It is determined that the measurement is to be continued in response to a pattern redisplay operation. In this case, the measurement unit 154 notifies the measurement pattern projection control unit 153 and the guide pattern drawing control unit 152 of the continuation of the measurement. The measurement pattern projection control unit 153 stops projecting the measurement pattern in response to the notification. Further, the process proceeds to S104.

  On the other hand, when the measurer finishes the measurement by completing the three-dimensional measurement work on a certain object, the measurement unit 154 does not continue the measurement in accordance with the operation of the measurer (such as turning off the power of the three-dimensional measurement device 100). Is determined. In this case, the measurement unit 154 notifies the measurement pattern projection control unit 153 of the end of the measurement. The measurement pattern projection control unit 153 ends the projection of the measurement pattern in response to the notification. Then, a series of processes illustrated in FIG. 9 ends.

  As described above, by displaying a visible guide pattern having a two-dimensional spread with respect to the target object, the measurer is less likely to lose sight of the guide pattern. In addition, the measurer can easily estimate the distance between the three-dimensional measuring device 100 and the object from the size of the guide pattern, and the position of the three-dimensional measuring device 100 can be easily adjusted. In addition, the inclination of the three-dimensional measuring device 100 can be easily estimated from the inclination of the guide pattern, and the inclination of the three-dimensional measuring device 100 can be easily adjusted. As a result, the measurer can efficiently move the three-dimensional measuring apparatus 100 and easily introduce the target into a suitable photographing range. When an object having a small size, a thin object, an object having complicated irregularities, or a part thereof is displayed, it is particularly effective to display the above guide pattern in a visible form.

  Although the preferred embodiments of the present invention have been described with reference to the accompanying drawings, the present invention is not limited to such examples. It is obvious that those skilled in the art can conceive various changes or modifications within the scope of the claims, and these naturally belong to the technical scope of the present invention.

  For example, in the above description, a laser light scanning type projector has been described as an example of the means for displaying the guide pattern, but any light source other than the laser light scanning type projector can be applied. As a means for displaying the guide pattern, for example, a projector that projects an image using a liquid crystal or a DMD (Digital Mirror Device) can be applied. When this type of projector is applied, by focusing on the vicinity of the position where the optical axes of the imaging devices 102a and 103a intersect, it is possible to use the projector in the same manner as a laser beam scanning projector. However, by using a light source capable of outputting light having a narrow line width and high linearity, such as laser light, there is an advantage that the trouble of focusing can be omitted.

  Further, in the above description, a description has been given assuming that a single focus lens is mounted on the imaging devices 102a and 103a. However, a zoom lens may be mounted on the imaging devices 102a and 103a. Even when a zoom lens is applied, if the focal length used for measurement is set, the focusing range and the angle of view can be calculated in the same manner as when a single focus lens is applied. Control based on the information 151c) can be similarly applied.

  Naturally, these modifications also belong to the technical scope of the present embodiment.

Reference Signs List 10 measurement area 20a, 20b object 100 three-dimensional measurement device 101 pattern projector 102a, 103a imaging device 102b, 103b laser projector 104a, 104b support member 105 control device 121, 131 two-dimensional pattern 151 storage unit 151a guide pattern information 151b Measurement pattern information 151c Lens information 152 Guide pattern drawing control unit 153 Measurement pattern projection control unit 154 Measurement unit

Claims (11)

A pattern projecting unit that projects a measurement pattern onto the target object,
First and second imaging units for imaging the target object on which the measurement pattern is projected,
A first projector that can project a two-dimensional pattern in an optical axis direction of the first imaging unit;
A second projector capable of projecting a two-dimensional pattern in the optical axis direction of the second imaging unit;
A control unit that controls the first projector to project a first two-dimensional pattern, and controls the second projector to project a second two-dimensional pattern.
The first two-dimensional pattern includes at least a part of a first figure having a shape symmetric about a first point or a straight line passing through the first point,
The second two-dimensional pattern includes at least a part of a second graphic having a shape symmetric about a second point or a straight line passing through the second point,
The control unit controls the first projector so that the first point and the optical axis direction of the first imaging unit match, and controls the second point and the light of the second imaging unit. A three-dimensional measuring device for controlling the second projector so that the axial direction coincides with the axial direction. When the first graphic includes a plurality of line segments symmetrically arranged with respect to a first straight line passing through the first point, a second straight line intersecting the first straight line at the first point Or further comprising a graphic having symmetry of the first point or having symmetry about the first point,
When the second graphic includes a plurality of line segments arranged symmetrically with respect to a third straight line passing through the second point, a fourth straight line intersecting the third straight line at the second point The three-dimensional measurement apparatus according to claim 1, further comprising: a figure having symmetry of the second point or a figure having symmetry with respect to the second point. The three-dimensional measurement device according to claim 1, wherein at least one of the first graphic and the second graphic includes one or more circles or ellipses. The first two-dimensional pattern includes a plurality of line segments that intersect at the first point;
The second two-dimensional pattern includes a plurality of line segments that intersect at the second point, or
The first two-dimensional pattern includes a plurality of line segments that intersect at the first point, and the second two-dimensional pattern includes a plurality of line segments that intersect at the second point. The three-dimensional measuring device according to any one of claims 3 to 3. The three-dimensional measuring apparatus according to claim 1, wherein the first two-dimensional pattern and the second two-dimensional pattern have different colors. The three-dimensional measuring apparatus according to any one of claims 1 to 5, wherein the first two-dimensional pattern and the second two-dimensional pattern have different shapes. The three-dimensional measuring apparatus according to any one of claims 1 to 6, wherein the first graphic and the second graphic have the same shape. A storage unit for storing information relating to a shooting angle of view of a lens used by the first and second imaging units;
The three-dimensional measurement according to any one of claims 1 to 7, wherein the control unit projects the first two-dimensional pattern and the second two-dimensional pattern at a size corresponding to a shooting angle of view of the lens. apparatus. The three-dimensional measuring apparatus according to any one of claims 1 to 8, wherein the first projector and the second projector are laser projectors that output laser light. Computer
A first projector capable of projecting a two-dimensional pattern in the optical axis direction of the first imaging unit is controlled to generate a first figure having a shape symmetrical with respect to a first point or a straight line passing through the first point. Projecting a first two-dimensional pattern including at least a part such that the first point and the optical axis direction of the first imaging unit coincide with each other;
By controlling a second projector capable of projecting a two-dimensional pattern in the optical axis direction of the second imaging unit, a second figure having a symmetrical shape with respect to a second point or a straight line passing through the second point is formed. Projecting a second two-dimensional pattern including at least a part such that the second point coincides with the optical axis direction of the second imaging unit;
After stopping the projection of the first two-dimensional pattern and the second two-dimensional pattern, project a measurement pattern toward the object,
Executing a process of controlling the first imaging unit and the second imaging unit to photograph the target on which the measurement pattern is projected, and measuring the shape of the target from photographing data of the target; , Three-dimensional measurement method. On the computer,
A first projector capable of projecting a two-dimensional pattern in the optical axis direction of the first imaging unit is controlled to generate a first figure having a shape symmetrical with respect to a first point or a straight line passing through the first point. Projecting a first two-dimensional pattern including at least a part such that the first point and the optical axis direction of the first imaging unit coincide with each other;
By controlling a second projector capable of projecting a two-dimensional pattern in the optical axis direction of the second imaging unit, a second figure having a symmetrical shape with respect to a second point or a straight line passing through the second point is formed. Projecting a second two-dimensional pattern including at least a part such that the second point coincides with the optical axis direction of the second imaging unit;
After stopping the projection of the first two-dimensional pattern and the second two-dimensional pattern, project a measurement pattern toward the object,
Executing a process of controlling the first imaging unit and the second imaging unit to photograph the target on which the measurement pattern is projected, and measuring the shape of the target from photographing data of the target; Let the program.

Images