JP7058336B2 - 光増感剤、感光性樹脂組成物、感光性エレメント、及び配線基板の製造方法 - Google Patents
光増感剤、感光性樹脂組成物、感光性エレメント、及び配線基板の製造方法 Download PDFInfo
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- JP7058336B2 JP7058336B2 JP2020544941A JP2020544941A JP7058336B2 JP 7058336 B2 JP7058336 B2 JP 7058336B2 JP 2020544941 A JP2020544941 A JP 2020544941A JP 2020544941 A JP2020544941 A JP 2020544941A JP 7058336 B2 JP7058336 B2 JP 7058336B2
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- 230000000996 additive effect Effects 0.000 description 1
- 239000012790 adhesive layer Substances 0.000 description 1
- 229910001854 alkali hydroxide Inorganic materials 0.000 description 1
- 229910052783 alkali metal Inorganic materials 0.000 description 1
- 150000008044 alkali metal hydroxides Chemical group 0.000 description 1
- 150000001340 alkali metals Chemical class 0.000 description 1
- 229920000180 alkyd Polymers 0.000 description 1
- XYLMUPLGERFSHI-UHFFFAOYSA-N alpha-Methylstyrene Chemical compound CC(=C)C1=CC=CC=C1 XYLMUPLGERFSHI-UHFFFAOYSA-N 0.000 description 1
- 125000005577 anthracene group Chemical group 0.000 description 1
- 239000003963 antioxidant agent Substances 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 235000015278 beef Nutrition 0.000 description 1
- CHIHQLCVLOXUJW-UHFFFAOYSA-N benzoic anhydride Chemical class C=1C=CC=CC=1C(=O)OC(=O)C1=CC=CC=C1 CHIHQLCVLOXUJW-UHFFFAOYSA-N 0.000 description 1
- RWCCWEUUXYIKHB-UHFFFAOYSA-N benzophenone Chemical compound C=1C=CC=CC=1C(=O)C1=CC=CC=C1 RWCCWEUUXYIKHB-UHFFFAOYSA-N 0.000 description 1
- 239000012965 benzophenone Substances 0.000 description 1
- 125000003236 benzoyl group Chemical group [H]C1=C([H])C([H])=C(C([H])=C1[H])C(*)=O 0.000 description 1
- 125000001797 benzyl group Chemical group [H]C1=C([H])C([H])=C(C([H])=C1[H])C([H])([H])* 0.000 description 1
- 239000011230 binding agent Substances 0.000 description 1
- 238000007664 blowing Methods 0.000 description 1
- 230000001680 brushing effect Effects 0.000 description 1
- 125000000484 butyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 229910052801 chlorine Inorganic materials 0.000 description 1
- 125000001309 chloro group Chemical group Cl* 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000004040 coloring Methods 0.000 description 1
- 239000011889 copper foil Substances 0.000 description 1
- 239000003431 cross linking reagent Substances 0.000 description 1
- 150000004292 cyclic ethers Chemical group 0.000 description 1
- 125000002704 decyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 229940028356 diethylene glycol monobutyl ether Drugs 0.000 description 1
- XXJWXESWEXIICW-UHFFFAOYSA-N diethylene glycol monoethyl ether Chemical compound CCOCCOCCO XXJWXESWEXIICW-UHFFFAOYSA-N 0.000 description 1
- 229940075557 diethylene glycol monoethyl ether Drugs 0.000 description 1
- 125000002147 dimethylamino group Chemical group [H]C([H])([H])N(*)C([H])([H])[H] 0.000 description 1
- 235000011180 diphosphates Nutrition 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 125000003438 dodecyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 239000000975 dye Substances 0.000 description 1
- 238000007772 electroless plating Methods 0.000 description 1
- 238000009713 electroplating Methods 0.000 description 1
- 239000003480 eluent Substances 0.000 description 1
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 1
- 125000000816 ethylene group Chemical group [H]C([H])([*:1])C([H])([H])[*:2] 0.000 description 1
- 239000000945 filler Substances 0.000 description 1
- 239000003063 flame retardant Substances 0.000 description 1
- 239000003205 fragrance Substances 0.000 description 1
- 230000004927 fusion Effects 0.000 description 1
- 230000014509 gene expression Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 125000005843 halogen group Chemical group 0.000 description 1
- 125000003187 heptyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 125000004051 hexyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 239000000852 hydrogen donor Substances 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-M hydroxide Chemical compound [OH-] XLYOFNOQVPJJNP-UHFFFAOYSA-M 0.000 description 1
- 239000012216 imaging agent Substances 0.000 description 1
- 150000002460 imidazoles Chemical class 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000031700 light absorption Effects 0.000 description 1
- 229940107698 malachite green Drugs 0.000 description 1
- FDZZZRQASAIRJF-UHFFFAOYSA-M malachite green Chemical compound [Cl-].C1=CC(N(C)C)=CC=C1C(C=1C=CC=CC=1)=C1C=CC(=[N+](C)C)C=C1 FDZZZRQASAIRJF-UHFFFAOYSA-M 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 125000001570 methylene group Chemical group [H]C([H])([*:1])[*:2] 0.000 description 1
- 125000002816 methylsulfanyl group Chemical group [H]C([H])([H])S[*] 0.000 description 1
- 125000001400 nonyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 125000002347 octyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- JCGNDDUYTRNOFT-UHFFFAOYSA-N oxolane-2,4-dione Chemical compound O=C1COC(=O)C1 JCGNDDUYTRNOFT-UHFFFAOYSA-N 0.000 description 1
- 125000004430 oxygen atom Chemical group O* 0.000 description 1
- 125000001147 pentyl group Chemical group C(CCCC)* 0.000 description 1
- 230000035699 permeability Effects 0.000 description 1
- 239000005011 phenolic resin Substances 0.000 description 1
- NBIIXXVUZAFLBC-UHFFFAOYSA-K phosphate Chemical compound [O-]P([O-])([O-])=O NBIIXXVUZAFLBC-UHFFFAOYSA-K 0.000 description 1
- 239000010452 phosphate Substances 0.000 description 1
- 150000003022 phthalic acids Chemical class 0.000 description 1
- 238000005554 pickling Methods 0.000 description 1
- 239000000049 pigment Substances 0.000 description 1
- 239000004014 plasticizer Substances 0.000 description 1
- 229920001515 polyalkylene glycol Polymers 0.000 description 1
- 229920006267 polyester film Polymers 0.000 description 1
- 229920000915 polyvinyl chloride Polymers 0.000 description 1
- 239000004800 polyvinyl chloride Substances 0.000 description 1
- 229910000027 potassium carbonate Inorganic materials 0.000 description 1
- 229910000160 potassium phosphate Inorganic materials 0.000 description 1
- 235000011009 potassium phosphates Nutrition 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- HJWLCRVIBGQPNF-UHFFFAOYSA-N prop-2-enylbenzene Chemical compound C=CCC1=CC=CC=C1 HJWLCRVIBGQPNF-UHFFFAOYSA-N 0.000 description 1
- 125000001436 propyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 125000004805 propylene group Chemical group [H]C([H])([H])C([H])([*:1])C([H])([H])[*:2] 0.000 description 1
- 238000010992 reflux Methods 0.000 description 1
- 230000007261 regionalization Effects 0.000 description 1
- 238000007788 roughening Methods 0.000 description 1
- 238000007790 scraping Methods 0.000 description 1
- FQENQNTWSFEDLI-UHFFFAOYSA-J sodium diphosphate Chemical compound [Na+].[Na+].[Na+].[Na+].[O-]P([O-])(=O)OP([O-])([O-])=O FQENQNTWSFEDLI-UHFFFAOYSA-J 0.000 description 1
- 235000019795 sodium metasilicate Nutrition 0.000 description 1
- 239000001488 sodium phosphate Substances 0.000 description 1
- 229910000162 sodium phosphate Inorganic materials 0.000 description 1
- 229940048086 sodium pyrophosphate Drugs 0.000 description 1
- NTHWMYGWWRZVTN-UHFFFAOYSA-N sodium silicate Chemical compound [Na+].[Na+].[O-][Si]([O-])=O NTHWMYGWWRZVTN-UHFFFAOYSA-N 0.000 description 1
- 229910052911 sodium silicate Inorganic materials 0.000 description 1
- 239000003381 stabilizer Substances 0.000 description 1
- 239000008107 starch Substances 0.000 description 1
- 235000019698 starch Nutrition 0.000 description 1
- 125000003011 styrenyl group Chemical group [H]\C(*)=C(/[H])C1=C([H])C([H])=C([H])C([H])=C1[H] 0.000 description 1
- 150000005846 sugar alcohols Polymers 0.000 description 1
- 239000004094 surface-active agent Substances 0.000 description 1
- 238000003786 synthesis reaction Methods 0.000 description 1
- 239000003760 tallow Substances 0.000 description 1
- YLQBMQCUIZJEEH-UHFFFAOYSA-N tetrahydrofuran Natural products C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 1
- RYCLIXPGLDDLTM-UHFFFAOYSA-J tetrapotassium;phosphonato phosphate Chemical compound [K+].[K+].[K+].[K+].[O-]P([O-])(=O)OP([O-])([O-])=O RYCLIXPGLDDLTM-UHFFFAOYSA-J 0.000 description 1
- 235000019818 tetrasodium diphosphate Nutrition 0.000 description 1
- 239000001577 tetrasodium phosphonato phosphate Substances 0.000 description 1
- LENZDBCJOHFCAS-UHFFFAOYSA-N tris Chemical compound OCC(N)(CO)CO LENZDBCJOHFCAS-UHFFFAOYSA-N 0.000 description 1
- RYFMWSXOAZQYPI-UHFFFAOYSA-K trisodium phosphate Chemical compound [Na+].[Na+].[Na+].[O-]P([O-])([O-])=O RYFMWSXOAZQYPI-UHFFFAOYSA-K 0.000 description 1
- 125000002948 undecyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
- 150000007934 α,β-unsaturated carboxylic acids Chemical class 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
- G03F7/028—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with photosensitivity-increasing substances, e.g. photoinitiators
- G03F7/031—Organic compounds not covered by group G03F7/029
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C211/00—Compounds containing amino groups bound to a carbon skeleton
- C07C211/43—Compounds containing amino groups bound to a carbon skeleton having amino groups bound to carbon atoms of six-membered aromatic rings of the carbon skeleton
- C07C211/57—Compounds containing amino groups bound to a carbon skeleton having amino groups bound to carbon atoms of six-membered aromatic rings of the carbon skeleton having amino groups bound to carbon atoms of six-membered aromatic rings being part of condensed ring systems of the carbon skeleton
- C07C211/61—Compounds containing amino groups bound to a carbon skeleton having amino groups bound to carbon atoms of six-membered aromatic rings of the carbon skeleton having amino groups bound to carbon atoms of six-membered aromatic rings being part of condensed ring systems of the carbon skeleton with at least one of the condensed ring systems formed by three or more rings
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
- G03F7/028—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with photosensitivity-increasing substances, e.g. photoinitiators
- G03F7/029—Inorganic compounds; Onium compounds; Organic compounds having hetero atoms other than oxygen, nitrogen or sulfur
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C2603/00—Systems containing at least three condensed rings
- C07C2603/02—Ortho- or ortho- and peri-condensed systems
- C07C2603/04—Ortho- or ortho- and peri-condensed systems containing three rings
- C07C2603/22—Ortho- or ortho- and peri-condensed systems containing three rings containing only six-membered rings
- C07C2603/24—Anthracenes; Hydrogenated anthracenes
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Materials For Photolithography (AREA)
- Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
- Polymerisation Methods In General (AREA)
- Non-Metallic Protective Coatings For Printed Circuits (AREA)
Description
式中、Aは芳香族炭化水素環を表し、X1及びX2は、それぞれ独立に1価の有機基を表し、Rは1価の炭化水素基を表し、m1は1以上の整数を表し、n1は0以上の整数を表す。
式中、X1a、X1b、X2a及びX2bは、それぞれ独立に1価の有機基を表し、Rは1価の炭化水素基を表し、n3は0~8の整数を表す。
一実施形態に係る感光性樹脂組成物は、(A)成分:樹脂と、(B)成分:光重合性化合物と、(C)成分:光重合開始剤と、(D)成分:下記式(1)で表される化合物とを含有する。
式中、Aは芳香族炭化水素環を表し、X1及びX2は、それぞれ独立に1価の有機基を表し、Rは1価の炭化水素基を表し、m1は1以上の整数を表し、n1は0以上の整数を表す。
式中、Aは芳香族炭化水素環を表し、X1及びX2は、それぞれ独立に1価の有機基を表し、Rは1価の炭化水素基を表し、m1は1以上の整数を表し、n1は0以上の整数を表す。m1が2以上の整数である場合、複数存在するX1又はX2で表される1価の有機基は、互いに同一であっても異なっていてもよい。n1が2以上の整数である場合、複数存在するRで表される1価の炭化水素基は、互いに同一であっても異なっていてもよい。
式中、Ra、Rc及びRdは、それぞれ独立に水素原子又は1価の炭化水素基を表し、Rbは2価の炭化水素基を表し、A、R、m1及びn1は式(1)におけるA、R、m1及びn1とそれぞれ同義である。
式中、m2、m3及びm4は、それぞれ独立に1以上の整数を表し、n2、n3及びn4は、それぞれ独立に0以上の整数を表し、X1、X2及びRは、式(1)におけるX1、X2及びRとそれぞれ同義である。m2、m3又はm4が2以上の整数である場合、複数存在するX1又はX2で表される1価の有機基は、互いに同一であっても異なっていてもよい。n2、n3又はn4が2以上の整数である場合、複数存在するRで表される1価の炭化水素基は、互いに同一であっても異なっていてもよい。
式中、X1a及びX1bは、それぞれ独立に式(3)におけるX1と同義であり、X2a及びX2bは、それぞれ独立に式(3)におけるX2と同義であり、R及びn3は、式(3)におけるR及びn3とそれぞれ同義である。X1a及びX1bは、好ましくは互いに同一である。X2a及びX2bは、好ましくは互いに同一である。
式中、R1a及びR2aは、それぞれ独立に式(1a)におけるRaと同義であり、好ましくは互いに同一である。R1b及びR2bは、それぞれ独立に式(1a)におけるRbと同義であり、好ましくは互いに同一である。R1c及びR2cは、それぞれ独立に式(1a)におけるRcと同義であり、好ましくは互いに同一である。R1d及びR2dは、それぞれ独立に式(1a)におけるRdと同義であり、好ましくは互いに同一である。R及びn3は、式(3a)におけるR及びn3とそれぞれ同義である。
図1は、一実施形態に係る感光性エレメントの模式断面図である。図1に示すように、感光性エレメント1は、支持体2と、支持体2上に設けられた感光性樹脂層3と、感光性樹脂層3の支持体2と反対側に設けられた保護層4とを備えている。
図2は、一実施形態に係る配線基板(プリント配線板とも呼ばれる)の製造方法を示す模式図である。この製造方法では、まず、図2(a)に示すように、絶縁層11と、絶縁層11上に形成された導体層12とを備える基板(例えば回路形成用基板)を用意する。導体層12は、例えば金属銅層であってよい。
(アクリル系樹脂A-1)
還流冷却器、温度計、滴下ロート及び窒素ガス導入管を備えたフラスコに、メチルセロソルブ240g及びトルエン160gの混合液400gを投入した。フラスコ内に窒素ガスを吹き込みながら、上記混合液を攪拌しつつ加熱して80℃まで昇温させた。一方、単量体であるメタクリル酸125g、メタクリル酸メチル250g及びスチレン125gと、アゾビスイソブチロニトリル0.8gとを混合した溶液(a)を用意し、80℃に加熱された上記混合液に溶液(a)を4時間かけて滴下した後、80℃で撹拌しながら2時間保温した。次いで、フラスコ内の溶液に、溶液(a)100gにアゾビスイソブチロニトリル1gを更に溶解した溶液を10分間かけて滴下速度を一定にして滴下した後、フラスコ内の溶液を80℃にて3時間攪拌した。更に、フラスコ内の溶液を30分間かけて90℃まで昇温させ、90℃にて2時間保温した後、冷却することにより、アクリル系樹脂A-1の溶液を得た。
(GPC条件)
ポンプ:日立 L-6000型(株式会社日立製作所製、商品名)
カラム:以下の計3本
Gelpack GL-R420
Gelpack GL-R430
Gelpack GL-R440(以上、日立化成株式会社製、商品名)
溶離液:テトラヒドロフラン
測定温度:40℃
流量:2.05mL/分
検出器:日立 L-3300型RI(株式会社日立製作所製、商品名)
表1に示す各成分を、表1に示す配合量(質量部)で混合することにより、感光性樹脂組成物をそれぞれ調製した。なお、表1に示す(A)成分の配合量(質量部)は、不揮発分の質量(固形分量)である。表1に示す各成分の詳細については、以下のとおりである。
B-1:2,2-ビス(4-(メタクリロキシペンタエトキシ)フェニル)プロパン[FA-321M(日立化成株式会社製、商品名)]
B-2:EO変性トリメチロールプロパンメタクリレート[FA-137M(日立化成株式会社製、商品名)]
B-3:ポリエチレングリコール#400ジメタクリレート[9G(新中村化学工業株式会社製、商品名)]
B-4:トリメチロールプロパンEO変性トリアクリレート[M3130(東洋ケミカルズ株式会社製、商品名)]
(C)成分
C-1:2,2-ビス(o-クロロフェニル)-4,5-4’,5’-テトラフェニル-1,2’-ビイミダゾール[B-CIM(Hampford社製、商品名)]
F-1:ロイコクリスタルバイオレット[LCV(山田化学株式会社製、商品名)]
F-2:1H-ベンゾトリアゾールカルボン酸、5-アミノ-1H-テトラゾール、牛脂アルキルトリメチレンジアミン、ジ(2-エチルヘキシル)アミン、及び、メトキシプロパノールの混合体[SF-808H(サンライト株式会社製、商品名)]
F-3:N-フェニルグリシン[NPG(和光純薬工業株式会社製、商品名)]
支持体として厚さ16μmのポリエチレンテレフタレートフィルム(帝人株式会社製、商品名「HTF-01」)を用意し、支持体上に、感光性樹脂組成物を厚さが均一になるように塗布した後、70℃及び110℃の熱風対流式乾燥器で順次乾燥して、乾燥後の厚さが25μmである感光性樹脂層を形成した。この感光性樹脂層上に保護層としてポリエチレンフィルム(タマポリ株式会社製、商品名「NF-15」)を貼り合わせ、支持体と感光性樹脂層と保護層とが順に積層された感光性エレメントを得た。
銅箔(厚さ:35μm)を両面に積層したガラスエポキシ材である銅張積層板(基板、日立化成株式会社製、商品名「MCL-E-679」)を、表面粗化処理液「メックエッチボンドCZ-8100」(メック株式会社製、商品名)を用いて表面処理した。次いで、水洗、酸洗及び水洗後、空気流で乾燥した。表面処理された銅張積層板を80℃に加温し、保護層を剥離しながら、感光性樹脂層が銅表面に接するように、前記感光性エレメントをそれぞれラミネートした。これにより、銅張積層板、感光性樹脂層、及び、支持体の順に積層された積層体をそれぞれ得た。得られた積層体は、以下に示す試験における試験片として用いた。なお、ラミネートは、110℃のヒートロールを用いて、0.4MPaの圧着圧力、1.5m/分のロール速度で行った。
(パターン精度の評価)
前記試験片の感光性樹脂層上に41段ステップタブレット(日立化成株式会社製)を置いた。次いで、評価用パターンとして、ライン幅/スペース幅がn/n(n=3~20μmで2~2.5μmずつ)の配線パターンを有する描画データを、半導体レーザーを光源として有する波長405nmのDLP露光機(ビアメカニクス株式会社製、商品名「DE-1UH」)を用いて露光した。露光は、41段ステップタブレットの現像後の残存ステップ段数が14.0となる露光量で行った。次いで、支持体を剥離し、30℃の1.0質量%炭酸ナトリウム水溶液を60秒間スプレーして未露光部分を除去することにより、レジストパターンを形成した。得られたレジストパターンを光学顕微鏡で観察し、レジストパターンのライン幅を測定した。この実測のライン幅と、描画データにおける配線パターンのライン幅との差ΔL(=実測のライン幅-配線パターンのライン幅)が小さいほど、精度良くレジストパターンを形成できていることを意味する。以下の基準に基づいて評価した結果を表1に示す。
A:ΔLが1.0μm未満
B:ΔLが1.0μm以上1.5μm未満
C:ΔLが1.5μm以上3.0μm未満
D:ΔLが3.0μm以上
E:感度不足によりレジストパターンがすべて剥離
Claims (4)
- 支持体と、
前記支持体上に設けられ、請求項2に記載の感光性樹脂組成物からなる感光性樹脂層と、
を備える、感光性エレメント。 - 請求項2に記載の感光性樹脂組成物からなる感光性樹脂層を基板上に設ける工程と、
前記感光性樹脂層の一部を光硬化させる工程と、
前記感光性樹脂層の未硬化部分を除去してレジストパターンを形成する工程と、
前記基板の前記レジストパターンが形成されていない部分に配線層を形成する工程と、
を備える、配線基板の製造方法。
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WO2007123062A1 (ja) * | 2006-04-18 | 2007-11-01 | Hitachi Chemical Company, Ltd. | 感光性エレメント、レジストパターンの形成方法及びプリント配線板の製造方法 |
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