JP7045663B2 - 複屈折測定装置および複屈折測定方法 - Google Patents

複屈折測定装置および複屈折測定方法 Download PDF

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JP7045663B2
JP7045663B2 JP2017232288A JP2017232288A JP7045663B2 JP 7045663 B2 JP7045663 B2 JP 7045663B2 JP 2017232288 A JP2017232288 A JP 2017232288A JP 2017232288 A JP2017232288 A JP 2017232288A JP 7045663 B2 JP7045663 B2 JP 7045663B2
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light
phase difference
measurement object
image
measuring device
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JP2019100862A5 (enExample
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顕雄 江本
隆史 福田
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National Institute of Advanced Industrial Science and Technology AIST
Doshisha Co Ltd
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National Institute of Advanced Industrial Science and Technology AIST
Doshisha Co Ltd
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JP2017232288A 2017-12-04 2017-12-04 複屈折測定装置および複屈折測定方法 Active JP7045663B2 (ja)

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KR102854841B1 (ko) * 2020-06-23 2025-09-03 현대자동차 주식회사 복합막 단층 측정을 위한 영상 시스템 및 그 방법
JP7318874B2 (ja) * 2021-04-16 2023-08-01 国立大学法人長岡技術科学大学 光測定装置
US12480866B2 (en) 2021-04-16 2025-11-25 National University Corporation Nagaoka University Of Technology Optical measurement apparatus

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004205500A (ja) 2002-12-13 2004-07-22 Canon Inc 複屈折測定装置及び複屈折測定方法
WO2008142723A2 (en) 2007-05-18 2008-11-27 Universita' Della Calabria Method and device for measuring circular dichroism in real time
JP2010008430A (ja) 2009-10-13 2010-01-14 Nokodai Tlo Kk 複屈折特性測定装置
WO2016031567A1 (ja) 2014-08-26 2016-03-03 学校法人同志社 複屈折測定装置および複屈折測定方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004205500A (ja) 2002-12-13 2004-07-22 Canon Inc 複屈折測定装置及び複屈折測定方法
WO2008142723A2 (en) 2007-05-18 2008-11-27 Universita' Della Calabria Method and device for measuring circular dichroism in real time
JP2010008430A (ja) 2009-10-13 2010-01-14 Nokodai Tlo Kk 複屈折特性測定装置
WO2016031567A1 (ja) 2014-08-26 2016-03-03 学校法人同志社 複屈折測定装置および複屈折測定方法

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