JP7035946B2 - イオン分析装置 - Google Patents

イオン分析装置 Download PDF

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Publication number
JP7035946B2
JP7035946B2 JP2018189685A JP2018189685A JP7035946B2 JP 7035946 B2 JP7035946 B2 JP 7035946B2 JP 2018189685 A JP2018189685 A JP 2018189685A JP 2018189685 A JP2018189685 A JP 2018189685A JP 7035946 B2 JP7035946 B2 JP 7035946B2
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ion
time
unit
mass
time constant
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JP2019114528A (ja
JP2019114528A5 (enExample
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宏之 三浦
秀明 出水
潔 小河
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Shimadzu Corp
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JP2018189685A 2017-12-20 2018-10-05 イオン分析装置 Active JP7035946B2 (ja)

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US16/226,003 US10541125B2 (en) 2017-12-20 2018-12-19 Ion analyzer

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JP2017244343 2017-12-20
JP2017244343 2017-12-20

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JP2019114528A JP2019114528A (ja) 2019-07-11
JP2019114528A5 JP2019114528A5 (enExample) 2021-04-01
JP7035946B2 true JP7035946B2 (ja) 2022-03-15

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Publication number Priority date Publication date Assignee Title
GB2617318B (en) * 2022-03-30 2025-01-15 Thermo Fisher Scient Bremen Gmbh Analysis of time-of-flight mass spectra
JP2024004391A (ja) * 2022-06-28 2024-01-16 株式会社日立ハイテク 測定装置および質量分析装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070018092A1 (en) 2005-07-19 2007-01-25 University Of New Hampshire Electronic read-out circuits for pixilated/resistive charge detectors
JP2017211285A (ja) 2016-05-26 2017-11-30 株式会社島津製作所 分析データ処理装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04154038A (ja) * 1990-10-17 1992-05-27 Yamaha Corp 質量分析計

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070018092A1 (en) 2005-07-19 2007-01-25 University Of New Hampshire Electronic read-out circuits for pixilated/resistive charge detectors
JP2017211285A (ja) 2016-05-26 2017-11-30 株式会社島津製作所 分析データ処理装置

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