JP7014647B2 - A break filter and a method for producing a silicon carbide porous body used in the break filter. - Google Patents

A break filter and a method for producing a silicon carbide porous body used in the break filter. Download PDF

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JP7014647B2
JP7014647B2 JP2018046604A JP2018046604A JP7014647B2 JP 7014647 B2 JP7014647 B2 JP 7014647B2 JP 2018046604 A JP2018046604 A JP 2018046604A JP 2018046604 A JP2018046604 A JP 2018046604A JP 7014647 B2 JP7014647 B2 JP 7014647B2
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聖一 福岡
裕樹 渡邉
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Coorstek KK
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Description

本発明は、ブレイクフィルタ(ディフューザーとも言う)及びこのブレイクフィルタに用いられる炭化珪素質多孔体の製造方法に関し、例えば、半導体製造装置におけるロードロックに用いられ、減圧下の容器内を大気圧に復帰させるためにガス導入口に設置されるブレイクフィルタ及びこのブレイクフィルタに好適な炭化珪素質多孔体の製造方法に関する。 The present invention relates to a break filter (also referred to as a diffuser) and a method for manufacturing a silicon carbide porous body used in the break filter. The present invention relates to a break filter installed at a gas inlet and a method for producing a silicon carbide porous body suitable for the break filter .

半導体製造工程においては、処理装置内部を減圧し、減圧下で熱処理が行われている。そして、この熱処理が終了すると、前記処理装置内を減圧状態から大気圧まで戻し、前記半導体ウェハの取り出しがなされる。
このような半導体処理装置にあっては、処理されるウェハを外部から搬入、または処理されたウェハを外部へ搬出する際に、その処理装置内の雰囲気を外部雰囲気に合わせることになるため、通常、ガス導入口部とガス排気口部とが設けられている。そして、これらガス導入口部、ガス排気口部によって、処理装置内の雰囲気ガスを排出して減圧状態にし、またガスを導入して減圧状態を解除するように構成されている。
In the semiconductor manufacturing process, the inside of the processing apparatus is depressurized and heat treatment is performed under the reduced pressure. Then, when this heat treatment is completed, the inside of the processing apparatus is returned from the reduced pressure state to the atmospheric pressure, and the semiconductor wafer is taken out.
In such a semiconductor processing device, when the wafer to be processed is carried in from the outside or the processed wafer is carried out to the outside, the atmosphere inside the processing device is usually matched with the external atmosphere. , A gas introduction port and a gas exhaust port are provided. The gas introduction port and the gas exhaust port are configured to discharge the atmospheric gas in the processing device to a reduced pressure state, and to introduce a gas to release the reduced pressure state.

この半導体処理装置の概略構成を、図3に基づいて説明する。
図3に示すように、半導体処理装置50には、ガスを導入して減圧状態を解除するガス導入装置60が設けられている。このガス導入口にガス導入装置(ブレイクフィルタ)60が用いられる場合、開閉弁51を開けた瞬間の圧力変動を緩和させることができるため、装置内のパーティクルの舞い上がりを抑制する効果がある。また、装置内の排気を行う場合、排気用の開閉弁52と並列に微調整弁53が備えられ、排気開始にあたって微調整弁53が操作されることでスロー排気が実現される、尚、図中の符号Wは処理されるウェハである。
The schematic configuration of this semiconductor processing apparatus will be described with reference to FIG.
As shown in FIG. 3, the semiconductor processing device 50 is provided with a gas introduction device 60 that introduces gas to release the depressurized state. When a gas introduction device (break filter) 60 is used for the gas introduction port, the pressure fluctuation at the moment when the on-off valve 51 is opened can be alleviated, so that there is an effect of suppressing the flying of particles in the device. Further, when exhausting the inside of the device, a fine adjustment valve 53 is provided in parallel with the on-off valve 52 for exhaust, and slow exhaust is realized by operating the fine adjustment valve 53 at the start of exhaust. The reference numeral W in the inside is the wafer to be processed.

このようにして用いられるガス導入装置(ブレイクフィルタ)60は、図4に示すように、フィルタエレメント61が、一対の金属製スペーサ62a、62b間にポリテトラフルオロエチレン(PTFE)製ガスケット63、63を介して装着されている。また、金属製中空状で周囲に多数の通気口64が穿設された通気パイプ65が設けられ、スペーサ62a及びフィルタエレメント61を貫通している。 In the gas introduction device (break filter) 60 used in this way, as shown in FIG. 4, the filter element 61 has a polytetrafluoroethylene (PTFE) gasket 63, 63 between the pair of metal spacers 62a, 62b. It is attached via. Further, a ventilation pipe 65 having a hollow metal shape and having a large number of ventilation holes 64 formed around it is provided and penetrates the spacer 62a and the filter element 61.

このガス導入装置(ブレイクフィルタ)60によって減圧状態を解除するには、まず開閉弁51が開放されて、ガスがスペーサ62b側の通気パイプ65から導入される。このガスは通気口64及びフィルタエレメント61を介して処理装置内に導入されるが、このときフィルタエレメント61が抵抗となり、流速が減速されて徐々に減圧状態が解除される。
このように、ガスは、処理装置内へ流れ込む速度が減速され、処理装置内のパーティクルの舞い上がりや結露の発生が抑制される。
In order to release the reduced pressure state by the gas introduction device (break filter) 60, the on-off valve 51 is first opened, and gas is introduced from the ventilation pipe 65 on the spacer 62b side. This gas is introduced into the processing device via the vent 64 and the filter element 61. At this time, the filter element 61 becomes a resistance, the flow velocity is decelerated, and the depressurized state is gradually released.
In this way, the speed at which the gas flows into the processing device is slowed down, and the flying up of particles in the processing device and the generation of dew condensation are suppressed.

ところで、ガス導入装置60(ブレイクフィルタ)におけるフィルタエレメント61の材質としては、ニッケルなどの金属粒子からなる濾過材(特許文献1)、或いはPTFE等の樹脂からなる濾過材、或いはアルミナ、シリカなどのセラミックスからなる濾過材が一般に用いられている。また、特許文献2には、炭化珪素質多孔体を濾過材としたブレイクフィルタが開示されている。 By the way, as the material of the filter element 61 in the gas introduction device 60 (break filter), a filter material made of metal particles such as nickel (Patent Document 1), a filter material made of a resin such as PTFE, alumina, silica or the like can be used. Filter media made of ceramics are commonly used. Further, Patent Document 2 discloses a break filter using a silicon carbide porous material as a filter material.

特表2012-530592号公報Special Table 2012-530592A Gazette 特許第5032937号公報Japanese Patent No. 5032937

しかしながら、フィルタエレメント61の材質として、ニッケルなどの金属粒子からなる濾過材を用いた場合、ロードロック内に導入されるガス、例えば腐食性ガスにより腐食が進行するという問題があった。また、アルミナセラミックスを濾過材として用いた場合、アルミナ自体の耐食性は高いが、助剤として添加される添加剤や不可避的不純物により、耐食性が低下するという課題があった。また、シリカセラミックスを濾過材として用いた場合には、フッ素系ガスに対する耐食性が劣るという課題があった。更に、PTFEを濾過材とした場合には、強度及び耐熱性が劣るという課題があった。 However, when a filter material made of metal particles such as nickel is used as the material of the filter element 61, there is a problem that corrosion proceeds due to a gas introduced into the load lock, for example, a corrosive gas. Further, when alumina ceramics are used as a filter material, the corrosion resistance of alumina itself is high, but there is a problem that the corrosion resistance is lowered due to additives and unavoidable impurities added as auxiliary agents. Further, when silica ceramics are used as a filter material, there is a problem that the corrosion resistance to a fluorine-based gas is inferior. Further, when PTFE is used as a filter material, there is a problem that the strength and heat resistance are inferior.

前記耐食性、及び耐熱性などの課題を解決するものとしては、特許文献2に開示された炭化珪素質多孔体を濾過材に用いることが考えられる。
しかしながら、特許文献2に開示されたブレイクフィルタにあっては、気孔径、気孔率が大きいため、パーティクル捕集性能、及びパーティクルの舞い上がり防止性能の点で不十分という課題があった。
また、前記課題を解決するため、炭化珪素多孔体において気孔径を小さくすると、気孔率が小さくなり、パーティクル捕集性能、パーティクル舞い上がり防止性能は改善されるが、圧力損失が大きくなって容器内を大気圧に復帰させる時間が長くなるという別の課題が生じていた。
As a solution to the problems such as corrosion resistance and heat resistance, it is conceivable to use the silicon carbide porous material disclosed in Patent Document 2 as the filter material.
However, the break filter disclosed in Patent Document 2 has a problem that it is insufficient in terms of particle collection performance and particle fly-up prevention performance because of its large pore diameter and porosity.
Further, in order to solve the above-mentioned problems, if the pore diameter of the silicon carbide porous body is reduced, the porosity is reduced, and the particle collection performance and the particle soaring prevention performance are improved, but the pressure loss is increased and the inside of the container is filled. Another problem was that it took longer to return to atmospheric pressure.

そこで、本願発明者は、ブレイクフィルタの濾過材として、耐食性、及び耐熱性に優れる炭化珪素質多孔体を用いることを前提とし、前記特許文献2に開示された発明の有する課題を解決するために鋭意研究を行い、本願発明をするに至った。 Therefore, the inventor of the present application presupposes that a silicon carbide porous body having excellent corrosion resistance and heat resistance is used as the filter material for the break filter, in order to solve the problems of the invention disclosed in Patent Document 2. Diligent research has led to the invention of the present application.

本発明は、前記事情の下になされたものであり、減圧下の容器内を大気圧に復帰させるために、ガス導入口に設置されるブレイクフィルタにおいて、パーティクル捕集性能、及びパーティクル舞い上がり防止性能を確保するとともに、容器内を短時間のうちに大気圧に復帰させることのできるブレイクフィルタ、及びこのブレイクフィルタに用いられる炭化珪素質多孔体の製造方法を提供することを目的とする。 The present invention has been made under the above circumstances, and has particle collection performance and particle soaring prevention performance in a break filter installed at a gas inlet in order to return the inside of a container under reduced pressure to atmospheric pressure. It is an object of the present invention to provide a break filter capable of returning the inside of a container to atmospheric pressure in a short time, and a method for producing a silicon carbide porous body used for the break filter .

上記目的を達成するためになされた本発明にかかるブレイクフィルタは、半導体製造装置のガス導入口に設置される、炭化珪素質多孔体からなるフィルターエレメントを備えるブレイクフィルタであって、前記フィルターエレメントは、複数の炭化珪素粒子が互いに結合することにより骨格をなすとともに、複数の気孔を形成し、隣接する前記炭化珪素粒子同士が面接触することにより形成されたネック部を有し、平均気孔径が3μmより大きく9μm以下であって、気孔率が35%以上55%以下の炭化珪素質多孔体からなる、ことを特徴とする。
このように構成された炭化珪素質多孔体を、半導体処理装置のガス導入口に設置されるブレイクフィルタに用いることによって、十分なガス流量を確保しつつ、優れたパーティクル捕集性能、及びパーティクル舞い上がり防止性能を得ることができる。また、ネック部を有することにより十分な強度を持たせることができる。
The break filter according to the present invention made to achieve the above object is a break filter provided with a filter element made of a silicon carbide porous body, which is installed at a gas inlet of a semiconductor manufacturing apparatus, and the filter element is , A plurality of silicon carbide particles are bonded to each other to form a skeleton, and a plurality of pores are formed, and the adjacent silicon carbide particles have a neck portion formed by surface contact with each other, and the average pore diameter is large. It is characterized by being composed of a silicon carbide porous body having a porosity of 35% or more and 55% or less, which is larger than 3 μm and 9 μm or less.
By using the silicon carbide porous material configured in this way for the break filter installed in the gas inlet of the semiconductor processing device, excellent particle collection performance and particle soaring can be achieved while ensuring a sufficient gas flow rate. Prevention performance can be obtained. Further, by having the neck portion, sufficient strength can be given.

また、上記目的を達成するためになされた本発明にかかる炭化珪素質多孔体の製造方法は、半導体処理装置のガス導入口に設置されるブレイクフィルタに用いられる炭化珪素質多孔体の製造方法であって、平均粒子径0.5μm以上5μm以下とした炭化珪素粒子に有機バインダーを添加、混合し、成形後に非酸化性雰囲気下で焼成する工程を備え、前記焼成の温度は2200℃以上2400℃以下であることを特徴とする。
また、前記平均粒子径0.5μm以上5μm以下とした炭化珪素粒子は、平均粒子径1μm未満の炭化珪素微粒子と平均粒子径1μm以上の炭化珪素粒子を混合したものであり、平均粒子径1μm未満の炭化珪素微粒子は、炭化珪素粒子全体の10wt%以上20wt%以下であることが好ましい。
Further, the method for producing a silicon carbide porous body according to the present invention, which has been made to achieve the above object, is a method for producing a silicon carbide porous body used for a break filter installed in a gas inlet of a semiconductor processing apparatus. A step of adding and mixing an organic binder to silicon carbide particles having an average particle diameter of 0.5 μm or more and 5 μm or less and firing in a non-oxidizing atmosphere after molding is provided, and the firing temperature is 2200 ° C. or higher and 2400 ° C. It is characterized by the following.
The silicon carbide particles having an average particle diameter of 0.5 μm or more and 5 μm or less are a mixture of silicon carbide fine particles having an average particle diameter of less than 1 μm and silicon carbide particles having an average particle diameter of 1 μm or more, and have an average particle diameter of less than 1 μm. The silicon carbide fine particles in the above are preferably 10 wt% or more and 20 wt% or less of the total silicon carbide particles.

このような方法で炭化珪素質多孔体を製造することにより、前記した本発明に係る炭化珪素質多孔体を得ることができる。 By producing the silicon carbide porous body by such a method, the silicon carbide porous body according to the present invention can be obtained.

また、前記平均粒子径0.5μm以上5μm以下の炭化珪素原料に有機バインダーを添加、混合し、成形後に焼成する工程の後、更に酸化性雰囲気下で、1000℃以上1300℃以下の温度で加熱処理することが好ましい。
このように上記温度範囲での酸化加熱処理を行うことにより、炭化珪素表面に酸化被膜が形成され、欠陥になり得る亀裂が充填され、補修される。その結果、多孔質体としての強度を2倍程度増加させることができる。
Further, after the step of adding and mixing an organic binder to the silicon carbide raw material having an average particle diameter of 0.5 μm or more and 5 μm or less, molding and firing, the mixture is further heated at a temperature of 1000 ° C. or higher and 1300 ° C. or lower in an oxidizing atmosphere. It is preferable to process.
By performing the oxidative heat treatment in the above temperature range in this way, an oxide film is formed on the surface of silicon carbide, and cracks that can become defects are filled and repaired. As a result, the strength as a porous body can be increased by about twice.

本発明によれば、減圧下の容器内を大気圧に復帰させるために、ガス導入口に設置されるブレイクフィルタにおいて、パーティクル捕集性能、及びパーティクル舞い上がり防止性能を確保するとともに、容器内を短時間のうちに大気圧に復帰させることのできるブレイクフィルタ、及びこのブレイクフィルタに用いられる炭化珪素質多孔体の製造方法を提供することができる。 According to the present invention, in order to return the inside of the container under reduced pressure to atmospheric pressure, the break filter installed at the gas inlet secures the particle collection performance and the particle soaring prevention performance, and shortens the inside of the container. It is possible to provide a break filter capable of returning to atmospheric pressure in time, and a method for producing a silicon carbide porous body used in the break filter .

図1は、本発明に係る炭化珪素質多孔体の第一の実施形態の骨格構造を示すSEM像である。FIG. 1 is an SEM image showing the skeletal structure of the first embodiment of the silicon carbide porous body according to the present invention. 図2は、本発明に係る炭化珪素質多孔体の第二の実施形態の骨格構造を示すSEM像である。FIG. 2 is an SEM image showing the skeletal structure of the second embodiment of the silicon carbide porous body according to the present invention. 図3は、半導体処理装置の概略構成を示すブロック図である。FIG. 3 is a block diagram showing a schematic configuration of a semiconductor processing apparatus. 図4は、ガス導入装置(ブレイクフィルタ)の概略構成を示すブロック図である。FIG. 4 is a block diagram showing a schematic configuration of a gas introduction device (break filter).

以下、本発明に係る炭化珪素質多孔体(ブレイクフィルタのフィルタエレメント)及びその製造方法の実施の形態について図面に基づき説明する。
図1は本発明に係る炭化珪素質多孔体の第一の実施形態の骨格構造を示すSEM(走査型電子顕微鏡)像である。
Hereinafter, embodiments of the silicon carbide porous body (filter element of the break filter) and the method for manufacturing the same according to the present invention will be described with reference to the drawings.
FIG. 1 is an SEM (scanning electron microscope) image showing the skeletal structure of the first embodiment of the silicon carbide porous body according to the present invention.

図1に示す炭化珪素質多孔体1は、炭化珪素(SiC)からなり、複数の炭化珪素粒子が結合されて骨格をなし、それらの間に多数の気孔が形成されている。この炭化珪素質多孔体1の平均気孔径は、3μmより大きく9μm以下(好ましくは3μmより大きく6μm以下)であり、気孔率は35%以上55%以下である。
尚、平均気孔径の測定は、水銀圧入法を用いた。また、炭化珪素粒子の平均粒子径の測定には、SEM画像解析法を用いた。
The silicon carbide porous body 1 shown in FIG. 1 is made of silicon carbide (SiC), and a plurality of silicon carbide particles are bonded to form a skeleton, and a large number of pores are formed between them. The average pore diameter of the silicon carbide porous body 1 is larger than 3 μm and 9 μm or less (preferably larger than 3 μm and 6 μm or less), and the porosity is 35% or more and 55% or less.
The mercury intrusion method was used to measure the average pore diameter. In addition, the SEM image analysis method was used to measure the average particle size of the silicon carbide particles.

また、図1の画像に示すように、隣接する炭化珪素粒子2同士は面接触し、その接続部にネック部3が形成されている。このネック部3が形成されていることにより、濾過材として使用するに耐える十分な強度を持たせることができる。 Further, as shown in the image of FIG. 1, adjacent silicon carbide particles 2 are in surface contact with each other, and a neck portion 3 is formed at the connecting portion thereof. Since the neck portion 3 is formed, it can be provided with sufficient strength to withstand use as a filtering material.

尚、平均気孔径が3μm以下の場合、圧力損失が大きくガス供給量が少なくなる。そのため、そのため、大気圧に到達するまでの時間が大幅に長くなる。一方、平均気孔径が9μmより大きいと、パーティクル捕集性能、及びパーティクル舞い上がり防止機能が低下し、ウェハ製造歩留まりの低下という課題がある。 When the average pore diameter is 3 μm or less, the pressure loss is large and the gas supply amount is small. Therefore, the time required to reach the atmospheric pressure becomes significantly longer. On the other hand, if the average pore diameter is larger than 9 μm, the particle collection performance and the particle fly-up prevention function are deteriorated, and there is a problem that the wafer manufacturing yield is lowered.

また、気孔率が35%より小さいと、ガス供給量が小さくなり、大気圧に達するまでの時間が大幅に長くなる。一方、気孔率が55%より大きいと、パーティクル舞い上がり防止性能が低下し、ウェハ製造歩留まりが低下する。 Further, when the porosity is smaller than 35%, the gas supply amount becomes small and the time until the atmospheric pressure is reached becomes significantly long. On the other hand, when the porosity is larger than 55%, the particle flying prevention performance is lowered and the wafer manufacturing yield is lowered.

このように形成された炭化珪素質多孔体1をブレイクフィルタとして用いることにより、十分なガス流量を確保しつつ、パーティクルを捕集し、パーティクル舞い上がりを十分に防止することができる。 By using the silicon carbide porous body 1 thus formed as a break filter, it is possible to collect particles and sufficiently prevent the particles from flying up while ensuring a sufficient gas flow rate.

前記炭化珪素質多孔体1を製造するには、平均粒子径0.5μm~5μmの炭化珪素原料に有機バインダーを添加、混合し、成形後に非酸化性雰囲気下で焼成する。焼成は、2200℃~2400℃で例えば2時間行う。炭化珪素原料の平均粒子径0.5μm~5μmの根拠は、0.5μmより小さいと気孔率が小さくなりガス供給量が小さくなって、大気圧に達するまでの時間が大幅に長くなる。5μmより大きいと気孔径が大きくなりパーティクル捕集性能、及びパーティクル舞い上がり防止機能が低下してしまう。 In order to produce the silicon carbide porous body 1, an organic binder is added to a silicon carbide raw material having an average particle diameter of 0.5 μm to 5 μm, mixed, and calcined in a non-oxidizing atmosphere after molding. Baking is carried out at 2200 ° C to 2400 ° C for, for example, 2 hours. The reason why the average particle size of the silicon carbide raw material is 0.5 μm to 5 μm is that if it is smaller than 0.5 μm, the porosity becomes small, the gas supply amount becomes small, and the time until the atmospheric pressure is reached becomes significantly long. If it is larger than 5 μm, the pore diameter becomes large and the particle collection performance and the particle soaring prevention function are deteriorated.

尚、焼成体を得るには2000℃~2200℃での加熱で可能であるが、その場合、粒成長が不十分となって炭化珪素微粉が残存し、発塵源となるとともに、気孔径が小さくなり、供給ガス量が減少する。更には、ネック部3の成長が十分ではなくなり、強度も不十分となる。 It is possible to obtain a fired body by heating at 2000 ° C to 2200 ° C, but in that case, the grain growth becomes insufficient and silicon carbide fine powder remains, which becomes a dust generation source and has a pore diameter. It becomes smaller and the amount of gas supplied decreases. Further, the growth of the neck portion 3 is not sufficient, and the strength is also insufficient.

焼成温度を前記のように2200℃~2400℃とすれば、炭化珪素微粉が気化する、或いはネック部に炭化珪素微粉が析出して凝集することで消失する。更には、強度も向上する。
焼成温度が2400℃より大きい場合は、粒成長が進み気孔径が大きくなりパーティクル捕集性能、及びパーティクル舞い上がり防止機能が低下るとともに強度が低下する。
尚、平均粒子径0.5μm以上5μm以下とした炭化珪素粒子は、平均粒子径1μm未満の炭化珪素微粒子と平均粒子径1μm以上の炭化珪素粒子を混合したものとし、平均粒子径1μm未満の炭化珪素微粒子を、炭化珪素粒子全体の10wt%以上20wt%以下とすることにより、炭化珪素粒子全体の大きさの割合が適切に制御され、目的とする気孔や骨格構造が作りやすくなる。
When the firing temperature is set to 2200 ° C. to 2400 ° C. as described above, the silicon carbide fine powder is vaporized, or the silicon carbide fine powder is deposited and aggregated on the neck portion and disappears. Furthermore, the strength is also improved.
When the firing temperature is higher than 2400 ° C., the grain growth progresses, the pore diameter becomes large, the particle collection performance and the particle flying prevention function are deteriorated, and the strength is lowered.
The silicon carbide particles having an average particle diameter of 0.5 μm or more and 5 μm or less are a mixture of silicon carbide fine particles having an average particle diameter of less than 1 μm and silicon carbide particles having an average particle diameter of 1 μm or more. By setting the silicon fine particles to 10 wt% or more and 20 wt% or less of the entire silicon carbide particles, the ratio of the size of the entire silicon carbide particles is appropriately controlled, and the target pores and skeletal structure can be easily formed.

以上のように本発明に係る第一の実施の形態によれば、炭化珪素質多孔体1において、平均気孔径が3μmより大きく9μm以下(好ましくは3μmより大きく6μm以下)、気孔率を35%以上55%以下とすることにより、十分なガス流量を確保しつつ、優れたパーティクル捕集性能、及びパーティクル舞い上がり防止性能を得ることができる。 As described above, according to the first embodiment of the present invention, in the silicon carbide porous body 1, the average pore diameter is larger than 3 μm and 9 μm or less (preferably larger than 3 μm and 6 μm or less), and the porosity is 35%. By setting the content to 55% or less, it is possible to obtain excellent particle collection performance and particle soaring prevention performance while ensuring a sufficient gas flow rate.

続いて、本発明に係る第二の実施形態について説明する。この第二の実施形態では、前記した第一の実施形態で得られた炭化珪素質多孔体1に対し更に加熱による酸化処理を行う。
即ち、前記得られた炭化珪素質多孔体1を、酸化雰囲気1000℃~1300℃で例えば2時間、加熱処理する。この酸化処理により得られた炭化珪素質多孔体10を図2に示す。図2は本発明に係る炭化珪素質多孔体の第二の実施形態の骨格構造を示すSEM(走査型電子顕微鏡)像である。
Subsequently, a second embodiment according to the present invention will be described. In this second embodiment, the silicon carbide porous body 1 obtained in the first embodiment is further subjected to an oxidation treatment by heating.
That is, the obtained silicon carbide porous body 1 is heat-treated in an oxidizing atmosphere of 1000 ° C. to 1300 ° C. for, for example, 2 hours. The silicon carbide porous body 10 obtained by this oxidation treatment is shown in FIG. FIG. 2 is an SEM (scanning electron microscope) image showing the skeletal structure of the second embodiment of the silicon carbide porous body according to the present invention.

この酸化処理により多孔質体としての強度が2倍程度に増加する。これは、加熱処理によって、SiC表面に酸化被膜(好ましくは膜厚50nm~200nm)が形成され、欠陥になり得る亀裂が充填され、補修されるためと考えられる。
この加熱処理による高強度化によってガス供給圧が大きくなり、ガス流量が増加できることから減圧された容器が大気圧に復帰するまでの時間を短くすることができる。
This oxidation treatment doubles the strength of the porous body. It is considered that this is because an oxide film (preferably a film thickness of 50 nm to 200 nm) is formed on the SiC surface by the heat treatment, and cracks that can become defects are filled and repaired.
By increasing the strength by this heat treatment, the gas supply pressure increases and the gas flow rate can be increased, so that the time until the depressurized container returns to the atmospheric pressure can be shortened.

尚、前記高強度化のための加熱処理において、加熱温度が1000℃より低いと、酸化膜厚が薄くなり、強度向上効果が不十分となる。一方、加熱温度が1300℃より高いと、酸化膜厚は更に厚くなるものの、欠陥の充填、補修効果が飽和し、それ以上の強度効果が認められない。また、厚くなりすぎた酸化膜が、熱膨張率の差によりSiC表面から剥がれてしまい発塵源となりやすい。 In the heat treatment for increasing the strength, if the heating temperature is lower than 1000 ° C., the oxide film thickness becomes thin and the strength improving effect becomes insufficient. On the other hand, when the heating temperature is higher than 1300 ° C., the oxide film thickness becomes thicker, but the defect filling and repairing effects are saturated, and no further strength effect is observed. Further, the oxide film that has become too thick is easily peeled off from the SiC surface due to the difference in the thermal expansion rate and becomes a dust generation source.

以上のように本発明に係る第二の実施形態によれば、平均気孔径が3μmより大きく9μm以下(好ましくは3μmより大きく6μm以下)、気孔率を35%以上55%以下とした炭化珪素質多孔体1に対し所定温度で酸化加熱処理を行うことで、より高強度となり、パーティクル捕集性能、パーティクル舞い上がり防止性能に優れ、チャンバの減圧から大気圧に復帰までの時間を短縮可能な炭化珪素質多孔体10を得ることができる。 As described above, according to the second embodiment of the present invention, the silicon carbide having an average pore diameter of more than 3 μm and 9 μm or less (preferably larger than 3 μm and 6 μm or less) and a porosity of 35% or more and 55% or less. By performing oxidation heat treatment on the porous body 1 at a predetermined temperature, the strength becomes higher, the particle collection performance and the particle soaring prevention performance are excellent, and the time from decompression of the chamber to return to atmospheric pressure can be shortened. A porous body 10 can be obtained.

続いて、本発明に係る炭化珪素質多孔体について、実施例に基づきさらに説明する。
本実施例では、前記実施の形態に示した構成の炭化珪素質多孔体の製造を行うことにより、その効果を検証した。
Subsequently, the silicon carbide porous body according to the present invention will be further described based on Examples.
In this example, the effect was verified by producing a silicon carbide porous body having the constitution shown in the above embodiment.

(実験1)
実験1では、本発明においてフィルタエレメントの材質として用いる炭化珪素質多孔体の耐食性について検証した。
(Experiment 1)
In Experiment 1, the corrosion resistance of the silicon carbide porous body used as the material of the filter element in the present invention was verified.

実験1で検証する炭化珪素質多孔体として、OY-15(屋久島電工株式会社製)を試料として用いた。
そして、この多孔体の試料をHF10%溶液(22℃)に15時間浸漬し、試料1gあたりの成分溶出量(μg/g)を測定した。
また、前記多孔体の試料をHCI10%溶液(22℃)に15時間浸漬し、試料1gあたりの成分溶出量(μg/g)を測定した。
更に、前記多孔体の試料をHBr10%溶液(22℃)に15時間浸漬し、試料1gあたりの成分溶出量(μg/g)を測定した。
OY-15 (manufactured by Yakushima Denko Co., Ltd.) was used as a sample as the silicon carbide porous body to be verified in Experiment 1.
Then, the sample of this porous body was immersed in a 10% HF solution (22 ° C.) for 15 hours, and the amount of component elution (μg / g) per 1 g of the sample was measured.
Further, the porous sample was immersed in a 10% HCI solution (22 ° C.) for 15 hours, and the amount of component elution (μg / g) per 1 g of the sample was measured.
Further, the porous sample was immersed in a HBr10% solution (22 ° C.) for 15 hours, and the amount of component elution (μg / g) per 1 g of the sample was measured.

また、参考例1として、A社製ディフューザーエレメント(Niエレメント)の試料をHF10%溶液(22℃)に15時間浸漬し、試料1gあたりの成分溶出量(μg/g)を測定した。
また、A社製ディフューザーエレメント(Niエレメント)の試料をHcl10%溶液(22℃)に15時間浸漬し、試料1gあたりの成分溶出量(μg/g)を測定した。
更に、A社製ディフューザーエレメント(Niエレメント)の試料をHBr10%溶液(22℃)に15時間浸漬し、試料1gあたりの成分溶出量(μg/g)を測定した。
Further, as Reference Example 1, a sample of a diffuser element (Ni element) manufactured by Company A was immersed in a 10% HF solution (22 ° C.) for 15 hours, and the amount of component elution (μg / g) per 1 g of the sample was measured.
Further, a sample of a diffuser element (Ni element) manufactured by Company A was immersed in an Hcl 10% solution (22 ° C.) for 15 hours, and the amount of component elution (μg / g) per 1 g of the sample was measured.
Further, a sample of a diffuser element (Ni element) manufactured by Company A was immersed in an HBr 10% solution (22 ° C.) for 15 hours, and the amount of component elution (μg / g) per 1 g of the sample was measured.

また、参考例2では、アルミナ多孔体に試料をHF10%溶液(22℃)に15時間浸漬し、試料1gあたりの成分溶出量(μg/g)を測定した。
また、アルミナ多孔体に試料をHcl10%溶液(22℃)に15時間浸漬し、試料1gあたりの成分溶出量(μg/g)を測定した。
更に、アルミナ多孔体に試料をHBr10%溶液(22℃)に15時間浸漬し、試料1gあたりの成分溶出量(μg/g)を測定した。
Further, in Reference Example 2, the sample was immersed in an alumina porous body in a 10% HF solution (22 ° C.) for 15 hours, and the amount of component elution (μg / g) per 1 g of the sample was measured.
Further, the sample was immersed in an alumina porous body in a Hcl 10% solution (22 ° C.) for 15 hours, and the amount of component elution (μg / g) per 1 g of the sample was measured.
Further, the sample was immersed in an alumina porous body in a 10% HBr solution (22 ° C.) for 15 hours, and the amount of component elution (μg / g) per 1 g of the sample was measured.

実験1の結果を表1に示す。この結果、A社製ディフューザーエレメント(参考例1)からは、Fe,Cr,Cu,Tiの溶出が認められ、アルミナ多孔体(参考例2)からは、Ca、Tiの溶出が認められた。
一方、炭化珪素質多孔体からは、微量のTi溶出が認められたのみであり、耐食性に優れることを確認することができた。
The results of Experiment 1 are shown in Table 1. As a result, elution of Fe, Cr, Cu, and Ti was observed from the diffuser element manufactured by Company A (Reference Example 1), and elution of Ca and Ti was observed from the alumina porous body (Reference Example 2).
On the other hand, only a small amount of Ti elution was observed from the silicon carbide porous body, and it was confirmed that the corrosion resistance was excellent.

Figure 0007014647000001
Figure 0007014647000001

(実験2)
実験2では、本発明に係る炭化珪素質多孔体(第一の実施形態)をブレイクフィルタとして用いた場合の特性について検証した。
この実験2では、平均粒子径が所定範囲の炭化珪素原料100重量部にバインダーとしてPVA(ポリビニルアルコール)を2重量部加え、水とともに混合した。これを乾燥後解砕し、金型成形により得た成形体を所定温度で2時間焼成した。これにより得られた多孔体は、粒子径や加熱温度の条件を変えることにより、平均気孔径、平均気孔率が異なるものとなった。
(Experiment 2)
In Experiment 2, the characteristics when the silicon carbide porous material (first embodiment) according to the present invention was used as a break filter were verified.
In this experiment 2, 2 parts by weight of PVA (polyvinyl alcohol) was added as a binder to 100 parts by weight of a silicon carbide raw material having an average particle size in a predetermined range, and the mixture was mixed with water. This was dried and then crushed, and the molded product obtained by mold molding was fired at a predetermined temperature for 2 hours. The porous body thus obtained had different average pore diameters and average porosities by changing the conditions of the particle diameter and the heating temperature.

そして、得られた多孔体から複数種のサンプルを選定し、それらから直径48mm、厚さ5mmのフィルタを形成した(実施例1~7、比較例1~6)。
表2に、実験2の条件を示す。
Then, a plurality of types of samples were selected from the obtained porous bodies, and filters having a diameter of 48 mm and a thickness of 5 mm were formed from them (Examples 1 to 7 and Comparative Examples 1 to 6).
Table 2 shows the conditions of Experiment 2.

Figure 0007014647000002
Figure 0007014647000002

表3に、実施例1~7、比較例1~6の多孔体をブレイクフィルタとして用いた場合の特性を示す。
尚、表3において、ガス流量(L/min)とは、直径48mm、厚さ5mmの多孔体に供給圧0.2MPaでNガスを流し、多孔体を通過したガス量を示す。
また、発塵数とは、直径48mm、厚さ5mmの多孔体にエアを流し、多孔体から発生したパーティクルの個数を示す。
また、パーティクル捕集性能とは、直径48mm、厚さ5mmの多孔体に30nmのパーティクルが含まれるガスを流し、多孔体を通過したパーティクルの割合を示す。なお、パーティクル捕集性能のデータでNは9を表し、その前の数値は9が連なる数を表す。(例:3N=99.9%)
また、パーティクル舞い上がり防止性能とは、チャンバ内に石英粉(直径30~60μm)を撒き、真空から大気に復帰するまでに舞い上がった粒子の数を示す。
Table 3 shows the characteristics when the porous bodies of Examples 1 to 7 and Comparative Examples 1 to 6 are used as break filters.
In Table 3, the gas flow rate (L / min) indicates the amount of gas that has passed through the porous body by flowing N2 gas through the porous body having a diameter of 48 mm and a thickness of 5 mm at a supply pressure of 0.2 MPa.
The number of dust generated indicates the number of particles generated from the porous body by flowing air through the porous body having a diameter of 48 mm and a thickness of 5 mm.
Further, the particle collection performance indicates the ratio of particles that have passed through the porous body by flowing a gas containing particles of 30 nm through the porous body having a diameter of 48 mm and a thickness of 5 mm. In the particle collection performance data, N represents 9, and the numerical value before that represents the number of consecutive 9s. (Example: 3N = 99.9%)
Further, the particle soaring prevention performance indicates the number of particles soared by sprinkling quartz powder (diameter 30 to 60 μm) in the chamber and returning from the vacuum to the atmosphere.

Figure 0007014647000003
Figure 0007014647000003

表3に示す結果から実施例1~7では、十分なガス流量を確保しつつ、パーティクル捕集性能、パーティクル舞い上がり防止性能に優れることを確認した。また、そのときの平均気孔径は、3μmより大きく9μm以下であって、気孔率が35%以上55%以下であることを確認した。
また、平均粒子径0.5μm以上5μm以下の炭化珪素原料に1μm未満の有機バインダーを添加、混合し、成形後に2200℃以上2400℃以下の温度で焼成することにより、前記平均気孔径及び気孔率を有する炭化珪素質多孔体を得ることができることを確認した。
From the results shown in Table 3, it was confirmed that in Examples 1 to 7, the particle collection performance and the particle soaring prevention performance were excellent while ensuring a sufficient gas flow rate. It was also confirmed that the average pore diameter at that time was larger than 3 μm and 9 μm or less, and the porosity was 35% or more and 55% or less.
Further, an organic binder of less than 1 μm is added to a silicon carbide raw material having an average particle diameter of 0.5 μm or more and 5 μm or less, mixed, and calcined at a temperature of 2200 ° C. or more and 2400 ° C. or less after molding to obtain the average pore size and porosity. It was confirmed that a silicon carbide porous body having the above can be obtained.

(実験3)
実験3では、本発明に係る炭化珪素質多孔体(第一の実施形態)を更に酸化加熱し、酸化膜を形成したフィルタの特性について検証した。
この実験3では、前記第一の実施形態に基づき、平均気孔径が5μm、平均気孔率が40%の炭化珪素質多孔体を形成した。
得られた多孔体に対し、加熱温度を条件に2時間の酸化加熱処理を行い、直径48mm、厚さ5mmのフィルタを形成し、その特性を検証した。
実験3の条件及び特性結果を表4に示す
(Experiment 3)
In Experiment 3, the silicon carbide porous body (first embodiment) according to the present invention was further oxidatively heated to verify the characteristics of the filter on which the oxide film was formed.
In this experiment 3, a silicon carbide porous body having an average porosity of 5 μm and an average porosity of 40% was formed based on the first embodiment.
The obtained porous body was subjected to oxidative heat treatment for 2 hours under the condition of heating temperature to form a filter having a diameter of 48 mm and a thickness of 5 mm, and its characteristics were verified.
Table 4 shows the conditions and characteristic results of Experiment 3.

Figure 0007014647000004
Figure 0007014647000004

表4の結果から、第一の実施形態で得られた多孔体に対し、さらに1000℃以上1300℃以下で加熱処理を行うことにより、優れたパーティクル捕集性能及びパーティクル舞い上がり防止性能を維持しつつ更に強度を増加させることができることを確認した。なお、表4のガス流量が表3に比べて多いのは、強度向上により高圧でガスを流すことができたためである。 From the results in Table 4, the porous body obtained in the first embodiment is further heat-treated at 1000 ° C. or higher and 1300 ° C. or lower to maintain excellent particle collection performance and particle fly-up prevention performance. It was confirmed that the strength could be further increased. The gas flow rate in Table 4 is higher than that in Table 3 because the gas can be flowed at high pressure due to the improvement in strength.

以上の実施例の実験結果から、本発明に係る炭化珪素質多孔体によれば、パーティクル捕集性能、及びパーティクル舞い上がり防止性能に優れ、設置チャンバの減圧から大気圧に復帰するまでを短時間にすることができることを確認した。 From the experimental results of the above examples, the silicon carbide porous material according to the present invention is excellent in particle collection performance and particle fly-up prevention performance, and it takes a short time from decompression of the installation chamber to return to atmospheric pressure. Confirmed that it can be done.

1 炭化珪素質多孔体
2 炭化珪素粒子
3 ネック部
10 炭化珪素質多孔体
1 Silicon Carbide Porous Medium 2 Silicon Carbide Particles 3 Neck 10 Silicon Carbide Porous Medium

Claims (4)

半導体製造装置のガス導入口に設置される、炭化珪素質多孔体からなるフィルターエレメントを備えるブレイクフィルタであって、
前記フィルターエレメントは、
複数の炭化珪素粒子が互いに結合することにより骨格をなすとともに、複数の気孔を形成し、隣接する前記炭化珪素粒子同士が面接触することにより形成されたネック部を有し、平均気孔径が3μmより大きく9μm以下であって、気孔率が35%以上55%以下の炭化珪素質多孔体からなる、
ことを特徴とするブレイクフィルタ。
A break filter equipped with a filter element made of a silicon carbide porous material, which is installed at the gas inlet of a semiconductor manufacturing apparatus.
The filter element is
A plurality of silicon carbide particles are bonded to each other to form a skeleton, and a plurality of pores are formed, and the adjacent silicon carbide particles have a neck portion formed by surface contact with each other, and the average pore diameter is 3 μm. It is composed of a silicon carbide porous body having a porosity of 35% or more and 55% or less, which is larger than 9 μm.
A break filter that features that.
半導体処理装置のガス導入口に設置されるブレイクフィルタに用いられる炭化珪素質多孔体の製造方法であって、
平均粒子径0.5μm以上5μm以下とした炭化珪素粒子に有機バインダーを添加、混合し、成形後に非酸化性雰囲気下で2200℃以上2400℃以下で焼成することを特徴とする炭化珪素質多孔体の製造方法。
A method for manufacturing a silicon carbide porous body used for a break filter installed in a gas inlet of a semiconductor processing apparatus.
A silicon carbide porous body characterized by adding and mixing an organic binder to silicon carbide particles having an average particle diameter of 0.5 μm or more and 5 μm or less, and firing at 2200 ° C. or more and 2400 ° C. or less in a non-oxidizing atmosphere after molding. Manufacturing method.
前記平均粒子径0.5μm以上5μm以下とした炭化珪素粒子は、平均粒子径1μm未満の炭化珪素微粒子と平均粒子径1μm以上の炭化珪素粒子を混合したものであり、平均粒子径1μm未満の炭化珪素微粒子は、炭化珪素粒子全体の10wt%以上20wt%以下であることを特徴とする請求項2に記載された炭化珪素質多孔体の製造方法。 The silicon carbide particles having an average particle diameter of 0.5 μm or more and 5 μm or less are a mixture of silicon carbide fine particles having an average particle diameter of less than 1 μm and silicon carbide particles having an average particle diameter of 1 μm or more, and are carbonized with an average particle diameter of less than 1 μm. The method for producing a silicon carbide porous body according to claim 2 , wherein the silicon fine particles are 10 wt% or more and 20 wt% or less of the total silicon carbide particles. 前記平均粒子径0.5μm以上5μm以下の炭化珪素原料に有機バインダーを添加、混合し、成形後に焼成する工程の後、
更に酸化性雰囲気下で、1000℃以上1300℃以下の温度で加熱処理することを特徴とする請求項2乃至請求項3のいずれかに記載された炭化珪素質多孔体の製造方法。
After the step of adding and mixing an organic binder to the silicon carbide raw material having an average particle diameter of 0.5 μm or more and 5 μm or less, and firing after molding,
The method for producing a silicon carbide porous body according to any one of claims 2 to 3 , further comprising heat treatment at a temperature of 1000 ° C. or higher and 1300 ° C. or lower in an oxidizing atmosphere.
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