JP6990455B2 - 液体試料の元素組成を分析する装置およびその使用方法 - Google Patents

液体試料の元素組成を分析する装置およびその使用方法 Download PDF

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JP6990455B2
JP6990455B2 JP2019513058A JP2019513058A JP6990455B2 JP 6990455 B2 JP6990455 B2 JP 6990455B2 JP 2019513058 A JP2019513058 A JP 2019513058A JP 2019513058 A JP2019513058 A JP 2019513058A JP 6990455 B2 JP6990455 B2 JP 6990455B2
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electrodes
electrode
elemental composition
discharge
analyzing
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JP2019535002A (ja
JP2019535002A5 (cg-RX-API-DMAC7.html
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アグネス オブチョースカ
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Obuchowska Agnes
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Obuchowska Agnes
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N1/10—Devices for withdrawing samples in the liquid or fluent state
    • G01N1/14—Suction devices, e.g. pumps; Ejector devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/40—Concentrating samples
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G01N21/67—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G01N21/69—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence specially adapted for fluids, e.g. molten metal
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/12—Ion sources; Ion guns using an arc discharge, e.g. of the duoplasmatron type
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/40—Concentrating samples
    • G01N2001/4038—Concentrating samples electric methods, e.g. electromigration, electrophoresis, ionisation

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  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Hydrology & Water Resources (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2019513058A 2016-09-08 2017-08-31 液体試料の元素組成を分析する装置およびその使用方法 Active JP6990455B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201662384799P 2016-09-08 2016-09-08
US62/384,799 2016-09-08
PCT/CA2017/051032 WO2018045455A1 (en) 2016-09-08 2017-08-31 Apparatus for analyzing the elemental composition of a liquid sample and methods of using the same

Publications (3)

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JP2019535002A JP2019535002A (ja) 2019-12-05
JP2019535002A5 JP2019535002A5 (cg-RX-API-DMAC7.html) 2020-08-13
JP6990455B2 true JP6990455B2 (ja) 2022-01-12

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US (1) US11474042B2 (cg-RX-API-DMAC7.html)
EP (1) EP3510383B1 (cg-RX-API-DMAC7.html)
JP (1) JP6990455B2 (cg-RX-API-DMAC7.html)
CN (1) CN109690296B (cg-RX-API-DMAC7.html)
CA (1) CA3033530C (cg-RX-API-DMAC7.html)
WO (1) WO2018045455A1 (cg-RX-API-DMAC7.html)

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JP7019505B2 (ja) * 2018-04-26 2022-02-15 アークレイ株式会社 プラズマ分光分析方法
CN111063604B (zh) * 2020-01-13 2025-04-22 华南师范大学 加热毛细管液体阴极辉光放电电离装置
CN111739783B (zh) * 2020-05-28 2021-10-29 清华大学 用于小型质谱仪的大气压电弧离子源及其检测方法
US20240162024A1 (en) * 2021-03-16 2024-05-16 Quadrocore Corp. A system for production of high yield of ions in rf only confinement field for use in mass spectrometry
CN113720811B (zh) * 2021-08-19 2022-12-30 中国地质大学（武汉） 一种基于超声雾化进样的微等离子体激发源及激发方法
CN117907562B (zh) * 2024-03-19 2024-06-04 张家港扬子江冷轧板有限公司 一种同时检测镀层中多种元素含量的方法

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JP2013064603A (ja) 2011-09-15 2013-04-11 Gunma Univ 重金属分析装置及び重金属の分析方法

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Publication number Publication date
CA3033530A1 (en) 2018-03-15
US11474042B2 (en) 2022-10-18
EP3510383A1 (en) 2019-07-17
EP3510383B1 (en) 2022-06-01
US20210131971A1 (en) 2021-05-06
JP2019535002A (ja) 2019-12-05
CA3033530C (en) 2023-03-07
EP3510383A4 (en) 2020-06-10
CN109690296A (zh) 2019-04-26
WO2018045455A1 (en) 2018-03-15
CN109690296B (zh) 2021-10-08

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