JP6939950B1 - Inspection equipment and inspection method - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a technique capable of appropriately inspecting clogging of a mesh structure or the like. SOLUTION: A holding portion for holding a plate-shaped object having a network structure in an upright state in a vertical direction, an imaging unit for imaging the network structure, a moving mechanism for moving a relative position between the object and the imaging unit, and the like. An inspection device including a processing unit that analyzes an image captured by the imaging unit and determines the state of the network structure. [Selection diagram] Fig. 1

Description

The present invention relates to an inspection device and an inspection method.

Depending on the network structure of the object, the powder may be classified (see, for example, Patent Document 1).

Japanese Unexamined Patent Publication No. 2010-064049

However, if the network structure is clogged or the like, there is a risk that the powder cannot be classified accurately. An object of the present invention is to provide a technique capable of appropriately inspecting clogging of a network structure or the like.

According to one aspect of the invention
A holding part that holds a plate-shaped object with a mesh structure in an upright position in the vertical direction,
An imaging unit that images the network structure and
A moving mechanism that moves the relative position between the object and the imaging unit,
A processing unit that analyzes the image captured by the imaging unit to determine the state of the network structure, and
An inspection device having the above is provided.

According to another aspect of the invention
The process of holding a plate-shaped object with a mesh structure upright in the vertical direction, and
The process of imaging the network structure and
The step of moving the relative position between the object and the imaging unit, and
A step of analyzing an image captured by the imaging unit to determine the state of the network structure,
An inspection method having the above is provided.

According to the present invention, it is possible to provide a technique capable of appropriately inspecting clogging or the like of a network structure.

FIG. 1 is a schematic configuration diagram of an inspection device according to an embodiment of the present invention. FIG. 2 is a perspective view showing a configuration example of a main part of the inspection device according to the embodiment of the present invention. FIG. 3 is an enlarged view of a clamp base in the inspection device according to the embodiment of the present invention. FIG. 4 is a schematic view showing a configuration example of a main part of the inspection device according to the embodiment of the present invention. FIG. 5 is a flowchart showing an example of an inspection method according to an embodiment of the present invention.

<Example of object configuration>
For example, in the powder manufacturing process, the raw material powder having a predetermined particle size is classified in one step. For example, as shown in FIG. 2, the classification is performed using a plate-shaped object having a network structure 300 functioning as a sieve (hereinafter, may be referred to as “flange 200”). However, if the network structure 300 is clogged or the like, the raw material powder cannot be classified satisfactorily. Therefore, it is necessary to periodically inspect the state of the mesh structure 300 (clogging, etc.).

As shown in FIG. 3, the flange 200 has, for example, a circular frame 1 and a concentric frame 2 having a diameter smaller than that of the frame 1. The flange 200 is formed by attaching a net body (mesh structure 300) to the frame 1 and then covering the frame 1 with a member made of synthetic resin. The frames 1 and 2 are made of a metal material. The network structure 300 is made of metal fibers. The diameter of the flange 200 is 0.7 to 1.0 m, and the mesh of the mesh structure 300 is 50 to 635 mesh.

As described above, since the flange 200 is large, it puts a heavy burden on the operator to set the flange 200 in the inspection device at the time of inspection. Further, if the mesh structure 300 of the flange 200 is set so as to be in a horizontal posture, the mesh structure 300 bends. The inspection device of the present embodiment is configured to appropriately inspect the state of the mesh structure 300 of the flange 200.

<One Embodiment of the present invention>
Hereinafter, an embodiment of the present invention will be described with reference to the drawings.

(1) Configuration Example of Inspection Device As shown in FIG. 1, the inspection device 100 of the present embodiment determines, for example, the state of the mesh structure 300 of the flange 200 as an upright object. It is configured as follows. In the present specification, the state in which the flange 200 is upright means a state in which the surface of the mesh structure 300 of the flange 200 is arranged upright along the vertical direction.

In order to determine the state of the mesh structure 300 of the flange 200, the inspection device 100 includes a holding unit 10, an imaging unit 11, a light source 12, a moving mechanism 13, and a processing unit 14. It is configured.

In the present specification, the vertical direction is the Z direction, the in-plane direction of the flange 200 is the X direction, and the direction orthogonal to the Z direction is the Y direction. Here, the in-plane direction of the flange 200 is a direction in the plane of the flange 200, that is, a direction along the plane of the flange 200.

As shown in FIG. 2, the holding portion 10 is configured to hold the flange 200 in an upright state in the vertical direction (Z direction). The holding portion 10 has a clamp base 20 as a clamp base A and a clamp base 30 as a clamp base B. Specifically, the holding portion 10 has two clamp bases 20 and one clamp base 30, and the clamp base 30 is provided so as to be located between the two clamp bases 20. There is. As shown in FIGS. 3 and 4, the clamp base 20 has a support surface S that supports the outer peripheral end of the frame 2 of the flange 200, in addition to the toggle clamp 5 described later. By placing the outer peripheral end of the frame 2 on the support surface S, the position of the flange 200 in the Z direction can be determined. By arranging the two clamp bases 20 at two positions separated from each other, the center position of the flange 200 held by the two clamp bases 20 is determined. Like the clamp base 20, the clamp base 30 also has a support surface T as shown in FIGS. 3 and 4. However, as described above, the Z-direction position of the flange 200 can be determined by placing the outer peripheral end of the frame 2 of the flange 200 on the support surfaces S of the two clamp bases 20. Therefore, it is not necessary to hold the frame 2 of the flange 200 on the support surface T of the clamp base 30, and the support surface T of the clamp base 30 is in the Z direction from the outer peripheral end of the frame 2 of the flange 200, for example, 0.1 to 0. It is arranged so as to be located with a gap of 5 mm.

As shown in FIGS. 3 and 4, the clamp base 20 is provided with a toggle clamp 5 having a clamp rubber 21 and a clamp lever 22. By operating the clamp lever 22, the clamp rubber 21 is configured to switch between a clamped state in which the flange 200 grips the vicinity of the frame 1 and a non-clamped state in which the clamp rubber 21 does not grip the flange 200. Further, in the clamp base 20, the toggle clamp 5 is attached to the swing end side of the arm 24 that swings around the fulcrum, and the knob 25 of the arm 23 connected to the arm 24 is operated to move the arm 23 with an arrow. When moved in the A direction, the arm 24 is configured to move in the arrow B direction. Similarly, when the arm 23 is moved in the direction of arrow C, the arm 24 is configured to move in the direction of arrow D. As a result, the clamp base 20 can change the clamp position, that is, the position of the support surface S that supports the outer peripheral end of the frame 2 of the flange 200, and the position where the clamp rubber 21 grips the flange 200. It is possible to handle flanges 200 of different sizes.

As shown in FIG. 4, the clamp base 30 is mainly provided with a toggle clamp 6 having a clamp rubber 26 and a clamp lever 27. Similar to the clamp base 20, the clamp lever 27 is operated to switch between the clamped state and the non-clamped state. The clamp base 30 is configured to define a position in a direction (Y direction) orthogonal to the in-plane direction of the flange 200. Further, as described above, the clamp base 20 and the clamp base 30 are arranged in a row along the X direction so that the positions in the Y direction are aligned. As a result, the clamp base 30 can hold the flange 200 so as not to tilt in the Y direction.

As described above, in the present embodiment, since the flange 200 can be upright in the Z direction and held by the holding portion 10, the installation area of the flange 200 is smaller than that in the case where the flange 200 is placed flat in the X direction. be able to. As a result, the inspection device 100 can be miniaturized. Further, since the flange 200 can be upright in the Z direction and held by the holding portion 10, it is possible to prevent the mesh structure 300 from bending when the flange 200 is placed flat in the X direction. Further, when the holding portion 10 holds the flange 200, the flange 200 can be temporarily placed on the three clamp bases 20 and 30, and then the clamp lever 22 or the like can be operated to fix the flange 200, which is less. You can work with a large number of people.

As shown in FIG. 1, the imaging unit 11 is arranged so that the imaging direction thereof is orthogonal to the mesh structure 300 of the flange 200. The imaging unit 11 is configured to image the mesh structure 300 of the flange 200. As the imaging unit 11, for example, a camera having an image sensor such as a CCD (Charged Coupled Device) or a CMOS (Complementary Metal Oxide Sensor) can be used. The imaging unit 11 can image the network structure 300 by converting the light collected by the lens (not shown) provided in the imaging unit 11 (camera) into an electric signal by an image sensor (not shown). In the present specification, the imaging direction is the direction in which the imaging unit 11 images the flange 200, which can be rephrased as the optical axis direction of the imaging unit 11.

The light source 12 is arranged at a position facing the image pickup unit 11 with the flange 200 interposed therebetween, and is configured to move together with the image pickup unit 11 by the first moving mechanism 43 described later. The light source 12 is configured to irradiate light parallel to the imaging direction. The light emitted by the light source 12 is incident on the imaging unit 11 through the network structure 300. As the light source 12, for example, a narrow directivity angle type LED can be used. Further, the light source 12 may have a collimator lens that parallelizes the light emitted by the light source 12.

The moving mechanism 13 is configured to move the position of the imaging unit 11 with respect to the fixed flange 200 (mesh structure 300). As shown in FIG. 1, the moving mechanism 13 has a first moving mechanism 43 and a second moving mechanism 53. The first moving mechanism 43 is configured to move the imaging unit 11 and the light source 12 together in the Z direction. The second moving mechanism 53 is configured to move the imaging unit 11 and the light source 12 together in the X direction. Specifically, the second moving mechanism 53 is arranged on the image pickup table 15 and the light source table 16, respectively, and the first moving mechanism 43 is arranged on each of the second moving mechanisms 53. .. That is, the second moving mechanism 53 is configured so that the imaging unit 11 and the light source 12 can be indirectly moved in the X direction by moving the first moving mechanism 43 in the X direction. In this way, the second moving mechanism 53 can move the imaging unit 11 and the light source 12 in the X direction, while the first moving mechanism 43 can move the imaging unit 11 and the light source 12 in the Z direction. .. The first moving mechanism 43 and the second moving mechanism 53 can be configured by combining an electric motor, a feed screw, or the like, respectively.

The processing unit 14 analyzes the image transmitted from the imaging unit 11 to determine the state of the network structure 300. Therefore, the processing unit 14 is configured to be capable of transmitting and receiving data to, for example, an imaging unit 11, a light source 12, and a moving mechanism 13, and transmits operation instructions to each of these units while also transmitting an operation instruction to the imaging unit 11. The captured image is received from. As a result, the processing unit 14 can analyze the image transmitted from the image pickup unit 11 while grasping which part of the network structure 300 the image pickup unit 11 is capturing. As such a processing unit 14, for example, a computer that executes a predetermined program as needed can be used. The details of the image analysis performed by the processing unit 14 will be described later.

(2) Inspection Method Using Inspection Device An inspection method for the state of the mesh structure 300 of the flange 200 using the inspection device 100 of the present embodiment will be described.

FIG. 5 is a flowchart showing an example of the inspection method of the present embodiment. The inspection method of the present embodiment includes, for example, a setting step S101, a moving / imaging step S102, an imaging determination step S103, and a processing step S104.

In the following description, the Z direction, which is the moving direction of the first moving mechanism 43, is the vertical direction, the Y direction is the front-back direction, and the X direction, which is the moving direction of the second moving mechanism 53, is the left-right direction. Further, the Z1 direction side, which is one side in the vertical direction, is referred to as the "upper" side, and the Z2 direction side, which is the other side in the vertical direction, is referred to as the "lower" side. The X1 direction side, which is one side in the left-right direction, is the "right" side, and the X2 direction side, which is the other side in the left-right direction, is the "left" side. The Y1 direction side, which is one side in the front-rear direction, is the "front" side, and the Y2 direction side, which is the other side in the front-rear direction, is the "rear" side (see FIG. 2).

(Setting step S101)
In the setting step S101, the flange 200 is held by using the holding portions 10 (clamp bases 20 and 30). Specifically, as shown in FIG. 2, the flange 200 is held by the holding portion 10 so that the flange 200 (mesh structure 300) is in an upright state. By using the holding portion 10 in this way, the flange 200 can be held so as not to be tilted back and forth. The flange 200 may be installed on the holding portion 10 by an operator (operator) of the inspection device 100, but may be installed by using a dedicated transfer robot.

(Movement / Imaging Step S102)
In the moving / imaging step S102, first, a position corresponding to the intersection P of the tangent line at the right end of the flange 200 in the X1 direction and the tangent line at the upper end of the flange 200 in the Z1 direction on the XZ plane (hereinafter referred to as “start position”). In some cases), the imaging unit 11 and the light source 12 are moved by the moving mechanism 13. Then, after taking an image using the image pickup unit 11 at the start position, the position movement of the image pickup unit 11 with respect to the flange 200 by the moving mechanism 13 and the image pickup by the image pickup unit 11 are repeatedly performed.

Specifically, at the start position, after the imaging unit 11 images a predetermined region, the first moving mechanism 43 moves the imaging unit 11 and the light source 12 in the Z2 direction (lower side) by a predetermined distance. The image pickup unit 11 takes an image of the flange 200 (mesh structure 300). These operations are repeated until the imaging unit 11 and the light source 12 reach the lower end of the flange 200 in the Z2 direction.

When the image pickup unit 11 and the light source 12 reach the lower end of the flange 200 in the Z2 direction, the second movement mechanism 53 moves the image pickup unit 11 and the light source 12 in the X2 direction (left side) by a predetermined distance. Then, after imaging a predetermined region by the imaging unit 11, the imaging unit 11 and the light source 12 are moved in the Z1 direction (upper side) by a predetermined distance by the first moving mechanism 43, and the flange 200 is moved by the imaging unit 11. Take an image. These operations are repeated until the imaging unit 11 and the light source 12 reach the upper end of the flange 200 in the Z1 direction. The above operation is referred to as operation A.

When the image pickup unit 11 and the light source 12 reach the upper end of the flange 200 in the Z1 direction, the second movement mechanism 53 further moves the image pickup unit 11 and the light source 12 in the X2 direction (left side) by a predetermined distance. Then, after imaging a predetermined region by the imaging unit 11, the imaging unit 11 and the light source 12 are moved in the Z2 direction (lower side) by a predetermined distance by the first moving mechanism 43, and the flange 200 is moved by the imaging unit 11. Is imaged. These operations are repeated until the imaging unit 11 and the light source 12 reach the lower end of the flange 200 in the Z2 direction. The above operation is referred to as operation B.

The above-mentioned operations A and B are, for example, positions corresponding to the intersection Q of the tangent line at the left end of the flange 200 in the X2 direction and the tangent line at the lower end of the flange 200 in the Z2 direction on the XZ plane (hereinafter, "end position"). The image pickup unit 11 and the light source 12 are repeated until they are moved by the moving mechanism 13. As a result, the image pickup unit 11 can take an entire image of the entire XZ plane of the network structure 300.

That is, since the moving mechanism 13 (the first moving mechanism 43 and the second moving mechanism 53) is orthogonally biaxially driven, its operating range is rectangular, but the circular outer circumference of the flange 200 is within the rectangular of the operating range. If the end is included, the image pickup unit 11 can take an image of the entire area of the flange 200 (mesh structure 300). In that case, the operating range of the moving mechanism 13 can be minimized by circumscribing the operating range (rectangular shape) of the moving mechanism 13 to the flange 200 (circular shape) as in the present embodiment.

(Imaging determination step S103)
In the imaging determination step S103, it is determined whether or not the imaging unit 11 has completely imaged the entire area of the network structure 300. Specifically, for example, whether or not the processing unit 14 can synthesize the partial data (rectangular region) of the captured image of the network structure 300 received from the imaging unit 11 to form the entire image of the network structure 300. To judge. When it is determined that the entire image of the mesh structure 300 can be constructed, the process proceeds to the next processing step S104. If it is determined that the entire image of the network structure 300 cannot be formed, the moving / imaging step S102 is performed again.

(Processing step S104)
In the processing step S104, the image transmitted from the imaging unit 11 is analyzed to determine the state of the network structure 300. Specifically, the data of each pixel constituting the combined rectangular region is analyzed. For example, the value range of the data of each pixel is "0 to 100", the value of the portion not blocked by the flange 200 (for example, the start position) is "95 or more", and the portion completely blocked by the frame portion of the flange 200. When the value is set to "less than 5", the outer peripheral edge of the flange 200 can be recognized by extracting the boundary between "95" and "5". Then, within the region of the flange 200, the range excluding the portion (frame portion) of "less than 5" is the region of the mesh structure 300. Within the region of the mesh structure 300, if it is within a predetermined range (for example, "40 to 70"), it is determined that the mesh structure 300 is not clogged or perforated, and if it is less than the predetermined range, the mesh structure is not clogged or perforated. It is determined that the 300 is clogged, and if it exceeds the predetermined range, it is determined that the network structure 300 has a hole.

(3) Effects of the present embodiment According to the present embodiment, one or more of the following effects are exhibited.

(A) The processing unit 14 of the present embodiment is configured to analyze the image captured by the imaging unit 11 to determine the state of the network structure 300. Specifically, the processing unit 14 compares the configuration data of the image transmitted from the imaging unit 11 with the preset determination criteria to obtain a state of the network structure 300 (for example, a normal state, a clogging state, etc.). Which of the perforated states it corresponds to) is determined. As a result, it is possible to make a quantitative judgment while eliminating the influence of artificial judgment variation and the size difference of the flange 200. In this way, it is possible to optimize the inspection by quantifying the determination.

Further, since the holding portion 10 of the present embodiment is configured to hold the flange 200 in an upright state in the vertical direction, the installation area of the flange 200 is smaller than that in the case where the flange 200 is placed flat in the X direction. can do. As a result, the inspection device 100 can be miniaturized. By downsizing the inspection device 100 in this way, even when the inspection space is to be saved, the inspection can be appropriately performed.

The holding portion 10 of the present embodiment is configured to hold the flange 200 in an upright state in the vertical direction. As a result, there is no possibility that the powder adhering to the flange 200 will fall on the imaging unit 11 or the light source 12 during the imaging of the flange 200. Therefore, since the processing unit 14 can perform accurate image analysis without being affected by the powder dropped on the light source 12 or the like, the network structure 300 can be inspected with high accuracy. Further, since it is not necessary to frequently clean the imaging unit 11 and the light source 12 during the imaging of the flange 200, the inspection can be performed efficiently. The inspection can be made more appropriate by improving the accuracy and efficiency.

Since the holding portion 10 of the present embodiment is configured to hold the flange 200 in an upright state in the vertical direction, it is necessary to prevent the mesh structure 300 from bending when the flange 200 is placed flat in the X direction. Can be done. As a result, high-precision inspection and efficiency of inspection can be realized, which is very useful for optimizing inspection.

The moving mechanism 13 of the present embodiment is configured to move the relative position between the flange 200 and the imaging unit 11. As a result, the flange 200 can be imaged for each region, and the entire area of the flange 200 does not have to be imaged at once. Therefore, the optics of the imaging unit 11 so that the entire area of the flange 200 is within one angle of view. There is no need to set the system. Therefore, it is not necessary to use the imaging unit 11 having a higher resolution than necessary, and the inspection can be performed by the imaging unit 11 having a simple and low-cost configuration. As described above, even when the imaging unit 11 having a simple and low-cost configuration is used, the inspection can be appropriately performed.

(B) The holding portion 10 of the present embodiment has two clamp bases 20 and one clamp base 30. Therefore, when the holding portion 10 holds the flange 200, the flange 200 can be temporarily placed on the three clamp bases 20 and 30, and then the clamp lever can be operated to fix the flange 200, which requires less work. The number of people can be increased.

Further, since the two clamp bases 20 of the present embodiment are configured so that the clamp positions can be changed, the inspection device 100 can handle flanges 200 of different sizes.

(C) The clamp base 30 of the present embodiment is configured to define a position in a direction (Y direction) orthogonal to the in-plane direction of the flange 200. As a result, the flange 200 can be held so as not to be tilted in the Y direction, and the distance between the flange 200 and the imaging unit 11 can be kept constant, so that the mesh structure 300 can be inspected with high accuracy. , Very useful for proper inspection.

(D) The first moving mechanism 43 of the present embodiment is configured to move the imaging unit 11 and the light source 12 together in the Z direction, and the second moving mechanism 53 includes the imaging unit 11 and the light source 12. Are configured to move together in the X direction. As described above, the moving mechanism 13 (the first moving mechanism 43 and the second moving mechanism 53) is an orthogonal biaxial drive, and by repeating the operation of the first moving mechanism 43 and the second moving mechanism 53, the imaging unit Reference numeral 11 can capture the entire area of the flange 200 (mesh structure 300). Further, since the relatively small image pickup unit 11 and the light source 12 are configured to move without moving the relatively large flange 200, the configuration of the inspection device 100 can be further simplified. .. As described above, even when the inspection device 100 having a simple structure is used, the inspection can be appropriately performed.

(E) The inspection device 100 of the present embodiment has a light source 12 that irradiates the flange 200 with light at a position facing the imaging unit 11 with the flange 200 in between. Thereby, the state of the network structure 300 can be determined based on the amount of light represented in the image of the network structure 300. That is, the state of the network structure 300 can be quantitatively determined only by the brightness (brightness) data of the image without requiring pattern recognition, shape analysis, or the like of the image of the network structure 300. As a result, the efficiency of the inspection can be realized, which is very useful for the optimization of the inspection.

(F) The inspection device 100 of the present embodiment is configured to inspect a sieve (flange 200) for classifying powder. The inspection device 100 can clearly determine the replacement time of the flange 200, and can realize accurate powder classification.

<Other Embodiments of the Present Invention>
Although the embodiments of the present invention have been specifically described above, the present invention is not limited to the above-described embodiments, and various modifications can be made without departing from the gist thereof.

In the above-described embodiment, the inspection device 100 having the light source 12 has been described as an example, but the present invention is not limited thereto. For example, the inspection device 100 that does not have the light source 12 may be used. However, it is better to have the light source 12 arranged at a position facing the imaging unit 11 with the flange 200 in between, so that the state of the network structure 300 is quantitatively based only on the amount of light shown in the image of the network structure 300. Can be determined, which is useful for optimizing the inspection.

Further, in the above-described embodiment, the first moving mechanism 43 moves the imaging unit 11 and the light source 12 in the Z direction, and the second moving mechanism 53 moves the imaging unit 11 and the light source 12 in the X direction. However, the present invention is not limited to this. For example, the first moving mechanism 43 moves the imaging unit 11 and the light source 12 in one direction in the in-plane direction of the flange 200 other than the Z direction, and the second moving mechanism 53 moves the imaging unit 11 and the light source 12 to each other. It may be moved in a direction orthogonal to the one direction. Even in this case, the image pickup unit 11 can take an image of the entire area of the flange 200 (mesh structure 300).

Further, in the above-described embodiment, the case where the image pickup unit 11 and the light source 12 are moved in the X direction and the Z direction by the moving mechanism 13 with respect to the fixed flange 200 (mesh structure 300) has been described. Is not limited to this. For example, the flange 200 may be moved in the X direction by a predetermined moving mechanism, and the imaging unit 11 and the light source 12 may be moved in the Z direction by the first moving mechanism 43. Further, the flange 200 may be configured to move in the X direction and the Z direction by two predetermined moving mechanisms, respectively. Even in these cases, the image pickup unit 11 can take an image of the entire area of the flange 200 (mesh structure 300).

Further, in the above-described embodiment, the case where the imaging start point of the imaging unit 11 is set as the intersection P and the imaging end point of the imaging unit 11 is set as the intersection Q has been described, but the present invention is not limited to this. The imaging start point and imaging end point are not particularly limited as long as they are on the outer side of the intersections P and Q of the flange 200 to be inspected. Therefore, for example, by setting the imaging start point and the imaging end point according to the flange 200 having the largest size among the flanges 200 to be inspected in advance, each time the flanges 200 having different sizes are inspected, these are set. There is no need to reset. As a result, the inspection can be performed efficiently, which is useful for optimizing the inspection. On the other hand, setting the operating range of the moving mechanism 13 corresponding to each of the flanges 200 having different sizes to eliminate unnecessary operation of the moving mechanism 13 also leads to the efficiency of the inspection and makes the inspection appropriate. It is useful.

Further, in the above-described embodiment, the case where the imaging unit 11 moves in the Z direction, then stops and takes an image, then moves in the Z direction again, stops, and repeats the imaging has been described. The present invention is not limited to this. For example, the imaging unit 11 may perform a continuous operation of continuously shooting while moving in the Z direction.

100 Inspection device 1 Frame 2 Frame 5 Toggle clamp 6 Toggle clamp 10 Holding part 11 Imaging unit 12 Light source 13 Moving mechanism 14 Processing unit 15 Imaging stand 16 Lighting stand 20 Clamp stand S Support surface T Support surface 21 Clamp rubber 22 Clamp lever 23 Arm 24 Arm 25 Knob 26 Clamp rubber 27 Clamp lever 30 Clamp base 43 First movement mechanism 53 Second movement mechanism 200 Flange 300 Mesh structure

Claims (7)

A holding part that holds a plate-shaped object with a mesh structure in an upright position in the vertical direction,
An imaging unit that images the network structure and
A moving mechanism that moves the relative position between the object and the imaging unit,
A processing unit that analyzes the image captured by the imaging unit to determine the state of the network structure, and
Have a,
The holding portion has a plurality of clamp bases and has a plurality of clamp bases.
At least two clamp bases A of the plurality of clamp bases are configured to determine the vertical position of the object.
The clamp base B, which is different from the clamp base A among the plurality of clamp bases, is provided between the two clamp bases A and is configured to define a position in a direction orthogonal to the in-plane direction of the object. Has been
Inspection equipment. The clamp base A is configured so that the clamp position can be changed according to the size of the object.
The inspection device according to claim 1. The moving mechanism includes a first moving mechanism that moves the imaging unit in one direction in the in-plane direction of the object, and a second moving mechanism that moves the imaging unit in a direction orthogonal to the one direction.
The inspection device according to claim 1 or 2. The one direction is the vertical direction,
The inspection device according to claim 3. Further having a light source for irradiating the object with light at a position facing the imaging unit with the object in between.
The imaging unit receives light from the light source that has passed through the network structure, and receives light.
The processing unit analyzes the amount of light received by the imaging unit to determine the state of the network structure.
The inspection device according to any one of claims 1 to 4. The object is a sieve for classifying powders,
The inspection device according to any one of claims 1 to 5. The process of holding a plate-shaped object with a mesh structure upright in the vertical direction, and
The process of imaging the network structure and
The step of moving the relative position between the object and the imaging unit, and
A step of analyzing an image captured by the imaging unit to determine the state of the network structure,
Have a,
In the step of holding the object upright in the vertical direction, at least two clamp bases A determine the vertical position of the object, and the object is provided between the two clamp bases A and the clamp base A. Defines the position of the object in a direction orthogonal to the in-plane direction by a different clamp base B.
Inspection method.

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