JP6916028B2 - Plating equipment for electronic components - Google Patents

Plating equipment for electronic components Download PDF

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JP6916028B2
JP6916028B2 JP2017077837A JP2017077837A JP6916028B2 JP 6916028 B2 JP6916028 B2 JP 6916028B2 JP 2017077837 A JP2017077837 A JP 2017077837A JP 2017077837 A JP2017077837 A JP 2017077837A JP 6916028 B2 JP6916028 B2 JP 6916028B2
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利文 溝上
利文 溝上
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Description

本発明は、例えばチップ型電子部品の電極等にめっきを施すための電子部品のめっき装置に関する。 The present invention relates to, for example, a plating device for electronic components for plating electrodes of chip-type electronic components.

チップ型抵抗器等の小型電子部品は、回路基板へのはんだ付け性の向上や電気的導通を確保するため、めっきを施して外部電極を形成している。そのような外部電極を形成するめっき装置として、例えば、めっき槽内に被めっき物とめっき液を投入し、めっき槽を水平方向に左右(正逆)交互に、あるいは連続的に、あるいは断続的に回転させてめっきを施す装置が知られている。 Small electronic components such as chip-type resistors are plated to form external electrodes in order to improve solderability to circuit boards and ensure electrical continuity. As a plating device for forming such an external electrode, for example, an object to be plated and a plating solution are put into a plating tank, and the plating tank is horizontally (forward and reverse) alternately, continuously or intermittently. There is a known device for plating by rotating the plate.

このようなめっき装置では、電解反応によりめっき槽内の金属濃度が徐々に低下するため、めっき槽と、別途設けた母槽とので常時、めっき液が循環するように構成されている。 In such a plating apparatus, since the metal concentration in the plating tank gradually decreases due to the electrolytic reaction, the plating solution is configured to constantly circulate between the plating tank and the separately provided mother tank.

例えば、特許文献1には、回転可能に構成されためっき処理室内で、遠心力により被めっき物と導電メディアとが凝集するのを防止するため、めっき処理室の回転速度に変化が生じるような態様で連続的、または断続的に回転させながらめっきを行う方法が開示されている。さらに、特許文献1のめっき装置は、被めっき物を通過させることなくめっき液のみを外部に抜き出して排出することができる、多孔質材料からなる環状のめっき抜き出し部(ポーラス状リング)を備え、抜き出されためっき液が、循環路を経てめっき処理室に循環されるように構成されている。 For example, in Patent Document 1, in order to prevent the object to be plated and the conductive medium from aggregating due to centrifugal force in the plating processing chamber configured to be rotatable, the rotation speed of the plating processing chamber changes. A method of performing plating while rotating continuously or intermittently in an embodiment is disclosed. Further, the plating apparatus of Patent Document 1 is provided with an annular plating extraction portion (porous ring) made of a porous material capable of extracting and discharging only the plating solution to the outside without passing the object to be plated. The extracted plating solution is configured to be circulated to the plating processing chamber via a circulation path.

また、特許文献2は、被めっき物等を収容するめっき処理室が、上方に開口部を有し外周部に陰極が設けられた回転体と、回転体の中心に配された筒状部材と、回転体の内部に配された陽極とを備え、筒状部材に対してオーバーフローさせてめっき液を筒状部材に流入させ、流入しためっき液を開口部からめっき処理室に還流することによりめっき液を循環させるめっき装置を開示している。 Further, in Patent Document 2, a plating processing chamber for accommodating an object to be plated and the like has a rotating body having an opening at the top and a cathode provided at the outer peripheral portion, and a tubular member arranged at the center of the rotating body. , Equipped with an anode arranged inside the rotating body, overflows the tubular member, allows the plating solution to flow into the tubular member, and returns the inflowing plating solution from the opening to the plating processing chamber for plating. A plating apparatus that circulates a liquid is disclosed.

特開2006−045619号(特許第4725051号)公報Japanese Unexamined Patent Publication No. 2006-045619 (Patent No. 4725051) 特開2013−053339号(特許第5741944号)公報Japanese Unexamined Patent Publication No. 2013-0533339 (Patent No. 5741944)

特許文献1における、めっき液の循環のための排出方法では、陰極電極とともにめっき槽のベース部材(底部)にセットされた、多孔質材料からなる環状のめっき抜き出し部が、上述したように処理液は通過させるが被めっき物は通過しない構造となっており、フィルター(ポーラス状リングフィルター)の役割を果たしている。 In the discharge method for circulation of the plating solution in Patent Document 1, an annular plating extraction portion made of a porous material, which is set on the base member (bottom) of the plating tank together with the cathode electrode, is a treatment liquid as described above. Has a structure that allows the material to pass through but does not pass through the object to be plated, and serves as a filter (porous ring filter).

しかしながら、近時において、めっき装置の被めっき物である電子部品の小型化が進んでおり、数μm〜数mm程度の微小な穴が無数に開いたポーラス状フィルターの場合、被めっき物、通電用メディア等が多数挟まる。そのため、めっき装置においてめっき液が循環せず、めっき未着等の不具合が生じるおそれがある。また、一旦フィルターに挟まっためっき物が脱落して、めっき未着や異常めっき等の不具合も多発する問題がある。さらには、挟まっためっき物に徐々にめっきが施されて微小な穴が塞がれ、めっき液循環や排出そのものが困難となり、短時間においてめっき装置としての機能を果たさなくなるという事態も想定される。 However, in recent years, the miniaturization of electronic components that are the objects to be plated in plating equipment has been progressing, and in the case of porous filters with innumerable minute holes of several μm to several mm, the objects to be plated and energization A lot of media etc. are sandwiched. Therefore, the plating solution does not circulate in the plating apparatus, and there is a possibility that problems such as non-adhesion of plating may occur. In addition, there is a problem that the plated material once sandwiched between the filters falls off, and problems such as non-plating and abnormal plating frequently occur. Furthermore, it is assumed that the sandwiched plated material is gradually plated to close minute holes, making it difficult to circulate and discharge the plating solution itself, and the plating device does not function in a short time. ..

また、特許文献2のめっき装置のように、回転体の中央に設けられた筒状部材に対してめっき液をオーバーフローさせ、筒状部材に流入させて排出して、めっき処理室に還流する構成では、被めっき物である電子部品が小型であることにより浮力によって液面に浮いてしまい、めっき液の排出とともに電子部品も一緒に排出されてしまうという問題がある。 Further, like the plating apparatus of Patent Document 2, a configuration in which a plating solution overflows a tubular member provided in the center of a rotating body, flows into the tubular member, is discharged, and is returned to the plating processing chamber. Then, since the electronic component to be plated is small, it floats on the liquid surface due to buoyancy, and there is a problem that the electronic component is discharged together with the discharge of the plating solution.

本発明は、上述した課題に鑑みなされたものであり、めっき槽から効率的にめっき液を排出することにより、チップ状電子部品に形成されるめっき皮膜の厚みバラツキ等、めっき不良を低減する電子部品のめっき装置を提供することを目的とする。 The present invention has been made in view of the above-mentioned problems, and by efficiently discharging the plating solution from the plating tank, electrons that reduce plating defects such as thickness variation of the plating film formed on the chip-shaped electronic component. It is an object of the present invention to provide a plating apparatus for parts.

かかる目的を達成し、上述した課題を解決する一手段として、例えば、以下の構成を備える。すなわち、本発明の電子部品のめっき装置は、略円錐状の蓋部と、外周側壁を有する略円板状の底部とで形成される内部空間に被めっき物およびめっき液を貯留し、水平方向に回転可能なめっき槽と、前記めっき槽内の略中央に配設された陽極電極と、前記めっき槽の内周側に露出するとともに前記外周側壁の一部を構成する陰極電極と、前記蓋部に設けられためっき液を排出する開口部とを備え、前記開口部は、前記蓋部の傾斜側面下方部に設けた貫通孔に、該蓋部の外側に突出する筒状部材を挿入してなることを特徴とする。 As one means for achieving such an object and solving the above-mentioned problems, for example, the following configuration is provided. That is, in the plating apparatus for electronic parts of the present invention, the object to be plated and the plating solution are stored in an internal space formed by a substantially conical lid portion and a substantially disk-shaped bottom portion having an outer peripheral side wall, and the plating solution is stored in the horizontal direction. A rotatable plating tank, an anode electrode arranged substantially in the center of the plating tank, a cathode electrode exposed on the inner peripheral side of the plating tank and forming a part of the outer peripheral side wall, and a lid. The portion is provided with an opening for discharging the plating solution, and the opening is provided with a tubular member that protrudes to the outside of the lid portion into a through hole provided in the lower portion of the inclined side surface of the lid portion. and wherein the Rukoto such Te.

例えば、前記開口部は、前記蓋部の傾斜側面下方部に設けた貫通孔に、該蓋部の外側に突出する筒状部材を挿入するとともに該貫通孔を覆うネット状部材を設けてなることを特徴とする。例えば、前記開口部は、前記蓋部の下方部の周方向に間隔を置いて複数設けられていることを特徴とする。また、例えば、前記外周側壁の高さを変えることで、前記めっき槽における前記開口部の垂直方向の位置を調整可能としたことを特徴とする。 For example, the opening is formed by inserting a tubular member projecting to the outside of the lid into a through hole provided in the lower portion of the inclined side surface of the lid and providing a net-like member covering the through hole. It is characterized by. For example, a plurality of the openings are provided at intervals in the circumferential direction of the lower portion of the lid portion . Further, for example, by changing the height of the outer peripheral side wall, the vertical position of the opening in the plating tank can be adjusted.

さらには、例えば、前記筒状部材は、前記蓋部の傾斜側面下方部において該傾斜側面に対して略垂直方向に該蓋部の外側に突出することを特徴とする。また、例えば、前記筒状部材は、前記貫通孔より引き抜いて交換可能であることを特徴とする。 Further, for example, the tubular member is characterized in that it projects to the outside of the lid portion in a direction substantially perpendicular to the inclined side surface at a lower portion of the inclined side surface of the lid portion. Further, for example, the tubular member is characterized in that it can be pulled out from the through hole and replaced.

本発明によれば、めっき槽の回転時において被めっき物が直接接触しない位置に開口部を設けることで、被めっき物の挟まり、残留等を防止でき、めっき液および水洗水の循環や排出に支障をきたすことなく被めっき物への均一なめっき処理が可能となる。 According to the present invention, by providing an opening at a position where the object to be plated does not come into direct contact with the object to be plated when the plating tank is rotated, it is possible to prevent the object to be plated from being pinched or left behind, and to circulate or discharge the plating solution and washing water. It is possible to perform a uniform plating process on the object to be plated without causing any trouble.

本発明の実施の形態例に係る電子部品のめっき装置の一部を破断して、その構造を示す斜視図である。It is a perspective view which shows the structure by breaking a part of the plating apparatus of the electronic component which concerns on embodiment of this invention. 本実施の形態例に係るめっき装置のめっき槽の蓋部に設けた、めっき液排出のための開口部の詳細構造を示す断面図である。It is sectional drawing which shows the detailed structure of the opening for discharging the plating solution provided in the lid part of the plating tank of the plating apparatus which concerns on this Embodiment example. めっき槽の蓋部に設けた開口部の他の構成例を示す図である。It is a figure which shows the other structural example of the opening provided in the lid part of a plating tank. 本実施の形態例に係るめっき装置のめっき槽の蓋部に設けた開口部の配置例を示す図である。It is a figure which shows the arrangement example of the opening provided in the lid part of the plating tank of the plating apparatus which concerns on this Embodiment example. 本実施の形態例に係るめっき装置におけるめっき液等の循環ルートを模式的に示す図である。It is a figure which shows typically the circulation route of the plating solution and the like in the plating apparatus which concerns on this Embodiment example. 外部電極にめっき層が形成されたチップ状抵抗器の断面構成を示す図である。It is a figure which shows the cross-sectional structure of the chip-like resistor which formed the plating layer on the external electrode.

以下、添付図面等を参照して本発明に係る一実施の形態例を詳細に説明する。図1は、本実施の形態例に係る電子部品のめっき装置の一部を破断して、その構造を示す斜視図である。図1に示すめっき装置10は、外形がほぼ円錐形の蓋部11と、その蓋部11の底面側に配置された底部13とで構成される内部空間をめっき槽15とする、回転型のめっき装置(ドーム型めっき装置)である。 Hereinafter, an example of an embodiment according to the present invention will be described in detail with reference to the accompanying drawings and the like. FIG. 1 is a perspective view showing a structure of a part of the plating apparatus for electronic components according to the present embodiment. The plating apparatus 10 shown in FIG. 1 is a rotary type in which an internal space composed of a lid portion 11 having a substantially conical outer shape and a bottom portion 13 arranged on the bottom surface side of the lid portion 11 is used as a plating tank 15. It is a plating device (dome type plating device).

蓋部11は、傾斜する側面の最下方端の周縁部(最外周部)が外周方向に鍔状に突出した突起部26を有し、その突起部26は環状のリング部材29によって覆われている。また、蓋部11の傾斜側面の下方部には、めっき槽15に貯留されためっき液等を排出するための開口部20が設けられている。なお、開口部20の詳細については後述する。 The lid portion 11 has a protrusion 26 in which the peripheral edge portion (outermost outer peripheral portion) of the lowermost end of the inclined side surface projects in a brim shape in the outer peripheral direction, and the protrusion 26 is covered with an annular ring member 29. There is. Further, an opening 20 for discharging the plating solution and the like stored in the plating tank 15 is provided in the lower portion of the inclined side surface of the lid portion 11. The details of the opening 20 will be described later.

底部13は、蓋部11の最外周部分の外径と同一の外径を有する円板形状の底板(ベース部材)18と、底板18の上面側の外周縁部に沿って配置された、一定の幅を有するリング状の陰極電極(陰極接点)17と、陰極電極17の上部であって、蓋部11の突起部26の下部に位置し、陰極電極17と同一径の環状部材であるスペーサリング19とを有して構成される。めっき槽15において、底板18の外周縁部、陰極電極17、スペーサリング19、および突起部26によって外周側壁28が形成される。 The bottom portion 13 is a disk-shaped bottom plate (base member) 18 having the same outer diameter as the outer diameter of the outermost outer peripheral portion of the lid portion 11, and is arranged along the outer peripheral edge portion on the upper surface side of the bottom plate 18 and is constant. A ring-shaped cathode electrode (cathode contact) 17 having the width of the above, and a spacer which is located above the cathode electrode 17 and below the protrusion 26 of the lid portion 11 and is an annular member having the same diameter as the cathode electrode 17. It is configured to have a ring 19. In the plating tank 15, the outer peripheral side wall 28 is formed by the outer peripheral edge portion of the bottom plate 18, the cathode electrode 17, the spacer ring 19, and the protrusion 26.

リング部材29、突起部26、スペーサリング19、および陰極電極17には、その周方向に複数の貫通孔が設けられている。そして、これらを重ね合わせた状態で貫通孔に固定部材27を挿通し、その固定部材27の先端部分に設けた雄ネジ部と、底板18に設けた雌ネジ部とを螺着することで、蓋部11と底部13とを相互に固定する。これら蓋部11と底部13とにより形成された内部空間がめっき槽15となる。 The ring member 29, the protrusion 26, the spacer ring 19, and the cathode electrode 17 are provided with a plurality of through holes in the circumferential direction thereof. Then, in a state where these are overlapped, the fixing member 27 is inserted into the through hole, and the male screw portion provided at the tip portion of the fixing member 27 and the female screw portion provided on the bottom plate 18 are screwed together. The lid portion 11 and the bottom portion 13 are fixed to each other. The internal space formed by the lid portion 11 and the bottom portion 13 serves as the plating tank 15.

なお、スペーサリング19は、固定部材27による螺着を解除することでめっき槽15から取り外すことが可能である。よって、めっき装置10における製品(被めっき物)の投入条件等に合わせて、厚さの異なるスペーサリング19を用意することで、上述した外周側壁28の高さを変えることができ、その結果、めっき槽15の容積、開口部20の位置(底板18からの高さ)等を調整できる。さらに、めっき槽15の排水能力についても、開口部20のサイズや数を適宜設定することによって調整できる。 The spacer ring 19 can be removed from the plating tank 15 by releasing the screwing by the fixing member 27. Therefore, by preparing spacer rings 19 having different thicknesses according to the charging conditions of the product (object to be plated) in the plating apparatus 10, the height of the outer peripheral side wall 28 described above can be changed, and as a result, the height of the outer peripheral side wall 28 can be changed. The volume of the plating tank 15, the position of the opening 20 (height from the bottom plate 18), and the like can be adjusted. Further, the drainage capacity of the plating tank 15 can also be adjusted by appropriately setting the size and number of the openings 20.

めっき槽15の中心部には、めっき液に浸漬される陽極電極16が配置され、さらに、蓋部11の頂部に設けた上部開口部24を貫いてめっき槽15の中心部に至る水洗水導入管21と、処理液導入管22と、槽内のめっき液の量を検知するための液面センサ23とが設けられている。めっき装置10では、後述するように、これら水洗水導入管21、処理液導入管22等により、各種処理液の循環や排出を効率的に行う。 An anode electrode 16 to be immersed in the plating solution is arranged in the center of the plating tank 15, and water washing water is introduced to reach the center of the plating tank 15 through the upper opening 24 provided at the top of the lid 11. A pipe 21, a treatment liquid introduction pipe 22, and a liquid level sensor 23 for detecting the amount of plating liquid in the tank are provided. In the plating apparatus 10, as will be described later, the water washing water introduction pipe 21, the treatment liquid introduction pipe 22, and the like efficiently circulate and discharge various treatment liquids.

底部13の下面側中心部には、垂直下方に延びる回転軸12が結合され、その回転軸12は回転可能に軸支されている。ここでは、回転軸12に対して不図示のモータ等で回転力が付与されることで、電子部品等の被めっき物25、およびめっき液(不図示)が貯留されためっき槽15が水平方向に回転する。具体的には、図1において白抜き矢印で示すように、めっき槽15は時計方向と反時計方向(正逆方向)の回転により、所定速度で回転および停止を繰り返す。回転軸12には、電解めっき用電源の負側から結線され、陰極電極17へ通電するための導通部材14が接触している。 A rotation shaft 12 extending vertically downward is connected to the center portion on the lower surface side of the bottom portion 13, and the rotation shaft 12 is rotatably supported. Here, by applying a rotational force to the rotating shaft 12 with a motor or the like (not shown), the object to be plated 25 such as an electronic component and the plating tank 15 in which the plating solution (not shown) is stored are in the horizontal direction. Rotate to. Specifically, as shown by the white arrows in FIG. 1, the plating tank 15 repeatedly rotates and stops at a predetermined speed by rotating in the clockwise direction and the counterclockwise direction (forward and reverse directions). The rotating shaft 12 is connected from the negative side of the power source for electrolytic plating, and a conductive member 14 for energizing the cathode electrode 17 is in contact with the rotating shaft 12.

めっき槽15が水平方向に正回転および逆回転を交互に繰り返し、その回転が維持されて、図1に示すように遠心力により被めっき物が陰極電極17へ押し付けられている短時間のみ、陽極電極16と陰極電極17間に通電されてめき処理が行われる。 The plating tank 15 alternately repeats forward rotation and reverse rotation in the horizontal direction, the rotation is maintained, and as shown in FIG. 1, the object to be plated is pressed against the cathode electrode 17 by centrifugal force, and the anode is used only for a short time. processing Ki Tsu because is energized between electrode 16 and the cathode electrode 17 is performed.

なお、本実施の形態例に係る電子部品のめっき装置によるめっき対象は、チップ型の抵抗器に限定されず、例えば、チップ型インダクタ、チップ型コンデンサ、これらの複合部品、多連抵抗器等、電極端子を有する電子部品のめっき処理にも使用できる。 The target of plating of electronic components by the plating apparatus according to the present embodiment is not limited to chip-type resistors, and for example, chip-type inductors, chip-type capacitors, composite components thereof, multiple resistors, etc. It can also be used for plating electronic components that have electrode terminals.

図2は、本実施の形態例に係るめっき装置においてめっき槽の蓋部に設けた、めっき液を排出するための開口部の詳細構造を示す断面図である。図2に示すように開口部20は、蓋部11の傾斜側面11aの下部であって、めっき槽15が水平方向に回転したときに被めっき物25が直接接触しない位置に設けられた貫通孔33からなる。ここでは、開口部20の孔径Dを例えば3mm以上とするが、これに限定されない。 FIG. 2 is a cross-sectional view showing a detailed structure of an opening for discharging the plating solution, which is provided on the lid of the plating tank in the plating apparatus according to the present embodiment. As shown in FIG. 2, the opening 20 is a through hole provided in the lower part of the inclined side surface 11a of the lid portion 11 at a position where the object to be plated 25 does not come into direct contact when the plating tank 15 rotates in the horizontal direction. It consists of 33. Here, the hole diameter D of the opening 20 is set to, for example, 3 mm or more, but the present invention is not limited to this.

めっき槽15内でのめっき液30の液面(液位)は、めっき処理前あるいはめっき処理終了直後等においてめっき槽15が静止しているとき、および、めっき処理中あるいは洗浄処理時においてめっき槽15が回転しているときには、めっき槽15の上部開口部24の近傍に位置する(図2の液面31a)。このときめっき液30は、開口部20からめっき槽15の外部に排出されるが、後述する循環ルートによって、処理液導入管22を介して新しいめっき液がめっき槽15に供給されるため、液面31aの位置に変化はない。一方、めっき処理等が完了して脱水(排出)する段階では、めっき液30が開口部20から外部に排出され、処理液導入管22からのめっき液の供給が停止しているので、液面は底板18の上面付近まで下降する(図2の液面31b)。 The liquid level (liquid level) of the plating solution 30 in the plating tank 15 is the plating tank when the plating tank 15 is stationary before the plating treatment or immediately after the completion of the plating treatment, and during the plating treatment or the cleaning treatment. When 15 is rotating, it is located in the vicinity of the upper opening 24 of the plating tank 15 (liquid level 31a in FIG. 2). At this time, the plating liquid 30 is discharged from the opening 20 to the outside of the plating tank 15, but since a new plating liquid is supplied to the plating tank 15 via the treatment liquid introduction pipe 22 by the circulation route described later, the liquid There is no change in the position of the surface 31a. On the other hand, at the stage where the plating treatment or the like is completed and dehydrated (discharged), the plating liquid 30 is discharged to the outside from the opening 20, and the supply of the plating liquid from the treatment liquid introduction pipe 22 is stopped. Lowers to the vicinity of the upper surface of the bottom plate 18 (liquid level 31b in FIG. 2).

なお、開口部20は、図2に示す例では蓋部11に形成した貫通孔33のみで構成されているが、これに限定されない。例えば、図3(a)に示す開口部20aのように、貫通孔33に金属あるいはフッ素樹脂等からなる、孔径Dが例えば3mmの中空パイプ(チューブ)35を装着し、中空パイプ35の一部を蓋部11の外側に例えば、H=3〜5mm突出させた構成としてもよい。こうすることで、めっき槽15が回転したとき、仮に被めっき物25が貫通孔33の下端部に接触して飛び出る位置に至っても、被めっき物は所定長の中空パイプ35によって捕捉され、しかも中空パイプ35は摩擦係数の低い材料からなるとともに傾斜しているため、捕捉された被めっき物が再び、めっき槽15内に戻されるので、排水効率を低下させずに被めっき物のめっき槽外部への飛散を有効に阻止できる。また、中空パイプ35を蓋部11の外側に突出させたことで、中空パイプの交換時等に容易に引き抜くことができる。 In the example shown in FIG. 2, the opening 20 is composed of only the through hole 33 formed in the lid portion 11, but the opening portion 20 is not limited to this. For example, as shown in the opening 20a shown in FIG. 3A, a hollow pipe (tube) 35 having a hole diameter D of, for example, 3 mm, which is made of metal, fluororesin, or the like, is attached to the through hole 33 and is a part of the hollow pipe 35. May be configured such that H = 3 to 5 mm is projected to the outside of the lid portion 11. By doing so, when the plating tank 15 rotates, even if the object to be plated 25 comes into contact with the lower end of the through hole 33 and pops out, the object to be plated is captured by the hollow pipe 35 having a predetermined length, and moreover. Since the hollow pipe 35 is made of a material having a low friction coefficient and is inclined, the captured object to be plated is returned to the inside of the plating tank 15 again, so that the outside of the plating tank of the object to be plated is not reduced in drainage efficiency. It can effectively prevent the scattering to. Further, since the hollow pipe 35 is projected to the outside of the lid portion 11, it can be easily pulled out when the hollow pipe is replaced or the like.

一方、図3(b)に示す開口部20bは、図3(a)に示す開口部20aに対して、蓋部11の内側において貫通孔33をネット状部材37で覆った構成となっている。ネット状部材37は、例えばフッ素樹脂等からなり、めっき液を容易に通過させるが、例えば1mm以下の微小な被めっき物を通過させない程度の網目を有する。その結果、被めっき物25が貫通孔33の開口部に触れる位置に至っても、ネット状部材37によりパイプ35内への侵入が阻止されるので、めっき槽15の外部への被めっき物の飛散を確実に防止できる。 On the other hand, the opening 20b shown in FIG. 3B has a configuration in which the through hole 33 is covered with a net-like member 37 inside the lid 11 with respect to the opening 20a shown in FIG. 3A. .. The net-like member 37 is made of, for example, a fluororesin, and has a mesh that allows the plating solution to easily pass through, but does not allow, for example, a minute object to be plated of 1 mm or less to pass through. As a result, even when the object to be plated 25 comes into contact with the opening of the through hole 33, the net-like member 37 prevents the object to be plated from entering the pipe 35, so that the object to be plated is scattered to the outside of the plating tank 15. Can be reliably prevented.

すなわち、めっき槽15の蓋部11に、図3(b)に示すように貫通孔33にネット状部材37を張った開口部20bを設けることで、被めっき物25の浮遊品や移動時の舞上がり品等がめっき液とともにめっき槽15の外部に漏れ出ることを防止できる。 That is, by providing the lid portion 11 of the plating tank 15 with an opening portion 20b in which a net-like member 37 is stretched in the through hole 33 as shown in FIG. It is possible to prevent the soaring product and the like from leaking to the outside of the plating tank 15 together with the plating solution.

なお、図3(b)に示す開口部20bを作製する場合、貫通孔33の孔径を超える大きさのネット状部材37を用意し、そのネット状部材37を貫通孔33の外側(蓋部11の外側)に当接させたまま、ネット状部材37とともに中空パイプ35を貫通孔33に挿入する。こうすることで、ネット状部材37の端部をめっき槽15の内部に露出させずに、貫通孔33全体を覆うようにネットを張ることができる。また、中空パイプ35を貫通孔33から引き抜くことで、ネット状部材37を容易に交換できる。 When the opening 20b shown in FIG. 3B is produced, a net-shaped member 37 having a size exceeding the hole diameter of the through hole 33 is prepared, and the net-shaped member 37 is placed on the outside of the through hole 33 (cover portion 11). The hollow pipe 35 is inserted into the through hole 33 together with the net-like member 37 while being in contact with the outside). By doing so, the net can be stretched so as to cover the entire through hole 33 without exposing the end portion of the net-like member 37 to the inside of the plating tank 15. Further, the net-like member 37 can be easily replaced by pulling out the hollow pipe 35 from the through hole 33.

図4は、本実施の形態例に係るめっき装置のめっき槽を平面視したときの蓋部に設けた開口部の配置例を示している。図4(a)は、蓋部11の傾斜側面下部の円周方向に等間隔に複数の開口部20を設けた例である。また、図4(b)は、蓋部11の傾斜側面下部の円周方向に、中心線41に対して対称となるように複数の開口部20を設けた例を示す。開口部20の孔形状は、円形または楕円形のいずれであってもよい。 FIG. 4 shows an example of arranging an opening provided in the lid when the plating tank of the plating apparatus according to the present embodiment is viewed in a plan view. FIG. 4A is an example in which a plurality of openings 20 are provided at equal intervals in the circumferential direction of the lower portion of the inclined side surface of the lid portion 11. Further, FIG. 4B shows an example in which a plurality of openings 20 are provided so as to be symmetrical with respect to the center line 41 in the circumferential direction of the lower portion of the inclined side surface of the lid portion 11. The hole shape of the opening 20 may be either circular or elliptical.

図4(a)に示す例では、6個の開口部20をそれぞれ等間隔に配置したが、例えば、めっき槽の大きさ、必要な排水量等に応じて開口部の個数を増減し、それらをランダムな間隔で配置してもよい。また、めっき対象のサイズおよび投入量に応じて開口部の孔径、開口部の個数、および開口部同士の間隔を適宜変えた蓋部を複数、用意してもよい。 In the example shown in FIG. 4A, the six openings 20 are arranged at equal intervals, but for example, the number of openings is increased or decreased according to the size of the plating tank, the required amount of drainage, and the like, and these are arranged. It may be arranged at random intervals. Further, a plurality of lids may be prepared in which the hole diameter of the openings, the number of openings, and the spacing between the openings are appropriately changed according to the size of the plating target and the input amount.

図5は、本実施の形態例に係るめっき装置におけるめっき液等の循環ルートを模式的に示している。図5に示すめっき装置10において、めっき槽15の回転とともに蓋部11に設けた開口部20よりめっき液が排出されると、それと同時にめっき液母槽51内の新しいめっき液が、処理液導入管22を経由してめっき槽15に供給される。また、開口部20より排出されためっき液は、めっき槽15の外部全体を覆う容器50によって受けられ、処理液導出管42を経由してめっき液母槽51に至る。 FIG. 5 schematically shows a circulation route of a plating solution or the like in the plating apparatus according to the present embodiment. In the plating apparatus 10 shown in FIG. 5, when the plating solution is discharged from the opening 20 provided in the lid portion 11 as the plating tank 15 rotates, at the same time, a new plating solution in the plating solution mother tank 51 introduces the treatment liquid. It is supplied to the plating tank 15 via the tube 22. Further, the plating liquid discharged from the opening 20 is received by the container 50 that covers the entire outside of the plating tank 15, and reaches the plating liquid mother tank 51 via the treatment liquid outlet pipe 42.

なお、めっき装置10におけるめっき種の変更にともなう処理液の排出時には、めっき槽15を所定方向に高速回転させ、そのときの遠心力を利用して開口部20よりめっき液等を排出し、容器50で受ける。 When the treatment liquid is discharged due to the change of the plating type in the plating apparatus 10, the plating tank 15 is rotated at a high speed in a predetermined direction, and the plating liquid or the like is discharged from the opening 20 by utilizing the centrifugal force at that time to discharge the plating liquid or the like from the opening 20 to the container. Receive at 50.

めっき物の水洗工程では、水洗水槽53より水洗水導入管21を介してめっき槽15内へ水洗水が供給され、水洗後の水洗水の排出も、上記処理液の排出時と同様、めっき槽を高速回転してその遠心力を利用して行われる。そして、容器50で受けた水洗水は、水洗水導出管41を介して水洗水槽53に戻される。 In the water washing step of the plated product, water washing water is supplied from the water washing water tank 53 into the plating tank 15 via the water washing water introduction pipe 21, and the water washing water after washing is also discharged in the same manner as when the treatment liquid is discharged. Is rotated at high speed and the centrifugal force is used. Then, the water-washed water received in the container 50 is returned to the water-washed water tank 53 via the water-washed water outlet pipe 41.

めっき装置10でのめっき処理における電解反応により、めっき槽15内の金属濃度が徐々に低下するので、めっき槽15と、別に設けためっき液母槽51との間で常にめっき液の循環が行われる。そのため、処理液および水洗水の循環や排出が確実に行われない場合、めっき時における電流異常、各処理液の混入等によって様々なめっき品質の不具合が発生する。 Since the metal concentration in the plating tank 15 gradually decreases due to the electrolytic reaction in the plating process in the plating apparatus 10, the plating solution is constantly circulated between the plating tank 15 and the separately provided plating solution mother tank 51. Will be Therefore, if the treatment liquid and the washing water are not reliably circulated and discharged, various plating quality problems occur due to current abnormality during plating, mixing of each treatment liquid, and the like.

次に、本実施の形態例に係るめっき装置を使用してめっき処理したチップ抵抗器のめっき品質の評価結果について、実施例を参照して説明する。ここでは、表1に示すロット数量の実施例1〜5について、Ni(ニッケル)めっき層の膜厚(μm)およびSn(錫)めっき層の膜厚(μm)を測定した。各めっき層の膜厚測定は、サンプル数n=20で実施した。 Next, the evaluation result of the plating quality of the chip resistor plated by using the plating apparatus according to the present embodiment will be described with reference to the examples. Here, the film thickness (μm) of the Ni (nickel) plating layer and the film thickness (μm) of the Sn (tin) plating layer were measured for Examples 1 to 5 of the lot quantity shown in Table 1. The film thickness of each plating layer was measured with the number of samples n = 20.

Niめっき層、およびSnめっき層とは、図6に例示する断面構造のチップ抵抗器における外部電極を構成する2つのめっき層であり、通常、チップ抵抗器の製造工程において、端面電極を形成した後、Niめっき層を形成し、そのNiめっき層に重ねてSnめっきを施してSnめっき層を形成する。 The Ni plating layer and the Sn plating layer are two plating layers constituting an external electrode in the chip resistor having a cross-sectional structure illustrated in FIG. 6, and usually, an end face electrode was formed in the manufacturing process of the chip resistor. After that, a Ni plating layer is formed, and Sn plating is performed on the Ni plating layer to form a Sn plating layer.

めっき処理におけるチップ抵抗器のめっき層形成に使用しためっき液は、Niめっき:ワット浴、Snめっき:中性浴である。また、被めっき物は0603サイズの抵抗チップ、および通電用φ0.55mmメディアである。 The plating solution used to form the plating layer of the chip resistor in the plating process is Ni plating: Watt bath and Sn plating: Neutral bath. The objects to be plated are a 0603 size resistor chip and a φ0.55 mm medium for energization.

Figure 0006916028
Figure 0006916028

従来のめっき装置を使用した試作例では、めっき槽内(ポーラスリング)への被めっき物の挟まり、および水洗後の残留数が約20〜30個確認された。これに対して、本実施の形態例に係るめっき装置を使用してめっき処理したチップ抵抗器の試作例(表1の実施例1〜5)では、被めっき物の挟まり等が0個であった。また、従来のめっき装置を使用した試作例では、ポーラスリングへの挟まりが原因と思われる未めっき品(めっき未着品)が多数見られたのに対して、本実施の形態例に係るめっき装置を使用した試作例では未めっき品がなく、さらに、膜厚の最大値と最小値の差が小さいことから、めっきの膜厚バラツキについても良好な結果が得られた。 In the prototype example using the conventional plating apparatus, it was confirmed that the object to be plated was caught in the plating tank (porous ring) and the number of residues after washing with water was about 20 to 30. On the other hand, in the prototype example of the chip resistor plated by using the plating apparatus according to the present embodiment (Examples 1 to 5 in Table 1), the number of objects to be plated was 0. rice field. Further, in the prototype example using the conventional plating apparatus, a large number of unplated products (non-plated products) which are considered to be caused by being caught in the porous ring were found, whereas the plating according to the embodiment of the present embodiment was performed. In the prototype using the device, there were no unplated products, and the difference between the maximum and minimum film thickness was small, so good results were obtained with regard to the variation in plating film thickness.

以上説明したように、本実施の形態例に係る電子部品のめっき装置では、めっき層を構成する蓋部の傾斜側面のうち、めっき層が回転しても被めっき物が直接、接触しない位置に開口部を設けることによって、被めっき物の挟まり、残留等を防止でき、めっき液や水洗水のみを効率良く確実に排出することが可能となる。すなわち、めっき槽が水平方向に回転し、遠心力により被めっき物がめっき槽の端部へ移動して内壁に押し付けられても、それらの被めっき物と重ならない位置に開口部を設けたことで、めっき液等の循環や排出に支障をきたすことなく対象物に均一なめっき処理ができる。 As described above, in the plating apparatus for electronic components according to the embodiment of the present embodiment, the object to be plated does not come into direct contact with the inclined side surface of the lid portion constituting the plating layer even if the plating layer rotates. By providing the opening, it is possible to prevent the object to be plated from being pinched or left behind, and it is possible to efficiently and surely discharge only the plating solution and the washing water. That is, even if the plating tank rotates in the horizontal direction and the objects to be plated move to the end of the plating tank due to centrifugal force and are pressed against the inner wall, an opening is provided at a position where the objects to be plated do not overlap with the objects to be plated. Therefore, a uniform plating process can be performed on the object without hindering the circulation and discharge of the plating solution and the like.

また、めっき層の底部を構成するスペーサリングの厚さを変えて外周側壁の高さを調整可能な構成としたことで、被めっき物の投入条件等に合わせて、めっき槽における開口部の垂直方向の位置、めっき槽の容積を迅速に調整できる。 In addition, the height of the outer peripheral side wall can be adjusted by changing the thickness of the spacer ring that constitutes the bottom of the plating layer, so that the opening is vertical in the plating tank according to the conditions for loading the object to be plated. The position in the direction and the volume of the plating tank can be adjusted quickly.

さらには、上記のような開口部を設けた本実施の形態例に係る電子部品のめっき装置は、従来のポーラス状フィルターリングのような強固な構造、取付が不要となり、めっき装置の構成を簡略化できるだけでなく、処理液の循環や排出を効率的に行うことができ、簡単な構成でめっき品質の異常発生を確実に防止できる。 Further, the plating apparatus for electronic components according to the embodiment of the present embodiment provided with the above-mentioned opening does not require a strong structure and mounting unlike the conventional porous filter ring, and the configuration of the plating apparatus is simplified. Not only can the treatment liquid be circulated and discharged efficiently, and the simple configuration can reliably prevent the occurrence of abnormal plating quality.

また、めっき槽の蓋部の内側において貫通孔にネット状部材を張った構成の開口部とした場合、ネット交換等の定期的なメンテナンスも短時間、簡便、かつ容易に行うことができる。 Further, when the opening is provided with a net-like member in the through hole inside the lid of the plating tank, regular maintenance such as net replacement can be performed easily and easily in a short time.

10 めっき装置
11 蓋部
12 回転軸
13 底部
14 導通部材
15 めっき槽
16 陽極電極
17 陰極電極
18 底板(ベース部材)
19 スペーサリング
20,20a,20b 開口部
21 水洗水導入管
22 処理液導入管
23 液面センサ
24 上部開口部
25 被めっき物
26 突起部
27 固定部材
28 外周側壁
29 リング部材
30 めっき液
31 液面(液位)
33 貫通孔
35 中空パイプ
37 ネット状部材
41 水洗水導出管
42 処理液導出管
50 容器
51 めっき液母槽
53 水洗水槽
10 Plating device 11 Cover 12 Rotating shaft 13 Bottom 14 Conductive member 15 Plating tank 16 Anode electrode 17 Cathode electrode 18 Bottom plate (base member)
19 Spacer ring 20, 20a, 20b Opening 21 Water wash water introduction pipe 22 Treatment liquid introduction pipe 23 Liquid level sensor 24 Upper opening 25 Plated object 26 Projection 27 Fixing member 28 Outer peripheral side wall 29 Ring member 30 Plating liquid 31 Liquid level (Liquid level)
33 Through hole 35 Hollow pipe 37 Net-shaped member 41 Water wash water outlet pipe 42 Treatment liquid outlet pipe 50 Container 51 Plating liquid mother tank 53 Water wash water tank

Claims (6)

略円錐状の蓋部と、外周側壁を有する略円板状の底部とで形成される内部空間に被めっき物およびめっき液を貯留し、水平方向に回転可能なめっき槽と、
前記めっき槽内の略中央に配設された陽極電極と、
前記めっき槽の内周側に露出するとともに前記外周側壁の一部を構成する陰極電極と、
前記蓋部に設けられためっき液を排出する開口部と、
を備え
前記開口部は、前記蓋部の傾斜側面下方部に設けた貫通孔に、該蓋部の外側に突出する筒状部材を挿入してなることを特徴とする電子部品のめっき装置。
A plating tank that can rotate in the horizontal direction by storing the object to be plated and the plating solution in the internal space formed by the substantially conical lid and the substantially disk-shaped bottom having the outer peripheral side wall.
An anode electrode arranged substantially in the center of the plating tank and
A cathode electrode exposed on the inner peripheral side of the plating tank and forming a part of the outer peripheral side wall,
An opening provided in the lid for discharging the plating solution and
Equipped with a,
The opening, in a through hole provided on the inclined side surface lower portion of the lid, the plating apparatus for an electronic component, characterized in Rukoto such by inserting the tubular member protruding to the outside of the lid portion.
前記開口部は、前記蓋部の傾斜側面下方部に設けた貫通孔に、該蓋部の外側に突出する筒状部材を挿入するとともに該貫通孔を覆うネット状部材を設けてなることを特徴とする請求項に記載の電子部品のめっき装置。 The opening is characterized in that a tubular member projecting to the outside of the lid is inserted into a through hole provided in the lower portion of the inclined side surface of the lid, and a net-like member is provided to cover the through hole. The electronic component plating apparatus according to claim 1. 前記開口部は、前記蓋部の下方部の周方向に間隔を置いて複数設けられていることを特徴とする請求項1または2に記載の電子部品のめっき装置。 The plating apparatus for an electronic component according to claim 1 or 2 , wherein a plurality of the openings are provided at intervals in the circumferential direction of the lower portion of the lid portion. 前記外周側壁の高さを変えることで、前記めっき槽における前記開口部の垂直方向の位置を調整可能としたことを特徴とする請求項1から3のいずれか1項に記載の電子部品のめっき装置。 The plating of an electronic component according to any one of claims 1 to 3, wherein the vertical position of the opening in the plating tank can be adjusted by changing the height of the outer peripheral side wall. Device. 前記筒状部材は、前記蓋部の傾斜側面下方部において該傾斜側面に対して略垂直方向に該蓋部の外側に突出することを特徴とする請求項1から4のいずれか1項に記載の電子部品のめっき装置。The method according to any one of claims 1 to 4, wherein the tubular member projects outward of the lid portion in a direction substantially perpendicular to the inclined side surface at a lower portion of the inclined side surface of the lid portion. Electronic component plating equipment. 前記筒状部材は、前記貫通孔より引き抜いて交換可能であることを特徴とする請求項1から5のいずれか1項に記載の電子部品のめっき装置。The electronic component plating apparatus according to any one of claims 1 to 5, wherein the tubular member can be pulled out from the through hole and replaced.
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