JP6906376B2 - Purification method for PCB processing facility - Google Patents

Purification method for PCB processing facility Download PDF

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JP6906376B2
JP6906376B2 JP2017116756A JP2017116756A JP6906376B2 JP 6906376 B2 JP6906376 B2 JP 6906376B2 JP 2017116756 A JP2017116756 A JP 2017116756A JP 2017116756 A JP2017116756 A JP 2017116756A JP 6906376 B2 JP6906376 B2 JP 6906376B2
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pcb
distance
concentration
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partition member
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JP2019000784A (en
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清水 由章
由章 清水
松本 忠雄
忠雄 松本
友幸 立見
友幸 立見
加藤 治
治 加藤
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Shinko Pantec Co Ltd
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Kobelco Eco Solutions Co Ltd
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Description

本発明は、PCB処理施設の浄化方法に関し、特にPCB処理施設を区画する区画部材を削り取って除去することにより、該区画部材のPCB濃度を基準値以下に低下させるPCB処理施設の浄化方法に関する。 The present invention relates to a method for purifying a PCB treatment facility, and more particularly to a method for purifying a PCB treatment facility in which the PCB concentration of the partition member is reduced to a reference value or less by scraping and removing the partition member for partitioning the PCB treatment facility.

不燃性の絶縁体であるPCB(ポリ塩化ビフェニル)は人体に有害であることから、法定期間内に無害化処理することが規定されている。日本に存在するPCB汚染物全ての無害化処理を終えた後はPCB処理施設を解体することとなるが、PCB処理施設にある壁、床、天井等の区画部材は、PCBを含んだ空気に晒されたり、PCB汚染物から漏れ出たPCBが付着したりしているため、PCB処理施設を解体する前に該区画部材を浄化する必要がある。 Since PCB (polychlorinated biphenyl), which is a nonflammable insulator, is harmful to the human body, it is stipulated that it should be detoxified within the legal period. After detoxifying all PCB contaminants existing in Japan, the PCB treatment facility will be dismantled, but the partition members such as walls, floors, and ceilings in the PCB treatment facility will be made into air containing PCB. It is necessary to clean the compartment members before dismantling the PCB treatment facility because they are exposed or have adhered to the PCB leaked from the PCB contaminants.

特許文献1のPCB処理施設の浄化方法は、コンクリート製の壁の表面に液体塗料で塗膜を形成し、硬化した塗膜と共に該表面を5〜10mmの深さまで削り取ってPCBを除去するものである。その結果、コンクリート壁の微細な凹部に入り込んだPCBを塗膜に付着させて除去することができると記載されている。 The method for purifying a PCB treatment facility in Patent Document 1 is to form a coating film on the surface of a concrete wall with a liquid paint, and scrape the surface together with the cured coating film to a depth of 5 to 10 mm to remove PCB. be. As a result, it is described that the PCB that has entered the fine recesses of the concrete wall can be attached to the coating film and removed.

特開2012−187456号公報Japanese Unexamined Patent Publication No. 2012-187456

例えばコンクリートで構成される区画部材の場合、表面からある程度の深さに達するまでPCBが浸透しているおそれがある。特許文献1に記載のPCB処理施設の浄化方法では、区画部材の表面付近の凹部に存在するPCBを塗膜に付着させて除去することができるものの、区画部材の深くにまで浸透したPCBを確実に除去することが困難であるため、改善の余地がある。しかも、区画部材の表面全域に塗膜を形成するのは煩雑である。 For example, in the case of a section member made of concrete, PCB may permeate until it reaches a certain depth from the surface. In the method for purifying a PCB treatment facility described in Patent Document 1, although PCB existing in a recess near the surface of a partition member can be removed by adhering to a coating film, PCB that has penetrated deep into the partition member can be reliably removed. There is room for improvement as it is difficult to remove. Moreover, it is complicated to form a coating film on the entire surface of the partition member.

そこで、簡便な方法でありながら区画部材のPCBを確実に除去できるPCB処理施設の浄化方法が望まれている。 Therefore, there is a demand for a purification method for a PCB processing facility that can reliably remove PCBs of partition members while being a simple method.

PCB処理施設の浄化方法は、PCB処理施設の内部を区画する区画部材の所定エリアごとに特徴地点を設け、当該特徴地点を前記区画部材の厚み方向に設定された第一距離ごとに削り取る削取工程と、前記区画部材における前記第一距離ごとの削取部位のPCB濃度を測定する測定工程と、前記第一距離を加算することにより前記区画部材の表面からの前記厚み方向の第二距離を設定し、前記測定工程で測定されたPCB濃度が基準値以下となる前記削取部位に対応した前記第二距離を特定する特定工程と、前記所定エリアにおいて、前記表面から前記第二距離に前記第一距離を減算した第三距離に到達するまで、前記区画部材を削り取って除去する除去工程と、を備えた点にある。 The purification method of the PCB processing facility is to set a feature point for each predetermined area of the partition member that partitions the inside of the PCB treatment facility, and scrape off the feature point for each first distance set in the thickness direction of the partition member. The step, the measurement step of measuring the PCB concentration of the scraped portion for each first distance in the section member, and the second distance in the thickness direction from the surface of the section member by adding the first distance. A specific step of setting and specifying the second distance corresponding to the scraped portion where the PCB concentration measured in the measuring step is equal to or less than the reference value, and the second distance from the surface in the predetermined area. It is a point provided with a removal step of scraping and removing the partition member until the third distance obtained by subtracting the first distance is reached.

本方法では、区画部材の所定エリアに設けた特徴地点において、第一距離(D1)ごとに削り取った削取部位のPCB濃度を測定している。このため、第一距離(D1)の削取部位と、次の第一距離(D1)の削取部位とが混ざり合って、各削取部位ごとのPCB濃度が正確に測定できないといった不都合を解消できる。その結果、第一距離(D1)をN回加算した第二距離(D2=D1×N)における削取部位のPCB濃度を正確に測定することが可能となり、PCBが浸透した深さとしての第三距離(D3=D2−D1)を確実に特定することができる。 In this method, the PCB concentration of the scraped portion is measured for each first distance (D1) at the feature point provided in the predetermined area of the partition member. For this reason, the inconvenience that the cutting part of the first distance (D1) and the cutting part of the next first distance (D1) are mixed and the PCB concentration for each cutting part cannot be measured accurately is solved. can. As a result, it becomes possible to accurately measure the PCB concentration of the scraped portion at the second distance (D2 = D1 × N) in which the first distance (D1) is added N times, and the PCB penetration depth is the second. The three distances (D3 = D2-D1) can be reliably specified.

また、除去工程では、所定エリアにおける区画部材の表面から第三距離(D3)に到達するまで削り取るので、複数の地点で都度PCB濃度を測定しながら削り取る手間を省くことができる。さらに、本方法では、PCB濃度が基準値以下となる第二距離(D2)を特定しているので、必要以上に深く削り取ることもなく、効率的である。 Further, in the removing step, since the scraping is performed until the third distance (D3) is reached from the surface of the partition member in the predetermined area, it is possible to save the trouble of scraping while measuring the PCB concentration at each of a plurality of points. Further, in this method, since the second distance (D2) at which the PCB concentration is equal to or less than the reference value is specified, it is efficient without scraping deeper than necessary.

このように、簡便な方法でありながら区画部材のPCBを確実に除去できるPCB処理施設の浄化方法を提供できた。 As described above, it has been possible to provide a purification method for a PCB processing facility that can reliably remove PCBs of partition members while being a simple method.

他の方法は、前記除去工程の後、前記特徴地点と異なる地点において、前記第一距離分の前記区画部材を削り取り、前記第一距離分の前記削取部位のPCB濃度が前記基準値以下か否かを判定する分析工程をさらに備えた点にある。 In another method, after the removal step, the partition member for the first distance is scraped off at a point different from the feature point, and the PCB concentration of the scraped portion for the first distance is equal to or less than the reference value. The point is that it is further provided with an analysis process for determining whether or not it is present.

所定エリアにおいて作業履歴等からPCB濃度が高いと想定される特徴地点を選定したとしても、PCB濃度がさらに高い地点が存在する可能性がある。本方法のように、第三距離(D3)まで区画部材を削り取った後に特徴地点とは異なる地点における第一距離(D1)分の削取部位のPCB濃度を判定すれば、区画部材のPCBをより確実に除去することができる。 Even if a characteristic point where the PCB concentration is assumed to be high is selected from the work history or the like in a predetermined area, there is a possibility that there is a point where the PCB concentration is even higher. As in this method, if the PCB concentration of the scraped portion for the first distance (D1) at a point different from the feature point is determined after scraping the partition member up to the third distance (D3), the PCB of the compartment member can be obtained. It can be removed more reliably.

本実施形態に係るPCB処理施設の浄化方法の概念図である。It is a conceptual diagram of the purification method of the PCB processing facility which concerns on this embodiment. 浄化フロー図である。It is a purification flow chart.

以下に、本発明に係るPCB処理施設の浄化方法の実施形態について、図面に基づいて説明する。本実施形態では、PCB処理施設の浄化方法の一例として、PCB処理施設の各管理区域を仕切るコンクリート製の壁WL(区画部材の一例)、コンクリート製の床WF(区画部材の一例)又はコンクリート製の天井WT(区画部材の一例)のPCBを除去する場合として説明する。ただし、以下の実施形態に限定されることなく、その要旨を逸脱しない範囲内で種々の変形が可能である。 Hereinafter, embodiments of the purification method for the PCB processing facility according to the present invention will be described with reference to the drawings. In the present embodiment, as an example of the purification method of the PCB treatment facility, a concrete wall WL (an example of a section member), a concrete floor WF (an example of a section member) or a concrete material that divides each controlled area of the PCB treatment facility. The case where the PCB of the ceiling WT (an example of a partition member) is removed will be described. However, the present invention is not limited to the following embodiments, and various modifications can be made without departing from the gist thereof.

図1に示すように、PCB処理施設の内部は、PCBの汚染レベルが定められた管理区域AおよびPCBを取り扱わない非管理区域と、を備えている。また、PCB処理施設は、不図示の洗浄設備、プラズマ溶融炉や活性炭槽等を備えている。 As shown in FIG. 1, the inside of the PCB treatment facility includes a controlled area A in which the contamination level of the PCB is defined and a non-controlled area in which the PCB is not handled. In addition, the PCB processing facility is equipped with cleaning equipment (not shown), a plasma melting furnace, an activated carbon tank, and the like.

管理区域Aは、PCB汚染レベル3である高濃度管理区域と、PCB汚染レベル2の中濃度管理区域A2と、PCB汚染レベル1の低濃度管理区域とで構成されている。PCB汚染レベル3の高濃度管理区域とは、通常操業下でPCBによる作業環境の汚染の可能性があるため、レベルの高い管理が必要な区域である。PCB汚染レベル2の中濃度管理区域A2とは、通常操業下ではPCBによる作業環境の汚染は無いが、工程内の作業で間接的に高濃度のPCBを取扱う(又はPCBがほとんど除去された対象物を作業環境中で取扱う)ため、相応の管理が必要な区域である。PCB汚染レベル1の低濃度管理区域とは、工程内のPCBは設備内に密閉されているため、通常操業下ではPCBによる作業環境の汚染は無く、最小限の管理で対応できる区域である。 The controlled area A is composed of a high concentration controlled area having a PCB contamination level 3, a medium concentration controlled area A2 having a PCB contamination level 2, and a low concentration controlled area having a PCB contamination level 1. A high concentration control area with PCB contamination level 3 is an area that requires high level control because there is a possibility that the work environment will be contaminated by PCB under normal operation. The medium concentration control area A2 of PCB contamination level 2 is a target in which the work environment is not contaminated by PCB under normal operation, but high concentration PCB is indirectly handled (or the PCB is almost removed) in the work in the process. It is an area that requires proper management because it handles things in the work environment). The low concentration control area of PCB contamination level 1 is an area where the PCB in the process is sealed in the equipment, so that the working environment is not contaminated by the PCB under normal operation and can be dealt with with the minimum control.

高濃度管理区域では、PCB汚染物を種類ごとに分別した上で、グローブボックス内で電気機器等を解体して、例えば洗浄かご、ドラム缶やぺール缶で構成される容器(不図示)に詰替える。そして、この洗浄かごを溶剤洗浄したり、容器をプラズマ溶融炉に投入したりする等して、PCB汚染物を無害化する。なお、PCB汚染物は、電気機器(安定器、トランス、コンデンサ等)、運転廃棄物(作業服、ゴム手袋、ウエス等)、感圧複写紙、汚泥、絶縁油などで構成されている。 In high-concentration control areas, PCB contaminants are sorted by type, and electrical equipment is disassembled in the glove box and packed in a container (not shown) consisting of, for example, a washing basket, drums, and pail cans. Change. Then, the PCB contaminants are detoxified by cleaning the cleaning basket with a solvent or putting the container into a plasma melting furnace. PCB contaminants are composed of electrical equipment (ballasts, transformers, capacitors, etc.), operating waste (work clothes, rubber gloves, waste cloth, etc.), pressure-sensitive copying paper, sludge, insulating oil, and the like.

中濃度管理区域A2では、グローブボックス(内側は高濃度管理区域)の外側や、PCBを含んだ空気や液体が流通する配管やPCB濃度の低い機器等が配置されている。低濃度管理区域では、PCBを含む液体を内封する密閉機器や配管等が配置されている。非管理区域は、屋根裏や管理区域Aと外部に面した壁WLとの間の空間などで構成されている。また、夫々の管理区域Aおよび非管理区域は壁WL、床WF又は天井WTで区画されている。 In the medium concentration control area A2, the outside of the glove box (the inside is a high concentration control area), piping through which air or liquid containing PCB flows, equipment having a low PCB concentration, and the like are arranged. In the low concentration control area, sealing equipment, piping, etc. that contain liquid containing PCB are arranged. The non-controlled area is composed of an attic or a space between the controlled area A and the wall WL facing the outside. In addition, each controlled area A and non-controlled area is partitioned by a wall WL, a floor WF, or a ceiling WT.

中濃度管理区域A2や低濃度管理区域の壁WL、床WF又は天井WTは、コンクリート製等で構成されている。また、非管理区域の外部に面した壁WLは、鉄筋が埋設された軽量発泡コンクリート(ALC)で構成されている。 The wall WL, floor WF or ceiling WT of the medium concentration control area A2 and the low concentration control area are made of concrete or the like. Further, the wall WL facing the outside of the uncontrolled area is composed of lightweight foam concrete (ALC) in which reinforcing bars are embedded.

以下、中濃度管理区域A2の壁WL、床WF又は天井WTに含まれるPCBを除去する方法を一例として説明する。 Hereinafter, a method for removing PCB contained in the wall WL, floor WF, or ceiling WT of the medium concentration control area A2 will be described as an example.

中濃度管理区域A2では、PCB濃度の高いPCB汚染物を積極的に取り扱うことはないが、工程内の作業で間接的に高濃度のPCBを取扱うため、空気中のPCB濃度は比較的高い。そこで、この中濃度管理区域A2では、不図示の排気ファンによってPCBを含む空気が活性炭槽等の排気処理設備に送られて浄化されるように構成されている。中濃度管理区域A2の壁WL、床WF又は天井WTに、PCBを含む空気が接触してPCBが浸透したり、例えば空気を排気する際に設けられるストレーナのように定期点検のために開放する必要がある機器からPCBが漏れ出してPCBが付着したりする。このため、壁WL、床WF又は天井WTのうち、機器の配置場所や使用方法からPCB濃度の高い部位を特定することができる。 In the medium concentration control area A2, PCB contaminants having a high PCB concentration are not actively handled, but the PCB concentration in the air is relatively high because the high concentration PCB is indirectly handled in the work in the process. Therefore, in the medium concentration control area A2, air containing PCB is sent to an exhaust treatment facility such as an activated carbon tank to be purified by an exhaust fan (not shown). The wall WL, floor WF, or ceiling WT of the medium concentration control area A2 is opened for periodic inspection, such as a strainer provided when air including PCB permeates the wall WL, floor WF, or ceiling WT and permeates the PCB. PCB leaks from the equipment that needs it, and PCB adheres to it. Therefore, among the wall WL, the floor WF, and the ceiling WT, a portion having a high PCB concentration can be specified from the arrangement location and usage method of the equipment.

図1〜図2に示すように、中濃度管理区域A2のうちPCBを除去する所定エリアを設定する。所定エリアの設定は、一日あたりの作業面積で設定しても良いし、予め定めた所定面積で区分しても良い。次いで、所定エリアのうち、PCB濃度が最も高いと想定される特徴地点P1を選定する。この特徴地点P1は、機材の配置場所や使用方法、作業履歴等に基づいて総合的に選定される。 As shown in FIGS. 1 and 2, a predetermined area from which the PCB is removed is set in the medium concentration control area A2. The predetermined area may be set by the working area per day, or may be divided by a predetermined predetermined area. Next, the feature point P1 in which the PCB concentration is assumed to be the highest is selected from the predetermined areas. This feature point P1 is comprehensively selected based on the location of the equipment, the method of use, the work history, and the like.

次いで、特徴地点P1を壁WL、床WF又は天井WTの厚み方向に設定された第一距離D1(例えば、5mm)ごとに削り取る(削取工程)。この削取工程は、砥石、鑢、ワイヤーブラシ等を有する研削機1と、コンクリートを削り取って発生する研削粉(削取部位)を吸引する真空吸引装置Cとを用いて実行される。研削機1で削り取られた研削粉を含む排気が真空吸引装置Cで吸引され、配管3を経由した排気を濾過して回収された研削粉が集塵部2に貯留される。なお、研削粉が分離した排気は、活性炭槽等の排気処理設備で無害化処理される。 Next, the feature point P1 is scraped off every first distance D1 (for example, 5 mm) set in the thickness direction of the wall WL, the floor WF, or the ceiling WT (cutting step). This grinding step is performed using a grinding machine 1 having a grindstone, a file, a wire brush, and the like, and a vacuum suction device C that sucks grinding powder (cutting portion) generated by scraping concrete. The exhaust gas containing the grinding powder scraped off by the grinding machine 1 is sucked by the vacuum suction device C, and the grinding powder collected by filtering the exhaust gas passing through the pipe 3 is stored in the dust collecting unit 2. The exhaust gas from which the grinding powder is separated is detoxified by an exhaust treatment facility such as an activated carbon tank.

次いで、集塵部2に貯留された第一距離D1分の研削粉(削取部位)のPCB濃度を測定する(測定工程)。次いで、研削粉のPCB濃度が基準値(例えば、PCBの卒業基準である0.03mg/L−検液)以下か否かを判定し、PCB濃度が基準値以下となるまで上述した削取工程および測定工程をN回繰り返す。次いで、第一距離D1をN回加算して、PCB濃度が基準値以下となる研削粉(削取部位)に対応した第二距離D2(D1×N)を特定する(特定工程)。なお、本実施形態の集塵部2においては、第一距離D1分の研削粉が貯留された時点で集塵袋を取り外し、次の削取工程の際には新たな集塵袋を設置することとしている。これにより、第一距離D1の研削粉と、次の第一距離D1の研削粉とが混ざり合うことがない。 Next, the PCB concentration of the grinding powder (cutting site) for the first distance D1 stored in the dust collecting unit 2 is measured (measurement step). Next, it is determined whether or not the PCB concentration of the grinding powder is equal to or less than the reference value (for example, 0.03 mg / L-test solution, which is the graduation standard of PCB), and the above-mentioned scraping step is performed until the PCB concentration becomes equal to or less than the reference value. And the measurement process is repeated N times. Next, the first distance D1 is added N times to specify the second distance D2 (D1 × N) corresponding to the grinding powder (cutting site) whose PCB concentration is equal to or less than the reference value (specific step). In the dust collecting unit 2 of the present embodiment, the dust collecting bag is removed when the grinding powder for the first distance D1 is stored, and a new dust collecting bag is installed in the next scraping process. It is supposed to be. As a result, the grinding powder at the first distance D1 and the grinding powder at the next first distance D1 do not mix with each other.

次いで、所定エリアの壁WL、床WF又は天井WT全体を、表面から第三距離D3(D2−D1=D1×(N−1))に到達するまで研削機1を用いて削り取って除去する(除去工程)。この除去された研削粉は、容器に詰替えてプラズマ溶融炉で無害化される。なお、除去された研削粉のPCB濃度を洗浄設備で基準値以下に低下させた後、PCB油を化学処理しても良いし、PCB処理施設から搬出して異なるPCB処理施設で適正処理しても良く、無害化方法は特に限定されない。 Next, the entire wall WL, floor WF, or ceiling WT in the predetermined area is scraped off using the grinder 1 until the third distance D3 (D2-D1 = D1 × (N-1)) is reached from the surface (D2-D1 = D1 × (N-1)). Removal process). The removed grinding powder is refilled in a container and detoxified in a plasma melting furnace. After reducing the PCB concentration of the removed grinding powder to below the standard value in a cleaning facility, the PCB oil may be chemically treated, or it may be taken out of the PCB treatment facility and properly treated in a different PCB treatment facility. The detoxification method is not particularly limited.

次いで、所定エリアの特徴地点P1とは異なる分析地点P2において、第一距離P1分の壁WL、床WF又は天井WTを研削機1で削り取り、研削粉(削取部位)のPCB濃度が基準値以下か否かを判定する(分析工程)。この分析地点P2は、特徴地点P1の次にPCB濃度が高いと想定された地点であることが好ましい。 Next, at the analysis point P2 different from the feature point P1 in the predetermined area, the wall WL, floor WF or ceiling WT for the first distance P1 is scraped by the grinding machine 1, and the PCB concentration of the grinding powder (cutting site) is the reference value. It is determined whether or not it is as follows (analysis step). The analysis point P2 is preferably a point where the PCB concentration is assumed to be the second highest after the feature point P1.

分析工程で研削粉のPCB濃度が基準値以下の場合は、所定エリアのPCB除去を終了する。一方、分析工程で研削粉のPCB濃度が基準値より大きい場合は、分析地点P2において、第三距離D3より下の第一距離D1分の壁WL、床WF又は天井WTを研削機1で削り取り、研削粉(削取部位)のPCB濃度が基準値以下となるまでN回繰り返す。次いで、所定エリアの壁WL、床WF又は天井WT全体を、表面から第三距離D3(D2−D1=D1×(N−1))に到達するまで研削機1を用いて削り取って除去する。この除去された研削粉は、容器に詰替えてプラズマ溶融炉で無害化される。なお、除去された研削粉のPCB濃度を洗浄設備で基準値以下に低下させた後、PCB油を化学処理しても良いし、PCB処理施設から搬出して異なるPCB処理施設で適正処理しても良く、無害化方法は特に限定されない。 If the PCB concentration of the grinding powder is less than the reference value in the analysis step, the PCB removal in the predetermined area is completed. On the other hand, if the PCB concentration of the grinding powder is higher than the reference value in the analysis process, the wall WL, floor WF or ceiling WT for the first distance D1 below the third distance D3 is scraped off by the grinding machine 1 at the analysis point P2. , Repeat N times until the PCB concentration of the grinding powder (cutting site) becomes equal to or less than the reference value. Next, the entire wall WL, floor WF, or ceiling WT in the predetermined area is scraped off using the grinder 1 until the third distance D3 (D2-D1 = D1 × (N-1)) is reached from the surface. The removed grinding powder is refilled in a container and detoxified in a plasma melting furnace. After reducing the PCB concentration of the removed grinding powder to below the standard value in a cleaning facility, the PCB oil may be chemically treated, or it may be taken out of the PCB treatment facility and properly treated in a different PCB treatment facility. The detoxification method is not particularly limited.

次いで、所定エリアの特徴地点P1および分析地点P2とは異なる分析地点P2’(3番目にPCB濃度が高いと想定された地点であることが好ましい。)において、第一距離P1分の壁WL、床WF又は天井WTを研削機1で削り取る。その後、研削粉のPCB濃度が基準値以下上述した分析地点P2と同様の作業を繰り返す。 Next, at the analysis point P2'(preferably the point where the PCB concentration is assumed to be the third highest) different from the feature point P1 and the analysis point P2 in the predetermined area, the wall WL for the first distance P1 minute, The floor WF or ceiling WT is scraped off with the grinder 1. After that, the same operation as that at the analysis point P2 described above is repeated when the PCB concentration of the grinding powder is below the reference value.

このように、壁WL、床WF又は天井WTの所定エリアに設けた特徴地点P1において、第一距離D1ごとに削り取った研削粉のPCB濃度を測定している。このため、第一距離D1の研削粉と、次の第一距離D1の研削粉とが混ざり合って、各研削粉ごとのPCB濃度が正確に測定できないといった不都合を解消できる。その結果、第一距離D1をN回加算した第二距離D2(D1×N)における研削粉のPCB濃度を正確に測定することが可能となり、PCBが浸透した深さとしての第三距離D3(D2−D1)を確実に特定することができる。 In this way, at the feature point P1 provided in the predetermined area of the wall WL, the floor WF, or the ceiling WT, the PCB concentration of the ground powder scraped off is measured for each first distance D1. Therefore, it is possible to eliminate the inconvenience that the grinding powder at the first distance D1 and the grinding powder at the next first distance D1 are mixed and the PCB concentration for each grinding powder cannot be accurately measured. As a result, it becomes possible to accurately measure the PCB concentration of the grinding powder at the second distance D2 (D1 × N) obtained by adding the first distance D1 N times, and the third distance D3 (the depth at which the PCB permeates) (3) D2-D1) can be reliably identified.

また、除去工程では、所定エリアにおける壁WL、床WF又は天井WTの表面から第三距離D3に到達するまで削り取るので、複数の地点で都度PCB濃度を測定しながら削り取る手間を省くことができる。さらに、本実施形態では、PCB濃度が基準値以下となる第二距離D2を特定しているので、必要以上に深く削り取ることもなく、効率的である。 Further, in the removing step, since the scraping is performed from the surface of the wall WL, the floor WF or the ceiling WT in the predetermined area until the third distance D3 is reached, it is possible to save the trouble of scraping while measuring the PCB concentration at each of a plurality of points. Further, in the present embodiment, since the second distance D2 in which the PCB concentration is equal to or less than the reference value is specified, it is efficient without scraping deeper than necessary.

一方、所定エリアにおいて作業履歴等からPCB濃度が高いと想定される特徴地点P1を選定したとしても、PCB濃度がさらに高い地点が存在する可能性がある。本実施形態のように、第三距離D3まで壁WL、床WF又は天井WTを削り取った後に特徴地点P1とは異なる分析地点P2における第一距離D1分の研削粉のPCB濃度を判定すれば、壁WL、床WF又は天井WTのPCBをより確実に除去することができる。 On the other hand, even if the feature point P1 which is assumed to have a high PCB concentration is selected from the work history or the like in a predetermined area, there is a possibility that there is a point where the PCB concentration is even higher. If the PCB concentration of the grinding powder for the first distance D1 at the analysis point P2 different from the feature point P1 is determined after scraping the wall WL, the floor WF or the ceiling WT up to the third distance D3 as in the present embodiment. PCBs on wall WL, floor WF or ceiling WT can be removed more reliably.

[その他の実施形態]
(1)所定エリアで最もPCB濃度が高い特徴地点P1を確実に選定できる場合は、上述した実施形態における分析工程を省略しても良い。また、分析工程を複数の分析地点P2,P2’,・・・で実行せずに、1箇所の分析地点P2のみで実行しても良い。
(2)上述した実施形態では、削取工程と除去工程とにおいて、壁WL、床WF又は天井WTを削り取る装置として同一の研削機1を用いる例を示したが、削取工程で小型の研削機1を用い、除去工程で大型の研削機又は掘削機を用いても良く、特に限定されない。また、研削機1も、削取部位を回収できる装置であれば、どのような装置でも良い。
(3)上述した実施形態の区画部材は壁WL、床WF又は天井WTに限定されず、PCBが浸透した部材であれば、どのような区画部材であっても良い。
[Other Embodiments]
(1) If the feature point P1 having the highest PCB concentration in the predetermined area can be reliably selected, the analysis step in the above-described embodiment may be omitted. Further, the analysis step may not be executed at a plurality of analysis points P2, P2', ..., But may be executed only at one analysis point P2.
(2) In the above-described embodiment, an example in which the same grinder 1 is used as a device for scraping the wall WL, floor WF, or ceiling WT in the scraping step and the removing step is shown, but small grinding is performed in the scraping step. Machine 1 may be used, and a large-scale grinder or excavator may be used in the removal step, and the method is not particularly limited. Further, the grinding machine 1 may be any device as long as it can collect the scraped portion.
(3) The partition member of the above-described embodiment is not limited to the wall WL, the floor WF, or the ceiling WT, and may be any partition member as long as it is a member in which PCB has penetrated.

本発明は、PCB処理施設の内部を区画する区画部材を削り取って除去するPCB処理施設の浄化方法に利用可能である。 INDUSTRIAL APPLICABILITY The present invention can be used as a purification method for a PCB processing facility in which a partition member for partitioning the inside of the PCB processing facility is scraped off and removed.

D1 第一距離
D2 第二距離
D3 第三距離
P1 特徴地点
P2 分析地点(特徴地点と異なる地点)
WF 床(区画部材)
WL 壁(区画部材)
WT 天井(区画部材)
D1 1st distance D2 2nd distance D3 3rd distance P1 Feature point P2 Analysis point (point different from feature point)
WF floor (partition member)
WL wall (partition member)
WT ceiling (partition member)

Claims (2)

PCB処理施設の内部を区画する区画部材の所定エリアごとにPCB濃度が最も高いと想定される特徴地点を設定し、当該特徴地点を前記区画部材の厚み方向に設定された第一距離ごとに削り取る削取工程と、
前記区画部材における前記第一距離ごとの削取部位のPCB濃度の平均値を測定する測定工程と、
前記第一距離を加算することにより前記区画部材の表面からの前記厚み方向の第二距離を設定し、前記測定工程で測定されたPCB濃度の平均値が基準値以下となる前記削取部位に対応する前記第一距離が最後に加算された前記第二距離を特定する特定工程と、
前記所定エリアにおいて、前記表面から前記第二距離に前記第一距離を減算した第三距離に到達するまで、前記区画部材を削り取って除去する除去工程と、を備えたPCB処理施設の浄化方法。
A feature point where the PCB concentration is assumed to be the highest is set for each predetermined area of the partition member that partitions the inside of the PCB processing facility, and the feature point is scraped off for each first distance set in the thickness direction of the partition member. Shaving process and
A measurement step of measuring the average value of the PCB concentration of the scraped portion for each first distance in the section member, and
By adding the first distance, the second distance in the thickness direction from the surface of the partition member is set, and the average value of the PCB concentration measured in the measurement step is equal to or less than the reference value. A specific step of identifying the second distance to which the corresponding first distance was last added, and
A method for purifying a PCB processing facility, comprising a removal step of scraping and removing the partition member in the predetermined area until a third distance obtained by subtracting the first distance from the surface to the second distance is reached.
前記除去工程の後、前記所定エリアにおける前記特徴地点と異なる地点において、前記第一距離分の前記区画部材を削り取り、前記第一距離分の前記削取部位のPCB濃度の平均値が前記基準値以下か否かを判定する分析工程をさらに備え
前記分析工程でPCB濃度の平均値が前記基準値を超えると判定された場合、前記異なる地点において、前記第二距離から更に第一距離ごとに削り取り、前記第一距離分の前記削取部位のPCB濃度の平均値が前記基準値以下か否かを判定する分析工程をPCB濃度の平均値が前記基準値以下となるまで繰り返す請求項1に記載のPCB処理施設の浄化方法。
After the removal step, the partition member for the first distance is scraped at a point different from the feature point in the predetermined area , and the average value of the PCB concentration of the scraped portion for the first distance is the reference value. Further equipped with an analysis process to determine whether or not the following
When it is determined in the analysis step that the average value of the PCB concentration exceeds the reference value, the PCB concentration is further scraped from the second distance at each first distance at the different points, and the scraped portion of the first distance is scraped. The purification method for a PCB processing facility according to claim 1, wherein the analysis step of determining whether or not the average value of the PCB concentration is equal to or less than the reference value is repeated until the average value of the PCB concentration becomes equal to or less than the reference value.
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