JP2019000784A - Method for purification of pcb treatment facility - Google Patents

Method for purification of pcb treatment facility Download PDF

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JP2019000784A
JP2019000784A JP2017116756A JP2017116756A JP2019000784A JP 2019000784 A JP2019000784 A JP 2019000784A JP 2017116756 A JP2017116756 A JP 2017116756A JP 2017116756 A JP2017116756 A JP 2017116756A JP 2019000784 A JP2019000784 A JP 2019000784A
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pcb
distance
partition member
concentration
scraped
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JP6906376B2 (en
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清水 由章
Yoshiaki Shimizu
由章 清水
松本 忠雄
Tadao Matsumoto
忠雄 松本
友幸 立見
Tomoyuki Tachimi
友幸 立見
加藤 治
Osamu Kato
治 加藤
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Shinko Pantec Co Ltd
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Kobelco Eco Solutions Co Ltd
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Abstract

To provide a method for purification of a PCB treatment facility by which PCB of a partition member can be reliably removed, even though the method is simple.SOLUTION: This method comprises: a scraping process in which a characteristic spot P1 is provided in each prescribed area of a partition member WL which partitions an interior of a PCT treatment facility, and the characteristic spot P1 is scraped at each first distance D1 set in a thickness direction of the partition member WL; a measurement process in which a PCB concentration of a scraping site at each first distance D1 in the partition member WL is measured; a specification process in which a second distance D2 in the thickness direction from a surface of the partition member WL is set by addition of the first distance D1, and a second distance D2, which corresponds to the scraping site at which the PCB concentration measured in the measurement process becomes a reference value or less, is specified; and a removal process in which the partition member WL in a prescribed area is scraped and removed until reaching a third distance D3 in which the first distance D1 is added to the second distance D2 from the surface of the partition member.SELECTED DRAWING: Figure 1

Description

本発明は、PCB処理施設の浄化方法に関し、特にPCB処理施設を区画する区画部材を削り取って除去することにより、該区画部材のPCB濃度を基準値以下に低下させるPCB処理施設の浄化方法に関する。   The present invention relates to a method for purifying a PCB processing facility, and more particularly, to a method for purifying a PCB processing facility that reduces the PCB concentration of the partition member to a reference value or less by scraping and removing the partition member that partitions the PCB processing facility.

不燃性の絶縁体であるPCB(ポリ塩化ビフェニル)は人体に有害であることから、法定期間内に無害化処理することが規定されている。日本に存在するPCB汚染物全ての無害化処理を終えた後はPCB処理施設を解体することとなるが、PCB処理施設にある壁、床、天井等の区画部材は、PCBを含んだ空気に晒されたり、PCB汚染物から漏れ出たPCBが付着したりしているため、PCB処理施設を解体する前に該区画部材を浄化する必要がある。   Since PCB (polychlorinated biphenyl), which is a nonflammable insulator, is harmful to the human body, it is stipulated that it be detoxified within the legal period. After detoxification of all PCB contaminants in Japan, the PCB processing facility will be dismantled. However, the partition members such as walls, floors, and ceilings in the PCB processing facility will be exposed to air containing PCB. Since the PCB that has been exposed or leaked from PCB contaminants is attached, it is necessary to clean the partition member before dismantling the PCB processing facility.

特許文献1のPCB処理施設の浄化方法は、コンクリート製の壁の表面に液体塗料で塗膜を形成し、硬化した塗膜と共に該表面を5〜10mmの深さまで削り取ってPCBを除去するものである。その結果、コンクリート壁の微細な凹部に入り込んだPCBを塗膜に付着させて除去することができると記載されている。   The method for cleaning a PCB processing facility in Patent Document 1 is to form a coating film with a liquid paint on the surface of a concrete wall, and scrape the surface to a depth of 5 to 10 mm together with the cured coating film to remove the PCB. is there. As a result, it is described that the PCB that has entered the fine recesses of the concrete wall can be removed by adhering to the coating film.

特開2012−187456号公報JP 2012-187456 A

例えばコンクリートで構成される区画部材の場合、表面からある程度の深さに達するまでPCBが浸透しているおそれがある。特許文献1に記載のPCB処理施設の浄化方法では、区画部材の表面付近の凹部に存在するPCBを塗膜に付着させて除去することができるものの、区画部材の深くにまで浸透したPCBを確実に除去することが困難であるため、改善の余地がある。しかも、区画部材の表面全域に塗膜を形成するのは煩雑である。   For example, in the case of a partition member made of concrete, there is a possibility that PCB has penetrated until reaching a certain depth from the surface. In the method for cleaning a PCB processing facility described in Patent Document 1, PCB existing in a recess near the surface of the partition member can be removed by adhering to the coating film, but the PCB that has penetrated deep into the partition member can be reliably removed. Since it is difficult to remove, there is room for improvement. Moreover, it is complicated to form a coating film on the entire surface of the partition member.

そこで、簡便な方法でありながら区画部材のPCBを確実に除去できるPCB処理施設の浄化方法が望まれている。   Therefore, there is a demand for a method for purifying a PCB processing facility that can remove PCBs of partition members with certainty while being a simple method.

PCB処理施設の浄化方法は、PCB処理施設の内部を区画する区画部材の所定エリアごとに特徴地点を設け、当該特徴地点を前記区画部材の厚み方向に設定された第一距離ごとに削り取る削取工程と、前記区画部材における前記第一距離ごとの削取部位のPCB濃度を測定する測定工程と、前記第一距離を加算することにより前記区画部材の表面からの前記厚み方向の第二距離を設定し、前記測定工程で測定されたPCB濃度が基準値以下となる前記削取部位に対応した前記第二距離を特定する特定工程と、前記所定エリアにおいて、前記表面から前記第二距離に前記第一距離を減算した第三距離に到達するまで、前記区画部材を削り取って除去する除去工程と、を備えた点にある。   A method for purifying a PCB processing facility is a method in which a feature point is provided for each predetermined area of a partition member that divides the interior of the PCB processing facility, and the feature point is scraped off at each first distance set in the thickness direction of the partition member. A step of measuring the PCB concentration of the scraped site for each first distance in the partition member, and adding the first distance to the second distance in the thickness direction from the surface of the partition member. Setting and specifying the second distance corresponding to the scraped site where the PCB concentration measured in the measuring step is below a reference value; and in the predetermined area, the second distance from the surface to the second distance A removal step of scraping and removing the partition member until a third distance obtained by subtracting the first distance is reached.

本方法では、区画部材の所定エリアに設けた特徴地点において、第一距離(D1)ごとに削り取った削取部位のPCB濃度を測定している。このため、第一距離(D1)の削取部位と、次の第一距離(D1)の削取部位とが混ざり合って、各削取部位ごとのPCB濃度が正確に測定できないといった不都合を解消できる。その結果、第一距離(D1)をN回加算した第二距離(D2=D1×N)における削取部位のPCB濃度を正確に測定することが可能となり、PCBが浸透した深さとしての第三距離(D3=D2−D1)を確実に特定することができる。   In this method, the PCB concentration of the scraped site cut at each first distance (D1) is measured at a characteristic point provided in a predetermined area of the partition member. This eliminates the inconvenience that the cutting site of the first distance (D1) and the cutting site of the next first distance (D1) are mixed and the PCB concentration for each cutting site cannot be measured accurately. it can. As a result, it is possible to accurately measure the PCB concentration of the scraped site at the second distance (D2 = D1 × N) obtained by adding the first distance (D1) N times, and the first depth as the depth of penetration of the PCB. Three distances (D3 = D2-D1) can be specified reliably.

また、除去工程では、所定エリアにおける区画部材の表面から第三距離(D3)に到達するまで削り取るので、複数の地点で都度PCB濃度を測定しながら削り取る手間を省くことができる。さらに、本方法では、PCB濃度が基準値以下となる第二距離(D2)を特定しているので、必要以上に深く削り取ることもなく、効率的である。   Further, in the removing step, since the scraping is performed from the surface of the partition member in the predetermined area until the third distance (D3) is reached, it is possible to save the trouble of scraping while measuring the PCB concentration each time at a plurality of points. Furthermore, in this method, since the second distance (D2) at which the PCB concentration is equal to or lower than the reference value is specified, the method is efficient without being cut deeper than necessary.

このように、簡便な方法でありながら区画部材のPCBを確実に除去できるPCB処理施設の浄化方法を提供できた。   Thus, it was possible to provide a method for purifying a PCB processing facility that can remove the PCB of the partition member reliably while being a simple method.

他の方法は、前記除去工程の後、前記特徴地点と異なる地点において、前記第一距離分の前記区画部材を削り取り、前記第一距離分の前記削取部位のPCB濃度が前記基準値以下か否かを判定する分析工程をさらに備えた点にある。   In another method, after the removing step, the partition member for the first distance is scraped off at a point different from the feature point, and whether the PCB concentration of the scraped part for the first distance is less than the reference value. It is in the point further provided with the analysis process which determines whether or not.

所定エリアにおいて作業履歴等からPCB濃度が高いと想定される特徴地点を選定したとしても、PCB濃度がさらに高い地点が存在する可能性がある。本方法のように、第三距離(D3)まで区画部材を削り取った後に特徴地点とは異なる地点における第一距離(D1)分の削取部位のPCB濃度を判定すれば、区画部材のPCBをより確実に除去することができる。   Even if a feature point that is assumed to have a high PCB concentration is selected from a work history or the like in a predetermined area, a point with a higher PCB concentration may exist. As in this method, after the partition member is scraped to the third distance (D3), if the PCB concentration of the scraped portion for the first distance (D1) at a point different from the feature point is determined, the PCB of the partition member is determined. It can be removed more reliably.

本実施形態に係るPCB処理施設の浄化方法の概念図である。It is a conceptual diagram of the purification method of the PCB processing facility which concerns on this embodiment. 浄化フロー図である。It is a purification | cleaning flowchart.

以下に、本発明に係るPCB処理施設の浄化方法の実施形態について、図面に基づいて説明する。本実施形態では、PCB処理施設の浄化方法の一例として、PCB処理施設の各管理区域を仕切るコンクリート製の壁WL(区画部材の一例)、コンクリート製の床WF(区画部材の一例)又はコンクリート製の天井WT(区画部材の一例)のPCBを除去する場合として説明する。ただし、以下の実施形態に限定されることなく、その要旨を逸脱しない範囲内で種々の変形が可能である。   Hereinafter, an embodiment of a purification method for a PCB processing facility according to the present invention will be described with reference to the drawings. In this embodiment, as an example of the purification method of the PCB processing facility, a concrete wall WL (an example of a partition member), a concrete floor WF (an example of a partition member), or a concrete made partitioning each management area of the PCB processing facility The case where the PCB of the ceiling WT (an example of a partition member) is removed will be described. However, the present invention is not limited to the following embodiments, and various modifications can be made without departing from the scope of the invention.

図1に示すように、PCB処理施設の内部は、PCBの汚染レベルが定められた管理区域AおよびPCBを取り扱わない非管理区域と、を備えている。また、PCB処理施設は、不図示の洗浄設備、プラズマ溶融炉や活性炭槽等を備えている。   As shown in FIG. 1, the inside of the PCB processing facility includes a management area A in which a PCB contamination level is defined and a non-management area in which the PCB is not handled. Further, the PCB processing facility includes a cleaning facility (not shown), a plasma melting furnace, an activated carbon tank, and the like.

管理区域Aは、PCB汚染レベル3である高濃度管理区域と、PCB汚染レベル2の中濃度管理区域A2と、PCB汚染レベル1の低濃度管理区域とで構成されている。PCB汚染レベル3の高濃度管理区域とは、通常操業下でPCBによる作業環境の汚染の可能性があるため、レベルの高い管理が必要な区域である。PCB汚染レベル2の中濃度管理区域A2とは、通常操業下ではPCBによる作業環境の汚染は無いが、工程内の作業で間接的に高濃度のPCBを取扱う(又はPCBがほとんど除去された対象物を作業環境中で取扱う)ため、相応の管理が必要な区域である。PCB汚染レベル1の低濃度管理区域とは、工程内のPCBは設備内に密閉されているため、通常操業下ではPCBによる作業環境の汚染は無く、最小限の管理で対応できる区域である。   The management area A includes a high concentration management area having a PCB contamination level of 3, a medium concentration management area A2 having a PCB contamination level of 2, and a low concentration management area having a PCB contamination level of 1. The high-concentration management area of PCB contamination level 3 is an area that requires high-level management because there is a possibility of contamination of the work environment by PCB under normal operation. The medium concentration control area A2 of PCB contamination level 2 is a target in which the PCB is not contaminated by the work environment under normal operation, but the high concentration PCB is handled indirectly in the process (or the PCB is almost removed). This is an area that requires appropriate management in order to handle items in the work environment. A PCB contamination level 1 low-concentration management area is an area where PCBs in the process are sealed in the equipment, so that there is no contamination of the work environment by the PCB under normal operation, and can be handled with minimal management.

高濃度管理区域では、PCB汚染物を種類ごとに分別した上で、グローブボックス内で電気機器等を解体して、例えば洗浄かご、ドラム缶やぺール缶で構成される容器(不図示)に詰替える。そして、この洗浄かごを溶剤洗浄したり、容器をプラズマ溶融炉に投入したりする等して、PCB汚染物を無害化する。なお、PCB汚染物は、電気機器(安定器、トランス、コンデンサ等)、運転廃棄物(作業服、ゴム手袋、ウエス等)、感圧複写紙、汚泥、絶縁油などで構成されている。   In high-concentration control areas, PCB contaminants are sorted by type, and electrical equipment is disassembled in a glove box and packed in containers (not shown) composed of, for example, washing baskets, drums, and pails. Change. Then, the cleaning basket is solvent-cleaned, the container is put into a plasma melting furnace, etc., and PCB contaminants are made harmless. PCB contaminants are composed of electrical equipment (stabilizers, transformers, capacitors, etc.), operating waste (work clothes, rubber gloves, wastes, etc.), pressure-sensitive copying paper, sludge, insulating oil, and the like.

中濃度管理区域A2では、グローブボックス(内側は高濃度管理区域)の外側や、PCBを含んだ空気や液体が流通する配管やPCB濃度の低い機器等が配置されている。低濃度管理区域では、PCBを含む液体を内封する密閉機器や配管等が配置されている。非管理区域は、屋根裏や管理区域Aと外部に面した壁WLとの間の空間などで構成されている。また、夫々の管理区域Aおよび非管理区域は壁WL、床WF又は天井WTで区画されている。   In the medium concentration management area A2, the outside of the glove box (inside, the high concentration management area), piping through which air and liquid containing PCB circulate, equipment with low PCB concentration, and the like are arranged. In the low-concentration management area, a sealing device, piping, or the like that encloses a liquid containing PCB is disposed. The non-management area is composed of an attic or a space between the management area A and the wall WL facing outside. In addition, each management area A and non-management area are partitioned by a wall WL, a floor WF, or a ceiling WT.

中濃度管理区域A2や低濃度管理区域の壁WL、床WF又は天井WTは、コンクリート製等で構成されている。また、非管理区域の外部に面した壁WLは、鉄筋が埋設された軽量発泡コンクリート(ALC)で構成されている。   The wall WL, floor WF, or ceiling WT of the medium concentration management area A2 or the low concentration management area is made of concrete or the like. The wall WL facing the outside of the unmanaged area is made of lightweight foamed concrete (ALC) in which reinforcing bars are embedded.

以下、中濃度管理区域A2の壁WL、床WF又は天井WTに含まれるPCBを除去する方法を一例として説明する。   Hereinafter, a method for removing PCB contained in the wall WL, the floor WF, or the ceiling WT of the medium concentration management area A2 will be described as an example.

中濃度管理区域A2では、PCB濃度の高いPCB汚染物を積極的に取り扱うことはないが、工程内の作業で間接的に高濃度のPCBを取扱うため、空気中のPCB濃度は比較的高い。そこで、この中濃度管理区域A2では、不図示の排気ファンによってPCBを含む空気が活性炭槽等の排気処理設備に送られて浄化されるように構成されている。中濃度管理区域A2の壁WL、床WF又は天井WTに、PCBを含む空気が接触してPCBが浸透したり、例えば空気を排気する際に設けられるストレーナのように定期点検のために開放する必要がある機器からPCBが漏れ出してPCBが付着したりする。このため、壁WL、床WF又は天井WTのうち、機器の配置場所や使用方法からPCB濃度の高い部位を特定することができる。   In the middle concentration management area A2, PCB contaminants having a high PCB concentration are not actively handled, but the PCB concentration in the air is relatively high because the PCB in the process is indirectly handled by a high concentration PCB. Therefore, the medium concentration management area A2 is configured such that air containing PCB is sent to an exhaust treatment facility such as an activated carbon tank for purification by an exhaust fan (not shown). The wall WL, the floor WF or the ceiling WT of the medium concentration management area A2 is in contact with the air containing the PCB so that the PCB penetrates or is opened for periodic inspection, such as a strainer provided when the air is exhausted. PCB leaks out from necessary equipment, and PCB adheres. For this reason, a site | part with a high PCB density | concentration can be pinpointed from the arrangement | positioning place and usage method of an apparatus among the wall WL, the floor WF, or the ceiling WT.

図1〜図2に示すように、中濃度管理区域A2のうちPCBを除去する所定エリアを設定する。所定エリアの設定は、一日あたりの作業面積で設定しても良いし、予め定めた所定面積で区分しても良い。次いで、所定エリアのうち、PCB濃度が最も高いと想定される特徴地点P1を選定する。この特徴地点P1は、機材の配置場所や使用方法、作業履歴等に基づいて総合的に選定される。   As shown in FIGS. 1 to 2, a predetermined area for removing PCB is set in the medium density management area A2. The predetermined area may be set based on the work area per day or may be classified according to a predetermined area. Next, a feature point P1 that is assumed to have the highest PCB concentration is selected from the predetermined area. This feature point P1 is comprehensively selected based on the arrangement location, usage method, work history, and the like of the equipment.

次いで、特徴地点P1を壁WL、床WF又は天井WTの厚み方向に設定された第一距離D1(例えば、5mm)ごとに削り取る(削取工程)。この削取工程は、砥石、鑢、ワイヤーブラシ等を有する研削機1と、コンクリートを削り取って発生する研削粉(削取部位)を吸引する真空吸引装置Cとを用いて実行される。研削機1で削り取られた研削粉を含む排気が真空吸引装置Cで吸引され、配管3を経由した排気を濾過して回収された研削粉が集塵部2に貯留される。なお、研削粉が分離した排気は、活性炭槽等の排気処理設備で無害化処理される。   Next, the feature point P1 is scraped for each first distance D1 (for example, 5 mm) set in the thickness direction of the wall WL, the floor WF, or the ceiling WT (scraping step). This cutting process is performed by using a grinding machine 1 having a grindstone, a grindstone, a wire brush, and the like, and a vacuum suction device C that sucks grinding powder (cutting site) generated by scraping concrete. Exhaust gas containing the grinding powder scraped off by the grinding machine 1 is sucked by the vacuum suction device C, and the grinding powder recovered by filtering the exhaust gas passing through the pipe 3 is stored in the dust collector 2. The exhaust from which the grinding powder has been separated is detoxified by an exhaust treatment facility such as an activated carbon tank.

次いで、集塵部2に貯留された第一距離D1分の研削粉(削取部位)のPCB濃度を測定する(測定工程)。次いで、研削粉のPCB濃度が基準値(例えば、PCBの卒業基準である0.03mg/L−検液)以下か否かを判定し、PCB濃度が基準値以下となるまで上述した削取工程および測定工程をN回繰り返す。次いで、第一距離D1をN回加算して、PCB濃度が基準値以下となる研削粉(削取部位)に対応した第二距離D2(D1×N)を特定する(特定工程)。なお、本実施形態の集塵部2においては、第一距離D1分の研削粉が貯留された時点で集塵袋を取り外し、次の削取工程の際には新たな集塵袋を設置することとしている。これにより、第一距離D1の研削粉と、次の第一距離D1の研削粉とが混ざり合うことがない。   Next, the PCB concentration of the grinding powder (cutting part) for the first distance D1 stored in the dust collecting unit 2 is measured (measurement step). Next, it is determined whether or not the PCB concentration of the grinding powder is lower than a reference value (for example, 0.03 mg / L-test solution, which is a graduation reference for PCB), and the above-described cutting process until the PCB concentration becomes lower than the reference value. And repeat the measurement process N times. Next, the first distance D1 is added N times, and the second distance D2 (D1 × N) corresponding to the grinding powder (cutting site) having a PCB concentration equal to or lower than the reference value is specified (specifying step). In the dust collection unit 2 of the present embodiment, the dust collection bag is removed when the grinding powder for the first distance D1 is stored, and a new dust collection bag is installed in the next cutting process. I am going to do that. Thereby, the grinding powder of the 1st distance D1 and the grinding powder of the following 1st distance D1 do not mix.

次いで、所定エリアの壁WL、床WF又は天井WT全体を、表面から第三距離D3(D2−D1=D1×(N−1))に到達するまで研削機1を用いて削り取って除去する(除去工程)。この除去された研削粉は、容器に詰替えてプラズマ溶融炉で無害化される。なお、除去された研削粉のPCB濃度を洗浄設備で基準値以下に低下させた後、PCB油を化学処理しても良いし、PCB処理施設から搬出して異なるPCB処理施設で適正処理しても良く、無害化方法は特に限定されない。   Next, the wall WL, the floor WF, or the entire ceiling WT in a predetermined area is scraped and removed using the grinding machine 1 until the third distance D3 (D2-D1 = D1 × (N−1)) is reached from the surface ( Removal step). The removed grinding powder is refilled in a container and rendered harmless in a plasma melting furnace. In addition, after reducing the PCB concentration of the removed grinding powder below the reference value with the cleaning equipment, the PCB oil may be chemically treated, or it may be carried out from the PCB processing facility and properly processed at a different PCB processing facility. The detoxification method is not particularly limited.

次いで、所定エリアの特徴地点P1とは異なる分析地点P2において、第一距離P1分の壁WL、床WF又は天井WTを研削機1で削り取り、研削粉(削取部位)のPCB濃度が基準値以下か否かを判定する(分析工程)。この分析地点P2は、特徴地点P1の次にPCB濃度が高いと想定された地点であることが好ましい。   Next, at the analysis point P2 different from the feature point P1 in the predetermined area, the wall WL, the floor WF or the ceiling WT for the first distance P1 is scraped with the grinder 1, and the PCB concentration of the grinding powder (scraped part) is the reference value. It is determined whether or not (analysis process). The analysis point P2 is preferably a point that is assumed to have the next highest PCB concentration after the feature point P1.

分析工程で研削粉のPCB濃度が基準値以下の場合は、所定エリアのPCB除去を終了する。一方、分析工程で研削粉のPCB濃度が基準値より大きい場合は、分析地点P2において、第三距離D3より下の第一距離D1分の壁WL、床WF又は天井WTを研削機1で削り取り、研削粉(削取部位)のPCB濃度が基準値以下となるまでN回繰り返す。次いで、所定エリアの壁WL、床WF又は天井WT全体を、表面から第三距離D3(D2−D1=D1×(N−1))に到達するまで研削機1を用いて削り取って除去する。この除去された研削粉は、容器に詰替えてプラズマ溶融炉で無害化される。なお、除去された研削粉のPCB濃度を洗浄設備で基準値以下に低下させた後、PCB油を化学処理しても良いし、PCB処理施設から搬出して異なるPCB処理施設で適正処理しても良く、無害化方法は特に限定されない。   If the PCB concentration of the grinding powder is equal to or lower than the reference value in the analysis step, the PCB removal in the predetermined area is terminated. On the other hand, when the PCB concentration of the grinding powder is larger than the reference value in the analysis step, the wall WL, the floor WF or the ceiling WT corresponding to the first distance D1 below the third distance D3 is scraped by the grinding machine 1 at the analysis point P2. Then, the process is repeated N times until the PCB concentration of the grinding powder (cutting part) is below the reference value. Next, the wall WL, the floor WF, or the entire ceiling WT in a predetermined area is removed by grinding using the grinding machine 1 until the third distance D3 (D2−D1 = D1 × (N−1)) is reached from the surface. The removed grinding powder is refilled in a container and rendered harmless in a plasma melting furnace. In addition, after reducing the PCB concentration of the removed grinding powder below the reference value with the cleaning equipment, the PCB oil may be chemically treated, or it may be carried out from the PCB processing facility and properly processed at a different PCB processing facility. The detoxification method is not particularly limited.

次いで、所定エリアの特徴地点P1および分析地点P2とは異なる分析地点P2’(3番目にPCB濃度が高いと想定された地点であることが好ましい。)において、第一距離P1分の壁WL、床WF又は天井WTを研削機1で削り取る。その後、研削粉のPCB濃度が基準値以下上述した分析地点P2と同様の作業を繰り返す。   Next, at the analysis point P2 ′ (preferably the point where the third highest PCB concentration is assumed) different from the feature point P1 and the analysis point P2 in the predetermined area, the wall WL for the first distance P1, The floor WF or the ceiling WT is scraped off by the grinding machine 1. After that, the same operation as that at the analysis point P2 described above where the PCB concentration of the grinding powder is below the reference value is repeated.

このように、壁WL、床WF又は天井WTの所定エリアに設けた特徴地点P1において、第一距離D1ごとに削り取った研削粉のPCB濃度を測定している。このため、第一距離D1の研削粉と、次の第一距離D1の研削粉とが混ざり合って、各研削粉ごとのPCB濃度が正確に測定できないといった不都合を解消できる。その結果、第一距離D1をN回加算した第二距離D2(D1×N)における研削粉のPCB濃度を正確に測定することが可能となり、PCBが浸透した深さとしての第三距離D3(D2−D1)を確実に特定することができる。   In this way, the PCB concentration of the grinding powder scraped for each first distance D1 is measured at the characteristic point P1 provided in the predetermined area of the wall WL, the floor WF, or the ceiling WT. For this reason, the inconvenience that the grinding powder of the first distance D1 and the grinding powder of the next first distance D1 are mixed and the PCB concentration for each grinding powder cannot be measured accurately can be solved. As a result, it is possible to accurately measure the PCB concentration of the grinding powder at the second distance D2 (D1 × N) obtained by adding the first distance D1 N times, and the third distance D3 (depth of penetration of the PCB) D2-D1) can be reliably identified.

また、除去工程では、所定エリアにおける壁WL、床WF又は天井WTの表面から第三距離D3に到達するまで削り取るので、複数の地点で都度PCB濃度を測定しながら削り取る手間を省くことができる。さらに、本実施形態では、PCB濃度が基準値以下となる第二距離D2を特定しているので、必要以上に深く削り取ることもなく、効率的である。   Further, in the removing step, the scraping is performed until the third distance D3 is reached from the surface of the wall WL, the floor WF, or the ceiling WT in the predetermined area, so that the trouble of scraping while measuring the PCB concentration at each of a plurality of points can be saved. Furthermore, in the present embodiment, the second distance D2 at which the PCB concentration is equal to or less than the reference value is specified, so that it is efficient without being cut deeper than necessary.

一方、所定エリアにおいて作業履歴等からPCB濃度が高いと想定される特徴地点P1を選定したとしても、PCB濃度がさらに高い地点が存在する可能性がある。本実施形態のように、第三距離D3まで壁WL、床WF又は天井WTを削り取った後に特徴地点P1とは異なる分析地点P2における第一距離D1分の研削粉のPCB濃度を判定すれば、壁WL、床WF又は天井WTのPCBをより確実に除去することができる。   On the other hand, even if a feature point P1 that is assumed to have a high PCB concentration is selected from a work history or the like in a predetermined area, there is a possibility that a point with a higher PCB concentration exists. If the PCB concentration of the grinding powder for the first distance D1 at the analysis point P2 different from the characteristic point P1 is determined after scraping the wall WL, floor WF or ceiling WT to the third distance D3 as in the present embodiment, The PCB of the wall WL, floor WF or ceiling WT can be removed more reliably.

[その他の実施形態]
(1)所定エリアで最もPCB濃度が高い特徴地点P1を確実に選定できる場合は、上述した実施形態における分析工程を省略しても良い。また、分析工程を複数の分析地点P2,P2’,・・・で実行せずに、1箇所の分析地点P2のみで実行しても良い。
(2)上述した実施形態では、削取工程と除去工程とにおいて、壁WL、床WF又は天井WTを削り取る装置として同一の研削機1を用いる例を示したが、削取工程で小型の研削機1を用い、除去工程で大型の研削機又は掘削機を用いても良く、特に限定されない。また、研削機1も、削取部位を回収できる装置であれば、どのような装置でも良い。
(3)上述した実施形態の区画部材は壁WL、床WF又は天井WTに限定されず、PCBが浸透した部材であれば、どのような区画部材であっても良い。
[Other Embodiments]
(1) When the feature point P1 having the highest PCB concentration in the predetermined area can be reliably selected, the analysis step in the above-described embodiment may be omitted. Further, the analysis process may be executed only at one analysis point P2 without being executed at the plurality of analysis points P2, P2 ′,.
(2) In the above-described embodiment, an example in which the same grinding machine 1 is used as a device for scraping the wall WL, the floor WF, or the ceiling WT in the cutting process and the removing process has been described. The machine 1 may be used and a large grinding machine or excavator may be used in the removal step, and is not particularly limited. Also, the grinding machine 1 may be any device as long as it can collect the scraped part.
(3) The partition member of the above-described embodiment is not limited to the wall WL, the floor WF, or the ceiling WT, and may be any partition member as long as it is a member into which PCB has penetrated.

本発明は、PCB処理施設の内部を区画する区画部材を削り取って除去するPCB処理施設の浄化方法に利用可能である。   INDUSTRIAL APPLICABILITY The present invention is applicable to a method for purifying a PCB processing facility that scrapes and removes a partition member that partitions the inside of the PCB processing facility.

D1 第一距離
D2 第二距離
D3 第三距離
P1 特徴地点
P2 分析地点(特徴地点と異なる地点)
WF 床(区画部材)
WL 壁(区画部材)
WT 天井(区画部材)
D1 1st distance D2 2nd distance D3 3rd distance P1 Feature point P2 Analysis point (point different from feature point)
WF Floor (partition member)
WL wall (partition member)
WT Ceiling (partition member)

Claims (2)

PCB処理施設の内部を区画する区画部材の所定エリアごとに特徴地点を設け、当該特徴地点を前記区画部材の厚み方向に設定された第一距離ごとに削り取る削取工程と、
前記区画部材における前記第一距離ごとの削取部位のPCB濃度を測定する測定工程と、
前記第一距離を加算することにより前記区画部材の表面からの前記厚み方向の第二距離を設定し、前記測定工程で測定されたPCB濃度が基準値以下となる前記削取部位に対応した前記第二距離を特定する特定工程と、
前記所定エリアにおいて、前記表面から前記第二距離に前記第一距離を減算した第三距離に到達するまで、前記区画部材を削り取って除去する除去工程と、を備えたPCB処理施設の浄化方法。
A feature step is provided for each predetermined area of the partition member that partitions the inside of the PCB processing facility, and the scraping step of scraping the feature point for each first distance set in the thickness direction of the partition member;
A measurement step of measuring the PCB concentration of the scraped part for each of the first distances in the partition member;
By setting the second distance in the thickness direction from the surface of the partition member by adding the first distance, the PCB concentration measured in the measurement step corresponds to the scraped site that is below a reference value A specific step of identifying the second distance;
A removal process of scraping and removing the partition member until reaching a third distance obtained by subtracting the first distance from the surface to the second distance in the predetermined area.
前記除去工程の後、前記特徴地点と異なる地点において、前記第一距離分の前記区画部材を削り取り、前記第一距離分の前記削取部位のPCB濃度が前記基準値以下か否かを判定する分析工程をさらに備えた請求項1に記載のPCB処理施設の浄化方法。   After the removing step, the partition member for the first distance is scraped at a point different from the feature point, and it is determined whether the PCB concentration of the scraped part for the first distance is equal to or less than the reference value. The method for purifying a PCB processing facility according to claim 1, further comprising an analysis step.
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