JP6895793B2 - 複数の信号経路を用いたセンサ自己診断 - Google Patents

複数の信号経路を用いたセンサ自己診断 Download PDF

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JP6895793B2
JP6895793B2 JP2017081918A JP2017081918A JP6895793B2 JP 6895793 B2 JP6895793 B2 JP 6895793B2 JP 2017081918 A JP2017081918 A JP 2017081918A JP 2017081918 A JP2017081918 A JP 2017081918A JP 6895793 B2 JP6895793 B2 JP 6895793B2
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signal path
sensor
signal
digital
main
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JP2017194466A (ja
Inventor
ガスティンガー フェアディナント
ガスティンガー フェアディナント
グラーニヒ ヴォルフガング
グラーニヒ ヴォルフガング
ハマーシュミット ディアク
ハマーシュミット ディアク
モッツ マリオ
モッツ マリオ
ラースボアニヒ フリードリヒ
ラースボアニヒ フリードリヒ
シャファー ベアンハート
シャファー ベアンハート
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Infineon Technologies AG
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Infineon Technologies AG
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Priority claimed from US15/132,783 external-priority patent/US10145882B2/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/3187Built-in tests
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/005Testing of electric installations on transport means
    • G01R31/006Testing of electric installations on transport means on road vehicles, e.g. automobiles or trucks
    • G01R31/007Testing of electric installations on transport means on road vehicles, e.g. automobiles or trucks using microprocessors or computers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2829Testing of circuits in sensor or actuator systems

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Combustion & Propulsion (AREA)
  • Electromagnetism (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Automation & Control Theory (AREA)
  • Transportation (AREA)
  • Mechanical Engineering (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Human Computer Interaction (AREA)
JP2017081918A 2016-04-19 2017-04-18 複数の信号経路を用いたセンサ自己診断 Active JP6895793B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US15/132,783 2016-04-19
US15/132,783 US10145882B2 (en) 2010-09-24 2016-04-19 Sensor self-diagnostics using multiple signal paths

Publications (2)

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JP2017194466A JP2017194466A (ja) 2017-10-26
JP6895793B2 true JP6895793B2 (ja) 2021-06-30

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JP2017081918A Active JP6895793B2 (ja) 2016-04-19 2017-04-18 複数の信号経路を用いたセンサ自己診断

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JP (1) JP6895793B2 (ko)
KR (1) KR102043210B1 (ko)
CN (1) CN107305235A (ko)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6962795B2 (ja) * 2017-11-22 2021-11-05 ルネサスエレクトロニクス株式会社 半導体装置および半導体システム
EP3514499B1 (en) * 2018-01-23 2020-08-26 Siemens Aktiengesellschaft Verification of sensor data
CN110398617B (zh) * 2018-04-25 2022-03-25 晶豪科技股份有限公司 测试装置及折叠探针卡测试系统
EP3647737B1 (en) * 2018-11-05 2022-08-03 Melexis Technologies NV Sensor interface circuit
JP7443518B2 (ja) 2019-11-26 2024-03-05 アレグロ・マイクロシステムズ・エルエルシー センサ集積回路
DE102019134077B4 (de) * 2019-12-12 2021-07-22 Infineon Technologies Ag Signalverarbeitungsschaltung für einen Hall-Sensor und Signalverarbeitungsverfahren
CN114325348A (zh) * 2022-01-13 2022-04-12 苏州博创集成电路设计有限公司 通道间匹配性测试电路

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0875574A (ja) * 1994-09-07 1996-03-22 Toyota Motor Corp Pztアクチュエータの変位測定装置
DE59609727D1 (de) * 1996-03-02 2002-10-31 Micronas Gmbh Monolithisch integrierte Sensorschaltung
JP4379993B2 (ja) * 1999-12-24 2009-12-09 株式会社デンソー 圧力センサ
JP3630112B2 (ja) * 2001-05-18 2005-03-16 シャープ株式会社 高周波回路及びそれを用いた高周波通信装置
EP1637898A1 (en) * 2004-09-16 2006-03-22 Liaisons Electroniques-Mecaniques Lem S.A. Continuously calibrated magnetic field sensor
US20060222370A1 (en) * 2005-02-28 2006-10-05 International Business Machines Corporation Methods and apparatus for optical modulation amplitude measurement
JP2008107232A (ja) * 2006-10-26 2008-05-08 Denso Corp 衝突検知手段
JP2008116339A (ja) * 2006-11-06 2008-05-22 Denso Corp センサ装置およびセンサ装置を備えた車両制御システム
US7855562B2 (en) * 2007-11-19 2010-12-21 Freescale Semiconductor, Inc. Dual sensor system having fault detection capability
US9346441B2 (en) * 2010-09-24 2016-05-24 Infineon Technologies Ag Sensor self-diagnostics using multiple signal paths
US9863786B2 (en) * 2013-07-17 2018-01-09 Infineon Technologies Ag Sensor with interface for functional safety

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Publication number Publication date
KR102043210B1 (ko) 2019-11-12
CN107305235A (zh) 2017-10-31
KR20170119636A (ko) 2017-10-27
JP2017194466A (ja) 2017-10-26

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