JP6889772B2 - 噴霧チャンバ及びそれらを利用する方法 - Google Patents

噴霧チャンバ及びそれらを利用する方法 Download PDF

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Publication number
JP6889772B2
JP6889772B2 JP2019512942A JP2019512942A JP6889772B2 JP 6889772 B2 JP6889772 B2 JP 6889772B2 JP 2019512942 A JP2019512942 A JP 2019512942A JP 2019512942 A JP2019512942 A JP 2019512942A JP 6889772 B2 JP6889772 B2 JP 6889772B2
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Prior art keywords
cells
outer chamber
chamber
spray chamber
spray
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Expired - Fee Related
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JP2019512942A
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English (en)
Japanese (ja)
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JP2019521366A5 (https=
JP2019521366A (ja
Inventor
スティーブン,チャディー
バディエイ,ハミド
サウチェンコ,セルゲイ
バザルガン,サマド
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PerkinElmer Health Sciences Canada Inc
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PerkinElmer Health Sciences Canada Inc
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/107Arrangements for using several ion sources
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H01J49/0445Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for introducing as a spray, a jet or an aerosol
    • H01J49/045Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for introducing as a spray, a jet or an aerosol with means for using a nebulising gas, i.e. pneumatically assisted
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02Column chromatography
    • G01N30/62Detectors specially adapted therefor
    • G01N30/72Mass spectrometers
    • G01N30/7233Mass spectrometers interfaced to liquid or supercritical fluid chromatograph
    • G01N30/7273Desolvation chambers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
    • H01J49/049Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample with means for applying heat to desorb the sample; Evaporation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/16Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/165Electrospray ionisation
    • H01J49/167Capillaries and nozzles specially adapted therefor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/105Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Dispersion Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Electron Tubes For Measurement (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Plasma Technology (AREA)
JP2019512942A 2016-05-18 2017-05-17 噴霧チャンバ及びそれらを利用する方法 Expired - Fee Related JP6889772B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201662337997P 2016-05-18 2016-05-18
US62/337,997 2016-05-18
PCT/US2017/033063 WO2017201143A1 (en) 2016-05-18 2017-05-17 Spray chambers and methods of using them

Publications (3)

Publication Number Publication Date
JP2019521366A JP2019521366A (ja) 2019-07-25
JP2019521366A5 JP2019521366A5 (https=) 2020-06-25
JP6889772B2 true JP6889772B2 (ja) 2021-06-18

Family

ID=60326194

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2019512942A Expired - Fee Related JP6889772B2 (ja) 2016-05-18 2017-05-17 噴霧チャンバ及びそれらを利用する方法

Country Status (8)

Country Link
US (4) US10147592B2 (https=)
EP (1) EP3459323A4 (https=)
JP (1) JP6889772B2 (https=)
KR (1) KR102042436B1 (https=)
CN (1) CN109964541B (https=)
AU (1) AU2017268310B8 (https=)
CA (1) CA3024740A1 (https=)
WO (1) WO2017201143A1 (https=)

Families Citing this family (13)

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US10804091B2 (en) * 2016-05-18 2020-10-13 Perkinelmer Health Sciences Canada, Inc. Single particle analysis using optical detection
KR102288662B1 (ko) * 2017-05-12 2021-08-10 가부시키가이샤 사무코 스프레이 챔버, 시료 안개화 도입 장치, 분석 장치 및 시료 중의 성분 분석 방법
US11630039B1 (en) * 2018-08-07 2023-04-18 Elemental Scientific, Inc. Spray chamber having dual input ports for impingement gas and sensitivity enhancement gas addition
US11075066B2 (en) * 2018-10-26 2021-07-27 Agilent Technologies, Inc. Automated detection of nanoparticles using single-particle inductively coupled plasma mass spectrometry (SP-ICP-MS)
WO2020150126A1 (en) * 2019-01-14 2020-07-23 Agilent Technologies, Inc. Versatile tube-free jet for gc detector
AU2020218788B2 (en) * 2019-02-04 2025-06-26 Glass Expansion Pty. Limited Analytic nebuliser
EP3949694B1 (en) * 2019-04-01 2025-04-30 Perkinelmer Health Sciences Canada, Inc. Devices and methods to improve background equivalent concentrations of elemental species
KR102137911B1 (ko) * 2019-09-16 2020-07-27 강원대학교산학협력단 형질전환 정원줄기세포의 생산방법
CN113237942B (zh) * 2021-05-07 2023-09-26 上海科技大学 在微量细胞中检测多种微量元素的方法及应用
KR102571890B1 (ko) * 2021-11-29 2023-08-30 한국생산기술연구원 표면증폭 라만산란을 위한 금속나노입자 수집장치
EP4258323A1 (en) * 2022-04-08 2023-10-11 Glass Expansion Pty. Limited A flow control device
WO2025133161A1 (en) * 2023-12-20 2025-06-26 Thermo Fisher Scientific (Bremen) Gmbh Connecting element for spectrometry
CN121612864B (zh) * 2026-02-02 2026-04-24 上海车仪田科技有限公司 光学传感器、光谱检测系统及半导体工艺设备

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US4990740A (en) * 1989-03-06 1991-02-05 The Dow Chemical Company Intra-microspray ICP torch
US5012065A (en) 1989-11-20 1991-04-30 New Mexico State University Technology Transfer Corporation Inductively coupled plasma torch with laminar flow cooling
US4958529A (en) * 1989-11-22 1990-09-25 Vestec Corporation Interface for coupling liquid chromatography to solid or gas phase detectors
JP2633974B2 (ja) * 1990-04-18 1997-07-23 株式会社日立製作所 試料のイオン化および質量分析のための装置
EP0560537A1 (en) * 1992-03-10 1993-09-15 Mds Health Group Limited Apparatus and method for liquid sample introduction
JP2852838B2 (ja) * 1992-09-10 1999-02-03 セイコーインスツルメンツ株式会社 誘導結合プラズマ質量分析装置
US5868322A (en) * 1996-01-31 1999-02-09 Hewlett-Packard Company Apparatus for forming liquid droplets having a mechanically fixed inner microtube
EP1012871A1 (en) 1997-01-03 2000-06-28 MDS Inc. Spray chamber with dryer
US5969352A (en) * 1997-01-03 1999-10-19 Mds Inc. Spray chamber with dryer
JPH11326165A (ja) * 1998-05-18 1999-11-26 Yokogawa Analytical Systems Inc 試料液の霧化導入装置
JP3836693B2 (ja) * 2001-07-30 2006-10-25 独立行政法人科学技術振興機構 Icp質量分析用クロスフロー型マイクロネブライザー
JP3809099B2 (ja) * 2001-12-12 2006-08-16 株式会社堀場製作所 乾式粒径分布測定装置
JP2006038729A (ja) 2004-07-29 2006-02-09 National Institute Of Advanced Industrial & Technology 誘導結合プラズマトーチ
US20070023677A1 (en) 2005-06-29 2007-02-01 Perkins Patrick D Multimode ionization source and method for screening molecules
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Also Published As

Publication number Publication date
CN109964541A (zh) 2019-07-02
WO2017201143A1 (en) 2017-11-23
US20200161117A1 (en) 2020-05-21
AU2017268310A8 (en) 2022-12-08
KR20190040135A (ko) 2019-04-17
US20210090872A1 (en) 2021-03-25
US10147592B2 (en) 2018-12-04
CN109964541B (zh) 2021-01-01
KR102042436B1 (ko) 2019-11-08
US11315778B2 (en) 2022-04-26
JP2019521366A (ja) 2019-07-25
AU2017268310B8 (en) 2022-12-08
US10395912B2 (en) 2019-08-27
US20170338092A1 (en) 2017-11-23
EP3459323A1 (en) 2019-03-27
US20190189416A1 (en) 2019-06-20
US10796895B2 (en) 2020-10-06
CA3024740A1 (en) 2017-11-23
AU2017268310A1 (en) 2019-01-03
EP3459323A4 (en) 2020-01-01
AU2017268310B2 (en) 2022-12-01

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