CN109964541B - 喷雾室 - Google Patents

喷雾室 Download PDF

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Publication number
CN109964541B
CN109964541B CN201780044419.9A CN201780044419A CN109964541B CN 109964541 B CN109964541 B CN 109964541B CN 201780044419 A CN201780044419 A CN 201780044419A CN 109964541 B CN109964541 B CN 109964541B
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CN
China
Prior art keywords
cells
chamber
spray chamber
outer chamber
spray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201780044419.9A
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English (en)
Chinese (zh)
Other versions
CN109964541A (zh
Inventor
C.斯蒂芬
H.巴迪埃
S.萨维谢科
S.巴扎甘
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
PerkinElmer Health Sciences Canada Inc
Original Assignee
PerkinElmer Health Sciences Canada Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by PerkinElmer Health Sciences Canada Inc filed Critical PerkinElmer Health Sciences Canada Inc
Publication of CN109964541A publication Critical patent/CN109964541A/zh
Application granted granted Critical
Publication of CN109964541B publication Critical patent/CN109964541B/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/107Arrangements for using several ion sources
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H01J49/0445Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for introducing as a spray, a jet or an aerosol
    • H01J49/045Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for introducing as a spray, a jet or an aerosol with means for using a nebulising gas, i.e. pneumatically assisted
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02Column chromatography
    • G01N30/62Detectors specially adapted therefor
    • G01N30/72Mass spectrometers
    • G01N30/7233Mass spectrometers interfaced to liquid or supercritical fluid chromatograph
    • G01N30/7273Desolvation chambers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
    • H01J49/049Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample with means for applying heat to desorb the sample; Evaporation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/16Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/165Electrospray ionisation
    • H01J49/167Capillaries and nozzles specially adapted therefor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/105Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Dispersion Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Electron Tubes For Measurement (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Plasma Technology (AREA)
CN201780044419.9A 2016-05-18 2017-05-17 喷雾室 Expired - Fee Related CN109964541B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201662337997P 2016-05-18 2016-05-18
US62/337,997 2016-05-18
PCT/US2017/033063 WO2017201143A1 (en) 2016-05-18 2017-05-17 Spray chambers and methods of using them

Publications (2)

Publication Number Publication Date
CN109964541A CN109964541A (zh) 2019-07-02
CN109964541B true CN109964541B (zh) 2021-01-01

Family

ID=60326194

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201780044419.9A Expired - Fee Related CN109964541B (zh) 2016-05-18 2017-05-17 喷雾室

Country Status (8)

Country Link
US (4) US10147592B2 (https=)
EP (1) EP3459323A4 (https=)
JP (1) JP6889772B2 (https=)
KR (1) KR102042436B1 (https=)
CN (1) CN109964541B (https=)
AU (1) AU2017268310B8 (https=)
CA (1) CA3024740A1 (https=)
WO (1) WO2017201143A1 (https=)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10804091B2 (en) * 2016-05-18 2020-10-13 Perkinelmer Health Sciences Canada, Inc. Single particle analysis using optical detection
KR102288662B1 (ko) * 2017-05-12 2021-08-10 가부시키가이샤 사무코 스프레이 챔버, 시료 안개화 도입 장치, 분석 장치 및 시료 중의 성분 분석 방법
US11630039B1 (en) * 2018-08-07 2023-04-18 Elemental Scientific, Inc. Spray chamber having dual input ports for impingement gas and sensitivity enhancement gas addition
US11075066B2 (en) * 2018-10-26 2021-07-27 Agilent Technologies, Inc. Automated detection of nanoparticles using single-particle inductively coupled plasma mass spectrometry (SP-ICP-MS)
WO2020150126A1 (en) * 2019-01-14 2020-07-23 Agilent Technologies, Inc. Versatile tube-free jet for gc detector
AU2020218788B2 (en) * 2019-02-04 2025-06-26 Glass Expansion Pty. Limited Analytic nebuliser
EP3949694B1 (en) * 2019-04-01 2025-04-30 Perkinelmer Health Sciences Canada, Inc. Devices and methods to improve background equivalent concentrations of elemental species
KR102137911B1 (ko) * 2019-09-16 2020-07-27 강원대학교산학협력단 형질전환 정원줄기세포의 생산방법
CN113237942B (zh) * 2021-05-07 2023-09-26 上海科技大学 在微量细胞中检测多种微量元素的方法及应用
KR102571890B1 (ko) * 2021-11-29 2023-08-30 한국생산기술연구원 표면증폭 라만산란을 위한 금속나노입자 수집장치
EP4258323A1 (en) * 2022-04-08 2023-10-11 Glass Expansion Pty. Limited A flow control device
WO2025133161A1 (en) * 2023-12-20 2025-06-26 Thermo Fisher Scientific (Bremen) Gmbh Connecting element for spectrometry
CN121612864B (zh) * 2026-02-02 2026-04-24 上海车仪田科技有限公司 光学传感器、光谱检测系统及半导体工艺设备

Family Cites Families (23)

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US4990740A (en) * 1989-03-06 1991-02-05 The Dow Chemical Company Intra-microspray ICP torch
US5012065A (en) 1989-11-20 1991-04-30 New Mexico State University Technology Transfer Corporation Inductively coupled plasma torch with laminar flow cooling
US4958529A (en) * 1989-11-22 1990-09-25 Vestec Corporation Interface for coupling liquid chromatography to solid or gas phase detectors
JP2633974B2 (ja) * 1990-04-18 1997-07-23 株式会社日立製作所 試料のイオン化および質量分析のための装置
EP0560537A1 (en) * 1992-03-10 1993-09-15 Mds Health Group Limited Apparatus and method for liquid sample introduction
JP2852838B2 (ja) * 1992-09-10 1999-02-03 セイコーインスツルメンツ株式会社 誘導結合プラズマ質量分析装置
US5868322A (en) * 1996-01-31 1999-02-09 Hewlett-Packard Company Apparatus for forming liquid droplets having a mechanically fixed inner microtube
EP1012871A1 (en) 1997-01-03 2000-06-28 MDS Inc. Spray chamber with dryer
US5969352A (en) * 1997-01-03 1999-10-19 Mds Inc. Spray chamber with dryer
JPH11326165A (ja) * 1998-05-18 1999-11-26 Yokogawa Analytical Systems Inc 試料液の霧化導入装置
JP3836693B2 (ja) * 2001-07-30 2006-10-25 独立行政法人科学技術振興機構 Icp質量分析用クロスフロー型マイクロネブライザー
JP3809099B2 (ja) * 2001-12-12 2006-08-16 株式会社堀場製作所 乾式粒径分布測定装置
JP2006038729A (ja) 2004-07-29 2006-02-09 National Institute Of Advanced Industrial & Technology 誘導結合プラズマトーチ
US20070023677A1 (en) 2005-06-29 2007-02-01 Perkins Patrick D Multimode ionization source and method for screening molecules
JP2008157895A (ja) * 2006-12-26 2008-07-10 Horiba Ltd 試料導入装置
US7595487B2 (en) * 2007-08-24 2009-09-29 Georgia Tech Research Corporation Confining/focusing vortex flow transmission structure, mass spectrometry systems, and methods of transmitting particles, droplets, and ions
US8440063B2 (en) 2008-03-26 2013-05-14 Massachusetts Institute Of Technology Electrokinetic concentration devices
KR101089328B1 (ko) 2009-12-29 2011-12-02 한국기초과학지원연구원 전기분무 이온화 장치 및 이를 이용한 전기분무 이온화 방법
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JP6698026B2 (ja) 2014-01-28 2020-05-27 パーキンエルマー・ヘルス・サイエンシーズ・インコーポレイテッドPerkinelmer Health Sciences, Inc. 誘導装置及びその使用方法
DE102014113482B4 (de) * 2014-09-18 2019-01-03 Bruker Daltonik Gmbh Ionisierungskammer mit temperierter Gaszufuhr

Also Published As

Publication number Publication date
CN109964541A (zh) 2019-07-02
WO2017201143A1 (en) 2017-11-23
US20200161117A1 (en) 2020-05-21
AU2017268310A8 (en) 2022-12-08
KR20190040135A (ko) 2019-04-17
US20210090872A1 (en) 2021-03-25
US10147592B2 (en) 2018-12-04
KR102042436B1 (ko) 2019-11-08
US11315778B2 (en) 2022-04-26
JP2019521366A (ja) 2019-07-25
AU2017268310B8 (en) 2022-12-08
US10395912B2 (en) 2019-08-27
JP6889772B2 (ja) 2021-06-18
US20170338092A1 (en) 2017-11-23
EP3459323A1 (en) 2019-03-27
US20190189416A1 (en) 2019-06-20
US10796895B2 (en) 2020-10-06
CA3024740A1 (en) 2017-11-23
AU2017268310A1 (en) 2019-01-03
EP3459323A4 (en) 2020-01-01
AU2017268310B2 (en) 2022-12-01

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Granted publication date: 20210101