JP6852485B2 - Calibration slide glass - Google Patents

Description

The present invention relates to a calibration slide glass capable of suppressing the appearance of Newton rings.

In recent years, as an apparatus used for observing a sample, for example, an observation apparatus equipped with an imaging apparatus such as a TV camera or a digital camera is known. Examples of the observation device with an image pickup device include a microscope with an image pickup device in which the image pickup device is attached to the microscope. When an observation device equipped with such an imaging device is used, the effect of being able to record the observation results and the information input from the microscope can be immediately output to a display or a printer, so that the sample can be obtained. It has the effect of being able to evaluate quickly. Therefore, an observation device with an imaging device is suitably used in a wide range of fields such as medical practice.

A slide glass for calibration is usually used for an observation device with an image pickup device. The calibration slide glass has a function of providing color information as a comparison reference when performing color evaluation and color correction of a sample image captured by using an observation device, for example. For example, Patent Document 1 comprises two or more color reference micro color filters for collecting a color as a comparison reference used for color evaluation and color correction of an image on one surface of a protective base material. One or more micro color filter groups are arranged, and two or more color reference micro color filters belonging to the same group among one or more micro color filter groups do not overlap each other on the surface of the protective base material. Slide glasses are disclosed which are arranged in such a manner and have different reference colors.

International Publication No. 2004/044639

By the way, the slide glass disclosed in Patent Document 1 has a structure in which a micro color filter is arranged on a protective base material and the surface of the micro color filter is exposed. Therefore, when an observation device with an image pickup device using such a slide glass is used, for example, physical adhesion of a solvent or the like to the surface of the micro color filter or physical dirt adhering to the surface of the micro color filter is wiped off. The contact causes problems such as a decrease in the color density of the micro color filter and a change in dye.

In order to solve such a problem, the inventors of the present invention have manufactured a calibration slide glass having a structure in which a calibration pattern chip (microcolor filter) is sandwiched between a pair of protective substrates. Specifically, as shown in FIG. 10, the calibration pattern chips 1a and 1b are arranged so as to face each other via the calibration pattern chips 1a and 1b, and overlap the calibration pattern chips 1a and 1b in a plan view. A first that is sandwiched between a pair of protective base materials 2a and 2b having at least a transmission portion 20 in a region and a pair of protective base materials 2a and 2b and arranged so as to fill a region having no calibration pattern chips 1a and 1b. A slide glass 100'with the spacer 3 of the above was manufactured. As a result, the inventors of the present invention obtained the following findings. That is, as shown in FIG. 10, since the calibration pattern chip is sandwiched between the pair of protective substrates, adhesion of a solvent or the like to the surface of the calibration pattern chip and physical contact with the calibration pattern chip are prevented. It has been found that it is possible to suppress the occurrence of problems such as a decrease in the color density of the calibration pattern chip and a change in dye.

However, in the above-mentioned calibration slide glass, there is a problem that a Newton ring appears on the protective base material on which the calibration pattern chip is observed. Therefore, as a result of various studies by the inventors of the present invention, it has been found that the appearance of the Newton ring is one of the causes of contact between the calibration pattern chip and the protective base material.

The present invention has been made in view of the above circumstances, and an object of the present invention is to provide a calibration slide glass capable of suppressing the appearance of a Newton ring.

As a result of diligent research to solve the above problems, the inventors of the present invention suppress the appearance of Newton rings by providing a predetermined gap between the calibration pattern chip and the protective base material. I found that I could do it. The present invention has been completed based on such findings.

That is, the present invention faces a calibration pattern having a plurality of calibration pattern chips, a first spacer arranged around the calibration pattern, and the calibration pattern and the first spacer. A pair of protective substrates having at least a transmissive portion in a region that overlaps the calibration pattern in a plan view, the first spacer, and at least one of the protective substrates. The material and the first spacer have a second spacer arranged so as to overlap a part of the calibration pattern chip in a plan view, and the second spacer is the calibration pattern. Provided is a calibration slide glass characterized by having at least an opening in a region that overlaps in plan view.

According to the present invention, the calibration pattern and at least one protective substrate on which the second spacer is arranged are provided by having at least an opening in a region where the second spacer overlaps the calibration pattern in a plan view. Since a gap corresponding to the thickness of the second spacer can be provided between the transmission portions, a calibration slide glass capable of suppressing the appearance of the Newton ring can be obtained.

In the present invention, it is preferable to have a sealing portion arranged along the outer circumference of the protective base material between the pair of protective base materials. This is because it is possible to prevent the side surfaces of the first spacer and the second spacer from being exposed, so that the mechanical strength can be improved.

In the present invention, it is preferable to have a groove on the surface of the second spacer. This is because it is possible to suppress an increase in thickness due to the arrangement of the adhesive on the surface of the second spacer, and when a liquid adhesive is used, it can be used as a relief groove.

In the present invention, it is preferable to have an origin mark on the surface of one of the pair of protective base materials. This is because it is possible to recognize the position information of the calibration pattern based on the origin mark, so that the calibration slide glass corresponding to the autochanger function can be obtained.

In the present invention, it is preferable that the transmissive portion of one of the protective base materials of the pair of protective base materials is arranged in the region of the transmissive portion of the other protective base material in a plan view. .. This is because the outline of the calibration pattern chip when the calibration slide glass is observed from a predetermined surface can be clarified, and a high-quality calibration slide glass can be obtained.

In the present invention, among the plurality of calibration pattern chips, it is preferable that at least all the calibration pattern chips to be measured have the same optical path length in the thickness direction of the calibration pattern chips. Since the optical path lengths in the thickness direction of all the calibration pattern chips to be measured in the same measurement are uniform, the observation device equipped with the image pickup device using the calibration slide glass provided with the calibration pattern chips is more accurate. It is possible to perform high measurement.

The present invention has the effect that it can be a calibration slide glass capable of suppressing the appearance of Newton rings.

It is a schematic plan view which shows an example of the slide glass for calibration of this invention. It is explanatory drawing for demonstrating the slide glass for calibration of this invention. It is the schematic sectional drawing which shows the other example of the slide glass for calibration of this invention. It is the schematic sectional drawing which shows the other example of the slide glass for calibration of this invention. It is explanatory drawing for demonstrating the groove in this invention. It is the schematic sectional drawing which shows the other example of the slide glass for calibration of this invention. It is explanatory drawing for demonstrating the sealing part in this invention. It is explanatory drawing for demonstrating the origin mark in this invention. It is explanatory drawing for demonstrating the alignment mark in this invention. It is schematic cross-sectional view which shows an example of the conventional slide glass for calibration. It is explanatory drawing for demonstrating the slide glass for calibration of this invention. It is explanatory drawing for demonstrating the slide glass for calibration of this invention. It is explanatory drawing for demonstrating the slide glass for calibration of this invention. It is explanatory drawing for demonstrating the slide glass for calibration of this invention. It is explanatory drawing for demonstrating the slide glass for calibration of this invention. It is a graph which shows the measurement result using the slide glass for calibration of FIG.

Hereinafter, the calibration slide glass of the present invention will be described.

The calibration slide glass of the present invention is via a calibration pattern having a plurality of calibration pattern chips, a first spacer arranged around the calibration pattern, the calibration pattern, and the first spacer. At least one of a pair of protective base materials having at least a transmissive portion in a region that is arranged so as to face each other and overlaps the calibration pattern in a plan view, the first spacer, and the pair of protective base materials. Between the protective base material and the first spacer, there is a second spacer arranged so as to overlap a part of the calibration pattern chip in a plan view, and the second spacer is the above. It is characterized by having at least an opening in a region that overlaps the calibration pattern in a plan view.

The calibration slide glass of the present invention will be described with reference to the drawings.
FIG. 1 is a schematic plan view showing an example of a slide glass for calibration of the present invention. As shown in FIG. 1, the calibration slide glass 100 of the present invention has a calibration pattern having a plurality of calibration pattern chips.
FIG. 2A is an enlarged view of a region R1 surrounded by a white broken line of the calibration slide glass 100 of the present invention shown in FIG. 1, and FIG. 2B is an enlarged view of A-A of FIG. 2A. It is a cross-sectional view taken along the line A, and FIG. 2 (c) is an enlarged view of a region R2 surrounded by a black broken line of the calibration slide glass 100 shown in FIG. 2 (b). As shown in FIGS. 2A to 2C, the calibration slide glass 100 of the present invention has a calibration pattern 1 having a plurality of calibration pattern chips 1a, 1b, 1c and around the calibration pattern 1. A pair of arranged first spacers 3 that face each other via the first spacers 3 and the first spacers 3 and have at least a transmissive portion 20 in a region that overlaps the calibration pattern 1 in a plan view. Arranged between the protective base materials 2a and 2b, the first spacer 3, and at least one of the pair of protective base materials 2a and 2b so as to overlap a part of the calibration pattern chip in a plan view. It has a second spacer 4 that has been calibrated. Further, the calibration slide glass 100 of the present invention is characterized in that the second spacer 4 has at least an opening A in a region that overlaps the calibration pattern 1 in a plan view.

The conventional calibration slide glass has a configuration in which a calibration pattern is arranged on a protective base material. In the calibration slide glass having such a configuration, since the surface of the calibration pattern is exposed, the surface of the calibration pattern is contaminated, the color density is lowered due to physical contact, and the dye change is generated. There is a problem that a problem occurs.
Therefore, the inventors of the present invention have a configuration in which the calibration pattern 1 is arranged between the pair of protective substrates 2a and 2b to prevent the surface of the calibration pattern from being exposed, for example, as shown in FIG. A slide glass for calibration was prepared. As a result, it was possible to suppress contamination of the surface of the calibration pattern, decrease in color density, and occurrence of pigment change, but on the other hand, the calibration pattern was observed through the transmissive portion provided on the protective base material. At that time, I discovered a new issue that the Newton ring appeared.
As a result of repeated research, the inventors of the present invention have newly found that the occurrence of Newton ring is one of the causes of contact between the calibration pattern and the protective substrate.
Therefore, according to the present invention, the calibration pattern and at least one protecting group on which the second spacer is arranged are provided by the second spacer having at least an opening in a region that overlaps the calibration pattern in a plan view. Since a gap corresponding to the thickness of the second spacer can be provided between the transmissive portions of the material, a calibration slide glass capable of suppressing the appearance of the Newton ring can be obtained.

In the calibration slide glass of the present invention, there is a gap corresponding to the thickness of the second spacer between the calibration pattern chip and the transmissive portion of at least one protective base material on which the second spacer is arranged. Has. In the calibration slide glass of the present invention, the surface having the void is usually the observation side. Therefore, when the gaps are arranged on both side surfaces of the calibration pattern chip, both side surfaces of the calibration slide glass can be the observation side, and the surface on the side toward the calibration pattern chip can be used. When a gap is arranged, one side of the calibration slide glass provided with the gap is the observation side.

The size of the void is not particularly limited as long as it can suppress the appearance of the Newton ring due to the contact between the calibration pattern chip and the protective glass, and is appropriately adjusted according to the design of the calibration slide glass and the like. can do. For example, the thickness of the void is such that the appearance of the Newton ring can be suppressed, and corresponds to the thickness of the second spacer described later. The specific thickness of the void is, for example, preferably in the range of 10 μm to 250 μm, particularly preferably in the range of 15 μm to 150 μm, and particularly preferably in the range of 20 μm to 80 μm. The thickness of the void corresponds to the _{symbol t 1} shown in FIG. 1 (c).

Hereinafter, each member constituting the calibration slide glass of the present invention will be described.

1. 1. Second Spacer The second spacer in the present invention is a part of a calibration pattern chip between the first spacer and at least one of the protective base materials and the first spacer among the first spacer and the pair of protective base materials. It is a member arranged so as to overlap with each other in a plan view. The second spacer in the present invention is characterized by having at least an opening in a region that overlaps the calibration pattern in a plan view. Further, in the present invention, for example, as shown in FIG. 4, it can be laminated on the first spacer 3 arranged around the calibration pattern. Since the description of FIG. 4 will be described later, the description here will be omitted.

In the present invention, for example, as shown in FIGS. 3 and 4, the second spacer 4 is placed between the first spacer 3 and the pair of protective substrates 2a and 2b, that is, on both sides of the first spacer 3. , It is preferable that the calibration pattern chip 1 is arranged so as to overlap a part of the calibration pattern chip 1 in a plan view. This is because a gap A can be provided between the protective base materials 2a and 2b and the calibration pattern chip 1 on any surface of the calibration slide glass 100, and the appearance of the Newton ring can be suppressed.

In the present invention, when the second spacer is arranged so as to overlap a part of the calibration pattern chip in a plan view, at least an opening is formed in a region where the calibration pattern overlaps in a plan view. That is, when a gap is provided between the protective base material and the calibration pattern chip, it is possible to prevent the calibration pattern chip from being displaced into the gap region.

The second spacer in the present invention has at least an opening in a region that overlaps the calibration pattern in a plan view. The second spacer in the present invention may be arranged in a layered manner so as to overlap the entire region other than the transmissive portion of the protective base material in a plan view, and is a region other than the transmissive portion of the protective base material. It may be arranged in a layer so that at least a part of the protective base material overlaps with the surrounding area in a plan view. Above all, it is preferable that the second spacer is arranged so as to overlap in a plan view over the entire region other than the transmissive portion of the protective base material. The second spacer is protected by pressure even when a gap is provided between the calibration pattern chip and the protecting substrate by having at least an opening in a region where the calibration pattern overlaps in plan view. It is possible to suppress a decrease in the strength of the calibration slide glass such that the base material is bent or cracked.

The thickness of the second spacer in the present invention is appropriately adjusted according to the size of the gap to be provided between the calibration pattern chip and the protective base material, and is not particularly limited. The specific thickness of the second spacer is, for example, preferably in the range of 10 μm to 250 μm, particularly preferably in the range of 15 μm to 150 μm, and particularly preferably in the range of 20 μm to 80 μm. preferable. When the thickness of the second spacer is within the above range, it is possible to provide a gap sufficient to suppress the appearance of the Newton ring.

The material of the second spacer in the present invention is a material that can be used for the calibration slide glass of the present invention and can form at least an opening in a region that overlaps the calibration pattern in a plan view. There is no particular limitation. As a specific material for the second spacer, for example, it is preferable that the material has a predetermined rigidity and is easy to process, and a metal such as stainless steel, iron-nickel alloy (42 alloy), copper, glass, or plastic is used. And so on. In the present invention, it is preferable to use a metal, and it is more preferable to use stainless steel from the viewpoint of corrosion resistance and workability.

The method for forming the second spacer in the present invention is not particularly limited as long as it can form the second spacer having a desired shape, depending on the type of material used for the second spacer and the like. Can be selected as appropriate. In the present invention, for example, the second spacer can be formed by punching or etching of a metal plate, penetrating by punching of a plastic plate, or molding such as plastic molding or printing.

In the present invention, as a method of arranging the second spacer between the first spacer and the protective base material so as to overlap a part of the calibration pattern chip in a plan view, for example, a second spacer is used. A method of adhering and arranging the first spacer and the protective base material so as to overlap a part of the calibration pattern chip in a plan view can be mentioned. Here, when the second spacer is adhered between the first spacer and the protective base material, an adhesive is usually used, but in the present invention, it is preferable to use a liquid adhesive. This is because the increase in thickness due to the adhesive can be suppressed and high adhesive strength can be obtained as compared with the case where an adhesive sheet or the like is used. The specific material used as the adhesive can be the same as that of a general material, and thus the description thereof is omitted here.

When a liquid adhesive is used when arranging the second spacer, it is preferable to have a groove on the surface of the second spacer for arranging the adhesive. For example, as shown in FIG. 5, it is preferable to have a groove 6 on the surface of the second spacer 4 for arranging the liquid adhesive. Above all, it is preferable that the surface of the second spacer has a groove in a region other than a region that overlaps a part of the calibration pattern chip in a plan view. By having a groove on the surface of the second spacer in a region other than a region that overlaps a part of the calibration pattern chip in a plan view, the calibration pattern chip is displaced into the gap region by the second spacer, etc. It is possible to effectively prevent the misalignment of. The term "surface of the second spacer" as used herein means not only the surface of the second spacer that is in contact with the first spacer or the surface that is in contact with the protective base material, but also one of the surfaces. Includes both surfaces that come into contact with the first spacer and surfaces that come into contact with the protecting substrate.

When the surface of the second spacer has a groove, the depth of the groove is smaller than the thickness of the second spacer, and by arranging the liquid adhesive in the groove, the second spacer is placed in the first spacer. It is preferable that the depth is such that it can be sufficiently adhered and arranged between the spacer and the protective base material. As described above, the depth of the groove can be appropriately adjusted according to the thickness of the second spacer, and for example, the ratio to the thickness of the second spacer may be in the range of 10% to 90%. It is preferably in the range of 20% to 80%, and particularly preferably in the range of 30% to 70%. The specific groove depth is, for example, preferably in the range of 5 μm to 130 μm, particularly preferably in the range of 10 μm to 80 μm, and particularly preferably in the range of 10 μm to 40 μm. .. When the depth of the groove is within the above range, when the liquid adhesive is placed in the groove, it can be used as a relief groove for the adhesive, and the second spacer, the first spacer, and the protective base material can be used. It is possible to prevent the adhesive from leaking from between. Therefore, it is possible to obtain a high-quality calibration slide glass. The depth of the grooves, for example, corresponds to a code t ₂ shown in FIG.

When the surface of the second spacer has grooves, the size and number of the grooves are not particularly limited, but it is preferable to appropriately adjust the groove according to the shape of the opening of the second spacer, the amount of adhesive used, and the like.

As a method of forming a groove on the surface of the second spacer, a method capable of forming a groove having a predetermined depth as described above is preferable, and the type of material used for the second spacer and the like are preferable. It can be appropriately selected according to the above. For example, a method of forming a desired groove can be used by subjecting the surface of the second spacer to a half-etching treatment.

2. First Spacer The first spacer in the present invention is a member arranged around the calibration pattern.

In the present invention, by arranging the first spacer around the calibration pattern, it is possible to fill the region having no calibration pattern with the first spacer. Therefore, the calibration pattern chip can be fixed in a predetermined position, and the calibration pattern chip can be prevented from being displaced in the length direction of the pair of protective substrates.

The first spacer in the present invention is not particularly limited as long as it can be arranged around the calibration pattern, and may be composed of one layer or a plurality of layers. In the present invention, from the viewpoint that the first spacer can be easily processed by etching or the like when forming the first spacer, for example, as shown in FIG. 4, a plurality of thin first spacers 3 are laminated. Is preferable. Since the description of FIG. 4 will be described later, the description here will be omitted.

When the first spacer of the present invention is composed of a plurality of layers, the thickness of one layer of the first spacer can be appropriately adjusted according to the material used for the first spacer and the like. The thickness of one layer of the first spacer is preferably, for example, in the range of 10 μm to 250 μm, particularly preferably in the range of 20 μm to 150 μm, and particularly preferably in the range of 50 μm to 150 μm. It is preferable to have. When the thickness of one layer of the first spacer is within the above range, it is possible to easily perform processing such as etching treatment when forming the first spacer.

Further, the total thickness of the first spacer of the present invention is appropriately adjusted according to the thickness of the calibration pattern chip described later, and is not particularly limited. For example, it is preferably in the range of 0.02 mm to 0.8 mm, particularly preferably in the range of 0.07 mm to 0.6 mm, and particularly preferably in the range of 0.1 mm to 0.4 mm. preferable. When the total thickness of the first spacer is within the above range, the calibration pattern chip can be sufficiently fixed.

The material of the first spacer in the present invention is not particularly limited as long as it is a material that can be arranged around the calibration pattern to fix the calibration pattern chip. As a specific material of the first spacer, for example, it is preferable that the material has a predetermined rigidity and is easy to process, and a metal such as stainless steel, iron-nickel alloy (42 alloy), copper alloy, glass, etc. Examples include plastic. In the present invention, it is preferable to use a metal, and it is more preferable to use stainless steel from the viewpoint of corrosion resistance and workability.

The method for forming the first spacer in the present invention is not particularly limited as long as it can form the first spacer having a desired shape, depending on the type of material used for the first spacer and the like. Can be selected as appropriate. The specific method for forming the first spacer can be the same as the method for forming the second spacer described in the above section "1. Second spacer". Omit.

In the present invention, as a method of arranging the first spacer around the calibration pattern, for example, a method of adhering the first spacer to a predetermined position of the protective base material and arranging the first spacer can be mentioned. Here, when the first spacer is adhered to the protective base material, an adhesive is usually used, but in the present invention, it is preferable to use a liquid adhesive. This is because the increase in thickness due to the adhesive can be suppressed and high adhesive strength can be obtained as compared with the case where an adhesive sheet or the like is used. The specific material used as the adhesive can be the same as that of a general material, and thus the description thereof is omitted here.

When a liquid adhesive is used when arranging the first spacer, it is preferable to have a groove on the surface of the first spacer for arranging the adhesive. The "surface of the first spacer" here means the first spacer when the first spacer is composed of a plurality of layers in addition to the surface where the first spacer contacts the protective base material. It also includes surfaces that come into contact with each other, surfaces that the first spacer contacts the second spacer, and the like. The specific groove depth, size, forming method, etc. can be the same as those described in the above section "1. Second spacer", and thus the description thereof will be omitted here.

3. 3. Calibration pattern The calibration pattern in the present invention is a member having a plurality of calibration pattern chips.

The calibration pattern in the present invention is appropriately selected according to the use of the calibration slide glass of the present invention, and is not particularly limited. For example, when the calibration slide glass of the present invention is used in a microscope with an imaging device, the calibration pattern used in the calibration slide glass can be used for evaluating the reproducibility of a measurement image by the microscope with an imaging device. .. Therefore, examples of the calibration pattern in this case include a color chart, a gray scale, a resolution chart, an inmega chart, a crosshatch chart, or a combination thereof.

The number of calibration patterns in the present invention can be appropriately adjusted according to the number of objective lenses of a microscope or the like with an imaging device in which the calibration slide glass of the present invention is used. In the calibration slide glass shown in FIG. 1, calibration patterns are provided at three locations.

The calibration pattern in the present invention is designed so that, for example, as shown in FIG. 1, the size changes stepwise and the patterns become similar. Specifically, the size of the calibration pattern is designed to be within the field of view of the microscope measurement by the objective lens. Further, as the shape of the calibration pattern, in addition to the rectangle as shown in FIG. 1, a square, a polygon, a circle, and the like can be mentioned.

Further, the calibration pattern thickness in the present invention is appropriately adjusted according to the design of the calibration slide glass of the present invention, and is not particularly limited. The specific thickness of the calibration pattern is, for example, preferably in the range of 0.02 mm to 0.8 mm, particularly preferably in the range of 0.07 mm to 0.6 mm, and particularly 0.1 mm. It is preferably in the range of ~ 0.4 mm.

Here, a color chart will be described as an example of the calibration pattern in the present invention. The color chart is composed of, for example, red (R), green (G), blue (B), yellow (Y), cyan (C), and magenta (M) as colors for color evaluation. Therefore, in this case, the calibration pattern in the present invention is an array of calibration pattern chips for each color for color evaluation.

The calibration pattern chip in the present invention can be composed of, for example, colored portions 1a ", 1b" and transparent portions 1a ", 1b" as shown in FIGS. 2 (b) and 2 (c). The arrangement of the colored portion and the transparent portion is not particularly limited, but for example, it is preferable that the arrangement of the colored portion and the transparent portion is the same in each calibration pattern chip. Specifically, for example, as shown in FIG. 2B, in each of the calibration pattern chips 1a and 1b, the colored portions 1a "and 1b" are arranged on the surface on the protective base material 2a side, and the colored portions 1a and 1b are arranged. It is preferable that the transparent portions 1a ′ and 1b ′ are arranged on the surface of the protective base material 2b of 1a ″ and 1b ″. The following effects can be obtained by aligning the arrangement of the colored portion and the transparent portion with each calibration pattern chip. That is, since the colored portion and the transparent portion have different refractive indexes, when light is transmitted through the calibration pattern chip, the refraction of light tends to occur at the interface between the colored portion and the transparent portion. At this time, if the arrangement of the colored portion and the transparent portion is different for each calibration pattern chip, the angle of the light emitted from each calibration pattern chip varies due to the difference in the position of the interface where the refraction of light occurs. , It may be difficult for the light receiving unit to acquire desired color information. On the other hand, as described above, when the arrangement of the colored portion and the transparent portion is aligned in each calibration pattern chip, it is possible to suppress the occurrence of the above problem.

The calibration pattern chip in the present invention can be obtained, for example, by cutting a color chart formed in a size larger than the size of the calibration pattern chip into a desired size. By producing the calibration pattern chip by such a method, it is possible to suppress the occurrence of color unevenness and shading unevenness and obtain a calibration pattern chip having stable characteristics.

Further, as the color chart, for example, a "standard color bar chart" manufactured by Dai Nippon Printing Co., Ltd., which serves as a reference color for a microscope equipped with an imaging device, can be used. Here, the "standard color bar chart" is composed of pre-designed red (R), green (G), blue (B), yellow (Y) cyan (C), and magenta (M), and the effective size is It is 175 mm × 245 mm.

The calibration pattern chip in the present invention is used as a reference color for evaluating the reproducibility of a measurement image by a microscope equipped with an image pickup device. The reference colors at this time are, for example, red (R), green (G), and so on. Examples include blue (B), yellow (Y), cyan (C), and magenta (M). The colors used as the reference colors are not limited to the above-mentioned six colors, and can be appropriately adjusted according to the object to be observed using a microscope equipped with an imaging device. Specifically, when observing biological tissues and cells by staining, hematoxylin / eosin staining method, which is a general staining method for biological tissues, and reddish and greenish colors stained by other staining methods. A color selected from colors, blue-based colors, cyan-based colors, magenta-based colors, yellow-based colors, other system colors, and the like can be used as a reference color.

The plurality of calibration pattern chips in the calibration pattern may be arranged in a row, in a grid pattern, or in a circular shape. In FIG. 2A, the calibration pattern 1 shows an example in which the calibration pattern chips 1a and 1b are arranged in a grid pattern of 2 rows × 5 columns. Further, as shown in FIGS. 2A and 2B, even if there is a colorless translucent blank region 1c between the upper calibration pattern chip and the lower calibration pattern chip. good.

Next, a gray scale will be described as an example of the calibration pattern in the present invention. The gray scale is a scale that expresses gradation step by step by changing the reflection density of gray between white and black in the reflection type. Here, a transparent gray scale will be described. The gray scale as a calibration pattern can be configured by arranging calibration pattern chips for each gradation having different transmittance. The arrangement can be arranged in a row or in a grid pattern so that the transmittance changes stepwise. Examples of the grayscale forming method include a sputtering method in which a plurality of metal films having different thicknesses are formed on a support such as glass or a film, a gradation of shades on the support, or a coating on the support. Examples thereof include a printing method, an inkjet method, a photolithography method, and the like, which can form halftone dot-like covering portions having different areas.

The calibration pattern in the present invention may have an IR cut filter or an ND filter, if necessary. For example, as shown in FIG. 4, an IR cut filter 8 that removes a specific wavelength may be provided in a region that overlaps the calibration pattern chips 1a and 1b in a plan view. By having the IR cut filter, it is possible to adjust the hue, saturation, brightness, brightness, etc. of the single-layer calibration pattern chip. Further, as shown in FIG. 4, when the IR cut filter 8 is provided, the second spacer 4 is placed between the calibration pattern chips 1a and 1b and the IR cut filter 8 with a part of the calibration pattern chip 1. The gaps A can be provided so as to overlap each other in a plan view, and the occurrence of Newton rings can be suppressed.

In the present invention, among the plurality of calibration pattern chips, it is preferable that at least all the calibration pattern chips to be measured the same have a uniform optical path length in the thickness direction of the calibration pattern chips. Hereinafter, a detailed description will be given.

First, the calibration slide glass has a function of providing color information as a comparison reference when performing color evaluation and color correction of a sample image captured by using an observation device, for example. Specifically, each of the plurality of calibration pattern chips constituting the calibration pattern has color information, and the observation device can be provided by measuring the plurality of calibration pattern chips and providing the color information. It is possible to perform color evaluation and color correction of the sample image captured by the use.
On the other hand, in the calibration slide glass, a plurality of calibration pattern chips are measured in providing color information, and the plurality of calibration pattern chips measured at this time are in the thickness direction of the calibration pattern chips. It is preferable that the optical path length is uniform. Above all, it is preferable that the optical path lengths in the thickness direction of all the calibration pattern chips constituting the calibration pattern are uniform. Here, the above-mentioned "plurality of calibration pattern chips measured at this time" is a calibration pattern chip that is measured by one calibration, and is a so-called plurality of calibration pattern chips that are the same measurement target. For example, when a white calibration pattern chip is used as a reference color and the color information of a pattern chip exhibiting another color is measured, the white calibration pattern chip and the pattern chip exhibiting another color are "same measurement". Target ". Further, when the calibration pattern has a gray chip for adjusting the brightness in addition to the calibration pattern chip exhibiting a predetermined color, the gray chip and the calibration pattern chip can be calibrated in one time. In the case of measurement, the gray chip and the calibration pattern chip are "the same measurement target". Further, when the calibration pattern has a resolution chip in addition to the calibration pattern chip exhibiting a predetermined color, it is not always necessary to measure the resolution chip and the calibration pattern chip in one calibration. , The resolution chart and the calibration pattern chip can be "the same measurement target" if necessary.

The reason why it is preferable that the optical path lengths of the plurality of calibration pattern chips to be the same measurement target are uniform is as follows. 11A and 11B have a red calibration pattern chip 1R, a white calibration pattern chip 1W, and a green calibration pattern chip 1G as calibration pattern chips, and red calibration pattern chip 1R and green color. The IR cut filter 8 is arranged in a region where the calibration pattern chip 1G overlaps in a plan view. Since the other configurations in FIGS. 11A and 11B are the same as those in FIG. 4 described above, the description thereof is omitted here. Further, in FIGS. 11A and 11B, for the sake of simplification, the first spacer, the second spacer, and the like are omitted, and the colored portion and the transparent portion of the calibration pattern chip are also omitted. ..

As shown in FIG. 11A, when the calibration slide glass is irradiated with parallel light as the light source h, the parallel light transmitted through the red calibration pattern chip 1R is received by the light receiving unit 30R and has a desired color. Information is measured. Further, the parallel light transmitted through the white calibration pattern chip 1W is received by the light receiving unit 30W, and desired color information is measured. Further, the parallel light transmitted through the green calibration pattern chip 1G is received by the light receiving unit 30G, and desired color information is measured. On the other hand, as shown in FIG. 11B, when the calibration slide glass was irradiated with non-parallel light as the light source h, the non-parallel light transmitted through the red calibration pattern chip 1R and the green calibration pattern chip 1G was emitted. The light receiving unit 30R and the light receiving unit 30G may not sufficiently receive light, making it difficult to measure desired color information.
Then, for example, when the white calibration pattern chip 1W is used as the reference color and the red calibration pattern chip 1R and the green calibration pattern chip 1G are measured, the measurement results are deviated and accurate calibration is performed. It can be difficult to do. Further, as a result, it may be difficult to perform highly accurate measurement by an observation device with an image pickup device using a calibration slide glass provided with a calibration pattern chip.
Examples of the "non-parallel light" include an imaging optical system such as a microscope.

Therefore, as a result of repeated studies on the above problems, the inventors of the present invention, as shown in FIG. 11B, when non-parallel light is used as the light source h, of each calibration pattern chip. It was found that the light to be received by each light receiving unit could not be sufficiently received due to the difference in the optical path length, and as a result, the color information was deviated. Based on such findings, the inventors of the present invention have solved the above problems by making the optical path lengths in the thickness direction uniform for all the calibration pattern chips to be measured. That is, in the present invention, by making the optical path length in the thickness direction uniform for all the calibration pattern chips to be measured, the image pickup device using the calibration slide glass provided with the calibration pattern chip is provided. The observation device of the above enables more accurate measurement.

Here, the "optical path length" can be calculated by the following formula.
(Thickness of the calibration pattern chip transmitted by the light source) x (Refractive index of the calibration pattern chip) = Optical path length In addition, "uniformizing the optical path length" means observation with an image pickup device using a calibration slide glass. It suffices if the device can perform highly accurate measurement, but for example, the difference in the optical path length in the thickness direction of all the calibration pattern chips to be measured is at least 15% or less. It is preferable, and above all, it is preferably 10% or less.

FIG. 12 is a schematic view showing an example in which the optical path length in the thickness direction of the calibration pattern chips to be measured in the same measurement target is uniformly adjusted in the calibration slide glass shown in FIG. 11B described above. In FIG. 11B, the IR cut filter 8 is arranged so as to overlap the red calibration pattern chip 1R and the green calibration pattern chip 1G in a plan view, whereas the white calibration pattern chip 1W has a pattern chip 1W. The IR cut filter 8 is not arranged. The calibration slide glass shown in FIG. 11 has a non-uniform optical path length at this point. Therefore, in the calibration slide glass shown in FIG. 12, an IR cut filter 8 and an adjustment filter 8'with a refractive index close to each other are arranged on the white calibration pattern chip 1W so as to overlap in a plan view, and each calibration pattern is arranged. The optical path length of the chip in the thickness direction was adjusted uniformly. Thereby, for example, when the white calibration pattern chip 1W is used as the reference color and the red calibration pattern chip 1R and the green calibration pattern chip 1G are measured, accurate calibration can be performed. Further, as a result, more accurate measurement can be performed by an observation device equipped with an imaging device using a calibration slide glass provided with a calibration pattern chip. The adjusting filter 8'used at this time is a member whose material and thickness are adjusted so as to approach the refractive index of the IR cut filter 8. Therefore, as the adjusting filter 8', a member made of the same material as the base material of the IR cut filter 8 may be used, or the IR cut filter 8 may be used. Specific examples of the case where the adjusting filter 8'is the former include soda glass, quartz glass, BK7 of optical glass, and the like.

In the present invention, as a method of making the optical path lengths of all the calibration pattern chips to be the same measurement target uniform in the thickness direction, for example, a method of aligning the number of layers of the calibration pattern chips to be the same measurement target can be mentioned. .. Further, when the number of layers is made uniform, it is preferable to select materials having similar materials. This is because the optical path length can be made more uniform. Further, as an effect obtained by making the number of layers uniform, in addition to being able to make the optical path length uniform, for example, by making the number of members arranged in the optical path uniform, the number of interfaces through which light passes can be increased. The effect of being able to align and align the refraction of light can be considered.

Specifically, as shown in FIG. 13A, when the red calibration pattern chip 1R and the green calibration pattern chip 1G are provided and the white calibration pattern chip 1W has a gap, the red calibration pattern is used. The chip 1R and the green calibration pattern chip 1G have one layer number, whereas the white calibration pattern chip 1W has a number of layers 0, and the number of layers differs from each other. In this case, for example, as shown in FIG. 13B, as the white calibration pattern chip 1W, a layer made of a material having a refractive index close to that of the red calibration pattern chip 1R and the green calibration pattern chip 1G is provided. Is preferable. Examples of the layer made of a material having a refractive index close to that of the red calibration pattern chip 1R and the green calibration pattern chip 1G include soda glass and the like.

Further, as shown in FIG. 14A, it has a red calibration pattern chip 1R, a white calibration pattern chip 1W, and a green calibration pattern chip 1G, and the red calibration pattern chip 1R and the green calibration pattern chip 1G have When the IR cut filters 8 are arranged so as to overlap in a plan view, the red calibration pattern chip 1R and the green calibration pattern chip 1G have two layers, whereas the white calibration pattern chip 1W has two layers. The number of layers becomes 1, and the number of layers differs from each other. In this case, for example, as shown in FIG. 14B, the IR cut filter 8 and the adjustment filter 8'with a refractive index close to each other may be arranged so as to overlap the white calibration pattern chip 1W in a plan view. preferable.

The reference numerals not described in FIGS. 13 (a) and 13 (b) and 14 (a) and 14 (b) can be the same as those in FIG. 4 described above, and thus the description thereof is omitted here. Further, in FIGS. 13 (a) and 13 (b) and 14 (a) and 14 (b), the first spacer, the second spacer, and the like are omitted for simplification of the drawings, and the calibration pattern chip is omitted. The colored part and the transparent part of the above are also omitted.

Here, when non-parallel light (microspectroscopy OLYMPUS: OSP-SP200) is used as a light source depending on whether the optical path length in the thickness direction of the calibration pattern chip to be the same measurement target is uniform or not. The measurement results were compared. Specifically, the calibration slide glass shown in FIG. 15A in which the calibration pattern chips 1a and 1b and the ND filter 9 are arranged so as to overlap only the calibration pattern chip 1a in a plan view, and the calibration. The ND filter 9 so as to overlap the pattern chips 1a and 1b and the calibration pattern chip 1a in a plan view, and the adjustment filter 9'containing the same material as the ND filter 9 so as to overlap the calibration pattern chip 1b in a plan view. The calibration slide glass shown in FIG. 15 (b) in which the and was arranged was prepared. Soda glass was used for the calibration pattern chip, and a filter designed to have a transmittance of around 60% was used as the ND filter. Further, as the adjusting filter 9', transparent glass made of the same material as the base material of the ND filter 9 was used. In the measurement, as shown in FIGS. 15A and 15B, the non-parallel light h is irradiated, and the light transmitted through the calibration pattern chips 1a and 1b, the ND filter 9 and the adjustment filter 9'are received. Light was received by 30a and 30b, and the transmittance was measured. As a result of the measurement, as shown in FIG. 16, in FIG. 15A in which the optical path length in the thickness direction of the calibration pattern chips to be the same measurement target is not uniformly adjusted, the transmittance is about 10%, which is accurate. Could not make a good measurement. On the other hand, in FIG. 15B in which the optical path length in the thickness direction of the calibration pattern chip to be the same measurement target is uniformly adjusted, the transmittance is about 60% as designed, and accurate measurement can be performed. It was.

In the present invention, for example, the optical path lengths in the thickness direction of all the calibration pattern chips to be measured are uniform, and the IR cut filter 8 and the ND filter shown in FIGS. 14 (b) and 15 (b) are shown. When the 9 is arranged so as to overlap the adjacent calibration pattern chips in a plan view, the IR cut filter 8 and the ND filter 9 may be arranged separately for each calibration pattern chip. , Each calibration pattern chip may be integrally arranged.

4. Protecting base material The protective base material in the present invention is a member that is arranged so as to face each other via a calibration pattern and a first spacer, and has at least a transmissive portion in a region that overlaps the calibration pattern in a plan view. Here, the “transmissive portion” refers to a region that transmits at least visible light, and refers to, for example, the region of reference numeral 20 shown in FIGS. 2B and 2C. The shape of the transparent portion is usually a rectangular shape as shown in FIGS. 2 (b) and 2 (c).

The protective base material in the present invention may have at least a transmissive portion formed in a region that overlaps the calibration pattern in a plan view. Specifically, for example, as shown in FIG. 2C, the width w _{1 of the transmissive portion is smaller than the width w 2} of the calibration pattern chip 1a, and the transmissive portion is smaller than both ends of the calibration pattern chip. It suffices if both ends are located inside.

The protective base material in the present invention is arranged so as to face both sides of the calibration pattern. At this time, the transmissive portions of the pair of protective base materials facing each other are formed at the predetermined positions described above. For example, the positions and widths of the transmissive portions in each protective base material may be the same or different. In the present invention, it is preferable that the position and width of the transmissive portion in each protective base material are the same. This is because the outline of the calibration pattern chip is clarified, and a higher quality calibration slide glass can be obtained. In addition, in a pair of protective base materials, when the position and width of the transmissive portion in each protective base material are different, the transparent portion of the protective base material provided on the observation side of the calibration slide glass is used to obtain the calibration slide glass. It is preferable that the region other than the transmissive portion of the protective base material provided on the side opposite to the observation side is not observed. That is, in the present invention, for example, as shown in FIG. 6, when the widths of the transmissive portions 20 in the protective base materials 2a and 2b are different, the side indicated by the arrow with the narrower width of the transmissive portion 20 is designated. It is preferably on the observation side of the calibration slide glass.

As described above, when the width (opening size) of the transmissive portion in each protective base material is different in the pair of protective base materials, the difference is preferably within 0.2 mm, particularly within 0.1 mm. Is preferable. When the difference in the position and width of the transmission portion in each protective base material is within the above range, the contour of the calibration pattern chip when the calibration slide glass is observed from a predetermined surface can be clarified, and the quality Can be a high calibration slide glass. Note that the difference between the position and the width of the transmission portion of each protective substrate, for example, corresponds to a code w ₃ shown in FIG.

Further, the width of the transmissive portion in the protective base material is appropriately adjusted according to the design of the calibration slide glass, and is not particularly limited.

The size of the protective base material is appropriately selected according to the size of the calibration slide glass of the present invention, and is not particularly limited. As a specific size of the protective base material, for example, the short side is preferably 26 ± 0.1 mm and the long side is preferably 76 ± 0.1 mm. The thickness of the protective base material is preferably in the range of, for example, 0.2 mm to 0.4 mm.

The material used for the protective base material is preferably, for example, a material capable of protecting the calibration pattern sandwiched between the pair of protective base materials from scratches and dust. Specific examples of the protective base material include glass, plastic, and the like. When the calibration slide glass of the present invention is used in a microscope with an imaging device, glass is usually used as the material of the protective base material. When plastic is used as the material of the protective base material, it is preferable to use plastic that does not contain a filler or the like from the viewpoint of enabling better microscopic measurement.

The method for forming the protective base material is not particularly limited as long as it can form a desired protective base material having a transmissive portion. For example, a method of applying a silver salt emulsion to the surface of a base material having colorless translucency and subjecting a predetermined region to a desilvering salt treatment to form a transmissive portion to serve as a protective base material can be mentioned. The protective base material may be composed of one layer or a plurality of layers.

5. Sealing part In the present invention, it is preferable to have a sealing part arranged along the outer circumference of the protective base material between the pair of protective base materials.

FIG. 7 is a schematic perspective view showing an example of the calibration slide glass of the present invention. As shown in FIG. 7, the calibration slide glass 100 of the present invention has a sealing portion 5 arranged along the outer circumference of the protective base materials 2a and 2b between the pair of protective base materials 2a and 2b. Is preferable. By having the sealing portion 5, it is possible to suppress the exposure of the side surfaces of the first spacer 3 and the second spacer 4, so that the mechanical strength of the calibration slide glass 100 can be increased. .. Further, for example, when a microscope with an imaging device using the calibration slide glass of the present invention is used in a medical field or the like, it is possible to suppress the intrusion of a solvent or the like into the inside of the calibration slide glass. .. The reference numerals not described in FIG. 7 can be the same as those in FIGS. 2 (a) to 2 (c), and thus the description thereof will be omitted here.

As shown in FIG. 7, the sealing portion in the present invention is arranged between the pair of protective base materials 2a and 2b along the outer circumference of the protective base materials 2a and 2b, so that the first spacers 3 and the first spacers 3 and the first are sealed. It is preferable to have a function of preventing the side surface of the spacer 4 of 2 from being exposed. The sealing portion in the present invention can be formed, for example, by pouring a curing agent along the outer circumference of the protective base material and then curing the sealing portion. In addition, the sealing portion in the present invention can be formed, for example, by processing a sealing layer having a resin material into a predetermined shape. The specific curing agent or resin material used for the sealing portion is not particularly limited as long as it can form a desired sealing portion, and examples thereof include general curing agents and resin materials. .. Further, the resin material may have a transparency or a light-shielding property.

The thickness of the sealing portion in the present invention can be appropriately adjusted according to the configuration of the calibration slide glass of the present invention and is not particularly limited, but usually corresponds to the distance between a pair of protective substrates, and the first Corresponds to the sum of the thickness of the spacer and the thickness of the second spacer. Therefore, the description about the specific thickness of the sealing portion is omitted.

In the present invention, as a method of arranging the sealing portion along the outer periphery of the protective base material between the pair of protective base materials, for example, when the sealing portion has a resin material, the sealing portion is protected. Examples thereof include a method of adhering to a base material and arranging. Here, an adhesive is usually used when the sealing portion is adhered to the protective base material, but in the present invention, it is preferable to use a liquid adhesive. This is because the increase in thickness due to the adhesive can be suppressed and high adhesive strength can be obtained as compared with the case where an adhesive sheet or the like is used. The specific material used as the adhesive can be the same as that of a general material, and thus the description thereof is omitted here.

When a liquid adhesive is used for arranging the sealing portion, a groove for arranging the adhesive may be provided on the surface of the sealing portion. Since the "surface of the sealing portion" here refers to a surface that comes into contact with the protective base material, it usually refers to both surfaces of the sealing portion.

6. Origin mark In the present invention, it is preferable that a pair of protective base materials have an origin mark on the surface of one of the protective base materials. The one protective base material here usually refers to the protective base material on the observation side of the calibration slide glass. Further, the surface of the protective base material here usually refers to a surface on the side where the pair of protective base materials face each other.

In the present invention, when the origin mark is provided on the surface of one of the protective base materials, the origin mark usually overlaps the transparent portion of the protective base material, the pattern chip for calibration, and the opening of the second spacer in a plan view. It is formed in such a position. This is because the origin mark can be illuminated by the transmitted light transmitted through the calibration slide glass of the present invention.

8 (a) is a schematic plan view showing an example of the calibration slide glass of the present invention, and FIG. 8 (b) is an enlargement of the region R3 in the calibration slide glass of the present invention shown in FIG. 8 (a). It is an enlarged view. As shown in FIGS. 8A and 8B, the calibration slide glass 100 of the present invention preferably has an origin mark 6 on its surface. In the present invention, for example, as shown in FIGS. 8A and 8B, it is preferable to have an origin mark 6x that defines the x-axis, an origin mark 6y that defines the y-axis, and the like. It is preferable to have an auxiliary origin mark 6'according to the above. By having the origin mark that defines the x-axis line and the origin mark that defines the y-axis line, it is possible to recognize the position information of the calibration pattern or the like based on the origin mark. Therefore, it is possible to use a calibration slide glass that supports the autochanger function.

The shape and size of the origin mark in the present invention are not particularly limited as long as they can define the x-axis line, the y-axis line, etc., and can be recognized as the origin mark, and are calibrated. It can be adjusted as appropriate according to the design of the slide glass for use.

The method for forming the origin mark in the present invention is not particularly limited as long as it can form a desired origin mark, but can be formed, for example, by the same method as the transmissive portion in the protective base material.

7. Alignment Marks In the present invention, it is preferable to form alignment marks on a pair of protective base materials, a first spacer, a second spacer, and the like to prevent misalignment.

The position where the alignment mark is formed is not particularly limited as long as it does not overlap the calibration pattern or the origin mark, and can be appropriately selected according to the configuration of the calibration slide glass. Further, the number of alignment marks is not particularly limited, and can be appropriately adjusted according to the configuration of the calibration slide glass and the like. In the present invention, for example, as shown in FIG. 7, alignment marks 7 can be formed at the four corners of each member.

9 (a) to 9 (d) are explanatory views for explaining the alignment mark in the present invention. When an alignment mark is formed on each member of the calibration slide glass of the present invention, for example, the protective base material 2a shown in FIG. 9A, the first spacer 3 shown in FIG. 9B, and FIG. 9C). By forming an alignment mark 7 having a predetermined shape like the second spacer 4 shown in FIG. 9 and the protective base material 2b shown in FIG. 9D, the members are overlapped in a plan view based on the alignment mark. It is possible to align in the same way. Therefore, in manufacturing the calibration slide glass of the present invention, the position accuracy at the time of assembling each member can be improved, and a high-quality calibration slide glass can be obtained.

In the present invention, the method for forming an alignment mark on each member is not particularly limited as long as it is a method capable of forming a desired alignment mark, and can be appropriately selected depending on the material and the like used for each member. For example, as a method of forming the alignment mark on the protective base material, for example, a method of forming the same as the transmission portion in the protective base material can be mentioned. Further, as a method of forming an alignment mark on the first spacer and the second spacer, for example, a penetration process by punching or etching of a metal plate, a punching process of a plastic plate, or a plastic molding or printing process is performed. Molding and the like can be mentioned.

The present invention is not limited to the above embodiment. The above embodiment is an example, and any one having substantially the same configuration as the technical idea described in the claims of the present invention and exhibiting the same effect and effect is the present invention. It is included in the technical scope of the invention.

1 ... Calibration pattern 1a, 1b ... Calibration pattern chip 1c ... Calibration pattern chip (blank)
2a, 2b ... Protecting base material 3 ... 1st spacer 4 ... 2nd spacer 5 ... Sealing part 6 ... Origin mark 7 ... Alignment mark 100 ... Calibration slide glass

Claims (6)

A calibration pattern with multiple calibration pattern chips and
A first spacer placed around the calibration pattern,
A pair of protecting base materials arranged so as to face each other via the calibration pattern and the first spacer and having at least a transmissive portion in a region that overlaps the calibration pattern in a plan view.
Of the first spacer and the pair of protective base materials, at least one of the protective base materials and the first spacer is arranged so as to overlap a part of the calibration pattern chip in a plan view. With a second spacer
The second spacer is a calibration slide glass having at least an opening in a region that overlaps the calibration pattern in a plan view. The calibration slide glass according to claim 1, wherein a sealing portion arranged along the outer circumference of the protective base material is provided between the pair of protective base materials. The calibration slide glass according to claim 1 or 2, wherein the surface of the second spacer has a groove. The calibration slide glass according to any one of claims 1 to 3, wherein an origin mark is provided on the surface of one of the pair of protective substrates. Claim 1 is characterized in that the transmissive portion of one of the protective base materials is arranged in the region of the transmissive portion of the other protective base material in a plan view. The calibration slide glass according to any one of claims 4 to 4. Claims 1 to 1, wherein at least all the calibration pattern chips to be measured the same among the plurality of calibration pattern chips have a uniform optical path length in the thickness direction of the calibration pattern chips. The calibration slide glass according to any one of claims up to 5.

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