JP6762959B2 - 温度に伴うオフセットドリフトを補償するための方法及び装置 - Google Patents

温度に伴うオフセットドリフトを補償するための方法及び装置 Download PDF

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Publication number
JP6762959B2
JP6762959B2 JP2017555219A JP2017555219A JP6762959B2 JP 6762959 B2 JP6762959 B2 JP 6762959B2 JP 2017555219 A JP2017555219 A JP 2017555219A JP 2017555219 A JP2017555219 A JP 2017555219A JP 6762959 B2 JP6762959 B2 JP 6762959B2
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Japan
Prior art keywords
adc
voltage
trim
capacitors
trim phase
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Japanese (ja)
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JP2018513651A5 (enExample
JP2018513651A (ja
Inventor
マンダル ディパンカール
マンダル ディパンカール
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日本テキサス・インスツルメンツ合同会社
テキサス インスツルメンツ インコーポレイテッド
テキサス インスツルメンツ インコーポレイテッド
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Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0602—Continuously compensating for, or preventing, undesired influence of physical parameters of deviations from the desired transfer characteristic
    • H03M1/0604—Continuously compensating for, or preventing, undesired influence of physical parameters of deviations from the desired transfer characteristic at one point, i.e. by adjusting a single reference value, e.g. bias or gain error
    • H03M1/0607—Offset or drift compensation
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H03M1/1033—Calibration over the full range of the converter, e.g. for correcting differential non-linearity
    • H03M1/1057—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by trimming, i.e. by individually adjusting at least part of the quantisation value generators or stages to their nominal values
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
    • H03M1/46—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
    • H03M1/466—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors
    • H03M1/468—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors in which the input S/H circuit is merged with the feedback DAC array

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
JP2017555219A 2015-04-20 2016-04-20 温度に伴うオフセットドリフトを補償するための方法及び装置 Active JP6762959B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201562149971P 2015-04-20 2015-04-20
US62/149,971 2015-04-20
US14/871,005 US9425811B1 (en) 2015-04-20 2015-09-30 Method and apparatus for compensating offset drift with temperature
US14/871,005 2015-09-30
PCT/US2016/028465 WO2016172228A1 (en) 2015-04-20 2016-04-20 Method and apparatus for compensating offset drift with temperature

Publications (3)

Publication Number Publication Date
JP2018513651A JP2018513651A (ja) 2018-05-24
JP2018513651A5 JP2018513651A5 (enExample) 2019-05-30
JP6762959B2 true JP6762959B2 (ja) 2020-09-30

Family

ID=56683335

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2017555219A Active JP6762959B2 (ja) 2015-04-20 2016-04-20 温度に伴うオフセットドリフトを補償するための方法及び装置

Country Status (4)

Country Link
US (1) US9425811B1 (enExample)
JP (1) JP6762959B2 (enExample)
CN (1) CN107636970B (enExample)
WO (1) WO2016172228A1 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110138386B (zh) * 2019-04-30 2020-12-25 厦门大学 一种比较器失调漂移后台校正电路和方法
JP2021150806A (ja) 2020-03-19 2021-09-27 キオクシア株式会社 半導体集積回路及び受信装置
EP4125220A1 (en) 2021-07-28 2023-02-01 Socionext Inc. Linearity and/or gain in mixed-signal circuitry
CN116185119B (zh) * 2023-04-23 2023-07-21 深圳市九天睿芯科技有限公司 基于cim的电压调节电路、芯片及电子设备
US12463651B2 (en) * 2023-09-01 2025-11-04 Apple Inc. Mixer second-order input-intercept point temperature compensation

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4399426A (en) * 1981-05-04 1983-08-16 Tan Khen Sang On board self-calibration of analog-to-digital and digital-to-analog converters
IT1186476B (it) * 1985-12-19 1987-11-26 Sgs Microelettronica Spa Apparecchio e metodo per la correzione della tensione di offset in un convertitore analogico-digitale
US6847319B1 (en) * 2003-07-22 2005-01-25 Standard Microsystems Corporation Temperature-to-digital converter
US7312648B2 (en) * 2005-06-23 2007-12-25 Himax Technologies, Inc. Temperature sensor
US7218259B2 (en) * 2005-08-12 2007-05-15 Analog Devices, Inc. Analog-to-digital converter with signal-to-noise ratio enhancement
US7286075B2 (en) * 2005-11-14 2007-10-23 Analog Devices, Inc. Analog to digital converter with dither
DE102009040543B4 (de) * 2009-09-08 2014-02-13 Texas Instruments Deutschland Gmbh Schaltung und Verfahren zum Trimmen einer Offsetdrift
US8368570B2 (en) * 2011-01-31 2013-02-05 SK Hynix Inc. Method and system for calibrating column parallel ADCs
WO2013001682A1 (ja) * 2011-06-30 2013-01-03 パナソニック株式会社 アナログ測定データ検出システム、電池電圧検出システム
US8638248B2 (en) * 2011-10-07 2014-01-28 Nxp, B.V. Input-independent self-calibration method and apparatus for successive approximation analog-to-digital converter with charge-redistribution digital to analog converter

Also Published As

Publication number Publication date
US9425811B1 (en) 2016-08-23
CN107636970A (zh) 2018-01-26
WO2016172228A1 (en) 2016-10-27
CN107636970B (zh) 2021-12-07
JP2018513651A (ja) 2018-05-24

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