JP6690390B2 - 光コヒーレンストモグラフィー装置 - Google Patents

光コヒーレンストモグラフィー装置 Download PDF

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Publication number
JP6690390B2
JP6690390B2 JP2016091560A JP2016091560A JP6690390B2 JP 6690390 B2 JP6690390 B2 JP 6690390B2 JP 2016091560 A JP2016091560 A JP 2016091560A JP 2016091560 A JP2016091560 A JP 2016091560A JP 6690390 B2 JP6690390 B2 JP 6690390B2
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Japan
Prior art keywords
light
optical
measurement
measurement light
polarization
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JP2016091560A
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English (en)
Japanese (ja)
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JP2016212105A (ja
JP2016212105A5 (https=
Inventor
昌明 羽根渕
昌明 羽根渕
佳史 村田
佳史 村田
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Nidek Co Ltd
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Nidek Co Ltd
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/0209—Low-coherence interferometers
    • G01B9/02091—Tomographic interferometers, e.g. based on optical coherence
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B3/00—Apparatus for testing the eyes; Instruments for examining the eyes
    • A61B3/10—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions
    • A61B3/102—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions for optical coherence tomography [OCT]
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B3/00—Apparatus for testing the eyes; Instruments for examining the eyes
    • A61B3/10—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions
    • A61B3/12—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions for looking at the eye fundus, e.g. ophthalmoscopes
    • A61B3/1225—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions for looking at the eye fundus, e.g. ophthalmoscopes using coherent radiation
    • A61B3/1233—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions for looking at the eye fundus, e.g. ophthalmoscopes using coherent radiation for measuring blood flow, e.g. at the retina
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B5/00—Measuring for diagnostic purposes; Identification of persons
    • A61B5/0059—Measuring for diagnostic purposes; Identification of persons using light, e.g. diagnosis by transillumination, diascopy, fluorescence
    • A61B5/0062—Arrangements for scanning
    • A61B5/0066—Optical coherence imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02017—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations
    • G01B9/02019—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations contacting different points on same face of object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02027—Two or more interferometric channels or interferometers
    • G01B9/02028—Two or more reference or object arms in one interferometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02083—Interferometers characterised by particular signal processing and presentation
    • G01B9/02087—Combining two or more images of the same region
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/45—Multiple detectors for detecting interferometer signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/70—Using polarization in the interferometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4795—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Molecular Biology (AREA)
  • Surgery (AREA)
  • Biophysics (AREA)
  • Biomedical Technology (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Medical Informatics (AREA)
  • Veterinary Medicine (AREA)
  • Public Health (AREA)
  • Animal Behavior & Ethology (AREA)
  • Ophthalmology & Optometry (AREA)
  • Hematology (AREA)
  • Signal Processing (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Eye Examination Apparatus (AREA)
JP2016091560A 2015-04-30 2016-04-28 光コヒーレンストモグラフィー装置 Active JP6690390B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2015093725 2015-04-30
JP2015093725 2015-04-30

Publications (3)

Publication Number Publication Date
JP2016212105A JP2016212105A (ja) 2016-12-15
JP2016212105A5 JP2016212105A5 (https=) 2019-05-09
JP6690390B2 true JP6690390B2 (ja) 2020-04-28

Family

ID=55967049

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016091560A Active JP6690390B2 (ja) 2015-04-30 2016-04-28 光コヒーレンストモグラフィー装置

Country Status (3)

Country Link
US (1) US9709383B2 (https=)
EP (1) EP3088837A1 (https=)
JP (1) JP6690390B2 (https=)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ES2933898T3 (es) * 2017-01-30 2023-02-14 Alcon Inc Sistema para cortar un colgajo mediante tomografía de coherencia óptica sensible a la polarización
CN109171659B (zh) * 2018-09-28 2024-07-30 南京航空航天大学 基于琼斯矩阵的光纤型扫频偏振敏感oct成像方法及系统
EP3856006B1 (en) * 2018-11-28 2024-12-04 Alcon Inc. Optical coherence tomography receiver
CN110742584A (zh) * 2019-10-09 2020-02-04 南京沃福曼医疗科技有限公司 一种导管偏振敏感光学相干层析成像解调方法用偏振解算方法
US11974806B2 (en) * 2021-02-19 2024-05-07 Topcon Corporation Ophthalmologic information processing apparatus, ophthalmologic apparatus, ophthalmologic information processing method, and recording medium
CN114001657B (zh) * 2021-09-26 2023-06-13 河北大学 基于低相干光串联干涉的量块长度校准装置和校准方法
CN115778319B (zh) * 2022-11-09 2024-05-07 山东大学 基于双光谱仪进行光源噪声补偿的可见光oct系统

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4344829B2 (ja) 2006-05-02 2009-10-14 国立大学法人 筑波大学 偏光感受光画像計測装置
US8059277B2 (en) 2007-08-27 2011-11-15 Axsun Technologies, Inc. Mode hopping swept frequency laser for FD OCT and method of operation
JP5623028B2 (ja) * 2009-01-23 2014-11-12 キヤノン株式会社 光干渉断層画像を撮る撮像方法及びその装置
JP5725697B2 (ja) 2009-05-11 2015-05-27 キヤノン株式会社 情報処理装置および情報処理方法
JP5626687B2 (ja) 2009-06-11 2014-11-19 国立大学法人 筑波大学 ２ビーム型光コヒーレンストモグラフィー装置
EP2574273B1 (en) * 2011-06-23 2014-09-24 Nidek Co., Ltd. Optical coherence tomography apparatus
JP5772284B2 (ja) 2011-06-23 2015-09-02 株式会社ニデック 光コヒーレンストモグラフィ装置
JP5903903B2 (ja) * 2012-01-19 2016-04-13 株式会社ニデック 光コヒーレンストモグラフィー装置
JP2014523536A (ja) * 2011-07-19 2014-09-11 ザ ジェネラル ホスピタル コーポレイション 光コヒーレンストモグラフィーにおいて偏波モード分散補償を提供するためのシステム、方法、装置およびコンピュータアクセス可能な媒体
JP5905711B2 (ja) * 2011-11-25 2016-04-20 株式会社トプコン 光画像計測装置
JP5954979B2 (ja) * 2011-12-15 2016-07-20 キヤノン株式会社 多波長干渉計を有する計測装置
JP6346410B2 (ja) * 2013-05-24 2018-06-20 国立大学法人 筑波大学 ジョーンズマトリックスｏｃｔシステム及び該ｏｃｔで得られた計測データを画像処理するプログラム
JP6463051B2 (ja) * 2014-09-10 2019-01-30 株式会社トーメーコーポレーション 光断層画像撮影装置
JP6606800B2 (ja) * 2015-04-23 2019-11-20 株式会社トーメーコーポレーション 偏光情報を利用した光干渉断層計

Also Published As

Publication number Publication date
US9709383B2 (en) 2017-07-18
JP2016212105A (ja) 2016-12-15
EP3088837A1 (en) 2016-11-02
US20160320171A1 (en) 2016-11-03

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