JP6682731B2 - 複数のサンプル経路を有する光コヒーレンス断層映像システム - Google Patents
複数のサンプル経路を有する光コヒーレンス断層映像システム Download PDFInfo
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- 238000012014 optical coherence tomography Methods 0.000 title description 22
- 238000003384 imaging method Methods 0.000 claims description 40
- 230000003287 optical effect Effects 0.000 claims description 18
- 210000002159 anterior chamber Anatomy 0.000 claims description 16
- 230000002207 retinal effect Effects 0.000 claims description 14
- 210000001525 retina Anatomy 0.000 claims description 6
- 230000004323 axial length Effects 0.000 claims description 4
- 238000000034 method Methods 0.000 claims description 4
- 210000004087 cornea Anatomy 0.000 description 6
- 238000012986 modification Methods 0.000 description 6
- 230000004048 modification Effects 0.000 description 6
- 239000003153 chemical reaction reagent Substances 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B3/00—Apparatus for testing the eyes; Instruments for examining the eyes
- A61B3/10—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions
- A61B3/102—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions for optical coherence tomography [OCT]
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
- G01B9/02002—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies
- G01B9/02004—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies using frequency scans
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02015—Interferometers characterised by the beam path configuration
- G01B9/02017—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations
- G01B9/02019—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations contacting different points on same face of object
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02015—Interferometers characterised by the beam path configuration
- G01B9/02017—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations
- G01B9/02021—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations contacting different faces of object, e.g. opposite faces
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02015—Interferometers characterised by the beam path configuration
- G01B9/02027—Two or more interferometric channels or interferometers
- G01B9/02028—Two or more reference or object arms in one interferometer
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/0209—Low-coherence interferometers
- G01B9/02091—Tomographic interferometers, e.g. based on optical coherence
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02015—Interferometers characterised by the beam path configuration
- G01B9/02017—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations
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Description
この出願は、引用によりその全体が本明細書に組み込まれている2014年1月21日出願の米国仮特許出願第61/929,617号からの優先権を主張するものである。
D12 オフセット
O1 角膜の前側
Claims (8)
- 波長走査式ビームを提供するように構成された同調可能レーザ源と、
前記波長走査式ビームを基準ビームと物体ビームに分割するように構成された干渉計と、
前記物体ビームを前房撮像構成要素に対応する第1の経路と網膜撮像構成要素に対応する第2の経路とに分割するように構成されたスプリッタと、
前記物体ビームの一部分を前記第1の経路へ通過させるように構成された第1のアパーチャと、
該物体ビームの前記一部分の他の部分を前記第2の経路へ通過させるように構成された第2のアパーチャと、
前記基準ビームと眼から反射される前記物体ビームの少なくとも前記一部分との間の干渉によって引き起こされる信号を検出するように構成された検出器と、
を含むことを特徴とする光コヒーレンス断層映像(OCT)撮像システム。 - 前記前房撮像構成要素は、前房を撮像するように構成されたレンズシステム及び走査ミラーを含むことを特徴とする請求項1に記載のOCT撮像システム。
- 前記網膜撮像構成要素は、網膜を撮像するように構成されたレンズシステム及び走査ミラーを含むことを特徴とする請求項1に記載のOCT撮像システム。
- 前記第1の経路は、前記第2の経路とは異なることを特徴とする請求項1に記載のOCT撮像システム。
- 前記検出器からの信号を処理して画像を発生させるように構成された処理ユニットを更に含むことを特徴とする請求項1に記載のOCT撮像システム。
- 前記第1の経路は、発散するビームとサンプルに対して垂直な横方向走査パターンとを用いるレンズシステムを含み、
前記第2の経路は、平行化ビームと前記サンプルに対して発散するような走査パターンとを用いるレンズシステムを含む、
ことを特徴とする請求項1に記載のOCT撮像システム。 - 前記第1及び第2の経路の各々が、撮像範囲間で切り換えるためにアパーチャにわたって閉じるように構成されたシャッターを含むことを特徴とする請求項1に記載のOCT撮像システム。
- 前記第1の経路と前記第2の経路の間の経路長差が、眼の眼軸長と同等な光路長を有することを特徴とする請求項1に記載のOCT撮像システム。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
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US201461929617P | 2014-01-21 | 2014-01-21 | |
US61/929,617 | 2014-01-21 | ||
PCT/IB2015/000808 WO2015121756A2 (en) | 2014-01-21 | 2015-01-21 | Optical coherence tomography system with multiple sample paths |
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JP2017502817A JP2017502817A (ja) | 2017-01-26 |
JP6682731B2 true JP6682731B2 (ja) | 2020-04-15 |
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JP2016564444A Active JP6682731B2 (ja) | 2014-01-21 | 2015-01-21 | 複数のサンプル経路を有する光コヒーレンス断層映像システム |
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US (1) | US9549671B2 (ja) |
EP (1) | EP3097382B1 (ja) |
JP (1) | JP6682731B2 (ja) |
WO (1) | WO2015121756A2 (ja) |
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WO2015183994A1 (en) | 2014-05-28 | 2015-12-03 | Santec Corporation | Non-invasive optical measurement of blood analyte |
WO2016142748A1 (en) * | 2015-03-11 | 2016-09-15 | Synaptive Medical (Barbados) Inc. | An optical coherence tomography system with dual optical coherence tomography probes |
US10548520B2 (en) | 2015-04-01 | 2020-02-04 | Santec Corporation | Non-invasive optical measurement of blood analyte |
JP6713149B2 (ja) * | 2015-06-01 | 2020-06-24 | サンテック株式会社 | 2つの波長を合成する光コヒーレンストモグラフィーシステム |
JP6848488B2 (ja) * | 2017-01-31 | 2021-03-24 | 株式会社ニデック | 光干渉断層計 |
US10571243B2 (en) | 2016-02-12 | 2020-02-25 | Carl Zeiss Meditec, Inc. | Systems and methods for improved OCT measurements |
DE102016205370B4 (de) * | 2016-03-31 | 2022-08-18 | Optomedical Technologies Gmbh | OCT-System |
US10677580B2 (en) | 2016-04-27 | 2020-06-09 | Santec Corporation | Optical coherence tomography system using polarization switching |
US9993153B2 (en) | 2016-07-06 | 2018-06-12 | Santec Corporation | Optical coherence tomography system and method with multiple apertures |
JP2018164636A (ja) | 2017-03-28 | 2018-10-25 | 株式会社トーメーコーポレーション | 眼科装置 |
US10426337B2 (en) | 2017-06-01 | 2019-10-01 | Santec Corporation | Flow imaging in an optical coherence tomography (OCT) system |
US10408600B2 (en) | 2017-06-22 | 2019-09-10 | Santec Corporation | Optical coherence tomography with a fizeau-type interferometer |
US10206567B2 (en) | 2017-07-12 | 2019-02-19 | Santec Corporation | Dual wavelength resampling system and method |
US10502546B2 (en) | 2017-11-07 | 2019-12-10 | Santec Corporation | Systems and methods for variable-range fourier domain imaging |
US10648797B2 (en) | 2017-11-16 | 2020-05-12 | Quality Vision International Inc. | Multiple beam scanning system for measuring machine |
AU2018389674B2 (en) * | 2017-12-21 | 2024-06-20 | Alcon Inc. | Multi-view ophthalmic diagnostic systems |
US11213200B2 (en) | 2018-03-22 | 2022-01-04 | Santec Corporation | Topographical imaging using combined sensing inputs |
US11067671B2 (en) | 2018-04-17 | 2021-07-20 | Santec Corporation | LIDAR sensing arrangements |
US10838047B2 (en) | 2018-04-17 | 2020-11-17 | Santec Corporation | Systems and methods for LIDAR scanning of an environment over a sweep of wavelengths |
EP3594614A1 (de) * | 2018-07-11 | 2020-01-15 | Haag-Streit Ag | Oct-system und oct-verfahren |
JP7323148B2 (ja) | 2018-09-28 | 2023-08-08 | 株式会社トーメーコーポレーション | 眼科装置 |
IT201900023229A1 (it) * | 2019-12-06 | 2021-06-06 | Adige Spa | Procedimento e sistema per la determinazione della posizione di un elemento di un sistema ottico in un complesso di lavorazione o misura di un oggetto tramite misure interferometriche parallele |
KR102418399B1 (ko) * | 2020-12-04 | 2022-07-07 | 주식회사 에이아이플랫폼 | 인공지능 기반 치매 조기 진단 플랫폼 |
CN113520299B (zh) * | 2021-08-24 | 2022-06-21 | 图湃(北京)医疗科技有限公司 | 一种眼部多模态成像系统 |
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JP3118270B2 (ja) * | 1991-04-15 | 2000-12-18 | 株式会社トプコン | 眼軸長測定装置 |
US7126693B2 (en) * | 2004-03-29 | 2006-10-24 | Carl Zeiss Meditec, Inc. | Simple high efficiency optical coherence domain reflectometer design |
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DE102007046507A1 (de) | 2007-09-28 | 2009-04-02 | Carl Zeiss Meditec Ag | Kurzkoheränz-Interferometer |
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- 2015-01-21 WO PCT/IB2015/000808 patent/WO2015121756A2/en active Application Filing
- 2015-01-21 JP JP2016564444A patent/JP6682731B2/ja active Active
- 2015-01-21 US US14/601,945 patent/US9549671B2/en active Active
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EP3097382B1 (en) | 2022-10-12 |
WO2015121756A2 (en) | 2015-08-20 |
EP3097382A2 (en) | 2016-11-30 |
US9549671B2 (en) | 2017-01-24 |
US20150201833A1 (en) | 2015-07-23 |
WO2015121756A3 (en) | 2015-12-03 |
JP2017502817A (ja) | 2017-01-26 |
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