JP6637485B2 - トモグラフィにおける暗視野イメージング - Google Patents

トモグラフィにおける暗視野イメージング Download PDF

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JP6637485B2
JP6637485B2 JP2017507434A JP2017507434A JP6637485B2 JP 6637485 B2 JP6637485 B2 JP 6637485B2 JP 2017507434 A JP2017507434 A JP 2017507434A JP 2017507434 A JP2017507434 A JP 2017507434A JP 6637485 B2 JP6637485 B2 JP 6637485B2
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signal
dark
image
dark field
phase contrast
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JP2017524139A (ja
JP2017524139A5 (enExample
Inventor
ケーラー，トマス
ヨハンネス ブレンデル，ベルンハルト
ヨハンネス ブレンデル，ベルンハルト
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Koninklijke Philips NV
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Koninklijke Philips NV
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/041—Phase-contrast imaging, e.g. using grating interferometers
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/48—Diagnostic techniques
    • A61B6/484—Diagnostic techniques involving phase contrast X-ray imaging
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/52—Devices using data or image processing specially adapted for radiation diagnosis
    • A61B6/5258—Devices using data or image processing specially adapted for radiation diagnosis involving detection or reduction of artifacts or noise
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T11/00—2D [Two Dimensional] image generation
    • G06T11/003—Reconstruction from projections, e.g. tomography
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/401—Imaging image processing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph

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  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Medical Informatics (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Radiology & Medical Imaging (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Biomedical Technology (AREA)
  • Veterinary Medicine (AREA)
  • Public Health (AREA)
  • Animal Behavior & Ethology (AREA)
  • Biophysics (AREA)
  • Surgery (AREA)
  • Molecular Biology (AREA)
  • Optics & Photonics (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Theoretical Computer Science (AREA)
  • Pulmonology (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2017507434A 2014-08-13 2015-08-04 トモグラフィにおける暗視野イメージング Expired - Fee Related JP6637485B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP14180751 2014-08-13
EP14180751.1 2014-08-13
PCT/EP2015/067864 WO2016023782A1 (en) 2014-08-13 2015-08-04 Quantitative dark–field imaging in tomography

Publications (3)

Publication Number Publication Date
JP2017524139A JP2017524139A (ja) 2017-08-24
JP2017524139A5 JP2017524139A5 (enExample) 2019-06-20
JP6637485B2 true JP6637485B2 (ja) 2020-01-29

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JP2017507434A Expired - Fee Related JP6637485B2 (ja) 2014-08-13 2015-08-04 トモグラフィにおける暗視野イメージング

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Country Link
US (1) US10339674B2 (enExample)
EP (1) EP3180603B8 (enExample)
JP (1) JP6637485B2 (enExample)
CN (1) CN106659449B (enExample)
WO (1) WO2016023782A1 (enExample)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104318536B (zh) * 2014-10-21 2018-03-20 沈阳东软医疗系统有限公司 Ct图像的校正方法及装置
CN109690627A (zh) 2016-09-08 2019-04-26 皇家飞利浦有限公司 改进的相衬和暗场ct重建算法
US20190250030A1 (en) * 2016-09-26 2019-08-15 Lavision Biotec Gmbh Measuring device and methods for characterization of a radiation field
JP6753342B2 (ja) * 2017-03-15 2020-09-09 株式会社島津製作所 放射線格子検出器およびｘ線検査装置
CN107238616B (zh) * 2017-06-22 2019-10-11 合肥工业大学 基于中子光栅干涉仪的暗场成像方法
EP3435325A1 (en) 2017-07-26 2019-01-30 Koninklijke Philips N.V. Scatter correction for dark field imaging
JP6943090B2 (ja) * 2017-09-05 2021-09-29 株式会社島津製作所 Ｘ線イメージング装置
CN108896588B (zh) * 2018-06-08 2020-11-20 中北大学 一种多孔介质微观结构的测量方法
WO2020039660A1 (ja) * 2018-08-24 2020-02-27 株式会社島津製作所 Ｘ線位相イメージング装置
WO2020090168A1 (ja) * 2018-10-31 2020-05-07 株式会社島津製作所 Ｘ線位相差撮影システム
US10679385B1 (en) * 2018-12-17 2020-06-09 General Electric Company System and method for statistical iterative reconstruction and material decomposition
EP4101388A1 (en) * 2021-06-08 2022-12-14 Universiteit Antwerpen A phase-contrast x-ray imaging system for obtaining a dark-field image and a method therefor
US20250130183A1 (en) * 2023-10-20 2025-04-24 Applied Materials, Inc. Determining tilt angle of substrate structures utilizing angular fourier decomposition of scattering images

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6990420B2 (en) * 2004-05-10 2006-01-24 Lsi Logic Corporation Method of estimating a local average crosstalk voltage for a variable voltage output resistance model
US8121249B2 (en) 2009-06-04 2012-02-21 Virginia Tech Intellectual Properties, Inc. Multi-parameter X-ray computed tomography
CN101943668B (zh) 2009-07-07 2013-03-27 清华大学 X射线暗场成像系统和方法
JP5915645B2 (ja) * 2011-03-23 2016-05-11 コニカミノルタ株式会社 医用画像表示システム
CN102360498B (zh) * 2011-10-27 2013-09-18 江苏省邮电规划设计院有限责任公司 图像超分辨率重建方法
EP2850595B1 (en) 2012-05-14 2016-04-06 Koninklijke Philips N.V. Dark field computed tomography imaging
US9510799B2 (en) * 2012-06-11 2016-12-06 Konica Minolta, Inc. Medical imaging system and medical image processing apparatus
EP2867655B1 (en) 2012-06-27 2019-05-08 Koninklijke Philips N.V. Dark-field imaging
JP6079204B2 (ja) * 2012-12-18 2017-02-15 コニカミノルタ株式会社 医用画像システム
US8989347B2 (en) * 2012-12-19 2015-03-24 General Electric Company Image reconstruction method for differential phase contrast X-ray imaging
US10096098B2 (en) * 2013-12-30 2018-10-09 Carestream Health, Inc. Phase retrieval from differential phase contrast imaging
JP2014140632A (ja) * 2012-12-27 2014-08-07 Canon Inc 演算装置、画像取得方法、プログラム、及びｘ線撮像システム

Also Published As

Publication number Publication date
US20170213365A1 (en) 2017-07-27
EP3180603A1 (en) 2017-06-21
CN106659449B (zh) 2020-11-24
US10339674B2 (en) 2019-07-02
JP2017524139A (ja) 2017-08-24
EP3180603B8 (en) 2020-04-01
CN106659449A (zh) 2017-05-10
WO2016023782A1 (en) 2016-02-18
EP3180603B1 (en) 2020-02-12

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