CN106659449B - 断层摄影中的定量暗场成像 - Google Patents

断层摄影中的定量暗场成像 Download PDF

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CN106659449B
CN106659449B CN201580043288.3A CN201580043288A CN106659449B CN 106659449 B CN106659449 B CN 106659449B CN 201580043288 A CN201580043288 A CN 201580043288A CN 106659449 B CN106659449 B CN 106659449B
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dark
signal
forward model
image
model
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CN106659449A (zh
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T·克勒
B·J·布伦德尔
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Koninklijke Philips NV
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/041—Phase-contrast imaging, e.g. using grating interferometers
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/48—Diagnostic techniques
    • A61B6/484—Diagnostic techniques involving phase contrast X-ray imaging
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/52—Devices using data or image processing specially adapted for radiation diagnosis
    • A61B6/5258—Devices using data or image processing specially adapted for radiation diagnosis involving detection or reduction of artifacts or noise
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T11/00—2D [Two Dimensional] image generation
    • G06T11/003—Reconstruction from projections, e.g. tomography
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/401—Imaging image processing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph

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  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Medical Informatics (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • General Physics & Mathematics (AREA)
  • Surgery (AREA)
  • Biophysics (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Molecular Biology (AREA)
  • Optics & Photonics (AREA)
  • Animal Behavior & Ethology (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Biomedical Technology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Pulmonology (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CN201580043288.3A 2014-08-13 2015-08-04 断层摄影中的定量暗场成像 Expired - Fee Related CN106659449B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP14180751.1 2014-08-13
EP14180751 2014-08-13
PCT/EP2015/067864 WO2016023782A1 (en) 2014-08-13 2015-08-04 Quantitative dark–field imaging in tomography

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CN106659449A CN106659449A (zh) 2017-05-10
CN106659449B true CN106659449B (zh) 2020-11-24

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US (1) US10339674B2 (enExample)
EP (1) EP3180603B8 (enExample)
JP (1) JP6637485B2 (enExample)
CN (1) CN106659449B (enExample)
WO (1) WO2016023782A1 (enExample)

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CN104318536B (zh) * 2014-10-21 2018-03-20 沈阳东软医疗系统有限公司 Ct图像的校正方法及装置
EP3510563B1 (en) 2016-09-08 2021-11-10 Koninklijke Philips N.V. Improved phase-contrast and dark-field ct reconstruction algorithm
EP3516351A1 (de) * 2016-09-26 2019-07-31 LaVision BioTec GmbH Messeinrichtung und verfahren zur charakterisierung eines strahlungsfeldes, insbesondere von laserstrahlung
JP6753342B2 (ja) * 2017-03-15 2020-09-09 株式会社島津製作所 放射線格子検出器およびｘ線検査装置
CN107238616B (zh) * 2017-06-22 2019-10-11 合肥工业大学 基于中子光栅干涉仪的暗场成像方法
EP3435325A1 (en) 2017-07-26 2019-01-30 Koninklijke Philips N.V. Scatter correction for dark field imaging
JP6943090B2 (ja) * 2017-09-05 2021-09-29 株式会社島津製作所 Ｘ線イメージング装置
CN108896588B (zh) * 2018-06-08 2020-11-20 中北大学 一种多孔介质微观结构的测量方法
JP6992902B2 (ja) * 2018-08-24 2022-01-13 株式会社島津製作所 Ｘ線位相イメージング装置
WO2020090168A1 (ja) * 2018-10-31 2020-05-07 株式会社島津製作所 Ｘ線位相差撮影システム
US10679385B1 (en) * 2018-12-17 2020-06-09 General Electric Company System and method for statistical iterative reconstruction and material decomposition
EP4101388A1 (en) * 2021-06-08 2022-12-14 Universiteit Antwerpen A phase-contrast x-ray imaging system for obtaining a dark-field image and a method therefor
US20250130183A1 (en) * 2023-10-20 2025-04-24 Applied Materials, Inc. Determining tilt angle of substrate structures utilizing angular fourier decomposition of scattering images

Citations (2)

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CN102360498A (zh) * 2011-10-27 2012-02-22 江苏省邮电规划设计院有限责任公司 图像超分辨率重建方法
WO2014103269A1 (en) * 2012-12-27 2014-07-03 Canon Kabushiki Kaisha Computation apparatus, program, and x-ray imaging system

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US6990420B2 (en) * 2004-05-10 2006-01-24 Lsi Logic Corporation Method of estimating a local average crosstalk voltage for a variable voltage output resistance model
US8121249B2 (en) 2009-06-04 2012-02-21 Virginia Tech Intellectual Properties, Inc. Multi-parameter X-ray computed tomography
CN101943668B (zh) 2009-07-07 2013-03-27 清华大学 X射线暗场成像系统和方法
WO2012128335A1 (ja) * 2011-03-23 2012-09-27 コニカミノルタエムジー株式会社 医用画像表示システム
WO2013171657A1 (en) 2012-05-14 2013-11-21 Koninklijke Philips N.V. Dark field computed tomography imaging
WO2013187150A1 (ja) * 2012-06-11 2013-12-19 コニカミノルタ株式会社 医用画像システム及び医用画像処理装置
EP2867655B1 (en) 2012-06-27 2019-05-08 Koninklijke Philips N.V. Dark-field imaging
JP6079204B2 (ja) 2012-12-18 2017-02-15 コニカミノルタ株式会社 医用画像システム
US8989347B2 (en) * 2012-12-19 2015-03-24 General Electric Company Image reconstruction method for differential phase contrast X-ray imaging
US10096098B2 (en) * 2013-12-30 2018-10-09 Carestream Health, Inc. Phase retrieval from differential phase contrast imaging

Patent Citations (2)

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CN102360498A (zh) * 2011-10-27 2012-02-22 江苏省邮电规划设计院有限责任公司 图像超分辨率重建方法
WO2014103269A1 (en) * 2012-12-27 2014-07-03 Canon Kabushiki Kaisha Computation apparatus, program, and x-ray imaging system

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Publication number Publication date
EP3180603B8 (en) 2020-04-01
JP6637485B2 (ja) 2020-01-29
EP3180603A1 (en) 2017-06-21
WO2016023782A1 (en) 2016-02-18
EP3180603B1 (en) 2020-02-12
US20170213365A1 (en) 2017-07-27
US10339674B2 (en) 2019-07-02
CN106659449A (zh) 2017-05-10
JP2017524139A (ja) 2017-08-24

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