JP6598673B2 - データ処理装置およびその方法 - Google Patents
データ処理装置およびその方法 Download PDFInfo
- Publication number
- JP6598673B2 JP6598673B2 JP2015252404A JP2015252404A JP6598673B2 JP 6598673 B2 JP6598673 B2 JP 6598673B2 JP 2015252404 A JP2015252404 A JP 2015252404A JP 2015252404 A JP2015252404 A JP 2015252404A JP 6598673 B2 JP6598673 B2 JP 6598673B2
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- JP
- Japan
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- image data
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- shape
- image
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- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/50—Depth or shape recovery
- G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2504—Calibration devices
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T5/00—Image enhancement or restoration
- G06T5/50—Image enhancement or restoration using two or more images, e.g. averaging or subtraction
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10028—Range image; Depth image; 3D point clouds
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Optics & Photonics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2015252404A JP6598673B2 (ja) | 2015-12-24 | 2015-12-24 | データ処理装置およびその方法 |
| EP16802161.6A EP3394830B1 (en) | 2015-12-24 | 2016-11-11 | Data processing apparatus and method of controlling same |
| PCT/JP2016/083538 WO2017110293A1 (en) | 2015-12-24 | 2016-11-11 | Data processing apparatus and method of controlling same |
| US15/767,844 US10664981B2 (en) | 2015-12-24 | 2016-11-11 | Data processing apparatus and method of controlling same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2015252404A JP6598673B2 (ja) | 2015-12-24 | 2015-12-24 | データ処理装置およびその方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2017116420A JP2017116420A (ja) | 2017-06-29 |
| JP2017116420A5 JP2017116420A5 (OSRAM) | 2019-02-14 |
| JP6598673B2 true JP6598673B2 (ja) | 2019-10-30 |
Family
ID=57421919
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2015252404A Active JP6598673B2 (ja) | 2015-12-24 | 2015-12-24 | データ処理装置およびその方法 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US10664981B2 (OSRAM) |
| EP (1) | EP3394830B1 (OSRAM) |
| JP (1) | JP6598673B2 (OSRAM) |
| WO (1) | WO2017110293A1 (OSRAM) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6598673B2 (ja) * | 2015-12-24 | 2019-10-30 | キヤノン株式会社 | データ処理装置およびその方法 |
| JP2019058993A (ja) * | 2017-09-27 | 2019-04-18 | セイコーエプソン株式会社 | ロボットシステム |
| JP2019159872A (ja) * | 2018-03-14 | 2019-09-19 | セイコーエプソン株式会社 | 演算装置、演算装置の制御方法、および、コンピュータープログラム |
| US11040452B2 (en) * | 2018-05-29 | 2021-06-22 | Abb Schweiz Ag | Depth sensing robotic hand-eye camera using structured light |
| KR102596053B1 (ko) * | 2018-08-27 | 2023-11-01 | 엘지이노텍 주식회사 | 영상 처리 장치 및 영상 처리 방법 |
| US11107268B2 (en) * | 2018-09-07 | 2021-08-31 | Cognex Corporation | Methods and apparatus for efficient data processing of initial correspondence assignments for three-dimensional reconstruction of an object |
| WO2020262389A1 (ja) * | 2019-06-28 | 2020-12-30 | キヤノン株式会社 | 計測装置、撮像装置、計測システム、制御方法及びプログラム |
| JP7452121B2 (ja) * | 2020-03-12 | 2024-03-19 | オムロン株式会社 | 検査装置及び検査方法 |
| CN118786325A (zh) * | 2022-03-30 | 2024-10-15 | 松下知识产权经营株式会社 | 视差信息生成装置及视差信息生成方法 |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6028826A (en) * | 1996-09-18 | 2000-02-22 | Matsushita Electric Industrial Co., Ltd. | Optical disk apparatus performing correction of phase difference tracking error signal, adjustment of focus position and process of gain adjustment |
| JP3708877B2 (ja) * | 2001-05-01 | 2005-10-19 | 松下電器産業株式会社 | フォトマスク |
| US7063923B2 (en) * | 2002-07-11 | 2006-06-20 | United Electronics Corp. | Optical proximity correction method |
| WO2005029050A1 (ja) * | 2003-09-17 | 2005-03-31 | Photonic Lattice Inc. | 偏光解析装置および偏光解析方法 |
| US8265343B2 (en) * | 2006-12-25 | 2012-09-11 | Nec Corporation | Apparatus, method and program for distance measurement |
| JP2009180708A (ja) * | 2008-02-01 | 2009-08-13 | Nikon Corp | 形状測定方法及び形状測定装置 |
| JP2009210509A (ja) | 2008-03-06 | 2009-09-17 | Roland Dg Corp | 3次元形状測定装置および3次元形状測定コンピュータプログラム |
| KR101129025B1 (ko) * | 2009-06-25 | 2012-03-23 | 주식회사 하이닉스반도체 | 위상반전마스크의 위상차 에러 보정방법 |
| JP5457825B2 (ja) * | 2009-12-24 | 2014-04-02 | ローランドディー.ジー.株式会社 | 3次元形状計測方法および3次元形状計測装置 |
| JP6507509B2 (ja) * | 2014-07-18 | 2019-05-08 | ソニー株式会社 | 流路撮像装置及び流路撮像方法 |
| JP6598673B2 (ja) * | 2015-12-24 | 2019-10-30 | キヤノン株式会社 | データ処理装置およびその方法 |
| US9858672B2 (en) * | 2016-01-15 | 2018-01-02 | Oculus Vr, Llc | Depth mapping using structured light and time of flight |
| TWI651513B (zh) * | 2016-11-15 | 2019-02-21 | 財團法人工業技術研究院 | 三維量測系統及其方法 |
| KR102464368B1 (ko) * | 2017-11-07 | 2022-11-07 | 삼성전자주식회사 | 메타 프로젝터 및 이를 포함하는 전자 장치 |
-
2015
- 2015-12-24 JP JP2015252404A patent/JP6598673B2/ja active Active
-
2016
- 2016-11-11 US US15/767,844 patent/US10664981B2/en active Active
- 2016-11-11 EP EP16802161.6A patent/EP3394830B1/en active Active
- 2016-11-11 WO PCT/JP2016/083538 patent/WO2017110293A1/en not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| US20180315205A1 (en) | 2018-11-01 |
| JP2017116420A (ja) | 2017-06-29 |
| US10664981B2 (en) | 2020-05-26 |
| WO2017110293A1 (en) | 2017-06-29 |
| EP3394830B1 (en) | 2024-04-17 |
| EP3394830A1 (en) | 2018-10-31 |
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