JP6572979B2 - 製造設備診断支援装置及び製造設備診断支援方法 - Google Patents

製造設備診断支援装置及び製造設備診断支援方法 Download PDF

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JP6572979B2
JP6572979B2 JP2017565020A JP2017565020A JP6572979B2 JP 6572979 B2 JP6572979 B2 JP 6572979B2 JP 2017565020 A JP2017565020 A JP 2017565020A JP 2017565020 A JP2017565020 A JP 2017565020A JP 6572979 B2 JP6572979 B2 JP 6572979B2
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data
feature
manufacturing facility
feature amount
abnormality detection
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JPWO2017134772A1 (ja
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手塚　知幸
知幸 手塚
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Toshiba Mitsubishi Electric Industrial Systems Corp
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Toshiba Mitsubishi Electric Industrial Systems Corp
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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0221—Preprocessing measurements, e.g. data collection rate adjustment; Standardization of measurements; Time series or signal analysis, e.g. frequency analysis or wavelets; Trustworthiness of measurements; Indexes therefor; Measurements using easily measured parameters to estimate parameters difficult to measure; Virtual sensor creation; De-noising; Sensor fusion; Unconventional preprocessing inherently present in specific fault detection methods like PCA-based methods
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/20—Pc systems
    • G05B2219/24—Pc safety
    • G05B2219/24063—Select signals as function of priority, importance for diagnostic

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Testing And Monitoring For Control Systems (AREA)
  • General Factory Administration (AREA)
JP2017565020A 2016-02-03 2016-02-03 製造設備診断支援装置及び製造設備診断支援方法 Active JP6572979B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2016/053233 WO2017134772A1 (ja) 2016-02-03 2016-02-03 製造設備診断支援装置及び製造設備診断支援方法

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JPWO2017134772A1 JPWO2017134772A1 (ja) 2018-05-17
JP6572979B2 true JP6572979B2 (ja) 2019-09-11

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JP2017565020A Active JP6572979B2 (ja) 2016-02-03 2016-02-03 製造設備診断支援装置及び製造設備診断支援方法

Country Status (5)

Country Link
JP (1) JP6572979B2 (zh)
KR (1) KR102042368B1 (zh)
CN (1) CN107949813B (zh)
TW (1) TWI615694B (zh)
WO (1) WO2017134772A1 (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20220018553A (ko) 2020-07-01 2022-02-15 도시바 미쓰비시덴키 산교시스템 가부시키가이샤 제조 설비의 진단 지원 장치

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7091743B2 (ja) * 2018-03-16 2022-06-28 株式会社リコー 情報処理装置、情報処理方法、プログラム、および機械装置
JP6777686B2 (ja) * 2018-05-29 2020-10-28 ファナック株式会社 診断装置、診断方法及び診断プログラム
CN112567306A (zh) * 2018-08-31 2021-03-26 东芝三菱电机产业系统株式会社 制造过程监视装置
EP3663011A1 (de) * 2018-12-05 2020-06-10 Primetals Technologies Austria GmbH Erfassen und übertragen von daten eines lagers eines stahl- oder walzwerks
JP7226103B2 (ja) * 2019-05-29 2023-02-21 オムロン株式会社 制御システム、サポート装置およびサポートプログラム
WO2021220323A1 (ja) * 2020-04-27 2021-11-04 三菱電機株式会社 状態判定装置
WO2022049701A1 (ja) * 2020-09-03 2022-03-10 三菱電機株式会社 機器分析装置、機器分析方法および機器分析プログラム
JP7468376B2 (ja) * 2021-01-21 2024-04-19 株式会社Tmeic ロール管理装置
CN114789200B (zh) * 2021-10-14 2024-02-09 天津市新宇彩板有限公司 冷轧机组故障自诊断并记录的方法及系统
CN114265390B (zh) * 2021-12-22 2024-02-20 苏州华星光电技术有限公司 设备数据采集诊断方法、装置、服务器及存储介质

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4458349B2 (ja) * 2004-08-27 2010-04-28 日立アプライアンス株式会社 機器診断装置、その動作プログラム、機器診断方法
US7622308B2 (en) * 2008-03-07 2009-11-24 Mks Instruments, Inc. Process control using process data and yield data
JP5156452B2 (ja) * 2008-03-27 2013-03-06 東京エレクトロン株式会社 欠陥分類方法、プログラム、コンピュータ記憶媒体及び欠陥分類装置
TWI385492B (zh) * 2008-12-16 2013-02-11 Ind Tech Res Inst 機台設備的維護分析系統及其方法
JP5427107B2 (ja) * 2010-05-20 2014-02-26 株式会社日立製作所 監視診断装置および監視診断方法
CN101937207B (zh) * 2010-08-27 2012-09-05 上海交通大学 机械设备状态的智能可视化监测与诊断方法
JP5565357B2 (ja) 2011-03-24 2014-08-06 新日鐵住金株式会社 設備診断装置、設備診断方法、設備診断プログラムおよびこれを記録したコンピュータ読み取り可能な記録媒体
JP5821363B2 (ja) * 2011-07-27 2015-11-24 東芝三菱電機産業システム株式会社 製品欠陥要因分析装置
US10996662B2 (en) 2014-05-20 2021-05-04 Toshiba Mitsubishi-Electric Industrial Systems Corporation Manufacturing equipment diagnosis support system

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20220018553A (ko) 2020-07-01 2022-02-15 도시바 미쓰비시덴키 산교시스템 가부시키가이샤 제조 설비의 진단 지원 장치
TWI789699B (zh) * 2020-07-01 2023-01-11 日商東芝三菱電機產業系統股份有限公司 製造設備的診斷支援裝置

Also Published As

Publication number Publication date
WO2017134772A1 (ja) 2017-08-10
TW201732475A (zh) 2017-09-16
TWI615694B (zh) 2018-02-21
KR20180026495A (ko) 2018-03-12
CN107949813B (zh) 2020-06-30
JPWO2017134772A1 (ja) 2018-05-17
KR102042368B1 (ko) 2019-11-07
CN107949813A (zh) 2018-04-20

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