JP6526811B2 - Iii族窒化物結晶を加工する方法 - Google Patents

Iii族窒化物結晶を加工する方法 Download PDF

Info

Publication number
JP6526811B2
JP6526811B2 JP2017529046A JP2017529046A JP6526811B2 JP 6526811 B2 JP6526811 B2 JP 6526811B2 JP 2017529046 A JP2017529046 A JP 2017529046A JP 2017529046 A JP2017529046 A JP 2017529046A JP 6526811 B2 JP6526811 B2 JP 6526811B2
Authority
JP
Japan
Prior art keywords
group iii
nitride
crystal
processing
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2017529046A
Other languages
English (en)
Japanese (ja)
Other versions
JP2017536325A (ja
Inventor
忠朗 橋本
忠朗 橋本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seoul Semicondutor Co Ltd
Seoul Semiconductor Co Ltd
Original Assignee
Seoul Semicondutor Co Ltd
Seoul Semiconductor Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seoul Semicondutor Co Ltd, Seoul Semiconductor Co Ltd filed Critical Seoul Semicondutor Co Ltd
Publication of JP2017536325A publication Critical patent/JP2017536325A/ja
Application granted granted Critical
Publication of JP6526811B2 publication Critical patent/JP6526811B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/10Inorganic compounds or compositions
    • C30B29/40AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
    • C30B29/403AIII-nitrides
    • C30B29/406Gallium nitride
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B25/00Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
    • C30B25/02Epitaxial-layer growth
    • C30B25/16Controlling or regulating
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B7/00Single-crystal growth from solutions using solvents which are liquid at normal temperature, e.g. aqueous solutions
    • C30B7/10Single-crystal growth from solutions using solvents which are liquid at normal temperature, e.g. aqueous solutions by application of pressure, e.g. hydrothermal processes
    • C30B7/105Single-crystal growth from solutions using solvents which are liquid at normal temperature, e.g. aqueous solutions by application of pressure, e.g. hydrothermal processes using ammonia as solvent, i.e. ammonothermal processes

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Inorganic Chemistry (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
JP2017529046A 2014-12-02 2015-12-02 Iii族窒化物結晶を加工する方法 Active JP6526811B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201462086699P 2014-12-02 2014-12-02
US62/086,699 2014-12-02
PCT/US2015/063528 WO2016090045A1 (en) 2014-12-02 2015-12-02 Group iii nitride crystals, their fabrication method, and method of fabricating bulk group iii nitride crystals in supercritical ammonia

Publications (2)

Publication Number Publication Date
JP2017536325A JP2017536325A (ja) 2017-12-07
JP6526811B2 true JP6526811B2 (ja) 2019-06-05

Family

ID=55024265

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2017529046A Active JP6526811B2 (ja) 2014-12-02 2015-12-02 Iii族窒化物結晶を加工する方法

Country Status (3)

Country Link
JP (1) JP6526811B2 (zh)
CN (1) CN107002278B (zh)
WO (1) WO2016090045A1 (zh)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9822465B2 (en) 2006-04-07 2017-11-21 Sixpoint Materials, Inc. Method of fabricating group III nitride with gradually degraded crystal structure
JP7117690B2 (ja) * 2017-09-21 2022-08-15 国立大学法人大阪大学 Iii-v族化合物結晶の製造方法および半導体装置の製造方法
JP6899958B2 (ja) * 2018-03-29 2021-07-07 日本碍子株式会社 13族元素窒化物層、自立基板、機能素子および13族元素窒化物層の製造方法
EP4108812A1 (en) 2021-06-24 2022-12-28 Instytut Wysokich Cisnien Polskiej Akademii Nauk A method for reducing a lateral growth of crystals
EP4144893A1 (en) * 2021-09-06 2023-03-08 Instytut Wysokich Cisnien Polskiej Akademii Nauk A method for reducing or eliminating cracks during crystal growing process and a shaped metal piece for use in this method

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5891008A (en) 1995-12-15 1999-04-06 The Procter & Gamble Company Sheet products for use in a pop-up dispenser and method for forming from stretched ribbons
US5890008A (en) 1997-06-25 1999-03-30 Sun Microsystems, Inc. Method for dynamically reconfiguring a processor
JP2000275303A (ja) 1999-03-23 2000-10-06 Mitsubishi Electric Corp バウンダリスキャンテスト方法及びバウンダリスキャンテスト装置
TWI277666B (en) 2001-06-06 2007-04-01 Ammono Sp Zoo Process and apparatus for obtaining bulk mono-crystalline gallium-containing nitride
IL161420A0 (en) 2001-10-26 2004-09-27 Ammono Sp Zoo Substrate for epitaxy
US7098487B2 (en) 2002-12-27 2006-08-29 General Electric Company Gallium nitride crystal and method of making same
US7118813B2 (en) * 2003-11-14 2006-10-10 Cree, Inc. Vicinal gallium nitride substrate for high quality homoepitaxy
WO2007008198A1 (en) 2005-07-08 2007-01-18 The Regents Of The University Of California Method for growing group iii-nitride crystals in supercritical ammonia using an autoclave
EP2004882A2 (en) 2006-04-07 2008-12-24 The Regents of the University of California Growing large surface area gallium nitride crystals
US9202872B2 (en) * 2006-04-07 2015-12-01 Sixpoint Materials, Inc. Method of growing group III nitride crystals
US8236237B2 (en) 2006-07-25 2012-08-07 Fiore Industries, Inc. Method and apparatus for destruction of biological and chemical agents
WO2009149299A1 (en) * 2008-06-04 2009-12-10 Sixpoint Materials Methods for producing improved crystallinty group iii-nitride crystals from initial group iii-nitride seed by ammonothermal growth
JP5197283B2 (ja) * 2008-10-03 2013-05-15 国立大学法人東京農工大学 窒化アルミニウム単結晶基板、積層体、およびこれらの製造方法
CN101962804B (zh) * 2010-10-30 2012-05-02 北京大学 基于外延材料应力控制的GaN厚膜自分离方法
CN103305909B (zh) * 2012-03-14 2016-01-20 东莞市中镓半导体科技有限公司 一种用于GaN生长的复合衬底的制备方法
US10611008B2 (en) 2016-11-20 2020-04-07 Custom Molded Products, Llc Installation tools for a water containing structure, components suitable for use therewith, and systems and methods of use therefor

Also Published As

Publication number Publication date
CN107002278A (zh) 2017-08-01
JP2017536325A (ja) 2017-12-07
CN107002278B (zh) 2019-07-09
WO2016090045A1 (en) 2016-06-09

Similar Documents

Publication Publication Date Title
US9985102B2 (en) Methods for producing improved crystallinity group III-nitride crystals from initial group III-nitride seed by ammonothermal growth
US9670594B2 (en) Group III nitride crystals, their fabrication method, and method of fabricating bulk group III nitride crystals in supercritical ammonia
JP6578570B2 (ja) Iii族窒化物半導体結晶基板の製造方法
JP5496007B2 (ja) 高品質ホモエピタキシ用微傾斜窒化ガリウム基板
US20070138505A1 (en) Low defect group III nitride films useful for electronic and optoelectronic devices and methods for making the same
JP6526811B2 (ja) Iii族窒化物結晶を加工する方法
JP4603386B2 (ja) 炭化珪素単結晶の製造方法
US9202872B2 (en) Method of growing group III nitride crystals
JP2006290677A (ja) 窒化物系化合物半導体結晶の製造方法及び窒化物系化合物半導体基板の製造方法
US20140087209A1 (en) Method of growing group iii nitride crystals
EP3094766B1 (en) Group iii nitride bulk crystals and fabrication method
US9834863B2 (en) Group III nitride bulk crystals and fabrication method
JP2005200250A (ja) 窒化物半導体結晶の製造方法及び窒化物半導体基板の製造方法
JP2019011245A (ja) ビスマスでドープされた半絶縁iii族窒化物ウエハおよびその生産方法
EP3191626A1 (en) Substrates for growing group iii nitride crystals and their fabrication method
WO2015179852A1 (en) Group iii nitride bulk crystals and their fabrication method

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20170705

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20180620

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20180727

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20181203

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20181228

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20190507

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20190508

R150 Certificate of patent or registration of utility model

Ref document number: 6526811

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250