JP6495110B2 - Resistance measuring device - Google Patents

Description

  The present invention relates to a resistance measuring apparatus configured to be able to measure a resistance value of a measurement target in any one of a plurality of measurement ranges.

  For example, an impedance measuring instrument (hereinafter also simply referred to as “measuring instrument”) disclosed in the following patent document has nine measurement ranges of 10Ω, 100Ω, 1 kΩ, 10 kΩ, 100 kΩ, 1 MΩ, 10 MΩ, 100 MΩ, and 1000 MΩ. A configuration is employed in which a measurement unit that includes a measurement unit and that automatically selects a measurement range that matches a predetermined condition from among the measurement ranges in accordance with the resistance value of the measurement target is employed. In this case, in this type of measuring device, as an example, the current value of the measurement current supplied to the measurement object during the measurement process is defined in advance for each measurement range.

  Specifically, as an example, the measurement current in the 10Ω range and the 100Ω range is defined as 10 mA, the measurement current in the 1 kΩ range and the 10 kΩ range is defined as 1 mA, and the measurement current in the 100 kΩ range is defined as 100 μA, The measurement current for the 1 MΩ range is defined as 10 μA, the measurement current for the 10 MΩ range is defined as 1 μA, the measurement current for the 100 MΩ range is defined as 100 nA, and the measurement current for the 1000 MΩ range is defined as 10 nA. .

  In addition, in this measuring instrument, by specifying in advance the measurement range to be switched from among the above nine measurement ranges, the measurement range that matches the conditions is selected from the measurement ranges specified as the switching target. A configuration that is automatically selected is adopted. As an example, when four measurement ranges of 1 kΩ, 10 kΩ, 100 kΩ, and 1 MΩ are designated for switching, the conditions specified in advance while switching from the 1 MΩ range to the lower measurement range (measurement range on the low resistance side) in order. A configuration is adopted in which a measurement range matching the above is specified and measurement processing is executed.

  At this time, as an example, when the above four measurement ranges are designated as switching targets, and measurement for a resistor having a resistance value of 4 kΩ is started, the 10 kΩ range passes through the 1 MΩ range and 100 kΩ. The resistance value of 4 kΩ is measured in the state where the switching is made. Thereby, the measurement process of the resistance value to be measured is completed.

Japanese Patent Laid-Open No. 5-288778 (page 2-3, FIG. 1-2)

  However, the conventional measuring instrument has the following problems to be solved. That is, in the conventional measuring instrument, in the state where the measurement range is switched in order from the measurement range on the highest resistance side of the measurement range specified as the switching target, and the measurement range is switched to the measurement range that satisfies the predefined condition, A configuration for measuring a resistance value to be measured is employed. In this case, in the above example for a resistor having a resistance value of 4 kΩ, a measurement current of 10 μA is supplied in the 1 MΩ range, so that a voltage of 0.04 V is applied to the measurement target, and in the 100 kΩ range, When a measurement current of 100 μA is supplied, a voltage of 0.4 V is applied to the measurement object, and when a measurement current of 1 mA is supplied in the 10 kΩ range, a voltage of 4 V is applied to the measurement object. Will be.

  On the other hand, for example, when measuring a resistor having a resistance value of 8 kΩ, the resistance value is 8 kΩ in a state where the resistance is switched to the 10 kΩ range via the 1 MΩ range and 100 kΩ in the same manner as the measurement of the 4 kΩ resistor. Is measured. At this time, a measurement current of 10 μA is supplied in the 1 MΩ range to apply a voltage of 0.08 V to the measurement target, and a measurement current of 100 μA is supplied to the measurement target in the 100 kΩ range. On the other hand, when a voltage of 0.8 V is applied and a measurement current of 1 mA is supplied in the 10 kΩ range, a voltage of 8 V is applied to the measurement target.

  In this case, for example, there are resistors having a small voltage value with a rated voltage of about 5V among the resistors as measurement objects. However, for example, for a resistor having a rated voltage of 5 V and a resistance value of 4 kΩ, a measurement current of 1 mA is applied when the maximum value of the voltage applied by supplying the measurement current is switched to the 10 kΩ range. Although the voltage value exceeding the rated voltage is not applied at 4V when the voltage is supplied, the resistance of the rated voltage of 5V and the resistance value of 8kΩ is measured at 1mA when switched to the 10kΩ range. By supplying a working current, a voltage of 8V exceeding the rated voltage is applied. For this reason, the conventional measuring instrument has a problem that when a resistor or the like having a small rated voltage value is to be measured, the measurement object may be damaged depending on the resistance value.

  On the other hand, in order to avoid the damage of the measurement target as described above, the user calculates the voltage value applied to the measurement target prior to the measurement work to determine whether or not the rated voltage is exceeded. When the measured voltage value exceeds the rated voltage, it is necessary to manually specify the measurement range on the high resistance side that is specified to supply a measurement current with a small current value. However, in particular, for users who are unfamiliar with resistance measurement work using this type of measuring instrument (measuring device), it is possible to grasp the current value of the measurement current defined for each measurement range, It is difficult to accurately calculate the voltage value of the voltage applied at the time of measurement based on the grasped current value and the resistance value of the measurement target. Therefore, there is a current situation that it is difficult to reliably avoid damage to the measurement object.

  The present invention has been made in view of such problems, and a main object of the present invention is to provide a resistance measuring apparatus that can reliably and easily measure the resistance value without causing damage to the measurement target.

  In order to achieve the above object, the resistance measuring device according to claim 1 is the resistance measuring range of any one of a plurality of types of resistance measuring ranges in which the current value of the measurement current supplied to the measurement target is defined in advance. A resistance measurement apparatus comprising: a measurement unit that measures the resistance value of the measurement target; and a processing unit that controls the measurement unit and designates one of the resistance measurement ranges to measure the resistance value of the measurement target. When the maximum voltage value that is allowed to be applied to the measurement object and the maximum resistance value that can be measured for the measurement object are specified, the processing unit is within the measurable range. First processing for specifying the resistance measurement range on the lowest resistance side among the resistance measurement ranges included, and the measurement current defined in the specified resistance measurement range before the maximum resistance value A second process for calculating a voltage value of a voltage applied to the measurement object when supplied to the measurement object. When the voltage value calculated in the second process is equal to or less than the maximum voltage value, the first process is performed. Specifying the resistance measurement range specified in the process to measure the resistance value of the measurement object, and when the voltage value calculated in the second process exceeds the maximum voltage value, the specified in the first process The resistance value of the measurement object is measured by designating the resistance measurement range on the high resistance side that is specified to supply the measurement current having a current value smaller than the resistance measurement range.

  The resistance measurement device according to claim 2 is the resistance measurement device according to claim 1, wherein the processing unit is configured to specify a tolerance of the reference resistance value of the measurement target and the resistance value of the measurement target. A third process for calculating the maximum resistance value based on the designated reference resistance value and the permissible error is executed prior to the first process.

  Furthermore, the resistance measuring device according to claim 3 is the resistance measuring device according to claim 2, wherein the processing unit is configured such that the resistance value of the measurement object measured by the measuring unit is equal to the allowable error with respect to the reference resistance value. The measurement result notification process is performed to notify whether or not the resistance value is within the range.

  In the resistance measuring apparatus according to claim 1, when the maximum voltage value and the maximum resistance value for the measurement target are designated, the processing unit is the largest in each resistance measurement range included in the measurable range. A first process for specifying a resistance measurement range on the low resistance side, and a second process for calculating a voltage value of a voltage applied when a measurement current in the specified resistance measurement range is supplied to a measurement target of the maximum resistance value; When the calculated voltage value is less than or equal to the maximum voltage value, the resistance measurement range specified in the first process is designated. When the calculated voltage value exceeds the maximum voltage value, the resistance specified in the first process is specified. The resistance value of the object to be measured is measured by specifying a resistance measurement range on the high resistance side that is specified to supply a measurement current having a current value smaller than the measurement range.

  Therefore, according to the resistance measuring apparatus of the first aspect, the resistance that supplies the measurement current having the current value that does not exceed the maximum voltage value only by designating the maximum voltage value and the maximum resistance value prior to the measurement process. Since the measurement range is automatically specified and the resistance value is measured, there is no need to calculate the voltage value of the voltage applied to the measurement target or manually switch the resistance measurement range. Even a user who is unfamiliar with the measurement of the resistance value using the apparatus can reliably and easily measure the resistance value without causing damage to the measurement object.

  According to the resistance measuring apparatus of the second aspect, when the reference resistance value to be measured and its allowable error are specified, the processing unit calculates the maximum resistance value based on the specified reference resistance value and allowable error. By executing the third process to be performed prior to the first process, the maximum resistance value is calculated simply by specifying the reference resistance value defined for the measurement object and its allowable error, and depending on the calculation result Since a resistance measurement range that does not apply a voltage exceeding the maximum voltage value is automatically selected, even users who are unfamiliar with measuring resistance values using this type of device can damage the measurement target. Therefore, the resistance value can be measured reliably and more easily.

  According to the resistance measuring apparatus of the third aspect, the processing unit can specify whether or not the resistance value of the measurement target measured by the measuring unit is a resistance value within a tolerance of the reference resistance value. By executing the measurement result notification process to notify, the resistance value range specified based on the reference resistance value and the allowable error is compared with the measurement result by the measurement unit to determine whether or not the measurement target is a non-defective product Therefore, even users who are unfamiliar with measurement work using this type of device (work to check the quality of the measurement object) can reliably and easily determine whether the measurement object is a non-defective product. Can be inspected.

1 is a configuration diagram showing a configuration of a resistance measuring device 1. FIG. It is explanatory drawing for demonstrating the electric current value of the electric current for a measurement prescribed | regulated for each resistance measurement range.

  Embodiments of a resistance measuring device according to the present invention will be described below with reference to the accompanying drawings.

  The resistance measurement apparatus 1 shown in FIG. 1 is an example of a “resistance measurement apparatus”, and includes a measurement unit 2, an operation unit 3, a display unit 4, a storage unit 5, and a processing unit 6. Measurement is possible.

  Under the control of the processing unit 6, the measurement unit 2 is configured to supply a measurement current from a constant current source (not shown) to the measurement target X via a pair of test leads (not shown). Measure. The measurement unit 2 calculates the resistance value of the measurement target X based on the measured voltage value and the current value of the supplied measurement current, and outputs the calculation result to the processing unit 6 as measurement value data D. In addition, as shown in FIG. 2, the measurement unit 2 has 10 types of 100 mΩ range, 1000 mΩ range, 10Ω range, 100Ω range, 1000Ω range, 1000 kΩ range, 100 kΩ range, 100 kΩ range, 1000 kΩ range, 10 MΩ range, and 100 MΩ range, for example. Has a resistance measurement range.

  In this case, in the measurement unit 2 in the resistance measuring apparatus 1 of this example, as an example, the measurement current in the 100 mΩ range and the 1000 mΩ range is defined as 100 mA, the measurement current in the 10Ω range and the 100Ω range is defined as 10 mA, and 1000Ω. The measurement current of the range and the 10 kΩ range is defined as 1 mA, the measurement current of the 100 kΩ range is defined as 100 μA, the measurement current of the 1000 kΩ range is defined as 10 μA, and the measurement current of the 10 MΩ range is defined as 1 μA, The measurement current in the 100 MΩ range is defined as 100 nA.

  The operation unit 3 includes an operation switch for performing an input operation of measurement conditions, an operation switch for instructing measurement start / stop, and manually switching the measurement range, and an operation signal corresponding to the switch operation. Output to the processing unit 6. The display unit 4 displays various display screens such as a measurement condition setting screen and a measurement result display screen, which will be described later, under the control of the processing unit 6. The storage unit 5 stores an operation program of the processing unit 6, measurement value data D, and the like.

  The processing unit 6 controls the resistance measuring apparatus 1 as a whole. Specifically, as will be described later, the processing unit 6 controls the measurement unit 2 based on a specified condition, thereby specifying any one of the resistance measurement ranges described above and the measurement target X. Let the resistance value be measured. The processing unit 6 stores the measurement value data D output from the measurement unit 2 in the storage unit 5 and displays a resistance value (measurement result by the measurement unit 2) specified based on the measurement value data D as a display unit. 4 is displayed.

  Furthermore, in the resistance measuring apparatus 1 of the present example, not only the process of measuring the resistance values of various “measurement objects”, but also inspects whether or not the resistors of “measurement objects (inspection objects)” are non-defective products. It is configured to be able to. Specifically, the processing unit 6 determines whether or not the resistance value specified based on the measurement value data D is within the range of “allowable error” with respect to the “reference resistance value” specified in advance. A “measurement result notification process” for notifying the determination result is executed.

  When measuring the resistance value of the chip resistance which is an example of the “measurement object (inspection object)” using the resistance measurement apparatus 1 and inspecting the quality, first, the operation unit 3 is operated to measure the measurement condition ( A setting screen of (inspection conditions) is displayed on the display unit 4. In this case, in the resistance measuring apparatus 1 of this example, by enabling the “volt limit function” on this setting screen, the upper limit value (maximum voltage value) of the voltage applied to the measurement target X when measuring the resistance value is set. It is possible to restrict. Further, when the “volt limit function” is validated, as an example, it is possible to select which of the 5V, 12V, and 30V voltage values to be applied.

  At this time, when the rated voltage of the measuring object X is defined as 5 V, the operation unit 3 is operated to enable the “volt limit function” and “5 V” is selected from the candidates for the “maximum voltage value”. (An example of “when [the maximum voltage value allowed to be applied to the measurement target] is specified”).

  Next, the operation unit 3 is operated to input the “reference resistance value” of the measurement object X and its “allowable error”. In this case, as an example, a “reference resistance value” of “4 kΩ” and an “allowable error” of “± 4%” are input (“[maximum resistance value that can be measured for a measurement object] is designated. Is an example of “when the [tolerance of the reference resistance value to be measured and the resistance value to be measured] is designated”). In response to this, the processing unit 6 calculates the “maximum resistance value” of the measurement object X based on the designated “reference resistance value” and “allowable error” (an example of “third process”). In this case, the value “4 kΩ + 4 kΩ × 4% = 4.16 kΩ” is calculated as the “maximum resistance value”.

  Subsequently, the processing unit 6 specifies the resistance measurement range on the lowest resistance side among the resistance measurement ranges in which the calculated “maximum resistance value (4.16 kΩ in this example)” is included in the measurable range ( Example of “first process”). At this time, there are five resistance measurement ranges capable of measuring a resistance value of “4.16 kΩ”, namely, a 10 kΩ range, a 100 kΩ range, a 1000 kΩ range, a 10 MΩ range, and a 100 MΩ range. The range is specified as the resistance measurement range on the lowest resistance side.

  Next, the processing unit 6 calculates the voltage value of the voltage applied to the measurement target X when the measurement current defined in the specified resistance measurement range is supplied to the measurement target X having the “maximum resistance value” ( Example of “second process”). At this time, since the current value of the measurement current in the 10 kΩ range is “1 mA” and the maximum resistance value of the measurement target X is “4.16 kΩ”, a voltage value of “4.16 V” is calculated.

  Subsequently, the processing unit 6 determines whether the calculated voltage value is equal to or less than the “maximum voltage value” defined for the measurement target X or exceeds the “maximum voltage value”. At this time, the rated voltage (maximum voltage value) specified for the measurement target X is “5 V”, and “1 mA” is measured for the measurement target X of “4.16 kΩ” of “maximum resistance value”. Since the voltage value of the voltage applied by supplying the measurement current is “4.16 V”, the processing unit 6 determines that the calculated voltage value is equal to or less than the “maximum voltage value” (“second processing” An example of “when the voltage value calculated in step is equal to or less than the maximum voltage value”).

  At this time, the processing unit 6 controls the measurement unit 2 so that the “maximum resistance value” of the measurement target X is the lowest resistance measurement range in the resistance measurement range included in the measurable range. Specify the specified 10 kΩ range and measure the resistance value. In response to this, the measurement unit 2 measures the voltage value between both electrodes while supplying a measurement current of “1 mA” between both electrodes in the measurement target X. As a result, even if the resistance value of the measurement target X is the maximum value within the range of “allowable error” with respect to the “reference resistance value” (in this example, “4.16 kΩ”), it is applied to the measurement target X. The maximum voltage is 4.16 V, and the voltage value is measured without exceeding the rated voltage. The measurement unit 2 calculates the resistance value of the measurement target X based on the measured voltage value and the current value of the supplied measurement current, and outputs the calculation result to the processing unit 6 as measurement value data D.

  In response to this, the processing unit 6 stores the output measurement value data D in the storage unit 5 and displays the resistance value specified based on the measurement value data D on the display unit 4 (not shown). . Further, the processing unit 6 determines whether or not the resistance value specified based on the measurement value data D is a resistance value within a range of “allowable error” with respect to the “reference resistance value”.

  At this time, in this example in which an “allowable error” of “± 4%” is defined with respect to a “reference resistance value” of “4 kΩ”, the processing unit 6 has a specified resistance value of “3”. When the resistance value is within a range of “.84 kΩ or more and 4.16 kΩ or less”, a character string indicating a resistance value specified based on the measured value data D (a character string “4.01 kΩ” as an example) and “ The character string “Pass” is displayed on the display unit 4 (an example of “measurement result notification process” for specifying that “the resistance value is within the allowable error range with respect to the reference resistance value”), and the measurement target The measurement process (inspection process) for X (chip resistance) is terminated.

  In addition, the processing unit 6 is a character string indicating a resistance value specified based on the measured value data D when the specified resistance value is not a resistance value in the range of “3.84 kΩ to 4.16 kΩ”. (For example, a character string “3.75 kΩ”) and a character string “Fail” are displayed on the display unit 4 (it is possible to specify that the resistance value is not within the allowable error range with respect to the reference resistance value). An example of the “measurement result notification process” to be notified), and the measurement process (inspection process) for the measurement target X (chip resistance) is terminated.

  On the other hand, for example, when executing a measurement process (inspection process) in which a chip resistance of 8 kΩ ± 4% is set as “measurement object (inspection object)” instead of a chip resistance of 4 kΩ ± 4%, the operation unit 3 is used. Operate to input “reference resistance value” of “8 kΩ” and “tolerance” of “± 4%” (when “maximum resistance value that can be measured for measurement object” is specified) Another example, which is another example of “when a measurement target reference resistance value and a measurement target resistance value tolerance is specified”. In response to this, the processing unit 6 calculates the “maximum resistance value” of the measurement target X based on the designated “reference resistance value” and “allowable error” (another example of “third process”). In this case, the value “8 kΩ + 8 kΩ × 4% = 8.32 kΩ” is calculated as the “maximum resistance value”.

  Subsequently, the processing unit 6 specifies the resistance measurement range on the lowest resistance side among the resistance measurement ranges in which the calculated “maximum resistance value (8.32 kΩ in this example)” is included in the measurable range ( Another example of “first process”). At this time, there are five types of resistance measurement ranges capable of measuring a resistance value of “8.32 kΩ”: 10 kΩ range, 100 kΩ range, 1000 kΩ range, 10 MΩ range, and 100 MΩ range. The range is specified as the resistance measurement range on the lowest resistance side.

  Next, the processing unit 6 calculates the voltage value of the voltage applied to the measurement target X when the measurement current defined in the specified resistance measurement range is supplied to the measurement target X having the “maximum resistance value” ( Another example of “second process”). At this time, since the current value of the measurement current in the 10 kΩ range is “1 mA” and the maximum resistance value of the measurement target X is “8.32 kΩ”, a voltage value of “8.32 V” is calculated.

  Subsequently, the processing unit 6 determines whether the calculated voltage value is equal to or less than the “maximum voltage value” defined for the measurement target X or exceeds the “maximum voltage value”. At this time, the rated voltage (maximum voltage value) specified for the measurement target X is “5 V”, and “1 mA” is measured for the measurement target X of “8.32 kΩ” of “maximum resistance value”. Since the voltage value of the voltage applied by supplying the measurement current is “8.32 V”, the processing unit 6 determines that the calculated voltage value exceeds the “maximum voltage value” (“second voltage”). An example of “when the voltage value calculated in the process exceeds the maximum voltage value”).

  At this time, the processing unit 6 has one “maximum resistance value” of the measurement target X that is specified as the resistance measurement range on the lowest resistance side among the resistance measurement ranges included in the measurable range. The current value of the measurement current specified in the 100 kΩ range on the high resistance side is specified. Further, the processing unit 6 calculates the voltage value of the voltage applied to the measurement target X when the measurement current having the specified current value is supplied to the measurement target X having the “maximum resistance value”. At this time, since the current value of the measurement current in the 100 kΩ range is “100 μA” and the maximum resistance value of the measurement target X is “8.32 kΩ”, a voltage value of “0.832 V” is calculated.

  In this case, in this example, since the calculated voltage value is lower than the “maximum voltage value (5 V in this example)”, the processing unit 6 controls the measurement unit 2 to control the “maximum resistance of the measurement target X”. The “value” is one resistance measurement range on the low resistance side among the resistance measurement ranges included in the measurable range, one higher resistance side than the 100 kΩ range on the high resistance side (smaller than the measurement current in the 10 kΩ range) The resistance value is measured by designating a resistance measurement range (an example of “resistance measurement range on the high resistance side”) that is specified to supply a measurement current of 100 μA that is a current value. In response to this, the measurement unit 2 measures the voltage value between both electrodes while supplying a measurement current of “100 μA” between both electrodes in the measurement target X.

  At this time, when the first specified 10 kΩ range is specified and the resistance value is measured, a measurement current of 1 mA is supplied to the measurement target X. Therefore, even if the resistance value of the measurement target X is the minimum value within the range of “allowable error” with respect to the “reference resistance value” (in this example, “7.68 kΩ”), the measurement target X is rated. “7.68V” exceeding the voltage “5V” is applied.

  On the other hand, in the resistance measuring apparatus 1 of the present example, the 100 kA range on the higher resistance side than the initially specified 10 kΩ range is specified, and the measurement current of 100 μA is supplied to the measurement target X. Since the resistance value is measured, even if the resistance value of the measuring object X is the maximum value within the range of “allowable error” with respect to the “reference resistance value” (in this example, “8.32 kΩ”), the measurement is performed. For the target X, “0.832 V” lower than the rated voltage “5 V” is applied. Therefore, in the resistance measurement apparatus 1 of this example, the voltage value of the measurement target X is measured without exceeding the rated voltage. The measurement unit 2 calculates the resistance value of the measurement target X based on the measured voltage value and the current value of the supplied measurement current, and outputs the calculation result to the processing unit 6 as measurement value data D.

  Although different from the above example, the resistance measurement range on the lowest resistance side in the resistance measurement range in which the “maximum resistance value” of the measurement target X is included in the measurable range (in the above example, the 10 kΩ range) In the measurement continuous flow defined in the resistance measurement range on the higher resistance side (in the above example, 100 kΩ range), the “maximum voltage value” is exceeded for the measurement target X of “maximum resistance value”. When calculating that a voltage is applied, the processing unit 6 specifies a resistance measurement range that is one higher resistance side than the resistance measurement range, and uses the measurement current defined in the specified resistance measurement range. A voltage exceeding the “maximum voltage value” is applied to check whether or not a voltage exceeding the “maximum voltage value” is applied when supplied to the measurement target X of the “maximum resistance value”. Resistance measurement with specified current value for measurement Repeat until a fixed range is specified.

  On the other hand, in this example in which the resistance value is measured in the 100 kΩ range, the processing unit 6 stores the measurement value data D output from the measurement unit 2 in the storage unit 5 and based on the measurement value data D. The specified resistance value is displayed on the display unit 4 (not shown). Further, the processing unit 6 determines whether or not the resistance value specified based on the measurement value data D is a resistance value within a range of “allowable error” with respect to the “reference resistance value”.

  At this time, in this example in which “allowable error” of “± 4%” is defined with respect to “reference resistance value” of “8 kΩ”, the processing unit 6 has a specified resistance value of “7 When the resistance value is in the range of not less than .68 kΩ and not more than 8.32 kΩ, a character string indicating a resistance value specified based on the measurement value data D (a character string “7.98 kΩ” as an example) The character string “Pass” is displayed on the display unit 4 (another example of “measurement result notification process” for specifying that “the resistance value is within the allowable error range with respect to the reference resistance value”), and The measurement process (inspection process) for the measurement target X (chip resistance) is terminated.

  In addition, the processing unit 6 is a character string indicating a resistance value specified based on the measured value data D when the specified resistance value is not a resistance value in the range of “7.68 kΩ to 8.32 kΩ”. (For example, a character string “8.41 kΩ”) and a character string “Fail” are displayed on the display unit 4 (“resistance value within the allowable error range with respect to the reference resistance value” can be specified) An example of the “measurement result notification process” to be notified), and the measurement process (inspection process) for the measurement target X (chip resistance) is terminated.

  As described above, in the resistance measuring apparatus 1, when the processing unit 6 specifies the “maximum voltage value” and the “maximum resistance value” for the measurement target X, the “maximum resistance value” is included in the measurable range. When the resistance measurement range on the lowest resistance side is specified in each resistance measurement range to be measured and the measurement current in the specified resistance measurement range is supplied to the measurement target X of the “maximum resistance value” Execute the “second process” to calculate the voltage value of the applied voltage, and if the calculated voltage value is less than the “maximum voltage value”, specify the resistance measurement range specified in the “first process” and calculate When the measured voltage value exceeds the “maximum voltage value”, the resistance measurement on the high resistance side that is specified to supply a measurement current having a current value smaller than the resistance measurement range specified in the “first processing” is performed. Specify the range to be measured X The resistance value to be measured.

  Therefore, according to the resistance measuring apparatus 1, a current for measurement having a current value that does not exceed the “maximum voltage value” can be obtained simply by specifying the “maximum voltage value” and the “maximum resistance value” prior to the measurement process. Since the resistance measurement range to be supplied is automatically specified and the resistance value is measured, there is no need to calculate the voltage value of the voltage applied to the measurement target X or to manually switch the resistance measurement range. Even a user unaccustomed to measuring resistance values using this type of device can reliably and easily measure the resistance value without causing damage to the measuring object X.

  Further, according to the resistance measuring apparatus 1, when the processing unit 6 specifies the “reference resistance value” of the measurement object X and its “allowable error”, the specified “reference resistance value” and “allowable error” are specified. Is performed prior to the “first process”, the “reference resistance value” defined for the measurement object X and its “allowable” By simply specifying “Error”, the “Maximum resistance value” is calculated, and the resistance measurement range in which no voltage exceeding the “Maximum voltage value” is applied is automatically selected according to the calculation result. Even a user who is unfamiliar with the measurement of the resistance value using a kind of device can reliably and more easily measure the resistance value without causing damage to the measuring object X.

  Further, according to the resistance measuring apparatus 1, the processing unit 6 determines whether the resistance value of the measurement target X measured by the measuring unit 2 is a resistance value within the range of “allowable error” with respect to the “reference resistance value”. Comparing the resistance value range specified based on the “reference resistance value” and “allowable error” and the measurement result by the measurement unit 2 by executing “measurement result notification processing” that notifies whether or not it can be specified Thus, since it is not necessary to determine whether or not the measurement target X is a non-defective product, the user is not accustomed to the measurement operation using this type of apparatus (the operation for inspecting the quality of the measurement target X). In addition, it is possible to reliably and easily inspect whether or not the measurement target X is a non-defective product.

  The configuration of the “resistance measurement device” is not limited to the configuration of the resistance measurement device 1 described above. For example, a configuration in which the “maximum voltage value” is specified by enabling the “volt limit function” and limiting the voltage applied to the measurement target X to any one of 5V, 12V, and 30V. Although described as an example, for example, when the voltage value of the rated voltage of the measurement target X is only one type, it is applied to the measurement target X simply by performing an operation of enabling the “volt limit function”. The upper limit value (maximum voltage value) of the voltage value is limited to one predetermined voltage value (another example of “when the maximum voltage value allowed to be applied to the measurement target is specified”). It can also be adopted.

  Also, instead of the configuration that specifies the “maximum voltage value” by selecting an arbitrary voltage value from among the multiple “maximum voltage values” defined in advance, the arbitrary voltage value is set as the “maximum voltage value”. It is also possible to adopt a configuration (for example, a configuration in which a voltage value is input by operating an operation switch: still another example of “when a maximum voltage value allowed to be applied to a measurement target is specified”). Further, the configuration for executing the “third process” for calculating the “maximum resistance value” based on the designated “reference resistance value” and “allowable error” has been described as an example. Instead, a configuration in which the “maximum resistance value” is directly designated (input operation) can be used.

  Whether or not the measurement object X is a non-defective product based on the measurement result by the measurement unit 2 and the “reference resistance value” and “allowable error” specified in advance (the measured resistance value is “reference resistance value”). In the above description, a configuration for inspecting and informing whether or not the error is within the “allowable error” range is described as an example. However, a configuration in which only the measurement process for the measurement target X is executed and this inspection is not performed is described. It can also be adopted.

DESCRIPTION OF SYMBOLS 1 Resistance measuring device 2 Measuring part 3 Operation part 4 Display part 5 Memory | storage part 6 Processing part D Measurement value data X Measurement object

Claims (3)

A measurement unit that measures the resistance value of the measurement target in any one of a plurality of types of resistance measurement ranges in which the current value of the measurement current supplied to the measurement target is defined in advance;
A resistance measuring device comprising: a processing unit that controls the measuring unit to specify one of the resistance measurement ranges and measure the resistance value of the measurement target;
When the maximum voltage value that is allowed to be applied to the measurement target and the maximum resistance value that can be measured for the measurement target are specified, the processing unit includes the maximum resistance value included in the measurable range. A first process for specifying the resistance measurement range on the lowest resistance side in the resistance measurement range, and supplying the measurement current defined in the specified resistance measurement range to the measurement target of the maximum resistance value And a second process for calculating a voltage value of the voltage applied to the measurement object, and when the voltage value calculated in the second process is equal to or less than the maximum voltage value, the specified in the first process When a resistance measurement range is specified to measure the resistance value of the measurement object, and the voltage value calculated in the second process exceeds the maximum voltage value, in the first process Boss was the resistance measuring range resistance measurement device for specifying the resistance measurement range of the high-resistance which is defined to provide measure the resistance of the measurement object the measuring current of a small current value than.   The processing unit calculates the maximum resistance value based on the specified reference resistance value and the permissible error when the reference resistance value of the measurement target and the permissible error of the resistance value of the measurement target are specified. The resistance measurement apparatus according to claim 1, wherein the third process is executed prior to the first process.   The processing unit performs a measurement result notification process for notifying whether or not the resistance value of the measurement target measured by the measurement unit is a resistance value within the allowable error range with respect to the reference resistance value. The resistance measuring device according to claim 2 to be executed.

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