JP6382610B2 - シミュレータシステム、ゲートウェイシステムテスト装置及びゲートウェイシステムテスト方法 - Google Patents

シミュレータシステム、ゲートウェイシステムテスト装置及びゲートウェイシステムテスト方法 Download PDF

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JP6382610B2
JP6382610B2 JP2014144760A JP2014144760A JP6382610B2 JP 6382610 B2 JP6382610 B2 JP 6382610B2 JP 2014144760 A JP2014144760 A JP 2014144760A JP 2014144760 A JP2014144760 A JP 2014144760A JP 6382610 B2 JP6382610 B2 JP 6382610B2
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JP2016021161A5 (enExample
JP2016021161A (ja
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裕 岡部
裕 岡部
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Hitachi Ltd
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JP2014144760A 2014-07-15 2014-07-15 シミュレータシステム、ゲートウェイシステムテスト装置及びゲートウェイシステムテスト方法 Active JP6382610B2 (ja)

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JP2016021161A5 JP2016021161A5 (enExample) 2017-08-17
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102618465B1 (ko) * 2022-11-24 2023-12-28 쿠팡 주식회사 정보를 제공하는 전자 장치의 동작 방법 및 이를 지원하는 전자 장치

Families Citing this family (1)

* Cited by examiner, † Cited by third party
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CN112925711A (zh) * 2021-02-26 2021-06-08 平安普惠企业管理有限公司 本地联调测试方法及相关装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07225707A (ja) * 1994-02-10 1995-08-22 Fujitsu Ltd アプリケーションのテスト方法及びそのテスト支援装置
JP2000132425A (ja) * 1998-10-26 2000-05-12 Hitachi Ltd ソフトウェアテスト方法
JP2007094631A (ja) * 2005-09-28 2007-04-12 Hitachi Electronics Service Co Ltd アプリケーション稼働監視システム及び顧客アプリケーション稼働監視サービス提供システム及びアプリケーション稼働監視方法及び顧客アプリケーション稼働監視サービス提供方法
JP2009301352A (ja) * 2008-06-13 2009-12-24 Hitachi Ltd テスト装置およびテスト方法
JP5052472B2 (ja) * 2008-09-30 2012-10-17 株式会社野村総合研究所 プログラムの設定情報切替システム及び切替方法
JP5651050B2 (ja) * 2011-03-08 2015-01-07 株式会社富士通マーケティング データ生成装置及びデータ生成プログラム

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102618465B1 (ko) * 2022-11-24 2023-12-28 쿠팡 주식회사 정보를 제공하는 전자 장치의 동작 방법 및 이를 지원하는 전자 장치
WO2024111750A1 (ko) * 2022-11-24 2024-05-30 쿠팡 주식회사 정보를 제공하는 전자 장치의 동작 방법 및 이를 지원하는 전자 장치

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