JP6380077B2 - サンプリング部及びそれを備えたｉｃｐ質量分析装置 - Google Patents

サンプリング部及びそれを備えたｉｃｐ質量分析装置 Download PDF

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JP6380077B2
JP6380077B2 JP2014253890A JP2014253890A JP6380077B2 JP 6380077 B2 JP6380077 B2 JP 6380077B2 JP 2014253890 A JP2014253890 A JP 2014253890A JP 2014253890 A JP2014253890 A JP 2014253890A JP 6380077 B2 JP6380077 B2 JP 6380077B2
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sampling
mass
axial direction
cone
mass spectrometer
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JP2016115566A5 (enExample
JP2016115566A (ja
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林　英幹
英幹 林
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Shimadzu Corp
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Shimadzu Corp
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JP2014253890A 2014-12-16 2014-12-16 サンプリング部及びそれを備えたｉｃｐ質量分析装置 Active JP6380077B2 (ja)

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JP2016115566A JP2016115566A (ja) 2016-06-23
JP2016115566A5 JP2016115566A5 (enExample) 2017-06-22
JP6380077B2 true JP6380077B2 (ja) 2018-08-29

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11667992B2 (en) 2021-07-19 2023-06-06 Agilent Technologies, Inc. Tip for interface cones

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB202108988D0 (en) * 2021-06-23 2021-08-04 Micromass Ltd Mass and/or mobility spectrometer vacuum pumping line

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10208690A (ja) * 1997-01-21 1998-08-07 Shimadzu Corp 質量分析装置
JP2014071971A (ja) * 2012-09-28 2014-04-21 Hitachi Ltd 固体高分子電解質膜およびそれを用いた燃料電池
JP6167969B2 (ja) * 2014-03-31 2017-07-26 株式会社島津製作所 サンプリング部及びそれを備えたｉｃｐ質量分析装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11667992B2 (en) 2021-07-19 2023-06-06 Agilent Technologies, Inc. Tip for interface cones

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