JP6339198B2 - インターコネクトリタイマのエンハンスメント - Google Patents

インターコネクトリタイマのエンハンスメント Download PDF

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JP6339198B2
JP6339198B2 JP2016532603A JP2016532603A JP6339198B2 JP 6339198 B2 JP6339198 B2 JP 6339198B2 JP 2016532603 A JP2016532603 A JP 2016532603A JP 2016532603 A JP2016532603 A JP 2016532603A JP 6339198 B2 JP6339198 B2 JP 6339198B2
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JP2017510094A (ja
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エス． フローリッチ、ダニエル
エス． フローリッチ、ダニエル
シャーマ、ダベンドラ ダス
シャーマ、ダベンドラ ダス
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Intel Corp
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Intel Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31703—Comparison aspects, e.g. signature analysis, comparators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3177—Testing of logic operation, e.g. by logic analysers
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
    • G06F13/38—Information transfer, e.g. on bus
    • G06F13/42—Bus transfer protocol, e.g. handshake; Synchronisation
    • G06F13/4265—Bus transfer protocol, e.g. handshake; Synchronisation on a point to point bus
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B3/00—Line transmission systems
    • H04B3/02—Details
    • H04B3/46—Monitoring; Testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
    • G01R31/3271—Testing of circuit interrupters, switches or circuit-breakers of high voltage or medium voltage devices
    • G01R31/3275—Fault detection or status indication
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/0751—Error or fault detection not based on redundancy
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Preventing errors by testing or debugging software
    • G06F11/3668—Software testing
    • G06F11/3672—Test management
    • G06F11/3688—Test management for test execution, e.g. scheduling of test suites
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
    • G06F13/14—Handling requests for interconnection or transfer
    • G06F13/16—Handling requests for interconnection or transfer for access to memory bus
    • G06F13/1668—Details of memory controller
    • G06F13/1689—Synchronisation and timing concerns
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
    • H01L22/34—Circuits for electrically characterising or monitoring manufacturing processes, e. g. whole test die, wafers filled with test structures, on-board-devices incorporated on each die, process control monitors or pad structures thereof, devices in scribe line
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2225/00—Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
    • H01L2225/03—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00
    • H01L2225/04—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers
    • H01L2225/065—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers the devices being of a type provided for in group H01L27/00
    • H01L2225/06503—Stacked arrangements of devices
    • H01L2225/06596—Structural arrangements for testing

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Information Transfer Systems (AREA)
  • Communication Control (AREA)
  • Maintenance And Management Of Digital Transmission (AREA)
  • Detection And Prevention Of Errors In Transmission (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
JP2016532603A 2013-12-26 2013-12-26 インターコネクトリタイマのエンハンスメント Active JP6339198B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US2013/077806 WO2015099733A1 (en) 2013-12-26 2013-12-26 Interconnect retimer enhancements

Publications (2)

Publication Number Publication Date
JP2017510094A JP2017510094A (ja) 2017-04-06
JP6339198B2 true JP6339198B2 (ja) 2018-06-06

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JP2016532603A Active JP6339198B2 (ja) 2013-12-26 2013-12-26 インターコネクトリタイマのエンハンスメント

Country Status (8)

Country Link
US (2) US10534034B2 (pt)
EP (1) EP3087403B1 (pt)
JP (1) JP6339198B2 (pt)
KR (1) KR101963011B1 (pt)
CN (1) CN105793715B (pt)
BR (1) BR112016012057B1 (pt)
DE (1) DE112013007726T5 (pt)
WO (1) WO2015099733A1 (pt)

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US20170270062A1 (en) * 2016-03-21 2017-09-21 Intel Corporation In-band retimer register access
US10114658B2 (en) * 2016-05-23 2018-10-30 Baida USA LLC Concurrent testing of PCI express devices on a server platform
US9965439B2 (en) 2016-06-27 2018-05-08 Intel Corporation Low latency multi-protocol retimers
US10747688B2 (en) * 2016-12-22 2020-08-18 Intel Corporation Low latency retimer
US10784986B2 (en) 2017-02-28 2020-09-22 Intel Corporation Forward error correction mechanism for peripheral component interconnect-express (PCI-e)
US10789201B2 (en) 2017-03-03 2020-09-29 Intel Corporation High performance interconnect
US11249808B2 (en) 2017-08-22 2022-02-15 Intel Corporation Connecting accelerator resources using a switch
US10601425B2 (en) * 2018-05-30 2020-03-24 Intel Corporation Width and frequency conversion with PHY layer devices in PCI-express
US11467999B2 (en) 2018-06-29 2022-10-11 Intel Corporation Negotiating asymmetric link widths dynamically in a multi-lane link
CN109031091B (zh) * 2018-07-16 2021-08-17 深圳市广和通无线股份有限公司 接口测试方法、测试系统和测试夹具
DE112018007637T5 (de) * 2018-09-28 2021-04-29 Intel Corporation Fehlermeldung in Verbindungsverlängerungsvorrichtungen
US10771189B2 (en) * 2018-12-18 2020-09-08 Intel Corporation Forward error correction mechanism for data transmission across multi-lane links
US11637657B2 (en) 2019-02-15 2023-04-25 Intel Corporation Low-latency forward error correction for high-speed serial links
US11249837B2 (en) 2019-03-01 2022-02-15 Intel Corporation Flit-based parallel-forward error correction and parity
US10846247B2 (en) 2019-03-05 2020-11-24 Intel Corporation Controlling partial link width states for multilane links
US11397701B2 (en) * 2019-04-30 2022-07-26 Intel Corporation Retimer mechanisms for in-band link management
US11296994B2 (en) 2019-05-13 2022-04-05 Intel Corporation Ordered sets for high-speed interconnects
TWI710953B (zh) * 2019-05-31 2020-11-21 緯創資通股份有限公司 韌體更新裝置以及韌體更新方法
CN114556870B (zh) * 2019-11-26 2023-04-04 华为技术有限公司 一种数据同步的方法以及装置
US11836101B2 (en) 2019-11-27 2023-12-05 Intel Corporation Partial link width states for bidirectional multilane links
US11740958B2 (en) 2019-11-27 2023-08-29 Intel Corporation Multi-protocol support on common physical layer
CN115004165A (zh) * 2020-01-22 2022-09-02 华为技术有限公司 一种用于执行重定时的装置以及路径切换的方法
KR102518285B1 (ko) 2021-04-05 2023-04-06 에스케이하이닉스 주식회사 PCIe 인터페이스 및 인터페이스 시스템
KR102415309B1 (ko) 2020-06-16 2022-07-01 에스케이하이닉스 주식회사 인터페이스 장치 및 그 동작 방법
KR102519480B1 (ko) 2021-04-01 2023-04-10 에스케이하이닉스 주식회사 PCIe 장치 및 이를 포함하는 컴퓨팅 시스템
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CN113740703B (zh) * 2021-07-28 2023-11-10 苏州浪潮智能科技有限公司 一种Retimer芯片的测试板及测试系统
KR102563047B1 (ko) * 2021-09-14 2023-08-04 테크위드유 주식회사 효율적 채널 제어를 지원하는 프로브카드 용 pmic와 신호용 스위치 ｉｃ

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Also Published As

Publication number Publication date
DE112013007726T5 (de) 2017-02-02
US20160377679A1 (en) 2016-12-29
BR112016012057A2 (pt) 2017-08-08
BR112016012057B1 (pt) 2021-12-28
EP3087403A1 (en) 2016-11-02
KR101963011B1 (ko) 2019-03-27
US20200132760A1 (en) 2020-04-30
US10534034B2 (en) 2020-01-14
JP2017510094A (ja) 2017-04-06
CN105793715A (zh) 2016-07-20
CN105793715B (zh) 2019-02-15
WO2015099733A1 (en) 2015-07-02
EP3087403B1 (en) 2020-01-22
US11675003B2 (en) 2023-06-13
KR20160075737A (ko) 2016-06-29
EP3087403A4 (en) 2017-10-18

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