JP6338689B2 - 陽電子放出断層撮影においけるデッドピクセル識別 - Google Patents

陽電子放出断層撮影においけるデッドピクセル識別 Download PDF

Info

Publication number
JP6338689B2
JP6338689B2 JP2016558781A JP2016558781A JP6338689B2 JP 6338689 B2 JP6338689 B2 JP 6338689B2 JP 2016558781 A JP2016558781 A JP 2016558781A JP 2016558781 A JP2016558781 A JP 2016558781A JP 6338689 B2 JP6338689 B2 JP 6338689B2
Authority
JP
Japan
Prior art keywords
pixel
pixels
functional
pet
count
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2016558781A
Other languages
English (en)
Japanese (ja)
Other versions
JP2017508979A5 (enExample
JP2017508979A (ja
Inventor
ルロワ ロランス，トマ
ルロワ ロランス，トマ
シャオロン ワン，シャロン
シャオロン ワン，シャロン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Koninklijke Philips NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips NV filed Critical Koninklijke Philips NV
Publication of JP2017508979A publication Critical patent/JP2017508979A/ja
Publication of JP2017508979A5 publication Critical patent/JP2017508979A5/ja
Application granted granted Critical
Publication of JP6338689B2 publication Critical patent/JP6338689B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/161—Applications in the field of nuclear medicine, e.g. in vivo counting
    • G01T1/164—Scintigraphy
    • G01T1/1641—Static instruments for imaging the distribution of radioactivity in one or two dimensions using one or several scintillating elements; Radio-isotope cameras
    • G01T1/1647—Processing of scintigraphic data
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T7/00—Details of radiation-measuring instruments
    • G01T7/005—Details of radiation-measuring instruments calibration techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2985—In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis)

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Biomedical Technology (AREA)
  • General Health & Medical Sciences (AREA)
  • Medical Informatics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Optics & Photonics (AREA)
  • Nuclear Medicine (AREA)
JP2016558781A 2014-03-28 2015-03-19 陽電子放出断層撮影においけるデッドピクセル識別 Active JP6338689B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201461971780P 2014-03-28 2014-03-28
US61/971,780 2014-03-28
PCT/IB2015/052019 WO2015145310A1 (en) 2014-03-28 2015-03-19 Dead pixel identification in positron emission tomography (pet)

Publications (3)

Publication Number Publication Date
JP2017508979A JP2017508979A (ja) 2017-03-30
JP2017508979A5 JP2017508979A5 (enExample) 2017-12-21
JP6338689B2 true JP6338689B2 (ja) 2018-06-06

Family

ID=52815060

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016558781A Active JP6338689B2 (ja) 2014-03-28 2015-03-19 陽電子放出断層撮影においけるデッドピクセル識別

Country Status (5)

Country Link
US (1) US9841515B2 (enExample)
EP (1) EP3123203B1 (enExample)
JP (1) JP6338689B2 (enExample)
CN (1) CN106164704B (enExample)
WO (1) WO2015145310A1 (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106821402B (zh) * 2016-12-14 2020-02-07 赛诺联合医疗科技（北京）有限公司 构建pet图像的方法和装置
DE102018109572B4 (de) 2017-04-21 2024-06-20 General Electric Company System und verfahren zur durchführung von fehlertoleranter rekonstruktion eines bildes
CN111051926B (zh) * 2017-07-31 2024-01-30 株式会社岛津制作所 放射线检测器以及核医学诊断装置
US10670745B1 (en) 2017-09-19 2020-06-02 The Government of the United States as Represented by the Secretary of the United States Statistical photo-calibration of photo-detectors for radiometry without calibrated light sources comprising an arithmetic unit to determine a gain and a bias from mean values and variance values
EP3685189B1 (en) * 2017-09-22 2024-09-04 Koninklijke Philips N.V. Handling detector pixel performance variation in digital positron emission tomography
EP3821279B1 (en) 2018-07-12 2025-08-20 Shenzhen Xpectvision Technology Co., Ltd. Method of making a radiation detector
CN111080734B (zh) * 2019-11-25 2023-10-20 中国科学院深圳先进技术研究院 一种处理正电子发射断层扫描pet数据的方法及终端
JP7768682B2 (ja) * 2021-03-04 2025-11-12 キヤノンメディカルシステムズ株式会社 Ｐｅｔ装置、方法及びプログラム
US11742175B2 (en) * 2021-06-30 2023-08-29 Fei Company Defective pixel management in charged particle microscopy
US12502156B2 (en) * 2023-05-12 2025-12-23 Canon Medical Systems Corporation Method for detecting and handling detector pixels with intermittent behavior for a small pixelated photon counting computed tomography (CT) system

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB9711124D0 (en) 1997-05-29 1997-07-23 Leo Pharm Prod Ltd Novel cyanoguanidines
US6529618B1 (en) * 1998-09-04 2003-03-04 Konica Corporation Radiation image processing apparatus
DE10122876C2 (de) * 2000-11-24 2003-08-21 Siemens Ag Verfahren zum Betrieb eines Bildsystems einer bildgebenden medizinischen Untersuchungseinrichtung und medizinische Untersuchungseinrichtung
US6694172B1 (en) * 2001-06-23 2004-02-17 Koninklijke Philips Electronics, N.V. Fault-tolerant detector for gamma ray imaging
US7142636B2 (en) 2003-09-23 2006-11-28 General Electric Company System and method for defective detector cell and DAS channel correction
EP1685426A1 (en) 2003-10-27 2006-08-02 Koninklijke Philips Electronics N.V. Calibration method and apparatus for pixilated solid state detector
KR101273965B1 (ko) * 2005-04-22 2013-06-12 코닌클리케 필립스 일렉트로닉스 엔.브이. 검출기 픽셀, 방사선 검출기, ｔｏｆ-ｐｅｔ 영상화 시스템, 신틸레이터와 함께 수행되는 방법, 및 의료 영상을 생성하는 방법
US8395127B1 (en) * 2005-04-22 2013-03-12 Koninklijke Philips Electronics N.V. Digital silicon photomultiplier for TOF PET
CN1940992A (zh) * 2005-06-17 2007-04-04 Cti分子成像公司 Pet/ct成像中基于图像的伪影降低
JP4874843B2 (ja) * 2007-03-22 2012-02-15 富士フイルム株式会社 放射線画像撮影方法および放射線画像撮影装置
CN101396271B (zh) * 2007-09-29 2010-09-01 上海西门子医疗器械有限公司 一种识别ct图像中感兴趣区域边界的方法
WO2009115956A2 (en) * 2008-03-19 2009-09-24 Koninklijke Philips Electronics N.V. Single photon radiation detector
JP5247268B2 (ja) * 2008-07-08 2013-07-24 三洋電機株式会社 投射型映像表示装置
US8193505B2 (en) * 2008-09-29 2012-06-05 Siemens Medical Solutions Usa, Inc. System and method for scatter normalization of PET images
US7872221B2 (en) 2009-01-30 2011-01-18 General Electric Company Apparatus and methods for calibrating pixelated detectors
CN102792184B (zh) * 2010-03-09 2014-10-29 株式会社岛津制作所 二维阵列x射线检测器的检查方法
US8660335B2 (en) * 2010-03-24 2014-02-25 Varian Medical Systems, Inc. Transient pixel defect detection and correction
US9006630B2 (en) 2012-01-13 2015-04-14 Altasens, Inc. Quality of optically black reference pixels in CMOS iSoCs
EP3123204A1 (en) 2014-03-28 2017-02-01 Koninklijke Philips N.V. Dead pixel compensation in positron emission tomography (pet)

Also Published As

Publication number Publication date
CN106164704A (zh) 2016-11-23
EP3123203A1 (en) 2017-02-01
WO2015145310A1 (en) 2015-10-01
US9841515B2 (en) 2017-12-12
CN106164704B (zh) 2019-03-08
US20170115409A1 (en) 2017-04-27
EP3123203B1 (en) 2019-10-09
JP2017508979A (ja) 2017-03-30

Similar Documents

Publication Publication Date Title
JP6338689B2 (ja) 陽電子放出断層撮影においけるデッドピクセル識別
US8923588B2 (en) Method and system for improved TOF PET reconstruction
EP2867701B1 (en) Digital positron emission tomography (dpet) energy calibration method
US9474501B2 (en) Hybrid method based on simulation and experimental data to normalize pet data
US8530846B2 (en) Apparatus and methods for detector scatter recovery for nuclear medicine imaging systems
EP3047307B1 (en) A scatter reject method via energy calibration
CN107110983A (zh) 基于像素的死时间校正
US10101475B2 (en) Dead pixel compensation in positron emission tomography (PET)
RU2705758C2 (ru) Недорогостоящая конструкция цифрового пэт (позитронного эмиссионного томографа)
EP3058392B1 (en) Histogram smoothing in positron emission tomography (pet) energy histograms
WO2015193756A2 (en) Magnetic resonance (mr)-based attenuation correction and monitor alignment calibration

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20160929

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20171110

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20171110

A871 Explanation of circumstances concerning accelerated examination

Free format text: JAPANESE INTERMEDIATE CODE: A871

Effective date: 20171110

A975 Report on accelerated examination

Free format text: JAPANESE INTERMEDIATE CODE: A971005

Effective date: 20171122

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20171128

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20180220

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20180410

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20180508

R150 Certificate of patent or registration of utility model

Ref document number: 6338689

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250