JP6325201B2 - 試験測定装置 - Google Patents
試験測定装置 Download PDFInfo
- Publication number
- JP6325201B2 JP6325201B2 JP2013107148A JP2013107148A JP6325201B2 JP 6325201 B2 JP6325201 B2 JP 6325201B2 JP 2013107148 A JP2013107148 A JP 2013107148A JP 2013107148 A JP2013107148 A JP 2013107148A JP 6325201 B2 JP6325201 B2 JP 6325201B2
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- Prior art keywords
- span
- test
- power
- user
- measurement
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/16—Spectrum analysis; Fourier analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R21/00—Arrangements for measuring electric power or power factor
- G01R21/133—Arrangements for measuring electric power or power factor by using digital technique
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/02—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form
- G01R13/029—Software therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
- G01R19/252—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques using analogue/digital converters of the type with conversion of voltage or current into frequency and measuring of this frequency
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/16—Spectrum analysis; Fourier analysis
- G01R23/18—Spectrum analysis; Fourier analysis with provision for recording frequency spectrum
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F15/00—Digital computers in general; Data processing equipment in general
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/16—Spectrum analysis; Fourier analysis
- G01R23/20—Measurement of non-linear distortion
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Mathematical Physics (AREA)
- Computer Hardware Design (AREA)
- General Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Measuring Frequencies, Analyzing Spectra (AREA)
Description
入力信号をデジタル化してデジタル・データを生成するアナログ・デジタル変換部と、
上記デジタル・データをスパン内パワー及びスパン外パワーを有する周波数スペクトラムに変換する周波数変換部と、
スパン外過大パワーを検出する検出部と、
検出された上記スパン外過大パワーをユーザに通知する通知手段と
を具えている。
105 アナログ・デジタル変換部
106 デジタル・フィルタ
110 時間対振幅計算部
115 時間領域表示
120 スペクトラム計算部
130 周波数領域表示
200 試験測定装置
205 スパン外エネルギー計算部
Claims (2)
- 入力信号をデジタル化してデジタル・データを生成するよう構成されるアナログ・デジタル変換部と、
上記デジタル・データをスパン内パワー及びスパン外パワーを有する周波数スペクトラムに変換するよう構成される周波数変換部と、
上記スパン外パワーをスパン外パワー状態パラメータと比較することによって、上記スパン外パワーの状態を検出するよう構成される検出部と、
検出された上記スパン外パワーの上記状態をユーザに通知する通知手段と
を具え、
上記周波数スペクトラムの全帯域幅は、測定に適した帯域幅であるスパンと、測定に適さないスパン外とから構成され、上記スパン外パワーが上記スパン外の上記周波数スペクトラムから算出される試験測定装置。 - 上記通知手段は、上記ユーザのために上記周波数スペクトラムの上記全帯域幅を表示することによって、上記ユーザに通知することを特徴とする請求項1記載の試験測定装置。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US13/477,360 US9207269B2 (en) | 2012-05-22 | 2012-05-22 | Automatically detecting in-band but out-of-span power in a frequency-domain test and measurement instrument |
US13/477,360 | 2012-05-22 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2013242318A JP2013242318A (ja) | 2013-12-05 |
JP6325201B2 true JP6325201B2 (ja) | 2018-05-16 |
Family
ID=48444194
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2013107148A Active JP6325201B2 (ja) | 2012-05-22 | 2013-05-21 | 試験測定装置 |
Country Status (5)
Country | Link |
---|---|
US (1) | US9207269B2 (ja) |
EP (1) | EP2667203B1 (ja) |
JP (1) | JP6325201B2 (ja) |
KR (1) | KR20130130661A (ja) |
CN (1) | CN103424612B (ja) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD947693S1 (en) | 2019-09-20 | 2022-04-05 | Tektronix, Inc. | Measurement probe head assembly |
Family Cites Families (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5812551B2 (ja) * | 1977-11-10 | 1983-03-09 | 横河電機株式会社 | 波形表示警報装置 |
DE3408026A1 (de) | 1984-03-05 | 1985-09-12 | Brown, Boveri & Cie Ag, 6800 Mannheim | Digitales messgeraet zur quasi analogen messwertanzeige |
JPH0769363B2 (ja) * | 1988-03-10 | 1995-07-31 | 沖電気工業株式会社 | 周波数分析装置におけるラインスペクトル信号自動検出方式 |
JP2891497B2 (ja) * | 1990-01-25 | 1999-05-17 | アンリツ株式会社 | スペクトラムアナライザ |
US6522345B1 (en) * | 1998-01-12 | 2003-02-18 | Agilent Technologies, Inc. | System and method for simultaneously invoking automated measurements in a signal measurement system |
US6681191B1 (en) * | 1999-12-21 | 2004-01-20 | Tektronix, Inc. | Frequency domain analysis system for a time domain measurement instrument |
US6687628B2 (en) * | 2000-12-29 | 2004-02-03 | Agilent Technologies, Inc. | Enhanced signal analysis in an amplitude versus frequency format |
US6768293B2 (en) * | 2001-11-30 | 2004-07-27 | Agilent Technologies, Inc. | Displaying signal measurements within multiple ranges of a parameter |
US6950054B1 (en) * | 2001-12-03 | 2005-09-27 | Cyterra Corporation | Handheld radar frequency scanner for concealed object detection |
US6734857B2 (en) * | 2002-08-07 | 2004-05-11 | Agilent Technologies, Inc. | Waveform zoom feature within an instrument having a table driven graphical display |
JP4254193B2 (ja) * | 2002-10-10 | 2009-04-15 | 横河電機株式会社 | 測定装置及び測定結果の表示方法 |
US7107165B2 (en) * | 2003-11-19 | 2006-09-12 | Agilent Technologies, Inc. | Markers used in the calculation and display of band functions |
US7233349B2 (en) | 2004-09-01 | 2007-06-19 | Videotek, Inc. | Video timing display indicator |
US20070027675A1 (en) * | 2005-07-26 | 2007-02-01 | Lecroy Corporation | Spectrum analyzer control in an oscilloscope |
US8184121B2 (en) | 2005-11-04 | 2012-05-22 | Tektronix, Inc. | Methods, systems, and apparatus for multi-domain markers |
JP5309331B2 (ja) | 2007-07-16 | 2013-10-09 | テクトロニクス・インコーポレイテッド | 測定装置の関心領域管理方法 |
US8860400B2 (en) | 2007-09-27 | 2014-10-14 | Agilent Technologies, Inc. | Systems and methods for providing signal analysis data |
US8155326B2 (en) * | 2007-10-09 | 2012-04-10 | Schweitzer Engineering Laboratories, Inc. | System, method, and apparatus for using the sound signature of a device to determine its operability |
US9784765B2 (en) * | 2009-03-13 | 2017-10-10 | Tektronix, Inc. | Graphic actuation of test and measurement triggers |
US8461850B2 (en) * | 2010-08-13 | 2013-06-11 | Tektronix, Inc. | Time-domain measurements in a test and measurement instrument |
CN201804043U (zh) * | 2010-08-24 | 2011-04-20 | 浙江涵普电力科技有限公司 | 直流电源综合电能检测仪 |
KR101792261B1 (ko) * | 2011-09-30 | 2017-11-02 | 삼성전기주식회사 | 전력 측정 장치 |
US9702907B2 (en) * | 2011-12-16 | 2017-07-11 | Tektronix, Inc. | Frequency mask trigger with non-uniform bandwidth segments |
-
2012
- 2012-05-22 US US13/477,360 patent/US9207269B2/en not_active Expired - Fee Related
-
2013
- 2013-05-16 EP EP13168092.8A patent/EP2667203B1/en not_active Not-in-force
- 2013-05-21 JP JP2013107148A patent/JP6325201B2/ja active Active
- 2013-05-21 CN CN201310189214.3A patent/CN103424612B/zh not_active Expired - Fee Related
- 2013-05-22 KR KR1020130057935A patent/KR20130130661A/ko not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
KR20130130661A (ko) | 2013-12-02 |
JP2013242318A (ja) | 2013-12-05 |
US20130317769A1 (en) | 2013-11-28 |
CN103424612A (zh) | 2013-12-04 |
CN103424612B (zh) | 2018-03-30 |
US9207269B2 (en) | 2015-12-08 |
EP2667203A1 (en) | 2013-11-27 |
EP2667203B1 (en) | 2017-11-22 |
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