JP6272051B2 - 光学検知装置及びそれを備える画像形成装置 - Google Patents

光学検知装置及びそれを備える画像形成装置 Download PDF

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Publication number
JP6272051B2
JP6272051B2 JP2014014192A JP2014014192A JP6272051B2 JP 6272051 B2 JP6272051 B2 JP 6272051B2 JP 2014014192 A JP2014014192 A JP 2014014192A JP 2014014192 A JP2014014192 A JP 2014014192A JP 6272051 B2 JP6272051 B2 JP 6272051B2
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light
light emitting
emitting element
optical detection
detection device
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JP2014014192A
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Japanese (ja)
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JP2015141113A (ja
JP2015141113A5 (enExample
Inventor
圭佑 石角
圭佑 石角
進介 小林
進介 小林
健男 河波
健男 河波
昭範 三又
昭範 三又
中川　健
健 中川
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Canon Inc
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Canon Inc
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Priority to JP2014014192A priority Critical patent/JP6272051B2/ja
Priority to US14/606,419 priority patent/US9304083B2/en
Publication of JP2015141113A publication Critical patent/JP2015141113A/ja
Publication of JP2015141113A5 publication Critical patent/JP2015141113A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03G—ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
    • G03G15/00—Apparatus for electrographic processes using a charge pattern
    • G03G15/50—Machine control of apparatus for electrographic processes using a charge pattern, e.g. regulating differents parts of the machine, multimode copiers, microprocessor control
    • G03G15/5054—Machine control of apparatus for electrographic processes using a charge pattern, e.g. regulating differents parts of the machine, multimode copiers, microprocessor control by measuring the characteristics of an intermediate image carrying member or the characteristics of an image on an intermediate image carrying member, e.g. intermediate transfer belt or drum, conveyor belt
    • G03G15/5058—Machine control of apparatus for electrographic processes using a charge pattern, e.g. regulating differents parts of the machine, multimode copiers, microprocessor control by measuring the characteristics of an intermediate image carrying member or the characteristics of an image on an intermediate image carrying member, e.g. intermediate transfer belt or drum, conveyor belt using a test patch
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N2021/556—Measuring separately scattering and specular

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Engineering & Computer Science (AREA)
  • Control Or Security For Electrophotography (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2014014192A 2014-01-29 2014-01-29 光学検知装置及びそれを備える画像形成装置 Active JP6272051B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2014014192A JP6272051B2 (ja) 2014-01-29 2014-01-29 光学検知装置及びそれを備える画像形成装置
US14/606,419 US9304083B2 (en) 2014-01-29 2015-01-27 Optical detection device and image forming apparatus including the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014014192A JP6272051B2 (ja) 2014-01-29 2014-01-29 光学検知装置及びそれを備える画像形成装置

Publications (3)

Publication Number Publication Date
JP2015141113A JP2015141113A (ja) 2015-08-03
JP2015141113A5 JP2015141113A5 (enExample) 2017-03-09
JP6272051B2 true JP6272051B2 (ja) 2018-01-31

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JP2014014192A Active JP6272051B2 (ja) 2014-01-29 2014-01-29 光学検知装置及びそれを備える画像形成装置

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US (1) US9304083B2 (enExample)
JP (1) JP6272051B2 (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6793449B2 (ja) 2015-11-06 2020-12-02 キヤノン株式会社 画像形成装置
JP6964972B2 (ja) * 2016-10-20 2021-11-10 キヤノン株式会社 画像形成装置
JP6630309B2 (ja) * 2017-04-10 2020-01-15 キヤノン株式会社 光学センサ及び画像形成装置
WO2019018313A1 (en) 2017-07-19 2019-01-24 Siemens Healthcare Diagnostics Inc. METHODS FOR COMPENSATION OF PARASITE LIGHT AND APPARATUS FOR CHARACTERIZING A SPECIMEN
CN108132138A (zh) * 2017-11-23 2018-06-08 矽力杰半导体技术(杭州)有限公司 光学检测组件
JP7277264B2 (ja) * 2019-06-05 2023-05-18 キヤノン株式会社 判別装置及び画像形成装置
US11674893B2 (en) 2020-02-17 2023-06-13 Canon Kabushiki Kaisha Structure of optical sensor having light-emitting element and light-receiving element
US11579081B2 (en) * 2020-02-17 2023-02-14 Canon Kabushiki Kaisha Structure of optical sensor having light-emitting element and plurality of light-receiving elements

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62148819A (ja) * 1985-12-23 1987-07-02 Anritsu Corp 分光測色計の光検出プロ−ブ
US5748221A (en) * 1995-11-01 1998-05-05 Xerox Corporation Apparatus for colorimetry gloss and registration feedback in a color printing machine
US6832824B1 (en) * 1998-10-30 2004-12-21 Hewlett-Packard Development Company, L.P. Color-calibration sensor system for incremental printing
JP2001264173A (ja) * 2000-03-14 2001-09-26 Minolta Co Ltd 反射特性測定装置
JP2005091252A (ja) * 2003-09-19 2005-04-07 Ricoh Co Ltd 光学センサ
JP2005241933A (ja) * 2004-02-26 2005-09-08 Canon Inc テストパターン濃度検知装置及び画像形成装置
JP4422039B2 (ja) 2005-01-31 2010-02-24 ニチコン株式会社 トナー付着量測定装置
JP4661247B2 (ja) * 2005-02-04 2011-03-30 富士ゼロックス株式会社 画像形成装置
JP2006267644A (ja) 2005-03-24 2006-10-05 Canon Inc 画像形成装置
JP2007085963A (ja) * 2005-09-26 2007-04-05 Fuji Xerox Co Ltd 光学測定装置及びこれを用いた画像形成装置
JP4815322B2 (ja) * 2006-10-06 2011-11-16 株式会社リコー 画像形成装置
JP6061703B2 (ja) * 2012-02-13 2017-01-18 キヤノン株式会社 光学センサ及び画像形成装置
JP6119246B2 (ja) * 2012-03-12 2017-04-26 株式会社リコー 画像形成装置
JP6004812B2 (ja) * 2012-07-30 2016-10-12 キヤノン株式会社 光学検知装置及び画像形成装置

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Publication number Publication date
JP2015141113A (ja) 2015-08-03
US20150211992A1 (en) 2015-07-30
US9304083B2 (en) 2016-04-05

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