JP6271593B2 - 角度補正モジュールを備える磁界センサ - Google Patents
角度補正モジュールを備える磁界センサ Download PDFInfo
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- JP6271593B2 JP6271593B2 JP2015558010A JP2015558010A JP6271593B2 JP 6271593 B2 JP6271593 B2 JP 6271593B2 JP 2015558010 A JP2015558010 A JP 2015558010A JP 2015558010 A JP2015558010 A JP 2015558010A JP 6271593 B2 JP6271593 B2 JP 6271593B2
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- 230000005291 magnetic effect Effects 0.000 title claims description 242
- 238000012937 correction Methods 0.000 title claims description 187
- 230000008859 change Effects 0.000 claims description 60
- 238000000034 method Methods 0.000 claims description 52
- 239000000758 substrate Substances 0.000 claims description 29
- 230000004044 response Effects 0.000 claims description 22
- 230000005355 Hall effect Effects 0.000 claims description 18
- 238000001514 detection method Methods 0.000 claims description 16
- 239000004065 semiconductor Substances 0.000 claims description 13
- 230000001419 dependent effect Effects 0.000 claims description 5
- 238000012545 processing Methods 0.000 claims description 5
- 238000009987 spinning Methods 0.000 description 104
- ORQBXQOJMQIAOY-UHFFFAOYSA-N nobelium Chemical compound [No] ORQBXQOJMQIAOY-UHFFFAOYSA-N 0.000 description 43
- 238000000819 phase cycle Methods 0.000 description 33
- 230000003595 spectral effect Effects 0.000 description 17
- 230000006870 function Effects 0.000 description 10
- 238000009792 diffusion process Methods 0.000 description 9
- 230000008878 coupling Effects 0.000 description 8
- 238000010168 coupling process Methods 0.000 description 8
- 238000005859 coupling reaction Methods 0.000 description 8
- 238000002347 injection Methods 0.000 description 6
- 239000007924 injection Substances 0.000 description 6
- PCTMTFRHKVHKIS-BMFZQQSSSA-N (1s,3r,4e,6e,8e,10e,12e,14e,16e,18s,19r,20r,21s,25r,27r,30r,31r,33s,35r,37s,38r)-3-[(2r,3s,4s,5s,6r)-4-amino-3,5-dihydroxy-6-methyloxan-2-yl]oxy-19,25,27,30,31,33,35,37-octahydroxy-18,20,21-trimethyl-23-oxo-22,39-dioxabicyclo[33.3.1]nonatriaconta-4,6,8,10 Chemical compound C1C=C2C[C@@H](OS(O)(=O)=O)CC[C@]2(C)[C@@H]2[C@@H]1[C@@H]1CC[C@H]([C@H](C)CCCC(C)C)[C@@]1(C)CC2.O[C@H]1[C@@H](N)[C@H](O)[C@@H](C)O[C@H]1O[C@H]1/C=C/C=C/C=C/C=C/C=C/C=C/C=C/[C@H](C)[C@@H](O)[C@@H](C)[C@H](C)OC(=O)C[C@H](O)C[C@H](O)CC[C@@H](O)[C@H](O)C[C@H](O)C[C@](O)(C[C@H](O)[C@H]2C(O)=O)O[C@H]2C1 PCTMTFRHKVHKIS-BMFZQQSSSA-N 0.000 description 5
- 101100321992 Drosophila melanogaster ABCD gene Proteins 0.000 description 5
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- 238000004364 calculation method Methods 0.000 description 3
- VUFOSBDICLTFMS-UHFFFAOYSA-M ethyl-hexadecyl-dimethylazanium;bromide Chemical compound [Br-].CCCCCCCCCCCCCCCC[N+](C)(C)CC VUFOSBDICLTFMS-UHFFFAOYSA-M 0.000 description 3
- 230000005294 ferromagnetic effect Effects 0.000 description 3
- WPYVAWXEWQSOGY-UHFFFAOYSA-N indium antimonide Chemical compound [Sb]#[In] WPYVAWXEWQSOGY-UHFFFAOYSA-N 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
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- 230000009977 dual effect Effects 0.000 description 2
- 239000007943 implant Substances 0.000 description 2
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- WPWLFFMSSOAORQ-UHFFFAOYSA-N 5-bromo-4-chloro-3-indolyl acetate Chemical compound C1=C(Br)C(Cl)=C2C(OC(=O)C)=CNC2=C1 WPWLFFMSSOAORQ-UHFFFAOYSA-N 0.000 description 1
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000004913 activation Effects 0.000 description 1
- 230000001174 ascending effect Effects 0.000 description 1
- 230000006399 behavior Effects 0.000 description 1
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- 239000004020 conductor Substances 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- 238000002513 implantation Methods 0.000 description 1
- 150000002472 indium compounds Chemical class 0.000 description 1
- 230000005381 magnetic domain Effects 0.000 description 1
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- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 230000005641 tunneling Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/023—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring distance between sensor and object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/0023—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/007—Environmental aspects, e.g. temperature variations, radiation, stray fields
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/07—Hall effect devices
- G01R33/077—Vertical Hall-effect devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/07—Hall effect devices
- G01R33/072—Constructional adaptation of the sensor to specific applications
- G01R33/075—Hall devices configured for spinning current measurements
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Toxicology (AREA)
- Transmission And Conversion Of Sensor Element Output (AREA)
- Measuring Magnetic Variables (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US13/766,327 | 2013-02-13 | ||
| US13/766,327 US9389060B2 (en) | 2013-02-13 | 2013-02-13 | Magnetic field sensor and related techniques that provide an angle error correction module |
| PCT/US2014/011580 WO2014126670A1 (en) | 2013-02-13 | 2014-01-15 | Magnetic field sensor comprising angle correction module |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2016507071A JP2016507071A (ja) | 2016-03-07 |
| JP2016507071A5 JP2016507071A5 (enExample) | 2016-12-15 |
| JP6271593B2 true JP6271593B2 (ja) | 2018-01-31 |
Family
ID=50030551
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2015558010A Active JP6271593B2 (ja) | 2013-02-13 | 2014-01-15 | 角度補正モジュールを備える磁界センサ |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US9389060B2 (enExample) |
| EP (2) | EP3828572B1 (enExample) |
| JP (1) | JP6271593B2 (enExample) |
| KR (1) | KR102057891B1 (enExample) |
| WO (1) | WO2014126670A1 (enExample) |
Families Citing this family (40)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9389060B2 (en) | 2013-02-13 | 2016-07-12 | Allegro Microsystems, Llc | Magnetic field sensor and related techniques that provide an angle error correction module |
| US9671486B2 (en) * | 2013-06-18 | 2017-06-06 | Infineon Technologies Ag | Sensors, systems and methods for compensating for thermal EMF |
| US9400164B2 (en) * | 2013-07-22 | 2016-07-26 | Allegro Microsystems, Llc | Magnetic field sensor and related techniques that provide an angle correction module |
| US10120042B2 (en) | 2013-12-23 | 2018-11-06 | Allegro Microsystems, Llc | Magnetic field sensor and related techniques that inject a synthesized error correction signal into a signal channel to result in reduced error |
| US9574867B2 (en) | 2013-12-23 | 2017-02-21 | Allegro Microsystems, Llc | Magnetic field sensor and related techniques that inject an error correction signal into a signal channel to result in reduced error |
| US9547048B2 (en) * | 2014-01-14 | 2017-01-17 | Allegro Micosystems, LLC | Circuit and method for reducing an offset component of a plurality of vertical hall elements arranged in a circle |
| GB2531257A (en) * | 2014-10-13 | 2016-04-20 | Skf Ab | Compass sensor based angle encoder for a magnetic target ring |
| US11163022B2 (en) | 2015-06-12 | 2021-11-02 | Allegro Microsystems, Llc | Magnetic field sensor for angle detection with a phase-locked loop |
| PL3384591T3 (pl) | 2015-12-02 | 2021-11-08 | Thyssenkrupp Presta Ag | Kompensacja rozproszonego pola magnetycznego dla czujnika położenia wirnika |
| US10481220B2 (en) * | 2016-02-01 | 2019-11-19 | Allegro Microsystems, Llc | Circular vertical hall (CVH) sensing element with signal processing and arctangent function |
| US9739848B1 (en) * | 2016-02-01 | 2017-08-22 | Allegro Microsystems, Llc | Circular vertical hall (CVH) sensing element with sliding integration |
| US9739847B1 (en) * | 2016-02-01 | 2017-08-22 | Allegro Microsystems, Llc | Circular vertical hall (CVH) sensing element with signal processing |
| US10585147B2 (en) * | 2016-06-14 | 2020-03-10 | Allegro Microsystems, Llc | Magnetic field sensor having error correction |
| DE102016212925A1 (de) * | 2016-07-14 | 2018-01-18 | Schaeffler Technologies AG & Co. KG | Permanentmagnet für eine Sensoranordnung zur Bestimmung einer Winkelposition des Permanentmagneten |
| US9999107B1 (en) | 2016-12-14 | 2018-06-12 | Allegro Microsystems, Llc | Light emitting diode driver for dimming and on/off control |
| DE102016225305B4 (de) | 2016-12-16 | 2019-07-11 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Verfahren zur Offset-Kompensation eines Sensorsignals eines Hall-Sensors und Sensoranordnung |
| JP6319601B1 (ja) * | 2016-12-19 | 2018-05-09 | Tdk株式会社 | 角度センサの補正装置および角度センサ |
| EP3502628B1 (en) * | 2017-12-21 | 2020-07-29 | Melexis Technologies SA | Redundant combinatory readout |
| EP3517897B1 (en) * | 2018-01-25 | 2020-10-28 | Melexis Technologies SA | Position sensing device |
| JP7260871B2 (ja) * | 2018-10-16 | 2023-04-19 | ナブテスコ株式会社 | 変位センサ |
| CN109342984A (zh) * | 2018-11-16 | 2019-02-15 | 南方电网科学研究院有限责任公司 | 一种磁阻芯片温湿度影响校正补偿系统及方法 |
| US11333486B2 (en) | 2019-10-04 | 2022-05-17 | Allegro Microsystems, Llc | Angle sensor with offline error correction |
| US11175160B2 (en) | 2019-10-18 | 2021-11-16 | Allegro Microsystems, Llc | Magnetic field sensor and method with reduced distortion measurement in sideshaft applications |
| US11333530B2 (en) | 2019-11-20 | 2022-05-17 | Allegro Microsystems, Llc | Absolute angle sensor with improved accuracy using error estimation |
| JP2021143969A (ja) * | 2020-03-13 | 2021-09-24 | Tdk株式会社 | 磁場検出装置、回転検出装置および電動パワーステアリング装置 |
| US11703314B2 (en) | 2020-05-29 | 2023-07-18 | Allegro Microsystems, Llc | Analog angle sensor with digital feedback loop |
| DE102020120803B3 (de) * | 2020-08-06 | 2022-01-13 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung eingetragener Verein | Hall-Sensor |
| US11733316B2 (en) | 2020-12-14 | 2023-08-22 | Allegro Microsystems, Llc | Position sensor having harmonic distortion compensation |
| US11802922B2 (en) | 2021-01-13 | 2023-10-31 | Allegro Microsystems, Llc | Circuit for reducing an offset component of a plurality of vertical hall elements arranged in one or more circles |
| US11581697B2 (en) | 2021-03-10 | 2023-02-14 | Allegro Microsystems, Llc | Detector system comparing pixel response with photonic energy decay |
| US12135249B2 (en) | 2021-03-12 | 2024-11-05 | Allegro Microsystems, Llc | Sensor interface with temperature signal processing |
| US12117465B2 (en) * | 2021-03-30 | 2024-10-15 | Allegro Microsystems, Llc | Automatic phase offset calculation |
| US11815406B2 (en) | 2021-04-14 | 2023-11-14 | Allegro Microsystems, Llc | Temperature sensing of an array from temperature dependent properties of a PN junction |
| US11770632B2 (en) | 2021-04-14 | 2023-09-26 | Allegro Microsystems, Llc | Determining a temperature of a pixel array by measuring voltage of a pixel |
| US11601733B2 (en) | 2021-04-14 | 2023-03-07 | Allegro Microsystems, Llc | Temperature sensing of a photodetector array |
| US11473935B1 (en) | 2021-04-16 | 2022-10-18 | Allegro Microsystems, Llc | System and related techniques that provide an angle sensor for sensing an angle of rotation of a ferromagnetic screw |
| US12111153B2 (en) | 2021-06-10 | 2024-10-08 | Allegro Microsystems, Llc | Angle sensor |
| FR3126499B1 (fr) * | 2021-09-02 | 2023-12-15 | Continental Automotive Gmbh | Procédé de détermination de la position d’un élément tournant d’un véhicule à partir d’un capteur de position |
| US11555716B1 (en) | 2021-10-20 | 2023-01-17 | Allegro Microsystems, Llc | Harmonic compensation with magnitude feedback for magnetic field sensors |
| US20230375678A1 (en) * | 2022-05-18 | 2023-11-23 | Allegro Microsystems, Llc | Photoreceiver having thresholded detection |
Family Cites Families (80)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4327416A (en) | 1980-04-16 | 1982-04-27 | Sangamo Weston, Inc. | Temperature compensation system for Hall effect element |
| JPS5855688A (ja) | 1981-09-28 | 1983-04-02 | Kawasaki Heavy Ind Ltd | 金属水素化物を利用した蓄熱システム |
| DE3346646A1 (de) | 1983-12-23 | 1985-07-04 | Standard Elektrik Lorenz Ag, 7000 Stuttgart | Magnetfeldsensor |
| DE3422490A1 (de) | 1984-06-16 | 1985-12-19 | Robert Bosch Gmbh, 7000 Stuttgart | Verfahren zur korrektur von winkelfehlern bei einem elektronischen kompass in fahrzeugen |
| CH669068A5 (de) | 1986-04-29 | 1989-02-15 | Landis & Gyr Ag | Integrierbares hallelement. |
| US4761569A (en) | 1987-02-24 | 1988-08-02 | Sprague Electric Company | Dual trigger Hall effect I.C. switch |
| US5331218A (en) | 1992-07-13 | 1994-07-19 | Allegro Microsystems, Inc. | Switched-capacitor notch filter with programmable notch width and depth |
| JP2833964B2 (ja) | 1993-06-28 | 1998-12-09 | 日本電気株式会社 | 折畳型携帯電話機 |
| US5541506A (en) | 1993-10-28 | 1996-07-30 | Nippondenso Co., Ltd. | Rotational position detector having initial setting function |
| JPH0888425A (ja) | 1994-09-19 | 1996-04-02 | Fujitsu Ltd | ホール効果磁気センサおよび薄膜磁気ヘッド |
| JPH08105707A (ja) | 1994-10-06 | 1996-04-23 | Nippondenso Co Ltd | 回転位置検出装置 |
| US5844411A (en) | 1995-05-31 | 1998-12-01 | Borg-Warner Automotive, Inc. | Diagnostic detection for hall effect digital gear tooth sensors and related method |
| US5572058A (en) | 1995-07-17 | 1996-11-05 | Honeywell Inc. | Hall effect device formed in an epitaxial layer of silicon for sensing magnetic fields parallel to the epitaxial layer |
| DE59609089D1 (de) | 1995-10-30 | 2002-05-23 | Sentron Ag Zug | Magnetfeldsensor und Strom- oder Energiesensor |
| US5621319A (en) | 1995-12-08 | 1997-04-15 | Allegro Microsystems, Inc. | Chopped hall sensor with synchronously chopped sample-and-hold circuit |
| US6297627B1 (en) | 1996-01-17 | 2001-10-02 | Allegro Microsystems, Inc. | Detection of passing magnetic articles with a peak-to-peak percentage threshold detector having a forcing circuit and automatic gain control |
| US5694038A (en) | 1996-01-17 | 1997-12-02 | Allegro Microsystems, Inc. | Detector of passing magnetic articles with automatic gain control |
| US6232768B1 (en) | 1996-01-17 | 2001-05-15 | Allegro Microsystems Inc. | Centering a signal within the dynamic range of a peak detecting proximity detector |
| US6525531B2 (en) | 1996-01-17 | 2003-02-25 | Allegro, Microsystems, Inc. | Detection of passing magnetic articles while adapting the detection threshold |
| US6100680A (en) | 1996-01-17 | 2000-08-08 | Allegro Microsystems, Inc. | Detecting the passing of magnetic articles using a transducer-signal detector having a switchable dual-mode threshold |
| US5619137A (en) | 1996-02-12 | 1997-04-08 | Allegro Microsystems, Inc. | Chopped low power magnetic-field detector with hysteresis memory |
| US5902925A (en) | 1996-07-01 | 1999-05-11 | Integrated Sensor Solutions | System and method for high accuracy calibration of a sensor for offset and sensitivity variation with temperature |
| JP3835486B2 (ja) | 1996-09-09 | 2006-10-18 | アーエムエス インターナショナル アーゲー | ホール装置のオフセット電圧を減少させる方法 |
| US5831513A (en) | 1997-02-04 | 1998-11-03 | United Microelectronics Corp. | Magnetic field sensing device |
| DE69822030T2 (de) | 1997-04-28 | 2004-08-12 | Allegro Microsystems, Inc., Worcester | Detektion von sich vorbeibewegenden magnetischen Gegenständen mit einem Schwellwertdetektor, wobei der Schwellwert ein prozentualer Anteil der Spitzenwerte ist |
| WO1998054547A1 (en) | 1997-05-29 | 1998-12-03 | Laboratorium Für Physikalische Elektronik | Magnetic rotation sensor |
| DE19738834A1 (de) | 1997-09-05 | 1999-03-11 | Hella Kg Hueck & Co | Induktiver Winkelsensor für ein Kraftfahrzeug |
| DE19738836A1 (de) | 1997-09-05 | 1999-03-11 | Hella Kg Hueck & Co | Induktiver Winkelsensor |
| US6064202A (en) | 1997-09-09 | 2000-05-16 | Physical Electronics Laboratory | Spinning current method of reducing the offset voltage of a hall device |
| US6064199A (en) | 1998-02-23 | 2000-05-16 | Analog Devices, Inc. | Magnetic field change detection circuitry having threshold establishing circuitry |
| EP0954085A1 (de) | 1998-04-27 | 1999-11-03 | Roulements Miniatures S.A. | Senkrechter Hallsensor und bürstenloser Elektromotor mit einem senkrechten Hallsensor |
| ATE337617T1 (de) | 1998-07-02 | 2006-09-15 | Austria Mikrosysteme Int | Integrierte hallanordnung |
| US6356741B1 (en) | 1998-09-18 | 2002-03-12 | Allegro Microsystems, Inc. | Magnetic pole insensitive switch circuit |
| US6265864B1 (en) | 1999-02-24 | 2001-07-24 | Melexis, N.V. | High speed densor circuit for stabilized hall effect sensor |
| DE19943128A1 (de) | 1999-09-09 | 2001-04-12 | Fraunhofer Ges Forschung | Hall-Sensoranordnung zur Offset-kompensierten Magnetfeldmessung |
| JP4936299B2 (ja) | 2000-08-21 | 2012-05-23 | メレクシス・テクノロジーズ・ナムローゼフェンノートシャップ | 磁場方向検出センサ |
| EP1260825A1 (de) | 2001-05-25 | 2002-11-27 | Sentron Ag | Magnetfeldsensor |
| DE10130988A1 (de) | 2001-06-27 | 2003-01-16 | Philips Corp Intellectual Pty | Justierung eines magnetoresistiven Winkelsensors |
| DE60237974D1 (de) | 2001-07-27 | 2010-11-25 | Delphi Tech Inc | Tachometervorrichtung und verfahren zur motorgeschwindigkeitsmessung |
| JP3775257B2 (ja) | 2001-07-30 | 2006-05-17 | アイシン精機株式会社 | 角度センサ |
| DE10148918A1 (de) | 2001-10-04 | 2003-04-10 | Philips Corp Intellectual Pty | Verfahren zur Offsetkompensation eines magnetoresistiven Weg- oder Winkelmeßsystems |
| DE10150950C1 (de) | 2001-10-16 | 2003-06-18 | Fraunhofer Ges Forschung | Kompakter vertikaler Hall-Sensor |
| AU2003221189A1 (en) | 2002-03-22 | 2003-10-08 | Asahi Kasei Emd Corporation | Angle determining apparatus and angle determining system |
| JP4368797B2 (ja) | 2002-08-01 | 2009-11-18 | メレクシス テクノロジーズ エスエー | 磁場センサ−と磁場センサ−の操作方法 |
| JP4624787B2 (ja) | 2002-09-10 | 2011-02-02 | メレクシス テッセンデルロ エヌヴィ | ホール素子を備える磁界センサ |
| DE10313642A1 (de) | 2003-03-26 | 2004-10-14 | Micronas Gmbh | Offset-reduzierter Hall-sensor |
| JP4044880B2 (ja) * | 2003-08-05 | 2008-02-06 | 株式会社日立製作所 | 非接触式角度測定装置 |
| AU2003277879A1 (en) | 2003-08-22 | 2005-04-11 | Sentron Ag | Sensor for detecting the direction of a magnetic field in a plane |
| JP2005241269A (ja) | 2004-02-24 | 2005-09-08 | Aisin Seiki Co Ltd | 角度センサ |
| GB2413905B (en) * | 2004-05-05 | 2006-05-03 | Imra Europ S A S Uk Res Ct | Permanent magnet synchronous motor and controller therefor |
| DE102004024398B4 (de) * | 2004-05-17 | 2008-05-15 | Infineon Technologies Ag | Verfahren und Vorrichtungen zum Einstellen einer Bestimmungsvorschrift eines Winkelsensors |
| DE102004038621B3 (de) * | 2004-08-09 | 2006-02-16 | Siemens Ag | Ermittlungsverfahren für ein Lagesignal |
| JP4792215B2 (ja) | 2004-09-09 | 2011-10-12 | トヨタ自動車株式会社 | 内燃機関の制御装置 |
| EP1637898A1 (en) | 2004-09-16 | 2006-03-22 | Liaisons Electroniques-Mecaniques Lem S.A. | Continuously calibrated magnetic field sensor |
| DE102004057163B3 (de) | 2004-11-26 | 2006-08-03 | A. Raymond & Cie | Anordnung zum dichten Abdecken eines Trägerteils im Bereich einer Ausnehmung |
| EP1679524A1 (en) | 2005-01-11 | 2006-07-12 | Ecole Polytechnique Federale De Lausanne Epfl - Sti - Imm - Lmis3 | Hall sensor and method of operating a Hall sensor |
| DE102005014509B4 (de) | 2005-03-30 | 2007-09-13 | Austriamicrosystems Ag | Sensoranordnung und Verfahren zur Bestimmung eines Drehwinkels |
| DE102005024879B4 (de) | 2005-05-31 | 2018-12-06 | Infineon Technologies Ag | Verfahren zum Bestimmen von Restfehler-Kompensationsparametern für einen magnetoresistiven Winkelsensor und Verfahren zum Verringern eines Restwinkelfehlers bei einem magnetoresistiven Winkelsensor |
| US7362094B2 (en) | 2006-01-17 | 2008-04-22 | Allegro Microsystems, Inc. | Methods and apparatus for magnetic article detection |
| JP2007304000A (ja) * | 2006-05-12 | 2007-11-22 | Tokai Rika Co Ltd | 回転角度検出装置 |
| US7714570B2 (en) | 2006-06-21 | 2010-05-11 | Allegro Microsystems, Inc. | Methods and apparatus for an analog rotational sensor having magnetic sensor elements |
| DE102006037226B4 (de) | 2006-08-09 | 2008-05-29 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Im Messbetrieb kalibrierbarer magnetischer 3D-Punktsensor |
| EP2000813A1 (en) | 2007-05-29 | 2008-12-10 | Ecole Polytechnique Fédérale de Lausanne | Magnetic field sensor for measuring a direction of a magnetic field in a plane |
| EP2000814B1 (en) | 2007-06-04 | 2011-10-26 | Melexis NV | Magnetic field orientation sensor |
| CN101836085B (zh) * | 2007-10-25 | 2013-03-27 | 玛克西姆综合公司 | 使用定向跟踪无接触地感测旋转和角度位置的方法和设备 |
| JP5592270B2 (ja) | 2008-01-04 | 2014-09-17 | アレグロ・マイクロシステムズ・エルエルシー | 角度センサのための方法および装置 |
| EP2108966A1 (en) | 2008-04-08 | 2009-10-14 | Ecole Polytechnique Fédérale de Lausanne (EPFL) | Current sensor and assembly group for current measurement |
| JP2010014607A (ja) | 2008-07-04 | 2010-01-21 | Aisin Seiki Co Ltd | 回転角検出装置 |
| JP5369527B2 (ja) | 2008-07-29 | 2013-12-18 | 株式会社ジェイテクト | 舵角検出装置 |
| JP2010078366A (ja) | 2008-09-24 | 2010-04-08 | Aisin Seiki Co Ltd | 角度検出装置 |
| US20100156397A1 (en) | 2008-12-23 | 2010-06-24 | Hitoshi Yabusaki | Methods and apparatus for an angle sensor for a through shaft |
| US7990209B2 (en) | 2009-06-19 | 2011-08-02 | Allegro Microsystems, Inc. | Switched capacitor notch filter |
| US8416014B2 (en) | 2010-03-12 | 2013-04-09 | Allegro Microsystems, Inc. | Switched capacitor notch filter with fast response time |
| US8350563B2 (en) * | 2010-10-12 | 2013-01-08 | Allegro Microsystems, Inc. | Magnetic field sensor and method used in a magnetic field sensor that adjusts a sensitivity and/or an offset over temperature |
| JP5177197B2 (ja) | 2010-10-13 | 2013-04-03 | Ｔｄｋ株式会社 | 回転磁界センサ |
| US8577634B2 (en) | 2010-12-15 | 2013-11-05 | Allegro Microsystems, Llc | Systems and methods for synchronizing sensor data |
| US9062990B2 (en) * | 2011-02-25 | 2015-06-23 | Allegro Microsystems, Llc | Circular vertical hall magnetic field sensing element and method with a plurality of continuous output signals |
| US8729890B2 (en) * | 2011-04-12 | 2014-05-20 | Allegro Microsystems, Llc | Magnetic angle and rotation speed sensor with continuous and discontinuous modes of operation based on rotation speed of a target object |
| US9007054B2 (en) | 2012-04-04 | 2015-04-14 | Allegro Microsystems, Llc | Angle sensor with misalignment detection and correction |
| US9389060B2 (en) | 2013-02-13 | 2016-07-12 | Allegro Microsystems, Llc | Magnetic field sensor and related techniques that provide an angle error correction module |
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2013
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2014
- 2014-01-15 KR KR1020157024923A patent/KR102057891B1/ko active Active
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- 2014-01-15 WO PCT/US2014/011580 patent/WO2014126670A1/en not_active Ceased
- 2014-01-15 EP EP14702173.7A patent/EP2954341B1/en active Active
- 2014-01-15 JP JP2015558010A patent/JP6271593B2/ja active Active
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|---|---|
| KR102057891B1 (ko) | 2020-01-22 |
| US9389060B2 (en) | 2016-07-12 |
| WO2014126670A1 (en) | 2014-08-21 |
| US20140225597A1 (en) | 2014-08-14 |
| KR20150121054A (ko) | 2015-10-28 |
| EP3828572A1 (en) | 2021-06-02 |
| EP2954341A1 (en) | 2015-12-16 |
| EP3828572C0 (en) | 2024-01-03 |
| EP2954341B1 (en) | 2021-02-24 |
| JP2016507071A (ja) | 2016-03-07 |
| EP3828572B1 (en) | 2024-01-03 |
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