JP6210976B2 - Mrirfコイルに対する離調回路としてのfetスイッチ - Google Patents
Mrirfコイルに対する離調回路としてのfetスイッチ Download PDFInfo
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- JP6210976B2 JP6210976B2 JP2014511992A JP2014511992A JP6210976B2 JP 6210976 B2 JP6210976 B2 JP 6210976B2 JP 2014511992 A JP2014511992 A JP 2014511992A JP 2014511992 A JP2014511992 A JP 2014511992A JP 6210976 B2 JP6210976 B2 JP 6210976B2
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- 230000005284 excitation Effects 0.000 claims description 17
- 230000004044 response Effects 0.000 claims description 9
- 230000005669 field effect Effects 0.000 claims description 6
- 238000000034 method Methods 0.000 claims description 6
- 230000003071 parasitic effect Effects 0.000 claims description 5
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 claims description 4
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 claims description 4
- 238000001646 magnetic resonance method Methods 0.000 claims description 3
- 230000003068 static effect Effects 0.000 claims description 2
- 229910002601 GaN Inorganic materials 0.000 claims 2
- 229910010271 silicon carbide Inorganic materials 0.000 claims 2
- 238000002595 magnetic resonance imaging Methods 0.000 description 19
- 238000010586 diagram Methods 0.000 description 15
- 230000005540 biological transmission Effects 0.000 description 7
- 239000003990 capacitor Substances 0.000 description 7
- 230000006870 function Effects 0.000 description 4
- 238000011143 downstream manufacturing Methods 0.000 description 3
- 238000004611 spectroscopical analysis Methods 0.000 description 3
- 230000000903 blocking effect Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000003595 spectral effect Effects 0.000 description 2
- 238000005513 bias potential Methods 0.000 description 1
- 239000002800 charge carrier Substances 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000003306 harvesting Methods 0.000 description 1
- 238000001727 in vivo Methods 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000002040 relaxant effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
- G01R33/28—Details of apparatus provided for in groups G01R33/44 - G01R33/64
- G01R33/32—Excitation or detection systems, e.g. using radio frequency signals
- G01R33/36—Electrical details, e.g. matching or coupling of the coil to the receiver
- G01R33/3628—Tuning/matching of the transmit/receive coil
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
- G01R33/28—Details of apparatus provided for in groups G01R33/44 - G01R33/64
- G01R33/32—Excitation or detection systems, e.g. using radio frequency signals
- G01R33/36—Electrical details, e.g. matching or coupling of the coil to the receiver
- G01R33/3642—Mutual coupling or decoupling of multiple coils, e.g. decoupling of a receive coil from a transmission coil, or intentional coupling of RF coils, e.g. for RF magnetic field amplification
- G01R33/3657—Decoupling of multiple RF coils wherein the multiple RF coils do not have the same function in MR, e.g. decoupling of a transmission coil from a receive coil
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
- G01R33/28—Details of apparatus provided for in groups G01R33/44 - G01R33/64
- G01R33/32—Excitation or detection systems, e.g. using radio frequency signals
- G01R33/34—Constructional details, e.g. resonators, specially adapted to MR
- G01R33/341—Constructional details, e.g. resonators, specially adapted to MR comprising surface coils
- G01R33/3415—Constructional details, e.g. resonators, specially adapted to MR comprising surface coils comprising arrays of sub-coils, i.e. phased-array coils with flexible receiver channels
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
- G01R33/28—Details of apparatus provided for in groups G01R33/44 - G01R33/64
- G01R33/32—Excitation or detection systems, e.g. using radio frequency signals
- G01R33/36—Electrical details, e.g. matching or coupling of the coil to the receiver
- G01R33/3664—Switching for purposes other than coil coupling or decoupling, e.g. switching between a phased array mode and a quadrature mode, switching between surface coil modes of different geometrical shapes, switching from a whole body reception coil to a local reception coil or switching for automatic coil selection in moving table MR or for changing the field-of-view
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- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Magnetic Resonance Imaging Apparatus (AREA)
Description
Claims (15)
- 磁気共鳴に使用する無線周波数(RF)コイルアセンブリにおいて、
無線周波数コイルと、
前記コイルを事前選択された共鳴周波数に対して離調及び同調するように開状態と閉状態との間で切り替わる電子スイッチと、
を含み、前記電子スイッチが、
少なくとも1つの電界効果トランジスタ(FET)及びバイアスネットワーク、
を含み、前記コイルは、前記FETがオフである場合に前記事前選択された共鳴周波数に対して離調され、前記FETがオンである場合に同調され、
前記バイアスネットワークは、アクティブバイアス信号に応答して前記FETにアクティブバイアス電圧を供給し、入射RF信号から生成される自己バイアス信号に応答して前記FETに自己バイアス電圧を供給する、
RFコイルアセンブリ。 - 前記RFコイルが、ループコイルであり、前記少なくとも1つのFETは、前記少なくとも1つのFETが閉じられる場合に前記ループコイルをMR周波数に同調させ、前記FETが開かれる場合に前記ループコイルを離調するようにループ内で接続される、請求項1に記載のRFコイルアセンブリ。
- 前記電子スイッチが、
同調状態で前記電子スイッチから寄生容量を除去する補償回路、
を含む、請求項1ないし2のいずれか一項に記載のRFコイルアセンブリ。 - 前記バイアスネットワークが、
前記アクティブバイアス信号及び前記自己バイアス信号の電圧を制限するバイアスリミッタ、
を含む、請求項1ないし3のいずれか一項に記載のRFコイルアセンブリ。 - 前記電子スイッチが、
入射RF信号の一部を整流することにより前記自己バイアス信号を生成する自己バイアスネットワーク、
を含む、請求項4に記載のRFコイルアセンブリ。 - 前記FETが、炭化ケイ素及び窒化ガリウムの少なくとも一方を有する、請求項1ないし5のいずれか一項に記載のRFコイルアセンブリ。
- 複数の状態の間の切り替え時間が、50マイクロ秒より小さい、請求項1ないし6のいずれか一項に記載のRFコイルアセンブリ。
- 前記電子スイッチが、同調状態で0.3オームより小さい抵抗及び離調状態で3000オームより大きい抵抗を持つ、請求項1ないし7のいずれか一項に記載のRFコイルアセンブリ。
- 前記電子スイッチが、離調状態において100ボルトより大きい電圧に耐える、請求項1ないし8のいずれか一項に記載のRFコイルアセンブリ。
- 前記電子スイッチが、前記電子スイッチの定格電圧を向上させるように直列に配置されたFETのアレイ及び前記電子スイッチの抵抗を減少させるように並列に配置されたFETのアレイの少なくとも1つを含む、請求項1ないし9のいずれか一項に記載のRFコイルアセンブリ。
- 検査領域において静磁場を生成する磁石と、
前記検査領域において共鳴を励起及び操作するように磁気周波数のRFパルスを生成するRF送信コイル及びRF送信器と、
前記検査領域から磁気共鳴データを取得するように構成された請求項1ないし10のいずれか一項に記載の少なくとも1つのRF受信コイルアセンブリと、
前記少なくとも1つのRFコイルアセンブリに接続された少なくとも1つのRF受信器と、
前記電子スイッチの少なくとも1つの状態を切り替える制御信号を生成する制御回路と、
前記RF送信器及びRF受信器並びに前記制御回路を制御するスキャンコントローラと、
を含む、磁気共鳴システム。 - 検査領域において共鳴信号を誘起するように磁気共鳴(MR)周波数においてRF励起信号を送信するステップと、
少なくとも1つの電界効果トランジスタ(FET)及びバイアスネットワークを用いて、前記検査領域から共鳴信号を受信するように前記MR周波数に対してRF受信コイルを同調させ、前記RF受信コイルが前記送信されたRF励起信号を受信することを阻止するように前記RF受信コイルを離調するステップと、
を含み、
前記バイアスネットワークは、アクティブバイアス信号に応答して前記FETにアクティブバイアス電圧を供給し、入射RF信号から生成される自己バイアス信号に応答して前記FETに自己バイアス電圧を供給する、
磁気共鳴方法。 - 前記RF受信コイルを離調するように少なくとも1つのFETを非導通状態に切り替えるバイアス電圧を生成するステップ、
を含む、請求項12に記載の方法。 - 前記FETが、炭化ケイ素及び窒化ガリウムの少なくとも一方を有する、請求項12及び13のいずれか一項に記載の方法。
- 離調状態と同調状態との間の切り替え時間が、50マイクロ秒より小さい、請求項12ないし14のいずれか一項に記載の方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
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US201161488861P | 2011-05-23 | 2011-05-23 | |
US61/488,861 | 2011-05-23 | ||
PCT/IB2012/052571 WO2012160518A1 (en) | 2011-05-23 | 2012-05-22 | Fet switch as detune circuit for mri rf coils |
Publications (3)
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JP2014515284A JP2014515284A (ja) | 2014-06-30 |
JP2014515284A5 JP2014515284A5 (ja) | 2015-06-25 |
JP6210976B2 true JP6210976B2 (ja) | 2017-10-11 |
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JP2014511992A Expired - Fee Related JP6210976B2 (ja) | 2011-05-23 | 2012-05-22 | Mrirfコイルに対する離調回路としてのfetスイッチ |
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US (1) | US9720060B2 (ja) |
EP (1) | EP2715386A1 (ja) |
JP (1) | JP6210976B2 (ja) |
CN (1) | CN103547937B (ja) |
WO (1) | WO2012160518A1 (ja) |
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CN101819263A (zh) * | 2010-03-23 | 2010-09-01 | 苏州工业园区朗润科技有限公司 | 用于核磁共振系统中射频发射线圈的失谐电路和方法 |
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2012
- 2012-05-22 EP EP12726866.2A patent/EP2715386A1/en not_active Withdrawn
- 2012-05-22 JP JP2014511992A patent/JP6210976B2/ja not_active Expired - Fee Related
- 2012-05-22 US US14/118,345 patent/US9720060B2/en not_active Expired - Fee Related
- 2012-05-22 WO PCT/IB2012/052571 patent/WO2012160518A1/en active Application Filing
- 2012-05-22 CN CN201280025121.0A patent/CN103547937B/zh not_active Expired - Fee Related
Also Published As
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EP2715386A1 (en) | 2014-04-09 |
US20140070808A1 (en) | 2014-03-13 |
US9720060B2 (en) | 2017-08-01 |
WO2012160518A1 (en) | 2012-11-29 |
CN103547937A (zh) | 2014-01-29 |
CN103547937B (zh) | 2016-09-21 |
JP2014515284A (ja) | 2014-06-30 |
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