JP6199938B2 - 3次元歪みを決定する方法及び装置 - Google Patents
3次元歪みを決定する方法及び装置 Download PDFInfo
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- JP6199938B2 JP6199938B2 JP2015206189A JP2015206189A JP6199938B2 JP 6199938 B2 JP6199938 B2 JP 6199938B2 JP 2015206189 A JP2015206189 A JP 2015206189A JP 2015206189 A JP2015206189 A JP 2015206189A JP 6199938 B2 JP6199938 B2 JP 6199938B2
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- reflector
- distortion
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/0006—Industrial image inspection using a design-rule based approach
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/005—Testing of reflective surfaces, e.g. mirrors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/08—Testing mechanical properties
- G01M11/081—Testing mechanical properties by using a contact-less detection method, i.e. with a camera
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
- G01N2021/9586—Windscreens
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Quality & Reliability (AREA)
- Theoretical Computer Science (AREA)
- Length Measuring Devices By Optical Means (AREA)
Description
2…ガラス表面
3…カメラ
5…格子
7…仮想カメラ
Claims (10)
- 反射体(1)における反射によって形成される対象物(5)の像の歪みを決定する方法であって、該方法は、
前記反射体(1)の表面(2)の3次元形状を決定する工程と、
既知となった前記反射体の前記3次元形状に基づいて、前記対象物(5)の前記像の前記歪みを、異なる複数の視野方向から計算する工程と、
計算した前記歪みに基づいて、3次元歪みを決定する工程と、
を有する方法。 - 請求項1記載の方法において、前記対象物(5)の前記像の前記歪みを、異なる複数の視野方向から計算するため、仮想カメラ(7)を所望の視野方向全てに配置し、前記対象物(5)の反射像を、前記仮想カメラ(7)の視点から決定することを特徴とする方法。
- 請求項1又は2記載の方法において、前記反射体の前記表面(2)の形状は、カメラ(3)を用いて、デフレクトメトリ法によって決定されることを特徴とする方法。
- 請求項1〜3のいずれか1項に記載の方法において、前記対象物(5)の前記像の前記歪みは、前記表面(2)上の各点に対して視野方向において決定され、前記視野方向は、該各点における前記反射体(1)の前記表面(2)の法線に一致することを特徴とする方法。
- 請求項1〜4のいずれか1項に記載の方法において、前記反射体の前記表面の反射率は、変化されることを特徴とする方法。
- 反射体(1)の反射によって形成される対象物(5)の像の3次元歪みを、カメラ(3)によって決定する装置であって、
前記装置は、
前記反射体(1)の表面(2)の3次元形状を決定し、
既知となった前記反射体の前記3次元形状に基づいて、前記対象物(5)の前記像の前記歪みを、異なる複数の視野方向から計算し、
計算した前記歪みに基づいて、前記3次元歪みを決定する、
ことを特徴とする装置。 - 請求項6記載の装置において、
前記対象物の前記像の前記歪みを、異なる複数の視野方向から計算し、
所望の視野方向全てに仮想カメラ(7)を配置し、
前記対象物(5)の反射像を、前記仮想カメラ(7)の視点から決定する、
ことを特徴とする装置。 - 請求項6又は7記載の装置において、前記反射体の前記表面(2)の形状を、前記カメラ(3)を用いて、デフレクトメトリ法によって決定することを特徴とする装置。
- 請求項6〜8のいずれか1項に記載の装置において、前記対象物(5)の前記像の前記歪みを、前記表面(2)上の各点に対して視野方向において決定し、前記視野方向は、該各点における前記反射体(1)の前記表面(2)の法線に一致することを特徴とする装置。
- 請求項6〜9のいずれか1項に記載の装置において、前記反射体の前記表面の反射率は、変化できることを特徴とする装置。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102014115331.6A DE102014115331A1 (de) | 2014-10-21 | 2014-10-21 | Verfahren und Vorrichtung zur Ermittlung einer dreidimensionalen Verzerrung |
DE102014115331.6 | 2014-10-21 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2016080709A JP2016080709A (ja) | 2016-05-16 |
JP6199938B2 true JP6199938B2 (ja) | 2017-09-20 |
Family
ID=54359828
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2015206189A Active JP6199938B2 (ja) | 2014-10-21 | 2015-10-20 | 3次元歪みを決定する方法及び装置 |
Country Status (6)
Country | Link |
---|---|
EP (1) | EP3012578B1 (ja) |
JP (1) | JP6199938B2 (ja) |
KR (1) | KR101841630B1 (ja) |
CN (1) | CN105528777B (ja) |
DE (1) | DE102014115331A1 (ja) |
ES (1) | ES2874101T3 (ja) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP3561446A1 (de) | 2018-04-23 | 2019-10-30 | Carl Zeiss Vision International GmbH | Verfahren und vorrichtung zum vermessen einer optischen linse für individuelle tragesituationen eines nutzers |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05272949A (ja) * | 1992-03-30 | 1993-10-22 | Nippon Sheet Glass Co Ltd | ガラス板表面評価方法 |
JPH10111953A (ja) * | 1996-10-07 | 1998-04-28 | Canon Inc | 画像処理方法および装置および記憶媒体 |
DE10217068B4 (de) * | 2002-04-17 | 2005-09-15 | Michael Dr.-Ing. Gandyra | Verfahren zum optischen Messen der Form reflektierender und streuender Freiformflächen |
AU2003286179A1 (en) * | 2002-11-29 | 2004-06-23 | Obe Ohnmacht And Baumgartner Gmbh And Co. Kg | Method and device for optical form measurement and/or estimation |
DE10258130A1 (de) * | 2002-11-29 | 2004-06-17 | Christoph Wagner | Verfahren und Vorrichtung zur optischen Formerfassung von Gegenständen und Oberflächen |
DE102004033526A1 (de) * | 2004-07-08 | 2006-02-02 | Universität Karlsruhe (TH) Institut für Mess- und Regelungstechnik | Verfahren und Vorrichtung zur Analyse zumindest partiell reflektierender Oberflächen |
JP4667161B2 (ja) * | 2005-08-10 | 2011-04-06 | 大日本印刷株式会社 | 表面に繊維シートを張り付けた三次元仮想物体に基づく二次元画像生成方法および生成装置 |
DE102006015792A1 (de) * | 2006-04-05 | 2007-10-18 | Isra Surface Vision Gmbh | Verfahren und System zur Formmessung einer reflektierenden Oberfläche |
US9767599B2 (en) * | 2006-12-29 | 2017-09-19 | X-Rite Inc. | Surface appearance simulation |
JP4998711B2 (ja) * | 2007-03-12 | 2012-08-15 | Jfeスチール株式会社 | 面歪の測定装置及び方法 |
US8224066B2 (en) * | 2007-05-29 | 2012-07-17 | Gerd Haeusler | Method and microscopy device for the deflectometric detection of local gradients and the three-dimensional shape of an object |
EP2252856B1 (en) * | 2008-02-15 | 2017-11-01 | Pilkington Group Limited | Method of determination of glass surface shape and optical distortion by reflected optical imaging |
JP5083052B2 (ja) * | 2008-06-06 | 2012-11-28 | ソニー株式会社 | 立体視画像生成装置、立体視画像生成方法およびプログラム |
JP2010071782A (ja) * | 2008-09-18 | 2010-04-02 | Omron Corp | 3次元計測装置およびその方法 |
FR2951544A1 (fr) * | 2009-10-21 | 2011-04-22 | Saint Gobain | Procede d'analyse de la qualite d'un vitrage |
CN102243074B (zh) * | 2010-05-13 | 2014-06-18 | 中国科学院遥感应用研究所 | 基于光线追踪技术的航空遥感成像几何变形仿真方法 |
-
2014
- 2014-10-21 DE DE102014115331.6A patent/DE102014115331A1/de not_active Ceased
-
2015
- 2015-10-16 EP EP15190190.7A patent/EP3012578B1/de active Active
- 2015-10-16 ES ES15190190T patent/ES2874101T3/es active Active
- 2015-10-20 JP JP2015206189A patent/JP6199938B2/ja active Active
- 2015-10-20 CN CN201510681560.2A patent/CN105528777B/zh active Active
- 2015-10-21 KR KR1020150146806A patent/KR101841630B1/ko active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
EP3012578A2 (de) | 2016-04-27 |
EP3012578B1 (de) | 2021-03-31 |
JP2016080709A (ja) | 2016-05-16 |
EP3012578A3 (de) | 2016-06-01 |
CN105528777B (zh) | 2018-11-09 |
KR101841630B1 (ko) | 2018-03-23 |
ES2874101T3 (es) | 2021-11-04 |
KR20160046745A (ko) | 2016-04-29 |
CN105528777A (zh) | 2016-04-27 |
DE102014115331A1 (de) | 2016-04-21 |
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