JP6158839B2 - フレキシブル基板上に光電池を形成するシステム - Google Patents
フレキシブル基板上に光電池を形成するシステム Download PDFInfo
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- JP6158839B2 JP6158839B2 JP2014553483A JP2014553483A JP6158839B2 JP 6158839 B2 JP6158839 B2 JP 6158839B2 JP 2014553483 A JP2014553483 A JP 2014553483A JP 2014553483 A JP2014553483 A JP 2014553483A JP 6158839 B2 JP6158839 B2 JP 6158839B2
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Images
Classifications
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/0021—Reactive sputtering or evaporation
- C23C14/0036—Reactive sputtering
- C23C14/0057—Reactive sputtering using reactive gases other than O2, H2O, N2, NH3 or CH4
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
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- C23C14/0036—Reactive sputtering
- C23C14/0063—Reactive sputtering characterised by means for introducing or removing gases
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/0623—Sulfides, selenides or tellurides
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
- C23C14/243—Crucibles for source material
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
- C23C14/3428—Cathode assembly for sputtering apparatus, e.g. Target using liquid targets
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
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- C—CHEMISTRY; METALLURGY
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3402—Gas-filled discharge tubes operating with cathodic sputtering using supplementary magnetic fields
- H01J37/3405—Magnetron sputtering
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- H01J37/3402—Gas-filled discharge tubes operating with cathodic sputtering using supplementary magnetic fields
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- H—ELECTRICITY
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- H01J37/32—Gas-filled discharge tubes
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- H01J37/3411—Constructional aspects of the reactor
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- H—ELECTRICITY
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- H—ELECTRICITY
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- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
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- H—ELECTRICITY
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Description
本出願は、2012年1月18日出願の米国仮特許出願第61/587,994号に対する優先権を主張し、この出願の全体が参照により本明細書に組み込まれる。
本明細書で述べる全ての刊行物、特許及び特許出願は、あたかも各個の刊行物、特許又は特許出願が具体的且つ個別に示されて参照により組み込まれるのと同程度に、参照により本明細書に組み込まれる。
本開示の一態様は、フレキシブル基板上に薄膜光電池を成膜する成膜システムを提供する。そのようなシステムは、銅・インジウム・ガリウム・ジセレニド(CIGS)、銅・インジウム・アルミニウム・ジセレニド(CIAS)、銅・亜鉛・スズ・ジスルフィド/セレニド(CZTS)、銅・インジウム・ジセレニド(CIS)、カドミウム・テルル(「テルル化カドミウム」)又はカドミウム・亜鉛・テルルから形成した吸収体を備える光電池の形成に使用するために採用することができる。
本開示のシステム及び方法は、コンピュータ・システムを用いて実装することができる。システムは、1つ又は複数の成膜システムと、ポンピング・システムとを備える筐体を含むことができる。コンピュータ・システム(又は制御器)は、システムに結合することができる。コンピュータ・システムは、光電池を形成する方法を実施する機械可読コードを実行するコンピュータ・プロセッサ(本明細書では「プロセッサ」とも呼ぶ)を含むことができる。コードは、本明細書で提供する方法のいずれかを実施することができる。
CIGS太陽電池用裏面電極層をステンレス鋼(SS)薄箔のウェブ上に被覆する機械構成を図8に示す。この例は、モリブデン裏面電極を採用するが、タングステン及びニオブ等の他の材料を使用することができる。
図9は、CIGSプリカーサ層を成膜するシステムを示す。各被覆ステーションが示され、各被覆ステーションは、層の成膜中に気化セレンを提供することができる蒸気供給源30を備える。標的材料は、銅、インジウム及びガリウムを含むが、いくつかの構成が可能である。例えば、各被覆ステーションにおける2つのマグネトロンは、インジウム標的を有する1つのマグネトロン、及び銅/ガリウム合金標的を有する1つのマグネトロンを有することができ、即ち、各ステーションは同一である。代替的に、標的の組成をステーションごとに変更してもよい。他の構成では、あらゆるステーションの両方の標的は、同一であってもよい。更に、銅/ガリウム合金標的のいずれも純粋な銅標的で置き換えることができ、ガリウムは、図5の供給源27によって示すようにその液相から銅又はインジウム標的上にスパッタリングする。
研究室で作製した最も高効率のCIGS太陽電池は、接合層として硫化カドミウム(CdS)の化学浴析出を使用している。しかし、市販のCIGSモジュールは、硫化亜鉛(ZnS)及び硫化インジウム(In2S3)を化学的に成膜した接合層を有する電池も使用している。スパッタリングによって接合層を作製することが可能であり、図10は、本出願のシステム構成を示す。機械の左側(ステーションI〜III)は、CdS平面標的の平面マグネトロン・スパッタリングを示す。純粋なCdSは、抵抗が高く、無線周波(RF)エネルギーでスパッタリングすることができるが、金属ドープしたCdS又は化学量論的組成から外れたCdSは、交流電流(AC)電力でスパッタリングすることができる。ステーションIV〜VIは、反応性ZnS又はIn2S3接合層をスパッタリング可能な様式に構成して示す。回転可能標的は、亜鉛金属又はインジウム金属のいずれかであり、これらは、供給源30によって供給される硫黄蒸気の存在下でスパッタリングされる。いくつかの工程では、真性又は高抵抗性酸化亜鉛(iZnO)の薄層を接合層の上部に成膜する。高抵抗性の平面酸化亜鉛標的は、この目的で(CdSのように)無線周波(RF)スパッタリングすることができ、又はわずかにドープした酸化亜鉛をACにより少量の酸素の存在下でスパッタリングして高抵抗性化学量論的組成を回復させることができる。
従来のシリコン太陽電池とは異なり、薄膜電池は、ほとんどの場合スパッタリングにより成膜する透明上部電極を必要とする。酸化インジウムスズ(ITO)、及びアルミニウムをわずかにドープした酸化亜鉛(AZO)は、この目的で使用できる2つの材料である。両方とも、回転可能形式で提供することができ、直流電流(DC)、パルスDC又はAC電力によってスパッタリングするのに十分に導電性である。図11は、透明上部電極のスパッタ成膜システムを示す。このシステムは、イオンエッチングがなく、標的が金属ではなく導電性酸化物、ITO及び/又はAZOである以外は裏面電極をスパッタリングする構成と非常に似ている。場合によっては、AC又はパルスDCモードは、有利には、アークの制御力のために長期の加工安定性を実現することができる。スパッタリングしながら少量の酸素をプラズマに添加することによって、AZO標的を使用するiZnOのような層を作ることも可能である。このことは、上記の例で説明したRFによるiZnOスパッタリングの代わりに使用することができる。また、裏側被覆は、上記又は本明細書の別の場所で説明したように、選択部分で単一マグネトロン・チャンバ35を使用して形成することができる。
Claims (10)
- フレキシブル基板上に薄膜光電池を成膜する成膜システムであって、
a)筐体であって、前記筐体の外部の環境から流体隔離した流体場を備える筐体と、
b)前記流体場内の複数の成膜チャンバであって、前記複数の成膜チャンバの少なくとも1つの成膜チャンバは、前記フレキシブル基板の、前記複数の成膜チャンバの前記少なくとも1つの成膜チャンバ内に配置した部分に向けて1つ又は複数の標的材料の材料流を誘導するマグネトロン・スパッタリング装置を備え、
b1)マグネトロン・スパッタリング装置を備える前記成膜チャンバのそれぞれは、前記フレキシブル基板が通過する開口、及び調節可能な伝導制限器であって、前記基板と前記伝導制限器との間に間隙を形成するために前記開口に配置した伝導制限器を含む、複数の成膜チャンバと、
c)前記筐体内の基板繰出しローラ及び基板巻取りローラであって、前記基板繰出しローラは、前記複数の成膜チャンバのそれぞれを通って前記基板巻取りローラに誘導されるフレキシブル基板を提供する、基板繰出しローラ及び基板巻取りローラと、
d)前記筐体内の少なくとも1つの案内ローラであって、前記フレキシブル基板を前記複数の成膜チャンバのうち所与の成膜チャンバに、又は前記所与の成膜チャンバから誘導するように構成した少なくとも1つの案内ローラと
を備える成膜システムであり、
前記少なくとも1つの成膜チャンバは、
平面マグネトロンに隣接する回転可能マグネトロンと、
前記回転可能マグネトロンと前記平面マグネトロンとの間にサブ・チャンバを形成する1つ又は複数の遮蔽部と
を備えるマグネトロン・スパッタリング装置を備え、
前記平面マグネトロンは、第1の材料を有する液体標的を収容し、前記第1の材料を有する材料流を前記回転可能マグネトロンに向けて与えるように構成され、
前記回転可能マグネトロンは、第2の材料を有する固体標的を前記平面マグネトロンに対して回転させ、前記第1の材料及び前記第2の材料を有する材料流を前記フレキシブル基板に向けて与えるように構成される、成膜システム。 - 前記第1の材料は、前記第2の材料の第2の溶融点よりも低い第1の溶融点を有する、請求項1に記載の成膜システム。
- 前記第1の材料はガリウムであり、前記第2の材料はインジウムである、請求項1に記載の成膜システム。
- 前記回転可能マグネトロンは、前記平面マグネトロンに対して前記固体標的を回転するように構成した支持部材を備える、請求項1に記載の成膜システム。
- 前記平面マグネトロンに隣接する別の平面マグネトロンを更に備える、請求項1に記載の成膜システムであって、前記別の平面マグネトロンは、前記サブ・チャンバ内に第3の材料の流れを与えるように構成される、成膜システム。
- 前記マグネトロン・スパッタリング装置に隣接する別のマグネトロン・スパッタリング装置を更に備える、請求項1に記載の成膜システムであって、前記別のマグネトロン・スパッタリング装置は、第3の材料の流れを前記基板に向けて与えるように構成される、成膜システム。
- 前記マグネトロン・スパッタリング装置は、前記基板をさらすように構成した開口を有する別のチャンバに封入される、請求項6に記載の成膜システム。
- 前記第1の材料はガリウムであり、前記第2の材料はインジウム及び銅のうちの1つであり、前記第3の材料はインジウム及び銅のうちの他方である、請求項6に記載の成膜システム。
- 前記マグネトロン・スパッタリング装置に隣接する第3の材料の供給源を更に備える、請求項1に記載の成膜システム。
- 前記第3の材料は硫黄又はセレンである、請求項9に記載の成膜システム。
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PCT/US2013/022284 WO2013109977A1 (en) | 2012-01-18 | 2013-01-18 | Systems for forming photovoltaic cells on flexible substrates |
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WO2022159633A1 (en) * | 2021-01-20 | 2022-07-28 | Starfire Industries Llc | Bellows coating by magnetron sputtering with kick pulse |
CN114990503B (zh) * | 2022-06-30 | 2023-12-12 | 业成科技(成都)有限公司 | 镀膜方法、镀膜设备和电子设备 |
CN117005019B (zh) * | 2023-10-07 | 2023-12-01 | 江苏格林保尔光伏有限公司 | 一种Top-Con单晶硅电池片材料制备设备及其制备方法 |
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JP3831592B2 (ja) * | 2000-09-06 | 2006-10-11 | 松下電器産業株式会社 | 化合物半導体薄膜の製造方法 |
AU2003275239A1 (en) * | 2002-09-30 | 2004-04-23 | Miasole | Manufacturing apparatus and method for large-scale production of thin-film solar cells |
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JP5240782B2 (ja) * | 2009-05-18 | 2013-07-17 | 株式会社神戸製鋼所 | 連続成膜装置 |
US8088224B2 (en) * | 2010-01-15 | 2012-01-03 | Solopower, Inc. | Roll-to-roll evaporation system and method to manufacture group IBIIAVIA photovoltaics |
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EP2805358A1 (en) | 2014-11-26 |
JP2015510037A (ja) | 2015-04-02 |
MX344096B (es) | 2016-12-05 |
CN104169459B (zh) | 2017-03-01 |
US20140367250A1 (en) | 2014-12-18 |
EP2805358A4 (en) | 2015-09-30 |
WO2013109977A8 (en) | 2014-08-21 |
WO2013109977A1 (en) | 2013-07-25 |
BR112014017732A8 (pt) | 2017-07-11 |
EP2805358B1 (en) | 2016-11-30 |
BR112014017732A2 (ja) | 2017-06-20 |
CN104169459A (zh) | 2014-11-26 |
KR20140116203A (ko) | 2014-10-01 |
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