JP6114539B2 - オブジェクトの検査のために画像を処理するための方法およびシステム - Google Patents

オブジェクトの検査のために画像を処理するための方法およびシステム Download PDF

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JP6114539B2
JP6114539B2 JP2012267830A JP2012267830A JP6114539B2 JP 6114539 B2 JP6114539 B2 JP 6114539B2 JP 2012267830 A JP2012267830 A JP 2012267830A JP 2012267830 A JP2012267830 A JP 2012267830A JP 6114539 B2 JP6114539 B2 JP 6114539B2
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processor
images
image
storage medium
readable storage
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Japanese (ja)
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JP2013125031A (ja
JP2013125031A5 (enExample
Inventor
グレン・ウイリアム・ブルックスビー
パウロ・リカルド・ド・サントス・メンドンカ
シュバオ・リュー
キ・ソン
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General Electric Co
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General Electric Co
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00—Image enhancement or restoration
    • G06T5/80—Geometric correction
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10132—Ultrasound image
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30164—Workpiece; Machine component

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Image Processing (AREA)
JP2012267830A 2011-12-13 2012-12-07 オブジェクトの検査のために画像を処理するための方法およびシステム Expired - Fee Related JP6114539B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13/323,957 US8942465B2 (en) 2011-12-13 2011-12-13 Methods and systems for processing images for inspection of an object
US13/323,957 2011-12-13

Publications (3)

Publication Number Publication Date
JP2013125031A JP2013125031A (ja) 2013-06-24
JP2013125031A5 JP2013125031A5 (enExample) 2016-01-21
JP6114539B2 true JP6114539B2 (ja) 2017-04-12

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JP2012267830A Expired - Fee Related JP6114539B2 (ja) 2011-12-13 2012-12-07 オブジェクトの検査のために画像を処理するための方法およびシステム

Country Status (6)

Country Link
US (1) US8942465B2 (enExample)
EP (1) EP2605213B1 (enExample)
JP (1) JP6114539B2 (enExample)
CN (1) CN103218805B (enExample)
BR (1) BR102012030402A2 (enExample)
CA (1) CA2797454A1 (enExample)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104751440A (zh) * 2013-12-31 2015-07-01 西门子医疗保健诊断公司 一种基于图像处理的方法和装置
US9305345B2 (en) 2014-04-24 2016-04-05 General Electric Company System and method for image based inspection of an object
CN103969337B (zh) * 2014-05-07 2017-02-22 北京工业大学 一种基于矢量全聚焦成像的超声阵列裂纹类缺陷方向识别方法
CN104034732B (zh) * 2014-06-17 2016-09-28 西安工程大学 一种基于视觉任务驱动的织物疵点检测方法
CN107582096A (zh) * 2016-07-08 2018-01-16 佳能株式会社 用于获取信息的装置、方法和存储介质
CN114079768B (zh) * 2020-08-18 2023-12-05 杭州海康汽车软件有限公司 图像的清晰度测试方法及装置
US11474080B2 (en) * 2021-11-26 2022-10-18 Hefei Juneng Electro Physics High-Tech Development Co., Ltd. Automatic ultrasonic imaging inspection method and system based on six-axis manipulator
CN119334280B (zh) * 2024-09-30 2025-09-16 中国航发北京航空材料研究院 一种单晶叶片壁厚的测量方法、系统、设备及存储介质

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JPS61203949A (ja) * 1985-03-04 1986-09-09 株式会社東芝 超音波診断装置
CA2296143A1 (fr) * 2000-01-18 2001-07-18 9071 9410 Quebec Inc. Systeme d'inspection optique
US7556602B2 (en) 2000-11-24 2009-07-07 U-Systems, Inc. Breast cancer screening with adjunctive ultrasound mammography
DE602004030900D1 (de) 2003-01-15 2011-02-17 Univ Virginia Effizientes ultraschallsystem für die zweidimensionale c-scan-darstellung und verwandte verfahren
US8317702B2 (en) * 2003-06-20 2012-11-27 U-Systems, Inc. Full-field breast ultrasound system and architecture
WO2005010561A2 (en) * 2003-07-22 2005-02-03 L-3 Communications Security and Detection Systems Corporation Methods and apparatus for detecting objects in baggage using x-rays
US7328620B2 (en) 2004-12-16 2008-02-12 General Electric Company Methods and system for ultrasound inspection
KR100868483B1 (ko) 2005-10-07 2008-11-12 주식회사 메디슨 초음파영상 디스플레이 방법
JP2007199865A (ja) 2006-01-24 2007-08-09 Sharp Corp 画像処理アルゴリズム評価装置、画像処理アルゴリズムの生成装置および画像検査装置ならびに画像処理アルゴリズム評価方法、画像処理アルゴリズムの生成方法および画像検査方法
US7677078B2 (en) 2006-02-02 2010-03-16 Siemens Medical Solutions Usa, Inc. Line-based calibration of ultrasound transducer integrated with a pose sensor
US8073234B2 (en) 2007-08-27 2011-12-06 Acushnet Company Method and apparatus for inspecting objects using multiple images having varying optical properties
JP5324136B2 (ja) * 2008-06-09 2013-10-23 東邦瓦斯株式会社 粒界面亀裂検出方法及び粒界面亀裂検出装置
GB0818088D0 (en) * 2008-10-03 2008-11-05 Qinetiq Ltd Composite evaluation
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US8525831B2 (en) * 2009-10-05 2013-09-03 Siemens Corporation Method and apparatus for three-dimensional visualization and analysis for automatic non-destructive examination of a solid rotor using ultrasonic phased array
KR101182999B1 (ko) 2009-11-25 2012-09-18 삼성메디슨 주식회사 초음파 영상 처리를 수행하는 초음파 시스템 및 방법
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JP2011224346A (ja) 2010-03-31 2011-11-10 Toshiba Corp 超音波診断装置、画像処理装置および画像処理方法

Also Published As

Publication number Publication date
JP2013125031A (ja) 2013-06-24
CN103218805A (zh) 2013-07-24
US8942465B2 (en) 2015-01-27
US20130148875A1 (en) 2013-06-13
CA2797454A1 (en) 2013-06-13
EP2605213B1 (en) 2020-02-05
CN103218805B (zh) 2017-08-15
EP2605213A1 (en) 2013-06-19
BR102012030402A2 (pt) 2014-07-15

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