JP6112769B2 - 情報処理装置、情報処理方法 - Google Patents

情報処理装置、情報処理方法 Download PDF

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Publication number
JP6112769B2
JP6112769B2 JP2012048610A JP2012048610A JP6112769B2 JP 6112769 B2 JP6112769 B2 JP 6112769B2 JP 2012048610 A JP2012048610 A JP 2012048610A JP 2012048610 A JP2012048610 A JP 2012048610A JP 6112769 B2 JP6112769 B2 JP 6112769B2
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pattern
projection
measurement
target object
imaging
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Japanese (ja)
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JP2013185832A (ja
JP2013185832A5 (enExample
Inventor
達矢 鈴木
達矢 鈴木
哲理 園田
哲理 園田
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Canon Inc
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Canon Inc
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Priority to JP2012048610A priority Critical patent/JP6112769B2/ja
Priority to US13/774,168 priority patent/US9074879B2/en
Publication of JP2013185832A publication Critical patent/JP2013185832A/ja
Publication of JP2013185832A5 publication Critical patent/JP2013185832A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
  • Measurement Of Optical Distance (AREA)
JP2012048610A 2012-03-05 2012-03-05 情報処理装置、情報処理方法 Expired - Fee Related JP6112769B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2012048610A JP6112769B2 (ja) 2012-03-05 2012-03-05 情報処理装置、情報処理方法
US13/774,168 US9074879B2 (en) 2012-03-05 2013-02-22 Information processing apparatus and information processing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012048610A JP6112769B2 (ja) 2012-03-05 2012-03-05 情報処理装置、情報処理方法

Publications (3)

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JP2013185832A JP2013185832A (ja) 2013-09-19
JP2013185832A5 JP2013185832A5 (enExample) 2015-04-16
JP6112769B2 true JP6112769B2 (ja) 2017-04-12

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JP2012048610A Expired - Fee Related JP6112769B2 (ja) 2012-03-05 2012-03-05 情報処理装置、情報処理方法

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US (1) US9074879B2 (enExample)
JP (1) JP6112769B2 (enExample)

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JP2013124884A (ja) 2011-12-13 2013-06-24 Canon Inc 情報処理装置、情報処理装置の制御方法、およびプログラム
JP6346427B2 (ja) * 2013-10-30 2018-06-20 キヤノン株式会社 画像処理装置、画像処理方法
JP6267486B2 (ja) * 2013-10-30 2018-01-24 キヤノン株式会社 画像処理装置、画像処理方法
JP6254849B2 (ja) * 2014-01-17 2017-12-27 キヤノン株式会社 画像処理装置、画像処理方法
JP6335011B2 (ja) * 2014-04-25 2018-05-30 キヤノン株式会社 計測装置およびその方法
JP6412372B2 (ja) * 2014-09-02 2018-10-24 キヤノン株式会社 情報処理装置、情報処理システム、情報処理装置の制御方法およびプログラム
CN104457607A (zh) * 2014-12-10 2015-03-25 东北大学 一种面向深度测量的沙漏码结构光的编解码方法
US10432902B2 (en) * 2015-03-17 2019-10-01 Sony Corporation Information processing device and information processing method
JP2016224021A (ja) * 2015-06-03 2016-12-28 上田　智章 デプスカメラ
WO2016199323A1 (ja) 2015-06-09 2016-12-15 三菱電機株式会社 画像生成装置、画像生成方法、及びパターン光生成装置
CN107726053B (zh) * 2016-08-12 2020-10-13 通用电气公司 探头系统和检测方法
CN108536467B (zh) * 2018-04-08 2021-11-02 中国联合网络通信集团有限公司 代码的定位处理方法、装置、终端设备及存储介质
JP2021158393A (ja) * 2018-06-22 2021-10-07 ソニーグループ株式会社 情報処理装置、情報処理方法、およびプログラム
CN114080535B (zh) * 2019-06-28 2025-02-25 佳能株式会社 测量设备、摄像设备、测量系统、控制方法以及存储介质
KR102161453B1 (ko) * 2019-07-30 2020-10-05 (주)칼리온 고해상도 패턴 스캐닝 방법 및 그 장치
CN110738273B (zh) * 2019-10-23 2023-07-21 成都极米科技股份有限公司 图像特征点的匹配方法、装置、设备及存储介质
US20250124586A1 (en) * 2022-03-30 2025-04-17 Panasonic Intellectual Property Management Co., Ltd. Parallax information generation device and parallax information generation method

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US4653104A (en) * 1984-09-24 1987-03-24 Westinghouse Electric Corp. Optical three-dimensional digital data acquisition system
JP3525964B2 (ja) * 1995-07-05 2004-05-10 株式会社エフ・エフ・シー 物体の三次元形状計測方法
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JP3867512B2 (ja) * 2000-06-29 2007-01-10 富士ゼロックス株式会社 画像処理装置および画像処理方法、並びにプログラム
US20030123707A1 (en) * 2001-12-31 2003-07-03 Park Seujeung P. Imaging-based distance measurement and three-dimensional profiling system
JP3878033B2 (ja) * 2002-02-28 2007-02-07 シーケーディ株式会社 三次元計測装置
JP2004239886A (ja) * 2002-12-11 2004-08-26 Fuji Xerox Co Ltd 三次元画像撮像装置および方法
JP4883517B2 (ja) * 2004-11-19 2012-02-22 学校法人福岡工業大学 三次元計測装置および三次元計測方法並びに三次元計測プログラム
DE602006016013D1 (de) * 2005-11-28 2010-09-16 3Shape As Codiertes strukturiertes licht
JP2007155379A (ja) * 2005-12-01 2007-06-21 Tokyo Univ Of Agriculture & Technology 三次元形状計測装置および三次元形状計測方法
JP2008032608A (ja) * 2006-07-31 2008-02-14 Aisin Seiki Co Ltd 三次元形状測定装置及び三次元形状測定方法
SG176440A1 (en) * 2006-11-21 2011-12-29 Mantisvision Ltd 3d geometric modeling and 3d video content creation
JP5322206B2 (ja) * 2008-05-07 2013-10-23 国立大学法人 香川大学 ３次元形状の計測方法および装置
JP5631025B2 (ja) * 2010-03-10 2014-11-26 キヤノン株式会社 情報処理装置、その処理方法及びプログラム
JP5576726B2 (ja) * 2010-06-29 2014-08-20 キヤノン株式会社 三次元計測装置、三次元計測方法、及びプログラム
JP5587137B2 (ja) * 2010-10-29 2014-09-10 キヤノン株式会社 測定装置及び測定方法
US20120176478A1 (en) * 2011-01-11 2012-07-12 Sen Wang Forming range maps using periodic illumination patterns

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US9074879B2 (en) 2015-07-07
JP2013185832A (ja) 2013-09-19
US20130229666A1 (en) 2013-09-05

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