JP6076223B2 - 電力用半導体素子の駆動回路 - Google Patents

電力用半導体素子の駆動回路 Download PDF

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JP6076223B2
JP6076223B2 JP2013183887A JP2013183887A JP6076223B2 JP 6076223 B2 JP6076223 B2 JP 6076223B2 JP 2013183887 A JP2013183887 A JP 2013183887A JP 2013183887 A JP2013183887 A JP 2013183887A JP 6076223 B2 JP6076223 B2 JP 6076223B2
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power semiconductor
semiconductor element
unit
gate
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JP2015053749A (ja
JP2015053749A5 (enExample
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堀口　剛司
剛司 堀口
中山　靖
靖 中山
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Mitsubishi Electric Corp
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JP2013183887A 2013-09-05 2013-09-05 電力用半導体素子の駆動回路 Active JP6076223B2 (ja)

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JP2013183887A JP6076223B2 (ja) 2013-09-05 2013-09-05 電力用半導体素子の駆動回路

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JP2013183887A JP6076223B2 (ja) 2013-09-05 2013-09-05 電力用半導体素子の駆動回路

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JP2015053749A JP2015053749A (ja) 2015-03-19
JP2015053749A5 JP2015053749A5 (enExample) 2015-12-17
JP6076223B2 true JP6076223B2 (ja) 2017-02-08

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Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6773499B2 (ja) * 2016-09-21 2020-10-21 株式会社日立製作所 半導体駆動装置ならびにこれを用いた電力変換装置
KR102578357B1 (ko) 2016-12-16 2023-09-15 현대자동차주식회사 회로 소자 보호 회로, 상기 회로 소자 보호 회로가 설치된 차량, 회로 소자 보호 방법 및 차량의 제어 방법
JP6300964B1 (ja) * 2017-01-13 2018-03-28 三菱電機株式会社 電力変換装置
JP6264491B1 (ja) * 2017-05-11 2018-01-24 富士電機株式会社 短絡検出装置および装置
DE112017007641T5 (de) * 2017-06-13 2020-04-02 Mitsubishi Electric Corporation Treiberschaltung für ein halbleiterelement
DE112018003834T5 (de) 2017-07-28 2020-04-09 Mitsubishi Electric Corporation Treiberschaltung für ein leistungshalbleiterelement
DE112018005588T5 (de) 2017-10-17 2020-07-16 Fuji Electric Co., Ltd. Überstrom-erfassungseinrichtung, steuereinrichtung und überstrom-erfassungsverfahren
JP7087373B2 (ja) 2017-12-20 2022-06-21 富士電機株式会社 半導体素子の電流検出回路及び電流検出方法
US10845428B2 (en) 2018-06-01 2020-11-24 Infineon Technologies Ag Method and circuit for detecting a loss of a bondwire in a power switch
US11404953B2 (en) * 2018-12-11 2022-08-02 Mitsubishi Electric Corporation Drive circuit for power semiconductor element and power semiconductor module employing the same
JP7346944B2 (ja) 2019-07-03 2023-09-20 富士電機株式会社 半導体素子の電流検出回路及び電流検出方法、並びに半導体モジュール
JP7408934B2 (ja) 2019-07-03 2024-01-09 富士電機株式会社 半導体素子の電流検出回路及び電流検出方法、並びに半導体モジュール
JP7431528B2 (ja) * 2019-08-08 2024-02-15 株式会社東芝 半導体増幅回路
CN111474460B (zh) * 2020-05-29 2022-03-22 中煤科工集团重庆研究院有限公司 Igbt栅极电阻故障检测系统
WO2022044123A1 (ja) * 2020-08-25 2022-03-03 三菱電機株式会社 電力用半導体素子の駆動制御回路、電力用半導体モジュール、および電力変換装置
JP7523552B2 (ja) * 2020-09-07 2024-07-26 三菱電機株式会社 半導体素子の駆動装置、半導体装置および電力変換装置
JP7420273B2 (ja) 2020-09-11 2024-01-23 富士電機株式会社 過電流検出回路および駆動回路
JP7414700B2 (ja) * 2020-12-01 2024-01-16 株式会社東芝 半導体装置
CN112803373B (zh) * 2020-12-14 2024-05-07 株洲中车时代半导体有限公司 功率半导体器件保护电路、控制方法、存储介质以及设备
CN112967695A (zh) * 2021-03-19 2021-06-15 武汉京东方光电科技有限公司 液晶显示模组的驱动装置、驱动方法和液晶显示装置
CN113938118B (zh) * 2021-10-19 2025-03-25 中国科学院上海微系统与信息技术研究所 去饱和短路保护电路、功率器件短路保护电路及测试电路
FR3128995B1 (fr) * 2021-11-08 2023-10-27 Thales Sa Détection et protection de court-circuit d’un composant à grille isolée par monitoring et contrôle de la tension de grille.
CN114660433A (zh) * 2022-03-10 2022-06-24 清华大学 一种碳化硅mosfet短路过流组合检测方法和系统

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4740320B2 (ja) * 2006-04-06 2011-08-03 三菱電機株式会社 半導体素子の駆動回路
JP5721137B2 (ja) * 2011-05-18 2015-05-20 国立大学法人九州工業大学 半導体装置の短絡保護装置

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