JP6075822B2 - センサ装置 - Google Patents

センサ装置 Download PDF

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Publication number
JP6075822B2
JP6075822B2 JP2012056533A JP2012056533A JP6075822B2 JP 6075822 B2 JP6075822 B2 JP 6075822B2 JP 2012056533 A JP2012056533 A JP 2012056533A JP 2012056533 A JP2012056533 A JP 2012056533A JP 6075822 B2 JP6075822 B2 JP 6075822B2
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JP
Japan
Prior art keywords
terahertz wave
optical waveguide
light
sensor device
electro
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2012056533A
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English (en)
Japanese (ja)
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JP2013190311A5 (enExample
JP2013190311A (ja
Inventor
尾内　敏彦
敏彦 尾内
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2012056533A priority Critical patent/JP6075822B2/ja
Priority to US13/795,978 priority patent/US8981303B2/en
Publication of JP2013190311A publication Critical patent/JP2013190311A/ja
Publication of JP2013190311A5 publication Critical patent/JP2013190311A5/ja
Application granted granted Critical
Publication of JP6075822B2 publication Critical patent/JP6075822B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/08—Optical arrangements
    • G01J5/0818—Waveguides
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
    • G01J3/108—Arrangements of light sources specially adapted for spectrometry or colorimetry for measurement in the infrared range
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G01N21/553—Attenuated total reflection and using surface plasmons
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • G01N21/3586—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation by Terahertz time domain spectroscopy [THz-TDS]

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Toxicology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2012056533A 2012-03-13 2012-03-13 センサ装置 Expired - Fee Related JP6075822B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2012056533A JP6075822B2 (ja) 2012-03-13 2012-03-13 センサ装置
US13/795,978 US8981303B2 (en) 2012-03-13 2013-03-12 Sensor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012056533A JP6075822B2 (ja) 2012-03-13 2012-03-13 センサ装置

Publications (3)

Publication Number Publication Date
JP2013190311A JP2013190311A (ja) 2013-09-26
JP2013190311A5 JP2013190311A5 (enExample) 2015-04-09
JP6075822B2 true JP6075822B2 (ja) 2017-02-08

Family

ID=49156779

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012056533A Expired - Fee Related JP6075822B2 (ja) 2012-03-13 2012-03-13 センサ装置

Country Status (2)

Country Link
US (1) US8981303B2 (enExample)
JP (1) JP6075822B2 (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5502564B2 (ja) * 2010-03-31 2014-05-28 浜松ホトニクス株式会社 電磁波検出装置
JP2012053450A (ja) * 2010-08-05 2012-03-15 Canon Inc テラヘルツ波発生素子、テラヘルツ波検出素子、テラヘルツ波発生装置、テラヘルツ波検出装置、テラヘルツ波測定装置、及びテラヘルツ波トモグラフィックイメージング装置
JP6456078B2 (ja) * 2013-10-09 2019-01-23 キヤノン株式会社 テラヘルツ波発生素子、及び、テラヘルツ波検出素子
WO2016084322A1 (en) * 2014-11-28 2016-06-02 Canon Kabushiki Kaisha Measuring apparatus and method for measuring terahertz pulses
US10345239B1 (en) * 2016-09-08 2019-07-09 Verily Life Sciences Llc Thin stackup for diffuse fluorescence system
KR101834798B1 (ko) * 2016-12-01 2018-03-09 서울시립대학교 산학협력단 테라헤르츠파를 이용한 dna 분석 방법 및 dna 분석 장치
CN108767650B (zh) * 2018-06-15 2020-07-24 南开大学 一种功能复合电光q开关
JP7523472B2 (ja) * 2019-05-27 2024-07-26 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 少なくとも１つのサンプルを光学的に分析するための分光計装置
JP2019144276A (ja) * 2019-06-11 2019-08-29 パイオニア株式会社 テラヘルツ波計測装置
JP2019203905A (ja) * 2019-09-04 2019-11-28 パイオニア株式会社 計測装置、計測方法及びコンピュータプログラム
JP6913261B2 (ja) * 2019-09-04 2021-08-04 パイオニア株式会社 計測装置、計測方法及びコンピュータプログラム

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3245932B2 (ja) 1992-02-06 2002-01-15 キヤノン株式会社 光半導体装置、その駆動方法及びそれを用いた光伝送方式
JPH06224882A (ja) 1992-10-03 1994-08-12 Canon Inc 光ｆｓｋ受信器及びそれを用いた光ｆｄｍ−ｆｓｋ伝送システム
JP3226067B2 (ja) 1992-10-03 2001-11-05 キヤノン株式会社 光通信方法及び光通信システム
JP3303515B2 (ja) 1994-03-18 2002-07-22 キヤノン株式会社 光通信方式及びそれを用いた光通信システム
JP3323725B2 (ja) 1995-12-08 2002-09-09 キヤノン株式会社 偏波変調レーザ、その駆動方法及びそれを用いた光通信システム
US6597713B2 (en) 1998-07-22 2003-07-22 Canon Kabushiki Kaisha Apparatus with an optical functional device having a special wiring electrode and method for fabricating the same
JP3817510B2 (ja) 2002-10-29 2006-09-06 キヤノン株式会社 光電気混載装置
US20050242287A1 (en) * 2004-04-30 2005-11-03 Hosain Hakimi Optical terahertz generator / receiver
JP4546326B2 (ja) * 2004-07-30 2010-09-15 キヤノン株式会社 センシング装置
JP4955966B2 (ja) * 2005-09-05 2012-06-20 キヤノン株式会社 導波路、それを用いた装置及び検出方法
WO2007070575A2 (en) * 2005-12-13 2007-06-21 Massachusetts Institute Of Technology Optically driven phase-matched terahertz emitter
WO2008026523A1 (en) * 2006-08-28 2008-03-06 Tohoku University Near-field light measuring method and near-field light measuring device
JP4871176B2 (ja) * 2007-03-13 2012-02-08 浜松ホトニクス株式会社 全反射テラヘルツ波測定装置
JP5729895B2 (ja) 2008-01-29 2015-06-03 キヤノン株式会社 光パルス圧縮器
JP5354582B2 (ja) 2009-03-04 2013-11-27 国立大学法人名古屋大学 テラヘルツ波発生装置
JP5666847B2 (ja) * 2009-08-10 2015-02-12 日本碍子株式会社 電磁波発振素子
JP5967867B2 (ja) * 2010-06-03 2016-08-10 キヤノン株式会社 テラヘルツ波発生素子、テラヘルツ波検出素子、及びテラヘルツ時間領域分光装置

Also Published As

Publication number Publication date
US8981303B2 (en) 2015-03-17
US20130240740A1 (en) 2013-09-19
JP2013190311A (ja) 2013-09-26

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