JP5962167B2 - 検出回路、センサーデバイス及び電子機器 - Google Patents

検出回路、センサーデバイス及び電子機器 Download PDF

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Publication number
JP5962167B2
JP5962167B2 JP2012095353A JP2012095353A JP5962167B2 JP 5962167 B2 JP5962167 B2 JP 5962167B2 JP 2012095353 A JP2012095353 A JP 2012095353A JP 2012095353 A JP2012095353 A JP 2012095353A JP 5962167 B2 JP5962167 B2 JP 5962167B2
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JP
Japan
Prior art keywords
transistor
gate
switching element
circuit
type transistor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
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JP2012095353A
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English (en)
Japanese (ja)
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JP2013221907A (ja
JP2013221907A5 (enExample
Inventor
山村　光宏
光宏 山村
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Seiko Epson Corp
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Seiko Epson Corp
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Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP2012095353A priority Critical patent/JP5962167B2/ja
Priority to US13/848,358 priority patent/US9052237B2/en
Priority to CN2013100971612A priority patent/CN103376161A/zh
Publication of JP2013221907A publication Critical patent/JP2013221907A/ja
Publication of JP2013221907A5 publication Critical patent/JP2013221907A5/ja
Priority to US14/725,144 priority patent/US9222839B2/en
Application granted granted Critical
Publication of JP5962167B2 publication Critical patent/JP5962167B2/ja
Expired - Fee Related legal-status Critical Current
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/34—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using capacitors, e.g. pyroelectric capacitors
    • G01J5/35—Electrical features thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/20—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices
    • G01J5/22—Electrical features thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/34—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using capacitors, e.g. pyroelectric capacitors
    • G01J2005/345—Arrays

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Geophysics And Detection Of Objects (AREA)
JP2012095353A 2012-04-19 2012-04-19 検出回路、センサーデバイス及び電子機器 Expired - Fee Related JP5962167B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2012095353A JP5962167B2 (ja) 2012-04-19 2012-04-19 検出回路、センサーデバイス及び電子機器
US13/848,358 US9052237B2 (en) 2012-04-19 2013-03-21 Detection circuit, sensor device and electronic apparatus
CN2013100971612A CN103376161A (zh) 2012-04-19 2013-03-25 检测电路、传感器器件以及电子设备
US14/725,144 US9222839B2 (en) 2012-04-19 2015-05-29 Detection circuit, sensor device and electronic apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012095353A JP5962167B2 (ja) 2012-04-19 2012-04-19 検出回路、センサーデバイス及び電子機器

Publications (3)

Publication Number Publication Date
JP2013221907A JP2013221907A (ja) 2013-10-28
JP2013221907A5 JP2013221907A5 (enExample) 2015-05-14
JP5962167B2 true JP5962167B2 (ja) 2016-08-03

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Family Applications (1)

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JP2012095353A Expired - Fee Related JP5962167B2 (ja) 2012-04-19 2012-04-19 検出回路、センサーデバイス及び電子機器

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US (2) US9052237B2 (enExample)
JP (1) JP5962167B2 (enExample)
CN (1) CN103376161A (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3324609A4 (en) * 2015-07-13 2018-08-01 Sharp Kabushiki Kaisha Radiation detector
FR3044443B1 (fr) * 2015-11-30 2018-12-07 Commissariat A L'energie Atomique Et Aux Energies Alternatives Procede de capture de motif thermique
US11118977B2 (en) 2017-05-09 2021-09-14 Tokyo Institute Of Technology Terahertz wave detection device and terahertz wave detection system
JP7230528B2 (ja) * 2018-01-30 2023-03-01 京セラドキュメントソリューションズ株式会社 画像形成装置
CN109061431B (zh) * 2018-08-22 2020-11-13 徐州中矿大传动与自动化有限公司 一种基于栅极电荷的SiC MOSFET栅极故障诊断系统及诊断方法
CN109541712B (zh) * 2018-11-30 2020-07-28 天津大学 基于周期性光栅化栅极金属栅mosfet太赫兹探测器
CN109581530B (zh) * 2018-12-28 2025-02-18 同方威视技术股份有限公司 便携式太赫兹安检设备
JP7561340B2 (ja) * 2019-10-09 2024-10-04 パナソニックＩｐマネジメント株式会社 撮影装置
KR102471024B1 (ko) * 2021-05-24 2022-11-25 (주)아이엠티 이중구조 스위치 및 이를 구비한 위성 전력제어 장치

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2186146B (en) * 1984-04-16 1988-06-22 Secr Defence Thermal detector
JPH073362B2 (ja) * 1984-06-14 1995-01-18 株式会社村田製作所 一次元焦電型センサアレイ
JPH05145853A (ja) * 1991-11-22 1993-06-11 Hamamatsu Photonics Kk 赤外線撮像装置
JP3731750B2 (ja) * 2002-06-24 2006-01-05 松下電器産業株式会社 赤外線センサの製造方法
JP3782095B2 (ja) * 2002-06-24 2006-06-07 松下電器産業株式会社 赤外線センサの製造方法
JP2008017288A (ja) * 2006-07-07 2008-01-24 Rohm Co Ltd 光電変換回路及びこれを用いた固体撮像装置
JP5022789B2 (ja) * 2007-06-27 2012-09-12 ザインエレクトロニクス株式会社 信号変換回路及びレール・ツー・レール回路
JP2009068863A (ja) * 2007-09-10 2009-04-02 Toshiba Corp 赤外線検出素子及びそれを用いた赤外線イメージセンサ
JP2009253559A (ja) * 2008-04-03 2009-10-29 Sharp Corp 固体撮像装置および電子情報機器
US8654110B2 (en) * 2008-07-11 2014-02-18 Sharp Kabushiki Kaisha Display device and method for driving display device
JP5178394B2 (ja) * 2008-08-20 2013-04-10 キヤノン株式会社 撮像装置及びその制御方法
JP5747498B2 (ja) * 2010-01-06 2015-07-15 セイコーエプソン株式会社 センサーデバイス及び電子機器
JP5736744B2 (ja) * 2010-01-26 2015-06-17 セイコーエプソン株式会社 熱センサーデバイス及び電子機器

Also Published As

Publication number Publication date
CN103376161A (zh) 2013-10-30
US20130277558A1 (en) 2013-10-24
US9052237B2 (en) 2015-06-09
JP2013221907A (ja) 2013-10-28
US20150260583A1 (en) 2015-09-17
US9222839B2 (en) 2015-12-29

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